Quality Assurance of Silicon Strip Detectors and Monitoring of Manufacturing Process Thomas Bergauer Institute f. High Energy Physics HEPHY, Vienna SiLC.
Planar Edgeless Silicon Detectors for the TOTEM Experiment 1.E-09 1.E-06 1.E-03 3.43.94.44.9 1/T, 1e3/K Current, A (294K) (256K)(227K)(204K) Gennaro Ruggiero,
Medipix sensors included in MP wafers 2 To achieve good spatial resolution through efficient charge collection: Produced by Micron Semiconductor on n-in-p.
Slim Edges from Cleaving and ALD Sidewall Passivation
Development of SOI pixel sensor
2 POINT ALIGNMENT
Updates on Punch-through Protection
Development and System Tests of DC-DC Converters for the CMS SLHC Tracker Lutz Feld, Rüdiger Jussen, Waclaw Karpinski, Katja Klein, Jennifer Merz, Jan.
