emi/emc
ITU-T Workshop on Tackling Climate Change and Specific Absorption Rate Measurement Cotonou, Benin, 19 July 2012 Flavio CUCCHIETTI Mauro FRANCAVILLA Benchmark.
DDi\'s ATE/BIB capability
Automated Regression Testing for Embedded Systems in Action
SVTL Basic Training 2 ©2002 Cypress Semiconductor SVTL Basic Training Outline 1.Terms and Concepts 2.Test Scripts Overview 3.Test Configurations 4.Drive.
JTAG over the internet!. The problem Until now device testing was physically (geographically) limited as the DUT (device under test) and the TAP controller.
1 FLIPPER SEU Fault Injection in Xilinx FPGAs Monica Alderighi National Institute for Astrophysics, IASF Milano, Italy [email protected] Computing.
A Generic Randomization Framework Architecture for Test Execution in Automated Testing Of SoC
Vibration
FLIPPER SEU Fault Injection in Xilinx FPGAs
Accelerators for Medical applications RF powering [email protected] 26 May - 5 June, 2015, CAS, Accelerators for Medical Applications, Vösendorf,