Defect MgmtBugDay Bangkok 2009: Defect Management
Analysis of Software Artifacts - Spring 2006 1 Survey of Race Condition Analysis Techniques Team Extremely Awesome Nels Beckman Project Presentation 17-654:
Composite Analysis of Phase Resolved Partial Discharge Patterns using Statistical Techniques
Semiconductor Defect Management Separating The Vital Few From The Trivial Many
Test Reports
Scopidea defect
Quality Issue Enhancement Guide
Scopidea Defect
Nadca - Overview of defets in die casting
7174455 x Ray Testing
Interpretation E V1.1
