UNH IOL SAS Consortium 3.0... · UNH IOL SAS Consortium SAS-3 Phy Layer Test Suite v1.0 ....

UNH IOL SAS Consortium SAS-3 Phy Layer Test Suite v1.0

InterOperability Lab — 121 Technology Drive, Suite 2 — Durham, NH 03824 — (603) 862-0701 Cover Letter

XX/XX/XXXX Vendor Company Vendor:

Enclosed are the results from the SAS-3 Clause 5 Physical Layer testing performed on the:

Device Under Test The testing was performed according to Version 1.00 of the UNH IOL SAS Consortium Clause 5

SAS-3 Physical Layer Test Suite, which is available online at:

http://www.iol.unh.edu/testsuites/sas/ Note that the tests defined in this test suite are based on Clause 5 of the SAS-3 specification,

ISO/IEC 14776-154:201x, Serial Attached SCSI-3 (SAS-3) Standard T10/2212-D, Revision 05a. Please feel free to contact me at [email protected] if you have any questions regarding the test

suite, or the results contained in this report.

Sincerely,

Michael Klempa

http://www.iol.unh.edu/testsuites/sas/�

mailto:[email protected]�

The University of New Hampshire InterOperability Laboratory DUT: UNH-IOL ID

UNH IOL SAS Consortium SAS-3 Physical Layer Test Suite v1.00 2 Document 1.0

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Table 1: Test Equipment and DUT Configuration/Feature Information DUT Details Manufacturer Model SAS Device Type (IT/CT) Mfr. Serial Number Port Tested Firmware Version Hardware Version Software Version UNH-IOL ID Number DUT: Reported Features DUT is a CT device DUT is an IT device that supports SATA DUT supports SSC on TX Test System Hardware Real-time DSO Agilent Infiniium DSO91304A, 13GHz, 40GS/s Real-time

DSO Sampling Scope Agilent DCA-J 86100C, with 86108B 50GHz Precision

Waveform Analyzer MDI-to-SMA Adapter Wilder Technologies SAS Receptacle Test Adapter Part No.

600-1008-000 Vector Network Analyzer Agilent E5071C ENA Additional Comments/Notes S-Parameter measurements (Table 5, and Figures 19 through 30) were initially performed with the SAS mated connector pair included, and the TX and RX common-mode return loss results were both observed to be outside the conformance limits. (Note this is a common and expected problem, due to the common-mode characteristics of most SAS connectors.) The common-mode S-parameters were re-measured using timegating to remove the connector from the measurements. The eyemask used for 12G is informative.



Table 2: Group 1 - TX OOB Signaling Tests Test/Parameter Valid Range Measured Units Figure

Test 5.1.1: AC TX Maximum Noise During OOB Idle Maximum peak-to-peak OOB idle noise < 120 35.9 mVppd 1 Test 5.1.2: TX OOB Burst Amplitude (ZL Test Load): < 1600 1208.1 mVppd 2 (ZL Test Load): > 240 740.1 mVppd 2 (3G TCTF Load): < 1600 1047.7 mVppd 3 (3G TCTF Load): > 240 614.3 mVppd 3 Test 5.1.3: TX OOB Offset Delta Mean differential voltage during OOB burst -25/+25 -3.4 mV 1 Test 5.1.4: TX OOB Common Mode Delta Mean common-mode voltage during OOB burst -50/+50 (61.9) mV 4



Table 3: Group 2 - TX SSC Requirements Test/Parameter Valid Range Measured Units Fig.

Test 5.2.1: TX SSC Modulation Frequency Frequency of SSC modulation 30/33 31.15 kHz 6 Test 5.2.2: TX SSC Modulation Deviation and Balance (If DUT is a SAS phy that supports Down-spreading): Average upper SSC peak value: < 100 83.7 ppm 6 Average lower SSC peak value: > -1000 -789.2 ppm 6 (If DUT is an Expander phy that supports Center-spreading):

Average upper SSC peak value: < 1000 N/P* ppm 8 Average lower SSC peak value: > -1000 N/P* ppm 8 Deviation Asymmetry: < 288 N/P* ppm 8 (If DUT is an Expander phy that supports Down-spreading when connected to SATA devices):

Average upper SSC peak value: < N/A N/A* ppm - Average lower SSC peak value: > N/A N/A* ppm - Test 5.2.3: TX SSC dF/dt (Informative) Peak dF/dt: (SAS Down-spreading case) -850/+850 661.4 ppm/us 7 Peak dF/dt: (SAS Center-spreading case) -850/+850 N/P* ppm/us 9 Peak dF/dt: (SATA Down-spreading case) -850/+850 N/A* ppm/us - *N/P: This test was not performed because the DUT does not support SSC Center spreading. *N/A: This test is not applicable.



