5-JTAG
5 Jtag
Alexander Gnusin Introduction to DFT. Internal Scan Concept Used to get access to all internal chip registers: Scan inputs Scan outputs Func inputs Func.
(Jtag) boundary scan test - a practical approach - harry bleeker - peter van den eijnden - frans de jong - kluwer academic
Debugging-with-JTAG
Debugging With JTAG Vision2008
1 Energy-Efficient Register Access Jessica H. Tseng and Krste Asanović MIT Laboratory for Computer Science, Cambridge, MA 02139, USA SBCCI2000.
Energy-Efficient Register Access
Alexander Gnusin
