Krishna Jharjaria TJ Strzelecki Rick Schuman Matt Waldersen.
Text Message DJ – Reliability & Safety Team 22 Garrett Strzelecki The Text Message DJ allows party...
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Transcript of Text Message DJ – Reliability & Safety Team 22 Garrett Strzelecki The Text Message DJ allows party...
Text Message DJ – Reliability & Safety Team 22
Garrett Strzelecki
The Text Message DJ allows party guests the opportunity to choose which songs they want to hear. Guests can text the name of the sing they want and the Text message DJ streams the song from the internet. Other features include a voting process, strobing lights, and customizable options.
Component Failure Analysis Linear Voltage Regulators – SPX29302
Voltage regulators are prone to failing if not designed properly against the given voltage and the voltage it must supply
Microcontroller – ATxmega64A3U Brain of the device that may utilizes most every
UART/I2C port simultaneously.
TVS Array – SMF05C Used between with the GSM to provide transient
voltage protection to the SIM card and back. Spiked of up to 2 amps.
Criticality Levels High - The device causes harm or injury to
the user
Medium – Device ceases to function in its most desired operation mode. It no longer plays the songs requested.
Low – The device loses an included function, but still can play songs that are requested. DMX, light strobe, R/W to SD card no longer work
Voltage Regulator – SPX29302
Symbol
Parameter Value Description
λbBase Failure Rate 0.002 Voltage Regulator
ΠTTemperature Factor 5.1 125 C (Max)
ΠSElectrical Stress 1.0 Voltage Reg
constant
ΠCContact Construction 1.0 Metalurgically
bonded
ΠQQuality Factor 8.0 Plastic
ΠEEnvironment Factor 1.0 GB Ground, base
λP 0.0816 /106 Hours Failure Rate
Voltage Regulator Devices
λP = λbΠTΠSΠCΠQΠE
Microcontroller – ATxmega64A3U
Symbol Parameter Value Description
C1Die Complexity 0.14 8 bit
πTTemperature Coef. 0.95 85C (Max)
C2Pin Number Constant .032 64 pins
πEEnvironmental Constant 0.5 Ground base
πQQuality Factor 10 Commercial
screening
πLLearning Factor 1.5 1 year in
production (conservative)
λP 2.235 /106 Hours Failure Rate
MOS Devices Digital/Linear Gate/Logic Array
λP = (C1πT + C2πE)πQπL
Transient Voltage Suppressor – SMF05C
Symbol Parameter Value Description
λbBase Failure Rate 0.0013 TVS
ΠTTemperature Factor 14 125 C (Max)
ΠSElectrical Stress 1.0 TVS constant
ΠCContact Construction 1.0 Metalurgically
bonded
ΠQQuality Factor 8.0 Plastic
ΠEEnvironment Factor 1.0 GB Ground, base
λP 0.1456 /106 Hours Failure Rate
Transient Suppressor Devices
λP = λbΠTΠSΠCΠQΠE
FCMEC Chart
Failure No.
Failure Mode Possible Cause
Failure Effects
Criticality
Probability (λ/Hour)
1 Failure of Voltage Regulator
Chip burn out. Temperature too high with no heat sinks.
Incorrect, unregulated voltage into the device and components.
Medium 0.0816 /106
2 Failure of Microcontroller
Physical connection, incorrect software translation
Logic levels unpredictable
Medium 2.235 /106
3 Failure of Transient Voltage Supressor
High current draws from GSM
SIM card unprotected. May result in no longer sending or receiving texts
Medium 0.1456 /106