MBISR Documentation1
Activity 2 : Use of CCD Cameras. In this activity some of the practical considerations of using and building CCD cameras are described. Simon Tulloch Nik.
ECE 555 Lecture 16: Design for Testability Slides by David Harris Harvey Mudd College Spring 2004 Slide 116: Design for Testability.
1 Seoul - December 20081 Yield Enhancement - International Technical Working Group ITRS Conference Seoul - December 2008 Lothar Pfitzner, Fraunhofer-IISB,
10b.ppt
Introduction to CMOS VLSI Design Lecture 17: Design for Testability David Harris Harvey Mudd College Spring 2004.
Defect Tolerance for Yield Enhancement of FPGA Interconnect Using Fine-grain and Coarse-grain Redundancy Anthony J. Yu August 15, 2005.
Defect-tolerant FPGA Switch Block and Connection Block with Fine- grain Redundancy for Yield Enhancement Anthony J. YuGuy G.F. Lemieux August 25, 2005.
LOW power VLSI
Spectral properties of array sensors
CDC/CRA CHiPs Mentoring Workshop High Performance Interconnects
