Nov. 21, 2006ATS'06 1 Spectral RTL Test Generation for Gate-Level Stuck-at Faults Nitin Yogi and Vishwani D. Agrawal Auburn University, Department of ECE,
May 11, 2006High-Level Spectral ATPG1 High-Level Test Generation for Gate-level Fault Coverage Nitin Yogi and Vishwani D. Agrawal Auburn University Department.
Aug 11, 2006Yogi/Agrawal: Spectral Functional ATPG1 Spectral Characterization of Functional Vectors for Gate-level Fault Coverage Tests Nitin Yogi and.
