VSC R2Everything - indico.cern.ch€¦ · LSS - scaling with luminosity 11/28/2017 Pawel Krakowski...

Pawel Krakowski

TE-VSC-ICM

Vacuum, Surfaces & Coatings Group

Technology Department 28/11/2017

VSC R2Everything

Results of the irradiation test campaigns of materials and electronics

Future actions


Technology Department

VSC R2E results of irradiation campaigns and future actions

“VSC R2E project focuses on identifying and addressing the risk of radiation

induced failures in the vacuum equipment of CERN machines. It proposes radiation

tests and adequate strategies and developments.” VSC R2E WP (EDMS 1726800)

1. Evolution of radiation environment in LHC

2. R2E (Radiation to Electronics)

Project overview

Components and modules test results

3. R2M (Radiation to Material)

Projects overview

Irradiation tests results

4. VSC R2Everything numbers & summary

11/28/2017 Pawel Krakowski 2



Fluence [cm-2] – (HEH – High Energy Hadron)

total number of particles that intersect a unit area

Flux [cm-2 s-1] – ”Fluence rate”

Dose [Gy] [J∙kg-1] – the absorption of one joule

of radiation energy by one kilogram of matter

Sv [J∙kg-1] – the health effect of low levels

of ionizing radiation on human body.

Depends of the type of radiation

How many apples will

fall on this area?

In time?

The particleHits received by

the sleeper

Will the headache

be the same

regardless of the

size or weight of the

apple?

The source (like accelerator)

Charged particles

interact strongly

and ionize directly

Neutral particles

interact less,

ionize indirectly

and penetrate further

Radiation related units

3

Amigo

11/28/2017 Pawel Krakowski



Where the radiation in LHC comes from?

Main doses contribution sources are:

• Burn-off -> (interactions in the experiments) -> Luminosity

scaling -> Dominating for all areas next to the experiments

and up to RR1s

• Collimation -> IR23/IR27, RRs included:

• Momentum cleaning2 (IR3): dominated by luminosity

• Betatron cleaning3 (IR7): with assumption that all is lost

in IR3 and IR7 and determining ratio with BLM5s.

• Beam -> residual gas interaction (vacuum quality).

Affects All areas downstream the RRs, scaling with circulating

intensity (beam current) and residual gas pressure.

• For scaling in time, the energy increase can be neglected.

LSS - scaling with luminosity


ARCs - scaling with intensity

4

1. RR → Shielded Alcoves in LHC ARCs.

2. IR → Insertion Regions. Middle of Long Straight Sections (LSS)

3. For particles with large betatron amplitudes (or energy deviations).

4. Fro particles with off-momentum deviations.

5. Beam Loss Monitor. The standard monitors are ionization chambers with parallel aluminium electrode plates.



Pirani threshold 500 Gy

Piezo threshold 200 Gy

24VDC 3kGy limit – from 350Gy linear drop of voltage 7-10%/1kGy

Penning threshold 12-15 Gy

Luminosity driven Intensity driven

Evolution of radiation levels of the LHC for VSC controls

Luminosity driven

Intensity

Localized Loss

TE-VSC-ICM controls, even Rad-tol electronics, have to be relocated

as far as possible from odd cells quadruples !


Salvatore Danzeca - Evian Workshop 2016

5



VSC R2E test results

& future actions




Mixed field

CHARM

500 Gy

is our goal

PSI4

Proscan COMET

P+ 200-250 MeV

15 components

TESTED

Defining radiation environment

Where in the machine the electronics is installed?

Tunnel? RE or RR?

What levels of radiation are expected?

TID2 (Gy)

>1-5 Gy/y

HEH2 (n/cm2)

>1E7 n/cm2/y

Rad-effects of concern

Test of COTS (Commercial Off-The-Shelf)Component

classification:

component type

based technology

available expertises

& reports

Effects and criticality:

TID limit ?

SET3 ?

Ex. LOG stage

Gamma

CC605

Mixed field

CHARM6

RHA1 guideline Rad-Tol design qualification in 5 easy steps

How does VSC-ICM manage such studies?

