X-ray physics relevant for MA-XRF · Exciting x-ray beam Ejected electrons from the atoms of...
Transcript of X-ray physics relevant for MA-XRF · Exciting x-ray beam Ejected electrons from the atoms of...
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X-ray physics relevant for MA-XRFAndreas - Germanos Karydas
Institute of Nuclear and Particle PhysicsNational Centre for Scientific Research “Demokritos”
Aghia Paraskevi, Athens, [email protected]
Andreas Karydas, ICTP, 24 September 2017
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Outline
• Fundamental interactions: X-rays and matter• Qualitative and Quantitative XRF Analysis:
Basic principles• Second order phenomena in Q-XRF and MAXRF• XRF Instrumentation with relevance to imaging:
X-rays sourcesX-ray OpticsX-ray detectors
• MAXRF spectrometers: Figures of merit • Conclusions
Andreas Karydas, ICTP, 24 September 2017
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(ED) XRF principle of operation
Material/Sample
Incident X-raybeam
X-raySource
Energy DispersiveX-ray Detector
CuSnAs Zn Pb
Fluorescence X-rays
XRF is an analytical technique based on the spectroscopy of the fluorescence (“characteristic”) x-rayradiation emitted from the material/sample when it is irradiated by x-rays.
Spectroscopy – measurement of a signal (number of x-rays) versus energy; formation of a spectrum
Fluorescence/characteristic x-ray radiation emitted from the elementscontained in the material/sample analyzed
X-rays – used for both excitation and detection
Andreas Karydas, ICTP, 24 September 2017
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xCReII 0
x,0I I
Ratio photo./scat. ≈ 1000 - 10000Photoelectric is the dominant process
X-rays interactions with matter
Beer-Lambert law
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X-ray Scattering Interactions with atoms
Ei=E0 : Coherent (Rayleigh),it occurs mostly with inner
atomic electrons
Ei < E0: Incoherent (Compton), it occurs mostly with outer, less bound electrons
E0>>Binding Energy
Andreas Karydas, ICTP, 24 September 2017
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Compound
(%)
Al2O3 16SiO2 57CaO 13
Fe2O3 14
X-ray scattering with matter (1)
1) Rayleigh/Elastic/Coherent scattering
Probability: Increases with 3rd-4th power of ZAndreas Karydas, ICTP, 24 September 2017
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Compound
(%)
Al2O3 16SiO2 57CaO 13
Fe2O3 14
X-ray scattering with matter (1)
1) Rayleigh/Elastic/Coherent scattering
Probability: Increases with 3rd-4th power of ZAndreas Karydas, ICTP, 24 September 2017
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Coherent scattering
X-ray scattering with matter (2)
Compton/Inelastic/Incoherent scattering
Compound
(%)
Al2O3 16
SiO2 57
CaO 13
Fe2O3 14
Ei < E0: Incoherent (Compton), mostly with outer, less bound electrons
Andreas Karydas, ICTP, 24 September 2017
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Coherent scattering
X-ray scattering with matter (2)
Compton/Inelastic/Incoherent scattering
Compound
(%)
Al2O3 16
SiO2 57
CaO 13
Fe2O3 14
Ei < E0: Incoherent (Compton), mostly with outer, less bound electrons
Andreas Karydas, ICTP, 24 September 2017
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Photoelectric cross sections: Probabilities
K-shell Photoelectric cross sections
Photoelectric cross section:휏~Ε .
휏~Ζ
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X-ray emission
De-excitation: Fluorescence/Auger yield
0 20 40 60 800.0
0.2
0.4
0.6
0.8
1.0
Fluorescence probability
Auger probability
Fluo
resc
ence
/Aug
er Y
ield
Atomic NumberOnly 5 holes over 100 are filled through the emission of characteristic radiation for Silicon (Z=14) atoms
Fluorescence Yield: Very small for low Z elements!!!
