X-Ray Diffraction as a Materials Characterization Technique By: Omar Alshehri Waterloo, ON Spring...

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X-Ray Diffraction as a Materials Characterization Technique By: Omar Alshehri Waterloo, ON Spring 2010 [email protected]

Transcript of X-Ray Diffraction as a Materials Characterization Technique By: Omar Alshehri Waterloo, ON Spring...

Page 1: X-Ray Diffraction as a Materials Characterization Technique By: Omar Alshehri Waterloo, ON Spring 2010 oalshehri@ksu.edu.sa.

X-Ray Diffraction as a Materials Characterization Technique

By: Omar AlshehriWaterloo, ONSpring 2010

[email protected]

Page 2: X-Ray Diffraction as a Materials Characterization Technique By: Omar Alshehri Waterloo, ON Spring 2010 oalshehri@ksu.edu.sa.

Outlines

• History.• Must-have basics.• How x-rays are generated?• How characterization is done?• Applications.• The $1 x-ray source.• Conclusion.

Page 3: X-Ray Diffraction as a Materials Characterization Technique By: Omar Alshehri Waterloo, ON Spring 2010 oalshehri@ksu.edu.sa.

History

• Discovered accidently in November 8th

1895 by Wilhelm Roentgen.• He was awarded the 1st Nobel Prize in

physics [1].• In 1912 Max von Laue invents x-ray

diffraction.• William Lawrence Bragg figured out how

to use x-rays to determine the crystal structures of materials.

Source: [8]

Source: [7]

Source: [7]

Page 4: X-Ray Diffraction as a Materials Characterization Technique By: Omar Alshehri Waterloo, ON Spring 2010 oalshehri@ksu.edu.sa.

Must-Have Basics

• X-ray is a form of electromagneticradiation.

• The energy associated with x-ray is as follows: eV/photon.

• The wavelengths range is0.001<λ<10 nm. NO HARD RULESFOR DETERMINING THIS RANGE [2].

• Therefore, if we plug in λ=0.1 nmwe will get an energy of12,400 eV/photon. How huge is it?

Page 5: X-Ray Diffraction as a Materials Characterization Technique By: Omar Alshehri Waterloo, ON Spring 2010 oalshehri@ksu.edu.sa.

Must-Have Basics (cont.)

Inner shell electron.Nitrogen atom

n=1

n=α

The ionization energy=668 eV.

The ionization energy, the energy to nock out an electron to the vacuum level, for the inner most electrons of nitrogen is 668 eV. Compare it with the 12,400 eV/photon for the 0.1 nm wavelength’s x-ray!!! Very huge [2].

Page 6: X-Ray Diffraction as a Materials Characterization Technique By: Omar Alshehri Waterloo, ON Spring 2010 oalshehri@ksu.edu.sa.

How X-Rays are Generated

• There are three methods to generate x-ray [3]:1- X-ray tube.2- Synchrotron radiation.3- 1 dollar source [4].

Most common in laboratories.

Page 7: X-Ray Diffraction as a Materials Characterization Technique By: Omar Alshehri Waterloo, ON Spring 2010 oalshehri@ksu.edu.sa.

How X-Rays are Generated (cont.)

Filament (Cathode)

Electrons

Target (Anode)

Vacuum Chamber

X-ray

The efficiency of energy conversion from thermoelectrons to x-rays is exteremely low 0.1%

Current

Page 8: X-Ray Diffraction as a Materials Characterization Technique By: Omar Alshehri Waterloo, ON Spring 2010 oalshehri@ksu.edu.sa.

How X-Rays are Generated (cont.)

Filament (Cathode)

X-ray

Target atom: Cu or Mo atom

Emitted electron

Ray or Rays?

Page 9: X-Ray Diffraction as a Materials Characterization Technique By: Omar Alshehri Waterloo, ON Spring 2010 oalshehri@ksu.edu.sa.

How Characterization is Done [5,7]

?

Page 10: X-Ray Diffraction as a Materials Characterization Technique By: Omar Alshehri Waterloo, ON Spring 2010 oalshehri@ksu.edu.sa.

Image Plate~$350K

Page 11: X-Ray Diffraction as a Materials Characterization Technique By: Omar Alshehri Waterloo, ON Spring 2010 oalshehri@ksu.edu.sa.

Benzene Snowflake

Isolated“Benzenes”

Look for e-density onevenly spaced planes.

(or near)

Page 12: X-Ray Diffraction as a Materials Characterization Technique By: Omar Alshehri Waterloo, ON Spring 2010 oalshehri@ksu.edu.sa.

Benzene Snowflake

Isolated“Benzenes”

Closer-spacedplanes give

higher angles.

Look for e-density on (or near)evenly spaced planes.

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“Direct” or “Diffraction” or “Real” Space “Reciprocal” Space

Crystal Diffraction Photo

“Unit Cell” Structure Fuzzy Pattern

Crystal Lattice Viewing Holes

Decreasing Spacing Increasing Spacing

How Characterization is Done? (cont.) [5]

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How Characterization is Done? (cont.) [6]

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Conclusions

• X-ray diffraction is a powerful technique but with many precautions as has harmful radiations.

• As x-ray diffraction has many capabilities, it has limitations that prevent its application.

• Day by day, science is proving it self to be simpler and cheaper than we pretend it!

Page 17: X-Ray Diffraction as a Materials Characterization Technique By: Omar Alshehri Waterloo, ON Spring 2010 oalshehri@ksu.edu.sa.

References• 1- nobelprize.org• 2- Donald Sadoway, 3.091 Introduction to Solid State Chemistry, Fall 2004. (Massachusetts Institute of

Technology: MIT OpenCourseWare). http://ocw.mit.edu (accessed 07, 20, 2010). License: Creative Commons Attribution-Noncommercial-Share Alike.

• 3- Materials Characterization Techniques. By: Zhang, Sam, Li, Lin, and Kumar Ashok. CRC press, 2008.• 4- http://www.nature.com/nature/videoarchive/x-rays/• 5- https://webspace.yale.edu/chem125_oyc/125/LectureSlides/Lect06timed.ppt• 6- http://www.eserc.stonybrook.edu/ProjectJava/Bragg/• 7- https://webspace.yale.edu/chem125_oyc/125/LectureSlides/Lect05timed.ppt• 8- Wikipedia.com