Tests of modules

Test of the System

7

1. RHA → Radiation Hardness Assurance.

2. TID → Total Ionising Dose. HEH – High Energy Hadron

3. SET → Single Event Transient. → Traversing particles induced voltage pulses (i.e. glitches) that propagate through the circuit.

4. PSI → Paul Scherrer Institut - Villigen →200-250MeV proton beam from Proscan (Comet) cyclotron.

5. CC60 → facility located in CERN Prevessin with 60Co gamma source for the qualification of components against TID effects.

6. CHARM → The Cern High energy AcceleRator Mixed field facility located in the East Area, features a wide spectrum of radiation types and energies.

Pawel Krakowski11/28/2017

https://maps.cern.ch/mapsearch/mapsearch.htm?centerX=2492929&centerY=1121025&centerScale=1000



Components tests at PSI

(Proton beam)




COTs (Commercial Off-The-Shelf) components tests at PSI

PIF- Proton Irradiation FacilityCOMET

PROSCAN

Proton beam

Emax= 250 Mev

Beam control and on-line monitoring DUTs (Device Under Test) local controls & supply & test station

Beamline and target


1 Campaign = ~5 COTs = ~20 h and more! of test time

In total 15 components tested for Vacuum R2E project

Tests up to 500 Gy or 1kGy

ICM assists with the tests of other users and prepares its own test reports!


Technology Department 10

PSI COTs – tests results examples

±5V Bandgap Reference

LT1029

PNP matched pair transistor

MAT03

2N3810

Op-amp + contitioning

OP2177

Electrometer grade

op-am

LMC6001

OPA128

Penning LOG stage components Tested REJECTED

0 100 200 300 400 500

1E-11

1E-10

1E-9

Fix

ed p

ressure

measure

ment [m

bar]

due

to r

adia

tion induced d

rop o

f V

_R

EF

DOSE (Gy)

REF 5.5E-10 mbar

F(dose): 5.5E-10 mbar

REF 1E-10 mbar

F(dose): 1E-10 mbar

REF 1E-11 mbar

F(dose): 1E-11 mbar

11/28/2017

Recommended by EN-STI-ECE Tested ACCEPTED

0 100 200 300 400 500

98

99

100

101

102

103

104

Matc

hin

g (

%)

Ib_1

to

Ib

_2

Dose (Gy)

2N3810_pair_1

2N3810_pair_2

2N3810_pair_3

2N3810_pair_REF

0 50 100 150 200

-5

-4

-3

-2

-1

0

1

V_o

ut [V

]

Dose (Gy)

LMC6001_3007

LMC6001_3003

LMC6001_3010

LMC6001_3005_REF

REJECTED

ACCEPTED

ACCEPTED

0 100 200 300 400 500

94

96

98

100

102

104

106

108

Matc

hin

g (

%)

Ib_1 to Ib_2

Dose [Gy]

MAT03_pair_1

MAT03_pair_2

MAT03_pair_3

MAT03_pair_REF

REJECTED

0 100 200 300 400 500

-30

-20

-10

0

10

20

30

OP

A1

28 r

ela

tive V

out

cha

ng

e [

mV

]

DOSE (Gy)

OPA128_3007

OPA128_3003

OPA128_3010

OPA128_3005_REF

ACCEPTED

Pawel Krakowski



LOG stage test at CC60

(Gamma)




CC60 test – cumulative TID effect

-5 V

V_REF

LT1029

V_out

±15V

Iin

DUT

DUT (Device Under Test) LOG OPA128 N.2 BOX at CC60.

Penning logarithmic stage contains 4 active

components:

1. OPA128 - Difet electrometer-grade operational amplifier.

2. LT1029 - 5V bandgap reference.

3. OP2177 - Low input bias current operational amplifier.

4. 2N3810 - PNP silicon dual matching transistor.

DUT (Device Under Test) LOG OPA128 N.2

LOG stage has been tested in two dose rates,

respectively HDR ~2.98 Gy/h and LDR ~0.36 Gy/h.

Iin =10pA sourced from SMU to the LOG trough Femto coax cable.

CC60 dose rates.

