Introduction to X-Ray Powder Diffraction Data Analysis Scott A Speakman, Ph.D. Center for Materials Science and Engineering at MIT [email protected] .
Introduction to High Resolution X-Ray Diffraction of Epitaxial Thin Films Scott A Speakman, Ph.D. MIT Center for Materials Science and Engineering 617-253-6887.
HighScore Plus for Crystallite Size Analysis Scott A Speakman, Ph.D. Center for Materials Science and Engineering at MIT [email protected] .
Profile Fitting for Analysis of XRPD Data using HighScore Plus v3 Scott A Speakman, Ph.D. Center for Materials Science and Engineering at MIT [email protected].
Estimating Crystallite Size Using XRD Scott A Speakman, Ph.D. 13-4009A [email protected] MIT Center for Materials Science and.
Scott A. Speakman, Ph.D. Basics of X-Ray Powder Diffraction Scott A Speakman, Ph.D. [email protected] (617) 253-6887 .
Basics of X-Ray Powder Diffraction Training to Become an Independent User of the X-Ray SEF at the Center for Materials Science and Engineering at MIT Scott.
