M.C. Rodriguez1, J.H. Allton2, and P.J. Burkett3 . 1 Geocontrol Systems- ESCG at NASA/Johnson Space Center, Houston, TX 77058; melissa.rodriguez-1@nasa.gov, 2 NASA/Johnson Space Center, Houston, TX 77058, 3

Jacobs- ESCG at NASA /Johnson Space Center, Houston, TX 77058.

This is an example of selecting an outline of the area of interest (AOI) of the collector surface. The Image Pro Plus software can

automatically select an outline of an area and assess the features within the AOI. Here, sample 60440 is shown after UPW cleaning at

JSC (left) and after later acid-etch.

This is an example of how the software uses color to separate and store information. In the image (60440 position 3) on the left, the blue features were observed after UPW cleaning at JSC, and the red are present after UPW+ acid-etch. In the image on the right, the features are separated by size

classes.

Wet cleaning

Curatorial Facility

UPW UV - O3

Lab TRXRF

SEM

SRTRXRF TOF-SIMS

Lab TRXRF

Particle Counts

SEM

Clean ?

Yes

No

Yes No

Clean ?

Curatorial Facility clean

collection

Size (µm)

Fig. 1. Sample 60440, after UPW and acid-etch. Each red box is approx. 1 mm2 in area.

Fig. 2. Position 1 on sample 60440, after UPW and acid-etch. Each tile is 222 x 160 µm.

Fig. 3. Position 3 on sample 60440, after UPW and acid-etch. Each tile is 222 x 160

µm.

Fig. 4. Position 2 on sample 60440, after UPW and acid-etch. Each tile is 222 x 160 µm.

These samples are the next in line for image processing. Once returned to JSC, they will be imaged again in the same locations as part of the “Master Cleaning Plan”. Each sample was images at 50X in three locations (1 mm² areas).

Sample 60508 FZ-Si B/C array

Sample 61052 FZ-Si B/C array Sample 61049 FZ-Si B/C array