V. Lashkaryov Institute of Semiconductor Physics National Academy of Sciences of Ukraine

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V. Lashkaryov V. Lashkaryov Institute of Institute of Semiconductor Semiconductor Physics Physics National National Academy of Academy of Sciences of Ukraine Sciences of Ukraine Athens, 11 April 2008 Athens, 11 April 2008

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V. Lashkaryov Institute of Semiconductor Physics National Academy of Sciences of Ukraine. Athens, 11 April 2008. ISP was established in 1960. The staff of our Institute includes now 785 employee s : ▪ 2 Academician s ▪ 9 Corresponding Members of NASU - PowerPoint PPT Presentation

Transcript of V. Lashkaryov Institute of Semiconductor Physics National Academy of Sciences of Ukraine

Page 1: V. Lashkaryov  Institute of Semiconductor Physics  National Academy of Sciences of Ukraine

V. Lashkaryov V. Lashkaryov Institute of Institute of

Semiconductor Semiconductor Physics Physics

NationalNational Academy of Academy of Sciences of UkraineSciences of Ukraine

Athens, 11 April 2008Athens, 11 April 2008

Page 2: V. Lashkaryov  Institute of Semiconductor Physics  National Academy of Sciences of Ukraine

ISP was established in 1960

The staff of our Institute includes now

785 employees:

▪ 2 2 AcademicianAcademicians

▪ 99 Corresponding Members of NASU Corresponding Members of NASU

▪ 8888 Doctors of Doctors of SciencesSciences (Habilitated)

▪ 204204 Candidates of Candidates of Sciences (Ph.D.)Sciences (Ph.D.)

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The areas ofThe areas of fundamental fundamental investigations and scientific-technical investigations and scientific-technical

worksworks▪ physics of semiconductors and semiconductor physics of semiconductors and semiconductor devices; devices;

▪ ▪ semiconductor materials science;semiconductor materials science;

▪ ▪ optics and spectroscopy;optics and spectroscopy;

▪ ▪ optoelectronics;optoelectronics;

▪ ▪ sensorics; sensorics;

▪ ▪ diagnostics and certification of semiconductor diagnostics and certification of semiconductor materials;materials;

▪ ▪ infrared photoelectronics;infrared photoelectronics;

▪ ▪ liquid-crystal and electroluminescence facilities for liquid-crystal and electroluminescence facilities for displaydisplayss; ;

▪ ▪ high-temperature electronics;high-temperature electronics;

▪ ▪ semiconductor solar power engineering semiconductor solar power engineering

Page 4: V. Lashkaryov  Institute of Semiconductor Physics  National Academy of Sciences of Ukraine

Multichannel Optical RotaMultichannel Optical Rotatingting ConnectorConnector

7 65

3

4

2

8

9

10

1

Designed for the non-contacting transferring of broadband digital signals to and from a rotating body

Applications:▪ in optical communication systems with rotating components

▪ radar antenna equipment

▪ wide angle azimuth field of view scanning systems in visible and IR

Page 5: V. Lashkaryov  Institute of Semiconductor Physics  National Academy of Sciences of Ukraine

Solar cells for ground-based portable Solar cells for ground-based portable electronic facilities and mobile electronic facilities and mobile

communicationscommunications

Page 6: V. Lashkaryov  Institute of Semiconductor Physics  National Academy of Sciences of Ukraine

Technological system for helio-welding

Parameters of solar batteryParameters of solar batteryOpen-circuit voltage, V 40,0Short-circuit current, A 5,5Operating voltage, V 36,0Operating current, A 5,0Peak power, W 180Weight (together with orientation system), kg 20Number of solar battery modules

10Coefficient of module efficiency, %

12-14

Page 7: V. Lashkaryov  Institute of Semiconductor Physics  National Academy of Sciences of Ukraine

GERMANIUM RESISTANCE THERMOMETERS FOR CRYOGENIC TEMPERATURES

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Diode Temperature Sensors DTS-1

Diode Temperature Sensors DTS-100

Minimized influence of self-heating and noise, enhanced sensitivity in low temperature range, accuracy and reproducibility.

The sensors have provide most reliable and accurate measurements for the objects, which are operating under extreme conditions

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Powder electroluminescent Powder electroluminescent indicatorsindicators

• Average brightness is 50-60 Candle/mAverage brightness is 50-60 Candle/m22 at 150V at 150V and 400 Hzand 400 Hz

• Based on screen printing and roll technologyBased on screen printing and roll technology

• Price ~ 50-80$/mPrice ~ 50-80$/m22

Page 10: V. Lashkaryov  Institute of Semiconductor Physics  National Academy of Sciences of Ukraine

Semiconductor silicon carbide technology

This technology provides amorphous and polycrystalline silicon carbide with grain sizes from 0.02 up to 5 mm. The main impurity is nitrogen with the concentration <1017 cm-3. The basic application is a source of materials for growing single crystals

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SiC

Page 12: V. Lashkaryov  Institute of Semiconductor Physics  National Academy of Sciences of Ukraine

INFRARED IMAGERINFRARED IMAGER

The portable infrared imager is designed for detection of thermal (infrared) radiation, subsequent processing of the signal and its real-time visualization on the built-in LCD display or external monitor.

InflammationBlood circulation

Contactless and intrusionless detection of inflammations, blood circulation anomalies and other pathologies, particularly in oncology (breast cancer, thyroid gland cancer), traumatology, gynaecology, post-operation complications control.

Page 13: V. Lashkaryov  Institute of Semiconductor Physics  National Academy of Sciences of Ukraine

Ecological monitoring and nondestructive control:

Detection of thermal losses of buildings, pipelines, monitoring of moving engine parts, control of fire-risk areas, etc.

Page 14: V. Lashkaryov  Institute of Semiconductor Physics  National Academy of Sciences of Ukraine

Qadrexed Dimension 3000 NanoScope IIIa Scanning Qadrexed Dimension 3000 NanoScope IIIa Scanning probe microscopeprobe microscope

SCM

STM

AFM

Force modulation

NanoIndentor

Fluid cell

Nanosensors for various methods of tip spectroscopy:C-AFM –conducting AFM; SCM – scanning capacitance m; Fluid c.- for study of fluids, STM – scanning tunelling m.; Force modulation – for the mapping of surface elastic properties

Page 15: V. Lashkaryov  Institute of Semiconductor Physics  National Academy of Sciences of Ukraine

0 20 40 60 80 100

0

10

20

30

Penetration depth , nm

Lo

adin

g f

orc

e,

N

Slid ing d is locationsat load curve and nanoindent

2 1 . 2 N

11.8 N

Х, m

0.1

3 0.

0

0 1 0. 2 0.Z

m,

16.5 N

0

1.2

2.4

Ym

,

0

1.2

2.4

Topographyof s ilicon transistor

Dopant m apof s ilicon transistor

Ym

,

- 6 - 4 - 2 0 2 4 6

- 4

- 3

- 2

- 1

0

1

2

3

Cu

rren

tn

A,

App lied vo ltage, V

50 nm

quantumdot

wetting layer

Examples of nanoindentor functioning

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Thank you for your Thank you for your attentionattention