2.98 Gy/h

0.36 Gy/h




0 100 200 300 400 500

-4.63

-4.62

-4.61

-4.60

-4.59

-4.58

-4.57

V_out of the LOG stage vs. Dose (CC60)

-4.579 V

V_

out

(V)

Dose (Gy)

LOG_CC60+20Gy

-4.596 V

475Gy in total

(including 20Gy

from previous run) 455Gy

CC60 LOG stage radiation test results LOG V_out (~-4.6V) for Iin of 10pA corresponding to 2.79E-11mbar

• LOG stage has received in total 475Gy (2 runs)

with negligable V_out degradation.

• Constant V_out offset of 200mV during irradiation(~3Gy/h) has been deducted from V_out measurement.

LOG stage CC60 radiation results. V_out compton offset of 200mV deducted.


0 100 200 300 400 500 600

-4.60

-4.55

-4.50

-4.45

-4.40

V_out (V

)

Time (s)

V_out_10pA_LDR

V_out_10pA_HDR

130-140 mV

Offset dose rate

dependantSourceclosed

Source open

0 100 200 300 400 500

-5.00

-4.99

-4.98

-4.97

-4.96

-4.95

-4.94

-4.93

-4.92

-4.91

-4.90

-4.89

LT1029 ± 5V Bandgap Reference drift - different test facilities

V_R

EF

(V)

Dose (Gy)

V_ref_CC60

V_ref_PSI

V_ref_CHARM

Gamma (CC60)

200MeVProtons

PSI

Mixed field

CHARM

13



LOG stage test at CHARM

(Mixed field)




LOG stage CHARM

• 4 LOG stages in 3 runs (3 weeks in total)

• 10pA current sourced to each LOG trough TFA3 HV Triaxial cable

(CHARM VSC infrastructure)

• Monitoring of V_out, V_ref and PS in sampling rate of 1s.


0 1x104

2x104

3x104

4x104

5x104

6x104

7x104

-4.60

-4.55

-4.50

-4.45

-4.40

-4.35

CHARM operation impact on 10pA measurement - Target IN/OUT

Value at 0Gy -4.63 V

NO Beam

V_

out

(V)

Sampling (number of samples)

LOG_Vout

~100Gy

Target

NO Target NO Beam

500 550 600 650 700 750 800

-4.64

-4.62

-4.60

-4.58

-4.56

-4.54

-4.52

-4.50

-4.48

-4.46

-4.44

-4.42

-4.40

Photocurrent impact on 10pA measurements - Target IN

Beam OFF

V_

out

(V)

Time (s)

LOG_180GyBeam ON TARGET IN

Total OFFSET

~150 mV

OFFSET_2 ~115mV

V_out -4.63 V at 0Gy 180Gy 30mV

-4.60V

0 1x103

2x103

3x103

4x103

5x103

6x103

7x103

-4.60

-4.55

-4.50

-4.45

-4.40

OF

FS

ET

~150m

V

CHARM operation impact on 10pA measurement - Beam ON/OFF

Beam on target

V_out

(V

)

Sampling (number od samples)

LOG_Vout

NO BEAM

Challenges of measuring low current under high fluxes of particles



0 100 200 300 400 500

1E-11

2E-11

3E-11

4E-11

5E-11

6E-11

7E-11

8E-11

9E-111E-10

1 O

M

Fixed pressure readout change with absorbed dose

0Gy2.79E-11mbar

I(A) 10E-12A

Pre

ssure

(m

bar)

Dose (Gy)

500Gy 3.4E-11mbar

P=1.7-2I

0.8

in (mbar)

Iin(A)

LOG stage CHARM test resultsLOG V_out (~-4.603V) for Iin of 10pA corresponding to 2.79E-11mbar

• LOG_1 & LOG_2 have exceeded desired TID of 500Gy (RUN_1)

• LOG_3 & LOG_4 have accumulated ~495Gy (RUN_3).

• Slight differences in the drift of the V_outs of 4 DUTs is noticible.

