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Principles and Applications of Ellipsometry Modern Techniques for Characterising Dispersions and Surfaces 17 November, 2004 Dr. Joe Keddie University of.
Jing Li Outline Introduction Classical Model Typical measurement methods Application Reference Index of Refraction.
1002.1505v1
013-Choosing the Most Suitable Theory in Laser Diffraction - Mie or Fraunhofer (1)
Claudia Ambrosch-Draxl Institute for Theoretical Physics University Graz [email protected] Optical Properties of Solids within WIEN2k.
Definition Platforms for this talk –Windows / DirectX11 –OpenGL 4 / OpenGL ES 3.0 –PlayStation 4 –Xbox One.
Polarizers Outline Review of the Lorentz Oscillator Reflection of Plasmas and Metals Polarization of Scattered Light Polarizers Applications of Polarizers.
Microwave Properties of Rock Salt and Lime Stone for Detection of Ultra-High Energy Neutrinos Toshio Kamijo and Masami Chiba Tokyo Metropolitan University,
Imaging x-ray generation and Scattering Tabletop soft x-ray coherent imaging microscopes.
Ellipsometry and X-ray Reflectivity (XRR). Learning objectives To roughly understand the principles of ellipsometry and XRR To be able to point out what.
[email protected] Time-resolved Fourier Transform Infrared Spectroscopy (FTIR) in Soft Matter research.