Andreas Karydas, ICTP, 24 September 2017
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Emission of element ‘characteristic’ x-rays
Unique set of emission energies for each element
X-ray spectroscopy within the energy range 1-30keV offers in principle the possibility to detect all the periodic table elements through their K, L or even M series of characteristic X-ray lines
Siegbahn/IUPAC
notation:Kα: K-L2+K-L3
Kβ: K-M2+K-M3
Lα: L3-M4+L3-M5
Lβ1: L2-M4Lβ2: L3-N5
The emission of characteristic X-ray lines follows allowed electronic transitions between specific subshells
LIII to K shell: EKα1 = UK- ULIII
Moseley law: 2)( iijij ZkE
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Κ L MNucleus
E0
Kα
Electron
Working principle: X-Ray Fluorescence Analysis
Working principle:
1) Photo-Ionizationof atomic boundelectrons (K, L, M) /Photoelectric absorption
2) Electronic transition and emission of element ‘characteristic’fluorescence radiation
Incident photon Energy E0should be adequate to ionize the atomic bound electrons>=Inner shellbinding energy
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Fluorescence cross sections: Selective excitation
Optimizing the energy of the exciting beam for maximizing
the produced characteristic X-ray intensity
XRF K-shell fluorescence cross section
KXKoKoKX FEE )()(K-shell photoelectric cross section
K-shell fluorescence yield
Transition probability for Kα emission
)( oKX E
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• D.K.G. de Boer, XRS, 19(1990) 145• M. Mantler, in Handbook of Practical
XRFA, Edited by B. Beckhoff et al.
Primary Fluorescence intensity: Assumptions
• Parallel incident beam • Infinite surface for sample • Beam cross section infinite• Homogenous sample • Flat surface of the sample
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Primary XRF intensity
)(4sin
),()( 21 sin/)(
1
sin/)(id
dxEkioii
xEoii EedxEEceIEdI kiskos
kdx1sin/),( kioii dxEEc
:4d
1sin/)( kos xEe
0I
kxd
2sin/)( kis xEe1 2
Number of incident Photons/s
(Concentration of i element) X (Fluorescence cross section; cm2/g) X (areal density; g/cm2)
Intrinsic efficiency of X-ray detector; Ei
Solid angle of detection (sr)
:)( id E
j=1,N number of elements
Sample mass attenuation coefficient for energy Eo )(,1
ojNj
j Ec
:)( os E
21 sin/)(sin/)(),( isosioT EEEE
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Primary XRF intensity: Approximations
)(4sin
1),(
1),()(1
),(
idd
ioT
dEE
iioioii EEE
ecEEIEIioT
),(1),()(
ioTiioiii EEcEESEI
dcEESEI iioiii ),()(
1),( dEE ioT
1),( dEE ioT
Sensitivity calibration: certified pure element/compound targetsSolid angle/Intensity calibration: Energy distribution, detector
efficiency known, well certified pure element/compound targetsStandard-less XRFA: Calibrated apertures, distances, detector
response function versus energy, incident beam intensity
),( ioi EESSensitivity
Thick target approximation
Thin target approximation
dEEE
eEEEIEcEIEo
U iT
dEE
iiidd
iii
Xi
iT
),(1),()()(
4sin1)(
),(
1
Andreas Karydas, ICTP, 24 September 2017
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ji
sample
Secondary Fluorescence Enhancement
X-ray Detector
Exciting x-ray beam
Element j characteristic x-ray(s) can excite element icharacteristic x-rays within the sample volume
Εο
Εj
Εi
Energy condition:Εj>Ux,ii
Sample
Εi
Andreas Karydas, ICTP, 24 September 2017
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i
sample
Photo-/Auger/Compton e- Indirect XRF intensity
X-ray Detector
Exciting x-ray beam
Ejected electrons from the atoms of element j can ionize an inner shell of element i
Εο
Εi
Energy conditions:Te, EΑ>Ux,b
i
Samplej e-
Electron spectrum:Discrete: Photo-e, AugerContinuous: Compton
Εi
N. Kawahara in Handbook of Practical X-Ray Fluorescence Analysis, J. Fernandez et al., X-Ray Spectrometry 2013, 42, 189–196, K. Stoev, J. Phys. D: Appl. Phys. 25 (1992) 131-138
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Chain of XRF related Fundamental interactions
J. Fernandez et al., X-Ray Spectrom. 2013, 42, 189–196
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W. Malzer, B. Kanngiesser, X-Ray Spectrom. 2003; 32: 106–112
The divergent angle is 20° and the trajectories are distributed isotropically
XRF intensities for non-parallel x-ray beams
퐼퐼
= 푝 푠⃗ 푒푥푝−휇휌퐷푠
푑푠⃗Beam divergences is taken into account by ‘equivalent angles’ calculated with Monte Carlo integration
Polycapillarylens: divergent angle of 10°, perpendicular to the sample surface. Detector angle: 20°.