0 100 200 300 400 500

-4.650

-4.625

-4.600

-4.575

-4.550

-4.525

V_out of the Penning LOG amp vs. Dose

LOG_1_Vout LOG_2_Vout LOG_3_Vout LOG_4_Vout

V_out

(V)

Dose (Gy)

TEST GOAL 500 Gy


0 100 200 300 400 500

0

2

4

6

8

10

12

14

16

18

20

V_out peak-to-peak, f(D)

V

_o

ut

(mV

)

Dose (Gy)

Average of 4 LOGs

~18mV of V_out noise at >500 Gy



VSC R2E (Radiation to Electronics) Future actions


Sub-WP1: R2E (Radiation to Electronics)Schedule Activity 2016 2017 2018 2019 2020 2021 2022 2023 2024 2025

• Task 1: Active gaugesin the Arcs (penning & pirani)

Study

DS+ARC Design & Proto

DS+ARC PSI & CC60 COTS rad testsDS+ARC CHARM modules rad testsDS+ARC CHARM final system test

DS series

DS rad test

DS installation

DS commissioning

ARC series

ARC rad test

ARC installation

ARC commissioning

• Task 1.2: Active piezo gauges in the ARCs & LSS

Preparation

Irradiation

Analysis

• Task 2: Active gauges in LSS

Study

Design & Proto & rad test

Series

Installation

Commissioning

• Task 3: 24 VDC local power supply for fixed pumpinggroups

Study

Design & Proto & rad test

Modification IT

Commissioning IT

Modification LSS

Commissioning LSS

17

Actions

Re-test

RadTol

re-design

Change to

Passive

Redesign &

relocation

VSC R2E - Sub-WP1: R2E : Task 1

• Tests of some of the modules and system moved to 2018

• DS commissioning moved to 2020

(NEW)VSC R2E - Sub-WP1: R2E : Task 1.2

Active piezo gauges in the ARCs & LSS



VSC R2M test results

& future actions



Technology Department 11/28/2017 Pawel Krakowski

Consultations with

all VSC sections

Consolidation of VSC

sections requests

Defining test

procedures & safety

precautions !

Radiation levels feedback

MCWG1 & FLUKA2 team

1.MCWG- Monitoring and Calculation Working Group. 2. FLUKA is a fully integrated particle physics MonteCarlo simulation package.

3.Yellow book report CERN-98-01.Compilation of radiation damage test data http://cds.cern.ch/record/357576

Defining criticality

and impact on the

machines operation

Irradiation conditions &

SPECIFICATIONS

Crosscheck with R2M WG

& 3

Planning & consolidation

of tests in campaigns

+

Optimising steps

=

Significant reduction

of the cost!

Management of samples handling

& Irradiation

EDMS & R2E sharepoint

documentation, results analysis

& reports preparation

How does VSC manage such studies?

DOSE STEP (MGy) 0.05 0.25 0.5 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15

0.05

0.05

5.1

15

0.25

0.5

1

5.2 5.3

1

5Task 4. Pumps

0.25

0.5

1

5

10

15

Kaptons

Task 2.2 New Bake-out

10

Task 1.2 O-rings

3 x 5 MGy

3

5

Task 8. Valves (also for BGS change)

0.5

1

5

15

0.5

10

0.5

1 (here I await for fluka team for confirmation)Task 7. Silicons

0.5

„Executed tests need to be properly documented

(preparation, execution, facilities report, PIE)

• Good example given by TE/VSC for R2M”

M. Calviani (EN/STI) R2E Cost & Schedule Review, 12-13 October 2017

„Long-term Material Radiation Damage”

19



EPDM based F6 and F14 – chosen for functional test

Studies continuation


0 50 250 500 1000 3000

0

5

10

15

20

25

30

35

Maxim

um

str

ess (

MP

a)

1st cycle

norm

alise

d to

orig

inal

Dose (kGy)

F6

F14

NBR

FKM

O-rings characterisation

Radiation conditions and samples

preparations

ResultsEDMS 1698871

NBR & FKM damage

in ~1 to 3MGy

Tests before irradiation

Assemblies test up to 10MGy

4 assemblies for 10 and 5 MGy

will be send this week

176 samples

20

2 types of assemblies for each formulation

O-rings elastomers formulation



0 Gy

Radiation induced ageing example of Red Bake-out Jackets


250 kGy 500 kGy 1 MGy 10 MGy

21

5 MGy

Radiation induced ageing example of White Bake-out Jackets and connectors

1 MGy

0 Gy

500 kGy

From 1 MGy

Sewing thread ok but glued

part fell apart with no force

needed!

