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FLUKA Rechnungen für das FLUKA Rechnungen für das CBM Experiment an FAIRCBM Experiment an FAIR
Anna SengerFAIR@GSI, CBM Detektoren
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OutlookOutlook
• FLUKA tool and radiation environment predictions
• The CBM experiment
• FLUKA calculations for the CBM detector
development
• Conclusions• FLUKA
– "The FLUKA code: Description and benchmarking" G. Battistoni, S. Muraro, P.R. Sala, F. Cerutti, A. Ferrari, S. Roesler, A. Fasso`, J. Ranft, Proceedings of the Hadronic Shower Simulation Workshop 2006, Fermilab 6--8 September 2006, M. Albrow, R. Raja eds., AIP Conference Proceeding 896, 31-49, (2007)
– "FLUKA: a multi-particle transport code" A. Fasso`, A. Ferrari, J. Ranft, and P.R. Sala, CERN-2005-10 (2005), INFN/TC_05/11, SLAC-R-773
• FLAIR– V.Vlachoudis "FLAIR: A Powerful But User Friendly Graphical Interface For FLUKA“ Proc. Int. Conf. on Mathematics, Computational
Methods & Reactor Physics (M&C 2009), Saratoga Springs, New York, 2009
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FLUKA is a general purpose tool for calculations of particle transport and interactions with matter, covering an extended range of applications spanning from proton and electron accelerator shielding to target design, calorimetry, activation, dosimetry, detector design, Accelerator Driven Systems, cosmic rays, neutrino physics, radiotherapy etc.
Transport limits: Secondary particles Primary particles charged hadrons 1 keV-20 TeV * 100 keV-20 TeV * ** neutrons thermal-20 TeV * thermal-20 TeV * antineutrons 1 keV-20 TeV * 10 MeV-20 TeV * muons 1 keV-1000 TeV 100 keV-1000 TeV ** electrons 1 keV-1000 TeV 70 keV-1000 TeV (low-Z materials) ** 150 keV-1000 TeV (high-Z materials) ** photons 100 eV-1000 TeV 1 keV-10000 TeV heavy ions <10000 TeV/n <10000 TeV/n
* upper limit 10 PeV with the DPMJET interface ** lower limit 10 keV in single scattering mode thermal ~ 10-5 eV
www.fluka.org
FLUKAFLUKA
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MATERIAL CAUSE RADIATION EFFECT
Semiconductors Electron-hole pair dose ionizationPhoton interaction photon absorption
Lattice displacement nuclear collision
Polymers Main and side chain rupture dose ionizationcross-linking degradation dose ionizationgas evolution, radical production dose rate
Ceramics Lattice displacements nuclear collisiontrapped charge carriers dose ionizationcolor centers dose ionization
Metals Lattice displacements nuclear collisionnuclear reactions producing clusters nuclear collision voids and bubbles nuclear collision
Radiation EffectsRadiation Effects
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Radiation environment during the Radiation environment during the experimentsexperiments
• Dose in shielded areas (where the electronics is usually located) is mainly due to neutrons (and associated photons)
• Dose and neutron fluxes have a very close correlation
• Cumulative damage comes from
– Energy deposition (ionizing dose)
– Lattice displacement (1-MeV n equivalent particle fluxes)
• Stochastic failures can occur (SEU) and are mostly due to “high” energy hadrons (“E>20 MeV”)
• No safe limit exists, only a risk level can be determined
• Risk level for commercial electronics is poorly known and varies by orders of magnitude between different devices and series
• Only a combination of the following can assure safe operation:
– Simulation studies of related radiation levels (Dose, 1MeV, 20MeV)
– Careful selection and testing of required electronics
– Shielding and displacement considerations
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Radiation EffectsRadiation Effects
Displacement Damage. Hadrons can interact and cause significant damage to the crystal lattice. The amount and type of damage depends on the particle type and energy. The damage is usually quantified by the amount of Non-Ionizing Energy Loss
Ionizing Radiation is of high energy, capable to penetrate in the matter, to produce ionization of the atoms and to break chemical bonds.