Andreas Karydas, ICTP, 24 September 2017
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T. Trojek, J. Anal. At. Spectrom., 2011, 26, 1253
Surface Topography in XRF intensities
Andreas Karydas, ICTP, 24 September 2017
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Surface Topography in XRF intensities
E. C. Geil and R. E. Thorne, J. Synchrotron Rad. (2014), 21, 1358
훪 휃 ∝1
1 + 휇휇 cos 푎 + tan 휃 sin 푎
θ, α are the rotation angles of the surface=be normal and detector axis, respectively, around the perpendicular z axis defined with respect to y-axis; θ = 0 for a surface parallel to the xz plane
Andreas Karydas, ICTP, 24 September 2017
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Map of surface angle θ computed from the Ca − Kα fluorescence
Surface Topography in XRF intensities
Rendering of the scanned area and shaded as if obliquely illuminated from the right side by a light source.
Photograph of the scanned area, adjusted to enhancecontrast and brightness.
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μf/μi = 20
Hint 2: The angle effect vanishes as the detector position approaches the incident beam (smaller α), and it is maximal when the detector is perpendicular to the beam
Surface Topography in XRF imaging Hint -1 :For samples with appreciable surface relief, an optimum approach is to orient the sample’s ‘mean” normal along the beam direction (theta =0)
Hint -3The stage should be aligned across the perpendicular to the incident beam plane, otherwise it will produce distortion of the images (the interaction point will vary not symmetrically)
CaCO3 matrix, incident beam energy 16.5keV
Andreas Karydas, ICTP, 24 September 2017
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MAXRF- FFXRF spectrometers
X-ray source X-ray detector
Beam modifier Geometry
FF-XRF
F.F. P. Romano et al., Analytical Chemistry 2014, 86, 10892
F.P. Romano et al., Analytical Chemistry 2016, 88, 9873
• Radiation dose • Motor control
Andreas Karydas, ICTP, 24 September 2017
F.P. Romano et. al. JAAS 2017DOI: 10.1039/c6ja00439c
MA-XRF
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X-ray sources
Synchrotron radiationHigh brilliance, polarization: Micro/Nano-XRF (< 1µm)
X-ray tubes High power (~ kW)
diffraction x-ray tubes Micro focus (~ 50-100µm)
anode size - Brilliance optimised (30-50 W (air cooled)
Miniature X-ray tubes –geometry optimized (2W-12W, 50kV)
• Anode material (Z)• Window (Be or glass)• Side or end window)• High Voltage• Anode thickness (end-window)
Andreas Karydas, ICTP, 24 September 2017
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Low/High power X-Ray Sources
Anode materials: Rh, Ag, MoFocus spot size 50-150 μmExposure < 0.5 mR/hr
Oxford Model: XTF5011
Newton M47, 50kV 10W X-ray Source, 400 grs
Andreas Karydas, ICTP, 24 September 2017
Moxtek end/side window tubes, 10W, 50kV
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2 4 6 8 10 12 14109
1010
1011 Rh- L lines 15 kVSi excitation
Phot
ons/
(KeV
x sr
x m
A x
sec)
Energy (KeV)2 4 6 8 10 12 14
109
1010
1011
Fe-K edge
Continuum exciting FeRh-L lines 15 kV
Fe excitation
Pho
tons
/(KeV
x s
r x m
A x
sec
)
Energy (KeV)
Quantification in Tube excited XRF analysis
4 8 12 16 20 24 28 32 36 40109
1010
40 kV
Cu excitation
Energy (KeV)
Ph
oton
s/(K
eV x
sr x
mA
x se
c)
0 4 8 12 16 20 24 28 32 36 40 44109
1010
continuumexciting Ag-K
40 kV
Ag excitation
Energy (KeV)
Ph
oton
s/(K
eV x
sr x
mA
x se
c)
Ag-K edge
15 kVUnfiltered
40 kVFiltered
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Beam Modifier
Primary beam modifier
The modifier device (for either beam divergence, focusing, spectral distribution) can be: Collimator FilterMonochomator
- Secondary target- Multilayer/crystals
Optics- Focusing crystals- Capillary lenses
To improve:Monochomaticity or P/B ratioBeam spot size spatial resolutionPolarization state of incoming radiationTo eliminate the presence of diffraction peaks
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sin2 dn
Bragg’s Law
)(2398.1)(,nm
keVEhcE
5 10 15 20 25 30
100
101
102
103
40 kV
5 10 15
20
40
60
80
100
C
ount
s
Energy (keV)
Filter: Ni\V\Kapton