From

1 MGy

NEW permanent bake-out for LHC bellows

Fabric Aerogel Sewing thread Connectors

Samples already at BGS

Permanent bake-out components (10y of HL-LHC operation)


Technology Department 11/28/2017 Pawel Krakowski 22

Radiation induced material aging observed in the machine

1. Silicone rubber, Xiameter RTV-4136-M

2. Black PU, Axson RE 11501/1020

3. Grey PU, Axson UR 3440

Due to time constraints, more complete round of testing

of different polymers in different conditions will

be postponed to a later date. Batch 2, and it is still

to be defined.

Straight clamps in ATLAS after ~year of operation

and exposure to ~1MGy

Radiation test up to 1MGy and more if needed.

I. Bellow clamp in ATLAS

II. Short straight clamp in CMS.

1 2 3 2 3

I II

3 different material under test

Silicon rubbers & polyurethanes clamps



CHARM


Target dose 100kGy/y

CHARM TDC2

→CHARM

Biaxial Strain Gauges on-line

measurement (few months)

→Irrad

Uniaxial strain gauges on-line

measurement (1week, 1MGy with

24GeV/c proton beam)

→TDC2

4 set-ups with online pressure

monitoring and pumping (up LS2 and

beyond?)

Co

nc

lus

ion

?

Fu

ture

ac

tion

s

SMA (Shape Memory Alloy)



Possible impact of radiation on the machine operation Passive penning gauges and its HV cable under high HEH

RUN_1 only penning

gauges

Immediate pressure change when

beam ONImmediate pressure change when

beam ON or OFF

When no beam pressure values

come back to previous states

No memory effect…

4 passive penning

connected to small

vacuum chambers

pumped down in

ranges from 10-10

up to 10-12 mbar

RUN_2 and 3 only 3 penning gauges

and 1 simulator

Gaugea2

disconnected

and replaced by

passive simulator

(11 TΩ)

BEAM OFF

BEAM ONBEAM ON

BEAM OFF BEAM OFF

BEAM ON

Test at CHARM facility at CERN in particles showers from 24GeV proton beam on copper target

The same behaviour was

observed with gauge and

passive vacuum simulator !


4E-10 mbar

6E-11 mbar

~E-12 mbar

RUN_2 and 3 have confirmed that the TFA3 Triaxial cable is the source of “peaks”

24



• Pressure measured byTPG300 controller LOG stagewith HV(3kV) on TFA3 cable.Current translated to thepressure.

• Pressure/current readout„Peaks” visible even withoutthe target. Beam passing tothe dump and dumpsbackscathered particles.

• Induced current observed also during LOG stage tests when no HV was applied to TFA3 cable.

• Is the HV TFA3 (triaxial) cable acting like ionisation chamber ?

TFA3 HV penning cables (different configurations) under E12 HEH

Possible impact of radiation on the machine operation


200 400 600 800 1000 1200 1400

1E-11

1E-10

1E-9

1E-8

1E-7

1E-11mbar10pA

1E-9mbarnA

HV TFA3 penning cable response on E12 HEH -CHARM

Pre

ssure

(mbar)

Sampling (s)

TFA3_cable+connector

TFA3_cable

1E-10mbar100pA

25

BEAM ON

BEAM OFF

BEAM ONNo target

BEAM OFF

0 100 200 300 400

1E-11

1E-10

1E-9

1E-8

1E-7

HV (3kV)TFA3 penning cable response on E12 HEH - CHARM

Pre

ssure

(mbar)

Sampling (s)

TFA3_cable+connector+Vac sim

TFA3_cable+connector

TFA3_cable

Vac sim 4E-10mbar

With no beam Red and Blue open cable ur-11mbar

• Amplitude of the „peaks” depends on CHARM operation.• Peaks appearance below hundreds of pA level corresponding to ~E-10mbar



• Sub-WP2: R2M (Radiation to Material)Schedule Activity 2016 2017 2018 2019

• Task 1: O-ring sealsPreparation

Irradiation BGSAnalysis (LRCCP)

• Task 1.2: F14 Formulation O-Rings under compressionPreparation

Irradiation BGSAnalysis (LRCCP)

