Center for Research on Interface Structures and PhenomenaYale University | Southern CT State University | Brookhaven Natl Lab CRISP NSF-MRSEC

DMR-0520495

CRISP – National Laboratory CollaborationsAdvanced Photon Source & Brookhaven National Laboratory

D. Kumah, J. Reiner, Y. Segal, A. Kolpak, S. Ismail-Beigi, Z . Zhang, P. Zschack,D. Su, Y. Zhu, M. Sawicki, C. Broadbridge, F.J. Walker, C.H. Ahn

Polarization model from XRD

Real Space Imaging (BNL)

Reciprocal Space Imaging (APS)

Si

SrO

Ti

DataPolarized STO model

x-ra

y in

tens

ity

Reciprocal space units1 2 3 4 5

100

10

1

0.1

0.001

• Subatomic resolution of structure from synchrotron x-ray diffraction at APS and electron microscopy at BNL

• Atomic layer precision in synthesis

• Correlation between structure and electronic properties with understanding from first principles

• Data critical for design of ferroelectric field effect transistors