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Page 1: Correlation between structure and magnetism in thin films INFM, Unità di Genova Francesco Bisio.

•Correlation between structure and magnetism in thin films

INFM, Unità di Genova

Francesco Bisio

Page 2: Correlation between structure and magnetism in thin films INFM, Unità di Genova Francesco Bisio.

Experimental techniques:

Magnetism+ structure in situ

MOKE + MSHG,Polar+longitudinal

QLEED

UHV chamber:p~1.5·10-10 mbar;Electromagnet ~800 Oe;MOKE: 670 nm laser diode;SHG: Ti:sapphire 720÷880 nm, <100fs pulse.

viewport

sample

Phosphor-screen

Magnet

Magnet

LEED

Laser 670 nm

viewport

polarizer

polarizer

Mon

och

r.PM

T

Page 3: Correlation between structure and magnetism in thin films INFM, Unità di Genova Francesco Bisio.

Kerr

sig

nal [a

. u

.]

3000200010000time [s]

sampleMagnet

Magnet

Magnetism + Structure: Fe/Cu3Au

Kerr

sig

nal (a

.u.)

4000300020001000time(s)

T=185 K

SROOnset of

Magnetic order

PO

LA

R

Magnet

sample

Magnet

LO

NG

ITU

DIN

AL SRO

T=290 K

sampleMagnet Magnet

LEED

LEED

43210 k||

LE

ED

inte

nsi

ty [

a.

u.]

(00)

(11)

Page 4: Correlation between structure and magnetism in thin films INFM, Unità di Genova Francesco Bisio.

Fe/Cu3Au thin films

•Fcc substrate, a=3.745 Å

•Possibility of stabilising metastable Fe structures

•Possible coexistence of different structural phases within the same film

AF

NMFM

P. M. Marcus et al. PRB 60, 369 (1999)

Rws (a. u.)

Fcc Fe:

Magnetic properties

depend upon lattice

parameter

(110)

(100)

(-110)

a=2.65 Å

c/a=2Au

CuFe

Page 5: Correlation between structure and magnetism in thin films INFM, Unità di Genova Francesco Bisio.

10

8

6

4

2

0x1

03

2.001.95 1.90 1.80

'

30 Å

25 Å

21 Å

17 Å

11 Å

Fe / Cu3Au: structural properties

Inte

nsity

[a.

u.]

Bcc Fe R45°

H [r. l. u.]

Substrate,Pseudomorphic Fe

F. Bruno et al. PRB 66, 045402

GIXRD radial scans vs. film thickness

Page 6: Correlation between structure and magnetism in thin films INFM, Unità di Genova Francesco Bisio.

Structure and morphology

~150 Å

thk >30 Å

Low coverage: thk<10 Å

Medium coverage: 10 Å<thk< 20 Å

High coverage: thk>25 Å

Fe

substrate

Fe

substrate

’ Fe

Fe

substrate

’ Fe

Fe

Page 7: Correlation between structure and magnetism in thin films INFM, Unità di Genova Francesco Bisio.

Structure-magnetism correlationKerr

Asy

mm

etr

y (

arb

. U

n.)

302520151050

Thickness (Å)

Cu3Au

Cu3Au

Cu3Au

Tdep~295 KHext=± 50 OeHext|| (100)

MM

M

Optical – Magneto Optical response ?Interface hybridization ?Different per atom ?

Page 8: Correlation between structure and magnetism in thin films INFM, Unità di Genova Francesco Bisio.

25

20

15

10

5

0

Coerciv

e fi

eld

[Oe]

6050403020100

Thickness [Å]

Kerr

asy

mm

etr

y [

Arb

. U

n.]

Morphology-magnetism correlation

20

15

10

5

0

Coerciv

e Fie

ld [O

e]

403020100

Thickness [Å]

Kerr

Asy

mm

etr

y [

a. u

.]

Tdep~295 KHext=± 50 OeHext|| (100)

Tdep~295 KHext=± 50 OeHext|| (110)

Page 9: Correlation between structure and magnetism in thin films INFM, Unità di Genova Francesco Bisio.

-40 -20 0 20 40

H (Oe)

35 Å 45 Å

Morphology-magnetism correlation

-40 -20 0 20 40

H (Oe)

40 Å

Hext|| (100)

Kerr

Sig

nal [a

. u

.]

40200-20-40

H (Oe)

9 Å 15 Å 20 Å 25 Å 30 Å

Kerr

Sig

nal [a

. u.]

-40 -20 0 20 40

H (Oe)

10 Å 21 Å 31 Å

Hext|| (110)

Page 10: Correlation between structure and magnetism in thin films INFM, Unità di Genova Francesco Bisio.

10x10-3

8

6

4

2

0

Kerr

Asy

mm

etr

y [

a.

u.]

302520151050

Thickness (Å)

Tdep=345 K Tdep=295 K

Temperature dependence of magnetic properties

Morphological effect

Intermixing + Curie temperature

shift

Kerr asymmetry during growth vs. substrate temperature

Page 11: Correlation between structure and magnetism in thin films INFM, Unità di Genova Francesco Bisio.

People

Università di Genova e UdR INFM

G. Gonella

R. Moroni

S. Terreni

M. Canepa

L. Mattera

Page 12: Correlation between structure and magnetism in thin films INFM, Unità di Genova Francesco Bisio.

Conclusions

Experimental apparatus devoted to the study of structure-magnetism correlation;

Application to heteroepitaxial ultrathin magnetic films;

Study of buried interface properties (MSHG);

Dependence of magnetism upon crystallographic

parameters;

Page 13: Correlation between structure and magnetism in thin films INFM, Unità di Genova Francesco Bisio.

Kerr

sig

nal [a

. u

.]

3000200010000time [s]

sampleMagnet

Magnet

LEED

Experimental techniques: real time MOKE

Kerr

sig

nal (a

.u.)

4000300020001000time(s)

T=185 K

SRO

Onset ofMagnetic order

POLAR Fe/Cu3Au

sample

Magnet

Magnet

LEED

LONGITUDINAL

SRO

T=290 K

Fe/Cu3Au

Page 14: Correlation between structure and magnetism in thin films INFM, Unità di Genova Francesco Bisio.

20x103

15

10

5

0

Inte

nsity

(ar

b. u

nits

)

2.001.951.901.851.80

H (r.l.u.)

~ 2.4 nm

~ 2.1 nm

~ 1.8 nm Fe

~ 2.9 nm

~ 3.7 nm

in= 1.8 deg.

in= 0.8

40

35

30

25

20

15

Spe

ssor

e (Å

)

2.001.951.901.851.80

H (r.l.u.)

in= 0.8 in= 1.8 deg.

fctbct

Inte

nsity

[a.

u.]

H [r. l. u.]

Fe/Cu3Au: structural properties

Coexistence of multiple structural phases on the film

In-depth scan of the film