@ 19 keV: 3-4 times@ 5-15 keV: 10-100 times
Filtered vs Unfiltered excitation: An example
Rh anode tube, 40 kV, low atomic number scatterer
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sin2 dn
Bragg’s Law
)(2398.1)(,nm
keVEhcE
5 10 15 20 25 30
100
101
102
103
40 kV
5 10 15
20
40
60
80
100
C
ount
s
Energy (keV)
Filter: Ni\V\Kapton
@ 19 keV: 3-4 times@ 5-15 keV: 10-100 times
Filtered vs Unfiltered excitation: An example
Rh anode tube, 40 kV, low atomic number scatterer
Andreas Karydas, ICTP, 24 September 2017
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X-ray Optics in MA-XRF analysis
휗 (푑푒푔푟푒푒푠) ≈ .( )
휌( )
푛 ≈ 1 − 훿 휗 = 2훿
1) Polycapillaryfull lens
2) Collimator
DivergenceP1 P2
RD
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• Spot size –FWHM (E)• Gain Factor – G(E)• Focal distance
2.4 keV 3.3 keV 3.7 keV
5.9 keV
10.5 keV 14.1 keV
6.9 keV4.5 keV
8.6 keV
T. Wolff et al, JAAS, 2009 24 669
Characteristics of Polycappilary X-ray lenses
Knife edge scan
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21
2
22
)()()(
fEFWHMRdETEG in
col
lens
V. Kantarelou, A.G. Karydas, XRS 2016, DOI 10.1002/xrs.2661
5 10 15 20 25 30 350.00.10.20.30.40.50.60.70.80.91.01.1
Lens
Tra
nsm
issio
n (a
.u.)
E (keV)
Characteristics of Polycappilary X-ray lenses
• Spot size –FWHM (E)• Gain Factor – G(E)• Focal distance
Lens Transmission efficiency
Andreas Karydas, ICTP, 24 September 2017
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21
2
22
)()()(
fEFWHMRdETEG in
col
lens
V. Kantarelou, A.G. Karydas, XRS 2016, DOI 10.1002/xrs.2661
5 10 15 20 25 30 350.00.10.20.30.40.50.60.70.80.91.01.1
Lens
Tra
nsm
issio
n (a
.u.)
E (keV)
Characteristics of Polycappilary X-ray lenses
• Spot size –FWHM (E)• Gain Factor – G(E)• Focal distance
Lens Transmission efficiency
Andreas Karydas, ICTP, 24 September 2017
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21
2
22
)()()(
fEFWHMRdETEG in
col
lens
V. Kantarelou, A.G. Karydas, XRS 2016, DOI 10.1002/xrs.2661
5 10 15 20 25 30 350.00.10.20.30.40.50.60.70.80.91.01.1
Lens
Tra
nsm
issio
n (a
.u.)
E (keV)
Characteristics of Polycappilary X-ray lenses
• Spot size –FWHM (E)• Gain Factor – G(E)• Focal distance
Lens Transmission efficiency
Andreas Karydas, ICTP, 24 September 2017
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Characteristics of Polycappilary X-ray lenses• Spot size –FWHM (E)• Gain Factor – G(E)• Focal distance
Μ. Alfeld et al., JAAS 2011, 26, 899
F. P. Romano et al., JAAS 2017, DOI: 10.1039/c6ja00439c
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Physics & technology behind X-rays detection
A photon produces pairs of free electrons and holes (energy needed to create an electron-hole pair=3.6 eV)
Charge is collected from the depleted active region of the sensor and it is further amplified
Signal strength is proportional to the detected photon energy
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Physics & technology behind X-rays detection
A photon produces pairs of free electrons and holes (energy needed to create an electron-hole pair=3.6 eV)
Charge is collected from the depleted active region of the sensor and it is further amplified
Signal strength is proportional to the detected photon energy
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Physics & technology behind MAXRF imaging
Central small anode contact surrounded by a number of concentric drift electrodes
Figure from Oxford Instruments Manual
Silicon Drift Detector - Principle: The charge is drifted from a large area into a small read-out node with low capacitance, independent of the active area of the sensor. Thus, the serial noise decreases and shorter shaping time can be used
Two advantages:1) Faster counting
is enabled2) Higher leakage
current can be accepted, drastically reducing the need for cooling
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CUBE preamplifier supports high-rate spectroscopy in XRF mapping applications while preserving enough energy resolution at shorter shaping times.
The use of short peaking times further reduces the impact of the detector leakage current on the total noise. Room temperature operation!