• Task 2: Permanent bake-out componentsPreparation

Irradiation BGSAnalysis

• Task 2.2: New bake out jackets for the LHC bellows close to the collimators

Preparation


• Task 3: NiTiNb SMA (shape memory alloy) connectorsPreparation

Irradiation CHARMAnalysis

• Task 3.2: SMA connectors set-up North Area (TDC2) long term exposure

Preparation

Irradiation TDC2 TDC2 Analysis

• Task 4: Primary and turbo pumpsPreparation


• Task 5: Micro switches and distributors for sector valvesPreparation

Irradiation IONISOS

Analysis

• Task 6: Passive penning gauges and its HV cable under radiation

Preparation

Irradiation CHARM

Analysis

• Task 6.2: Radiation induced current in coaxial/triaxial cablesPreparation

Irradiation 6.2 CHARM

• Task 6.3: Radiation induced cables aging impact on their electrical performance

Irradiation 6.3IONISOS

Analysis

• Task 7: Polymer, Silicon rubbers and polyurethanes clamps VacSeal and other epoxies

Preparation


• Task 8: Piezoelectric venting valvePreparation


• Task 9: Passive piezo resistive gauges in the LSS

Preparation

IrradiationCHARM

Analysis

DONE CONTINUATION

VSC R2M (Radiation to Material) Future actionsNEW TASKS

VSC groups in time irradiations of different projects

26

VSC R2M Planning



VSC R2Everything

numbers

& summary




VSC R2M – 4+ facilities

BGS→(gamma, higher dose rate),

IONISOS→(gamma, lower dose rate)

CHARM→(R0, target proximity),

IRRAD → SMA small samples

TDC2 North Area – for long term SMA

set-up exposure

VSC R2E – 3 facilities

PSI→(proton beam), 500-1kGy

C60→(gamma), 500Gy

CHARM→(mixed field) >500Gy

„Radiation tests as a service, database and know-

how.” Alessandro Masi (EN/STI). From 2011 to now.

“R2E Cost & Schedule Review” 12 & 13 October

2017Chairmen : Marco Calviani, Elisa Guillermain.

Since 2012 up now.

VSC contribution in CERN R2E VSC contribution in CERN R2M

VSC basic gamma irradiation planDOSE STEP (MGy) 0.05 0.25 0.5 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15

3 x 5 MGy

Task 1.2 O-rings

0.05

0.25

0.5

1

3

10

Task 2.2 New Bake-out

0.5

1

5

10

15

Kaptons

0.05

0.25

0.5

1

5

10

15

Task 4. Pumps 0.5

5

15

Task 7. Silicons0.5

1

Without combination

VSC OTHERS TOTAL

206 days 291 days 497 days

130.5k€ 130.5k€ 261 k€ !

VSC + others combination in 3 campaigns

228 days Reduction by factor 2

81.5 k€ Reduction by factor 3

28

VSC R2Everything

numbers & %



VSC R2E&M projects mostly on schedule defined by VSC R2E WP

Vacuum Group successfuly identifies and addresses the risk of radiation

induced failures to various equipment types of CERN machines

by performing one of the most extensive radiation test campaign at CERN

VSC is active in R2E, R2M and MCWG fields:

induces side tasks, such as:

• RPLs dose rate response studies,

• Temperature control strips response under gamma radiation

• Support and consultations in other projects

• And many more

All presented projects are in respect of HL-LHC and are the part of VSC R2E WP

The Project is described in Vacuum R2E technical note – EDMS 1703323

All info is available on VSC group SharePoint –VSC R2E

SUMMARY


https://espace.cern.ch/TE-VSCgroup/Projects/R2E/SitePages/Home.aspx



Sub-WP1: R2E (Radiation to Electronics)Gregory Pigny (TE-VSC-ICM); Nikolaos Chatzigeorgiou (TE-VSC-ICM); Salvatore Danzeca(EN-STI-ECE);

Gilles Foucard(EN-STI-ECE); Paul Peronnard (EN-STI-ECE).


Sub-WP2: R2M (Radiation to Materials)Markus Brugger (EN-EA); Elisa Guillermain (EN-STI-TCD); Ruben Garcia Alia (EN-STI-FDA);

Yacine Kadi(EN-EA); Angelo Infantino (EN-STI-FDA); Corinna Martinella (EN-EA); Robert Froeschl (HSE-

RP-AS); Helmut Vincke (HSE-RP-AS); Yann Pierre Pira (HSE-RP-AS); Mario Di Castro (EN-STI-ECE);

Giacomo Lunghi (EN-STI-ECE).