Table 4: Group 3 - TX NRZ Data Signaling Requirements Test/Parameter Range Measured Units Figure

Test 5.3.1: TX Physical Link Rate Long Term Stability Mean TX bitrate (SSC disabled): -100/+100 -6.8 ppm 10 Test 5.3.2: TX Common Mode RMS Voltage Limit RMS common-mode voltage: < 30 3.4 mV Test 5.3.3: TX Common Mode Spectrum Minimum margin with respect to limit line: > 0 See Figure dBmV 11 Test 5.3.4: TX Peak-to-Peak Voltage TX peak-to-peak voltage: 536/1200 747.0 mV 12 Test 5.3.5: TX VMA and EQ TX Voltage Modulation Amplitude: >= 80 677.5 mV 13 TX Equalization: 2/4 (1.82) dB 13 Test 5.3.6: TX Rise and Fall Times TX rise time while transmitting 1010 pattern: >= 20.8 25.1 ps 14 TX fall time while transmitting 1010 pattern: >= 20.8 24.5 ps 14 Test 5.3.7: TX Random Jitter (RJ) Peak-to-peak RJ @ 1E-12 BER with 1100 pattern: <= 150 (169.2) mUI - Test 5.3.8: TX Total Jitter (TJ) Pk-pk TJ with 1100 pattern (SSC disabled): <= 250 182.4 mUI 15 Pk-pk TJ with 1100 pattern (SSC Down-spreading): <= 250 182.4 mUI 16 Pk-pk TJ with 1100 pattern (SSC Center-spreading): <= 250 N/P1* mUI 17 Test 5.3.9: TX Waveform Distortion Penalty (WDP) SASWDP result for SCRAMBLED_0 pattern: < 13 N/P2* dB 18 * N/P1: This test was not performed because the DUT does not support SSC Center spreading. * N/P2: This test was not performed, as it does not apply to this rate.



Table 5: Group 4 - S-Parameter Requirements Test/Parameter Range Measured Units Fig.

Test 5.4.1: RX Differential Return Loss (SDD11) Minimum SDD11 margin: > 0 6.04 dB 19 Test 5.4.2: RX Common-Mode Return Loss (SCC11) Minimum SCC11 margin: > 0 16.10 dB 20 Test 5.4.3: RX Differential Impedance Imbalance (SCD11) Minimum SCD11 margin: > 0 11.65 dB 21 Test 5.4.4: TX Differential Return Loss (SDD22) Minimum SDD22 margin: > 0 3.64 dB 22 Test 5.4.5: TX Common-Mode Return Loss (SCC22) Minimum SCC22 margin: > 0 18.15 dB 23 Test 5.4.6: TX Differential Impedance Imbalance (SCD22) Minimum SCD22 margin: > 0 5.58 dB 24



Figure 1: TX Idle Noise and TX Offset Delta (Zero-Length Test Load)



Figure 2: OOB Maximum and Minimum Amplitude (Zero-Length Test Load)



Figure 3: OOB Maximum and Minimum Amplitude (3G TCTF)



Figure 4: TX OOB Common-Mode Delta (Zero-Length Test Load)



Figure 5: SSC + Link Rate Stability LPF Test Filter Response



Figure 6: SSC Profile (1010 Pattern, SAS Down-Spreading Case)



Figure 7: SSC dF/dt (1010 Pattern, SAS Down-Spreading Case)



Figure 8: SSC Profile (1010 Pattern, SAS Center-Spreading Case)



Figure 9: SSC dF/dt (1010 Pattern, SAS Center-Spreading Case)



Figure 10: TX Physical Link Rate Long Term Stability (1010 Pattern, SSC OFF)



Figure 11: TX Common Mode RMS Voltage Spectrum (CJTPAT Pattern, SSC OFF)



Figure 12: TX Vpp (D30.3 Pattern, SSC OFF)



Figure 13: TX VMA and EQ (TRAIN_DONE Pattern, SSC OFF)



Figure 14: TX Rise and Fall Times (1010 Pattern, SSC OFF)



Figure 15: TX Eye Diagram (1100 Pattern, SSC OFF)



Figure 16: TX Eye Diagram (1100 Pattern, SSC Down-Spreading)



Figure 17: TX Eye Diagram (1100 Pattern, SSC Center-Spreading)



Figure 18: SASWDP BER Eye (SCRAMBLED_0 Pattern, SSC OFF)



Figure 19: Ungated RX Differential Return Loss (SDD11)



Figure 20: Gated RX Common-Mode Return Loss (SCC11)



Figure 21: Ungated RX Differential Impedance Imbalance (SDC11)



Figure 22: Ungated TX Differential Return Loss (SDD22)



Figure 23: Gated TX Common-Mode Return Loss (SCC22)



Figure 24: Ungated TX Differential Impedance Imbalance (SDC22)

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