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X-ray uorescence course for sequentialWDXRF systems

XRF

Prerequisites

Greatest benets can be derived from

the course after the instrument has

been installed at the user site and the

participant has had an opportunity

to become acquainted with the XRF

spectrometer and software. It is

therefore recommended that the course

should be attended after installation

rather than before. A good working

knowledge of the English language

is required. Basic knowledge of the

operation of MS Windows -based

software packages is required. Please

also refer to the outline pages of the

folder.

Course contents

Physics of X-rays

The X-ray spectrometer

Instrumental parameters

Sample preparation

Matrix effects

Sources of errors

Qualitative analysis

Quantitative analysis

Standardless analysis

Statistical Process control

Fundamental Parameter basics

Calibration update

Instrument monitor correction

Spectrometer

AxiosmAX, Axios, MagiX, MagiX PRO,PW2404, PW2400, XUnique, XUnique II,

PW1480, PW1404.

Course duration

10 days - the course starts in the rst

week on Monday (10:00 a.m.) and

continues until Friday (5:00 p.m.) in the

following week.

Total number of participants

Minimum number of participants: 6

Maximum number of participants: 12

Each participant of an XRF trainingcourse receives a Tutorware CD free of

charge

Tutorware is training in the form of a

software program, which guides the

user through the principles of the XRF

technology. Graphics, animations and

simulations make it interesting and

easy to follow. The course consists of

a number of modules, which cover all

aspects from introduction to X-rays to

the basic operating principles of X-ray

analysis, whereby each module can be

started up independently. An ideal helpto learn, refresh and stay up to date.

Fundamental and practical techniques of X-ray uorescence analysis using

sequential spectrometers are treated in this course. Particular emphasis is placed on

the practical use of these instruments in conjunction with SuperQ and

Omnian / IQ+ software. Practical aspects of parameter selection, matrix effects,sample preparation, qualitative analysis, standardless analysis, calibration

and calibration update, monitor correction and results analysis are dealt with

extensively. The course is composed of lectures and practical sessions, with exercises

on the spectrometers currently available in our Application Competence Center.

After participating this (10 days) XRF course, the user is capable of using the

XRF spectrometer, use SuperQ software for application development, maintain

calibrations and has a good understanding of the hardware and theory of XRF

Although many subjects are the same as the (5 days) basic course, this 10-day

course is targeted at users who need to know to operate the spectrometer and

software in depth e.g. system owners.

At our Application Competence

Center courses are given in English.Courses in German (and French) can

be arranged upon request. If you

prefer the assistance of an interpreter

please contact your local PANalytical

representative. We will do our utmost to

nd a satisfactory solution. The course

material is in English.

For further information contact your

local PANalytical representative or:

Ms. J. Sutton

ACC Coordinator

PANalytical B.V.

Application Competence CenterP.O. Box 13

7600 AA Almelo

The Netherlands

Tel: ++31 546 534438

Fax: ++31 546 534445

e-mail: jacqueline.sutton@panalytical.com

www.panalytical.com

Comprehensive course for users of sequential WDXRF

spectrometers controlled by SuperQ