Simulations of sub-100nm strained Si MOSFETs with high- gate stacks Lianfeng Yang, Jeremy Watling *, Fikru Adamu-Lema, Asen Asenov and John Barker Device.
Simulations of sub-100nm strained Si MOSFETs with high- gate stacks
Data Assimilation Theory CTCD Data Assimilation Workshop Nov 2005