TE-VSC CollaborationPaulo Gomes (TE-VSC-ICM); Cedric Garion (TE-VSC-DLM); Mauro Taborelli (TE-VSC-SCC);

Giuseppe Bregliozzi (TE-VSC-BVO); Vincent Baglin (TE-VSC-VSM);

Germana Riddone (TE-VSC); Paul Cruikshank (TE-VSC); Paolo Chiggiato (TE-VSC).

Jose Antonio Ferreira Somoza (TE-VSC-BVO);Jaime Perez Espinos (TE-VSC-DLM); Willemjan Maan (TE-

VSC-DLM); Benoit Teissandier (TE-VSC-SCC); Josef Sestak (TE-VSC-BVO); Jorge Fraga (TE-VSC-ICM);

Hendrik Kos (TE-VSC-DLM); Lukasz Piotr Krzempek (TE-VSC-DLM); Caroline Guyenet (TE-VSC-DLM);

( Fabrizio Niccoli (TE-VSC-DLM); Yorick Maxence Delaup (TE-VSC-BVO); Jerome Gilles Chaure (TE-VSC-

BVO); Nicolas Zelko (TE-VSC-BVO); Jose Maria Ruiz (TE-VSC-BVO); Caroline Guyenet (TE-VSC-DLM);

VSC R2Everything

people

30



Thank you

for your attention



Spare slides



Motivation for Rad-tol penning design

IKR251 front-end electronics radiation test results

• Strong effects on electronics from 15 [Gy]!

• None survived designated dose



Motivation for FPG PS redesign and relocation

24VDC power supply for fixed vacuum pumping groups

• At 360 [Gy] voltage drop (92% linear correlation)

• At 1500 [Gy], 90%(255Ω) to 95%(1750Ω) of nominal voltage



Material

Damage

R2E

Cumulative

damage

R2E

Single-Event

Effects

35Pawel Krakowski

LHC machine electronics Experiments

Protected

UJ

Shielded

RE/UA

Tunnel

ARCs/LSS

Commercial Hardened

RadTol

Custom Boards

+commercial

Damage

Experiment

caverns

Earth orbit deep spaceenvironment

Radiation levels in LHC

𝐇𝐄𝐇 [𝐜𝐦−𝟐 ∙ 𝐲−𝟏]

𝐓𝐈𝐃[𝐆𝐲 ∙ 𝐲−𝟏]

11/28/2017


Technology Department 36Pawel Krakowski

Rad

iati

on

eff

ec

tsRadiation effects on electronics

Cumulativeaccumulating during the whole

LHC lifetime, due to the energy

deposited by radiation in the

electronics

Stochasticimmediate effects very

localized, event induced by a single particle

SEE (Single event effects)

TID(Total ionizing dose)

the dose is deposited by particles passing through the materials constituting the electronic devices.

DD(Displacement damage)

TransientSEU (Upset)

SET (Transient)

SEFI (Functional Interrupts

Destructive

SEL (Latchup) SEGR (Gate rupture)

SEB (Burnout)

11/28/2017

MOS

Bipolars

Optoel.

CMOS

Memories

Processors

Power MOSFET


Technology Department 37Pawel Krakowski

Radiation effects on electronics

Total Ionising Dose vs. Single Events Effect

TID + DD

In time components degrade slowly

There are no unwanted “stops”

The final failure can be predicted Interventions can be planned

SEEElectronics can work without any signs

of malfunction

Gy ∙ y-1 Time

HEH [cm-1]

Expected life time

Fa

ilu

re p

rob

ab

ilit

y

Fa

ilu

re p

rob

ab

ilit

y

Failures can appear and rapidly increase

in frequency

Nonzero probability of a failure

Destructive failures possible

Immediate interventions needed

Threshold

11/28/2017



Consequences on systems and equipmentDamage to the material of a defined system might alter its functioning !