microscopic effect(detectors)
macroscopic effect(electronics)
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CBM experiment @ FAIRCBM experiment @ FAIR
MVDMVD++
STSSTSRICHRICH TRDTRD ToFToF ECALECAL PSDPSD
MuChMuChSTSSTS TRDTRD ToFToF PSDPSD
Experimental tasks and detector systems
• tracking, momentum determination, vertex reconstruction: silicon pixel/strip detectors (MVD+STS) in a magnetic dipole field
• hadron identification: Time-of-Flight (ToF) measurements
• lepton identification: Muon detection system, RICH, TRD and ECAL for electrons (alternative measurements)
• determination of collision centrality and event plane: projectile spectator detector (PSD)
• high speed DAQ and online event selection
Experimental and technical challenges• high multiplicities (up to 1000 particles per reaction)• high reaction rates (up to 10 MHz)
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FLUKA CBM geometryFLUKA CBM geometryC
BM
@ S
IS30
0fu
ll se
tup
CB
M @
SIS
100
star
t ve
rsio
n
FLAIR
FLAIR
MVDMVD++
STSSTSRICHRICH
TRDTRD
ToFToF
PSDPSD He bags
vacuum beam pipeMVDMVD
++STSSTS
RICHRICH
TRDTRD ToFToF
PSDPSD
side view
side view
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CAVECAVE
neq/cm2/2months
CBM @ SIS100: Au+Au @ 10 GeV/u, 10CBM @ SIS100: Au+Au @ 10 GeV/u, 1099 Au/s Au/s
CBM @ SIS300: Au+Au @ 35 GeV/u, 10CBM @ SIS300: Au+Au @ 35 GeV/u, 1099 Au/s Au/s
Non-Ionizing Energy Loss (NIEL)
CB
M @
SIS
300
CB
M @
SIS
100
He bags
vacuum beam pipe
side view
side view
10
Gy/2months
CAVECAVECBM @ SIS100: Au+Au @ 10 GeV/u, 10CBM @ SIS100: Au+Au @ 10 GeV/u, 1099 Au/s Au/s
CBM @ SIS300: Au+Au @ 35 GeV/u, 10CBM @ SIS300: Au+Au @ 35 GeV/u, 1099 Au/s Au/s
Ionizing dose
CB
M @
SIS
300
CB
M @
SIS
100
He bags
vacuum beam pipe
side view
side view
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MVDMVD
Gy/2months
Ionizing dose
5 cm 10 cm 15 cm
CB
M @
SIS
300
CB
M @
SIS
100
CBM @ SIS100: Au+Au @ 10 GeV/u, 10CBM @ SIS100: Au+Au @ 10 GeV/u, 1077 Au/s Au/s
CBM @ SIS300: Au+Au @ 35 GeV/u, 10CBM @ SIS300: Au+Au @ 35 GeV/u, 1077 Au/s Au/s
10 cm 18.6 cm 22.8 cm
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neq/cm2/2months
Non-Ionizing Energy Loss (NIEL)
MVDMVD
5 cm 10 cm 15 cm
CB
M @
SIS
300
CB
M @
SIS
100
CBM @ SIS100: Au+Au @ 10 GeV/u, 10CBM @ SIS100: Au+Au @ 10 GeV/u, 1077 Au/s Au/s
CBM @ SIS300: Au+Au @ 35 GeV/u, 10CBM @ SIS300: Au+Au @ 35 GeV/u, 1077 Au/s Au/s
10 cm 18.6 cm 22.8 cm
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STSSTSCBM @ SIS100: Au+Au @ 10 GeV/u, 10CBM @ SIS100: Au+Au @ 10 GeV/u, 1077 Au/s Au/s
CBM @ SIS300: Au+Au @ 35 GeV/u, 10CBM @ SIS300: Au+Au @ 35 GeV/u, 1077 Au/s Au/s
CB
M @
SIS
300
CB
M @
SIS
100
30 cm 100 cm
48 40 cm2 96 100 cm2
Gy/2months
Ionizing dose
electronics
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STSSTSCBM @ SIS100: Au+Au @ 10 GeV/u, 10CBM @ SIS100: Au+Au @ 10 GeV/u, 1077 Au/s Au/s
CBM @ SIS300: Au+Au @ 35 GeV/u, 10CBM @ SIS300: Au+Au @ 35 GeV/u, 1077 Au/s Au/s
CB
M @
SIS
300
CB
M @
SIS
100
Non-Ionizing Energy Loss (NIEL)
30 cm 100 cm neq/cm2/2months
48 40 cm2 96 100 cm2
electronics
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Detector damagesDetector damages
1014 n/cm2
104 Gy
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ConclusionsConclusions
detectors beam intensity (s-1) live time without/mild damages
MVD 107 6 months *
STS
109
10 months *
RICH 2 years **
MuCh 6 months **
TRD2 years **
ToF
PSD 108 1 year **
estimated CBM detector live time (only for hot regions)
* sensitive to the NIEL** sensitive to the ionizing dose
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