EPrints.FRI – a case study Open Access: Maximising Research Impact in Sofia Sofia, 23 April 2009 [email protected].
Robust Low Power VLSI ECE 7502 S2015 Burn-in/Stress Test for Reliability: Reducing burn-in time through high-voltage stress test and Weibull statistical.
Napovedovanje imunskega odziva iz peptidnih mikromrež Mitja Luštrek 1 (2), Peter Lorenz 2, Felix Steinbeck 2, Georg Füllen 2, Hans-Jürgen Thiesen 2 1 Odsek.
Wireless Network Security Virtual Laboratory Anthony LoBono, Mike Steffen, and Shishir Gupta Advisor: Doug Jacobson Client: George Amariucai.