L. Bombelli et al, DOI: 10.1109/NSSMIC.2012.6551138, 2012
Performance Figures of Silicon Drift DetectorsA Variety of Shaping Times by the SVE 6 Signal Processor www.bruker.com
Vitus crystal active area: 30mm2
operated with Ketek DPP2
Andreas Karydas, ICTP, 24 September 2017
www.ketek.net
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Vitus crystal active area: 80mm2
operated with Ketek DPP2
Performance Figures of Silicon Drift Detectors
Larger area SDD’s do not lead necessarily to proportional increase of detected intensities in high count rate applications due to increased dead time. Coupling detector operation with suitable signal processing unit is a key elements for fully exploiting larger areas SDD’s
Vitus crystal active area: 30mm2
operated with Ketek DPP2
www.ketet.net
Andreas Karydas, ICTP, 24 September 2017
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Energy Response of X-Ray Detectors
I. Campbell et al. X-Ray Spectrometry, 1997
Fe-55 spectrum
Andreas Karydas, ICTP, 24 September 2017
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Energy Response of X-Ray Detectors
Background generated in XRF spectrum
Metallic matrices: Fluorescent peaks of the major alloy elements
Background in light matrices: Scattered Source radiation
Andreas Karydas, ICTP, 24 September 2017
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X-ray Detection in Full Field Geometry
FWHM<155eV@MnKα
The CCD sensor is composed of 1024 × 1024 pixels with 13μm lateral size and 40 μm thickness, readout speed of the CCD can be programmed from 50kHz to 5 MHz
F.P. Romano et. al. Anal. Chem. 2016, 88, 9873−9880
Total exposed area:176.9 mm2
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XRF Analytical Sensitivity
LoD: Limit of Detection
iI Fluorescent intensity (cps)
Background intensity (cps)BI
ic Analyte concentration
tt
cItI
LoDii
Bi
)/(/
3)(
(95%) CLi
iii NcLoD 3)(
Andreas Karydas, ICTP, 24 September 2017
BNiN
LoDLoQ 3.3
Bi N
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Figures of merit: Tube based MA-XRF
M. Alfeld et. al., JAAS 2011 F.P. Romano et. al. JAAS 2017
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Figures of merit: Synchrotron based MA-XRF
M. Alfeld et al. JAAS, 2013, 20, 40
Andreas Karydas, ICTP, 24 September 2017
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XRF Information depth
Material X-ray line D (μm)
Bronze95% Cu, 5% Sn
Cu-Kα 10Sn-Kα 32
Gold95% Au, 4.5 % Ag,
0.5% Cu
Cu-Kα 1.4Au-Lα 2Ag-Kα 5
Egyptian Blue20% + 80% binder
Cu-Kα 270Ca-Kα 37Si-Kα 6
)(1
iT ED
Critical thickness
The information depth depends on:• the sample matrix composition • analyte energy • incident beam energy
(spectrum)• geometry (incident/outgoing
angles)
21 sin/)(sin/)(),( isosioT EEEE
Andreas Karydas, ICTP, 24 September 2017
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XRF Information depth
Material X-ray line D (μm)
Bronze95% Cu, 5% Sn
Cu-Kα 10Sn-Kα 32
Gold95% Au, 4.5 % Ag,
0.5% Cu
Cu-Kα 1.4Au-Lα 2Ag-Kα 5
Egyptian Blue20% + 80% binder
Cu-Kα 270Ca-Kα 37Si-Kα 6
)(1
iT ED
Critical thickness
The information depth depends on:• the sample matrix composition • analyte energy • incident beam energy
(spectrum)• geometry (incident/outgoing
angles)
21 sin/)(sin/)(),( isosioT EEEE
80%Pb+20% alpha-linolenic acid as organic medium absorbing 90% of the emitted radiation
M. Alfeld, J.A.C. Broekaert , SAB 88 (2013) 211
Andreas Karydas, ICTP, 24 September 2017
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Overview - Conclusions The advanced MA-XRF imaging capabilities are supported by the improved
performance of X-ray detectors, digital signal processors, and X-ray focusing devices, but also by the availability of brilliant sources and fast spectrum analysis packages
The underlying physics in MAXRF imaging are common amongst the different XRF variants. However, the integration of multiple and variant geometry detection systems helps to acquire XRF signals which incorporate improved information regarding the sample morphology and even in-depth elemental distributions
State of the art MAXRF spectrometers achieve remarkable figures, almost 100ppm/1sec LoDs for the optimum detected elements
Precise quantification is hampered by the need to characterize optical components, however elemental associations can be revealed by statistical treatment of the generated large datasets
Andreas Karydas, ICTP, 24 September 2017
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Acknowledgements Paolo Romano, Claudia Caliri, Vasilike Kantarelou and
Ch. Zarkadas
Thank you for your attention!!