• Optical issues

• Loss of transmission

• Change of refractive Index

• Mechanical issues

• Strength, ductility, toughness modifications

• Cracks can appear

• Electrical issues

• Insulation properties

• Devices electrical properties modified

Metals

Lattice displacements

Voids, bubbles, clusters

Liquids

Radiolysis

Polymer

Radiolysis

Chain rupture

Recombination

Glass

Color centers,

Lattice displacement

CeramicsLattice displacements,

Color centers

Semiconductors

Lattice displacement

Radiation effects on materials



0 50 250 500 1000 3000

0

5

10

15

20

25

Pre

ssure

[M

Pa]

Dose [kGy]

MPa

Each point is an average of 5 measurements

# SampleREF 50 kGy 250 kGy 500 kGy 1 MGy 3 MGy

Pressure[MPa]

Δ [MPa]

Pressure[MPa]

Δ [MPa]

Pressure[MPa]

Δ [MPa]

Pressure[MPa]

Δ [MPa]

Pressure[MPa]

Δ [MPa]Pressure

[MPa]Δ

[MPa]

1 23.6 -0.7 26.8 3.4 23.2 0.6 21.6 0.2 21.2 -0.3 24 1.2

2 24.8 0.5 24 0.6 22.4 -0.2 20 -1.4 21.2 -0.3 24 1.2

3 24 -0.3 22 -1.4 22 -0.6 21.6 0.2 21.6 0.1 23.8 1.0

4 25.2 0.9 22.4 -1.0 22.8 0.2 22.4 1.0 21.2 -0.3 22 -0.8

5 23.8 -0.5 22 -1.4 22.4 -0.2 21.6 0.2 22.4 0.9 20 -2.8

AV 24.28 0.6 23.44 1.8 22.56 0.4 21.44 0.8 21.52 0.5 22.76 1.6

39

VSC R2E - Sub-WP2: R2MGlued Kapton (polyimide) sheets for beam heaters

11/28/2017

Heaters characterisation and work conditions (ex. ATLAS chamber), samples preparation and irradiation

Original heater

25µm Polyimide

Adhesive layer

(epoxy resin)

25µm Polyimide

*

Sample attached to the

surface with another epoxy

The probe attached to the surface

of a sample with the same epoxy

as to the surface

Measurement of the force

needed to detach one layer

from another

Adhesive layer Known epoxy

Edges of the sample were

cut to the size of the probe*

Samples provided by Jerome Gilles Chaure (BVO).

Test developed and performed by SCC (B.Teissandier, P.Bole)

Force applied

Test samples

Next batch of samples from different manufacturer already

in BGS (up to 15MGy!)

10MGy samples irradiated, still to be measured

Pawel Krakowski



64

6

0 500

0

10

20

30

40

50

60

70

OIT

in

da

ys

Dose [kGy]

Decrease of OIT by factor 10

646 days

40

VSC R2E - Sub-WP2: R2M

Permanent bake-out components in respect of 10 years operation

Example for NH25 cable studies on radiation induced degradation in high doses (example for 500 kGy)

0 Gy 500 kGy

0 500

0

20

40

60

80

100

120

104.2

The m

eltin

g tem

pera

ture

(non-isoth

erm

al)

[°C

]

Dose [kGy]

~110.4105.4

Repeatable measurements

Decrease in melting point after irradiation

Strong radiation induced degradation

• 9 White cables

• 10 Brown cables

• 1 Yellow/Green

• 5 Red cables

500

0.000

0.002

0.004

0.006

0.008

0.010

0.012

Dose [kGy]

0

0

2

4

6

8

10

Oxid

atio

n I

nd

uctio

n T

ime

(O

IT)

[h]

Dose [kGy]

Test performed by VSC-SCC

(B.Teissandier, P.Bole)

Transition from hours to less than minute !

Preparation Measurements Results

External

cable shield

Inner wires

insulation

Less than 1 minute of Oxidation Induction Time !

Cables are not protected in 105 Gy range

Pawel Krakowski11/28/2017

VSC R2Everything - indico.cern.ch€¦ · LSS - scaling with luminosity 11/28/2017 Pawel Krakowski...

Documents

Transcript of VSC R2Everything - indico.cern.ch€¦ · LSS - scaling with luminosity 11/28/2017 Pawel Krakowski...