TA3-2

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NSF Engineering Research Center for Reconfigurable Manufacturing Systems University of Michigan College of Engineering October 2006 TA3-2 Student: Vijay Srivatsan Faculty: Reuven Katz Debasish Dutta Rapid Inspection of Complex Surfaces MCS PCS PCS MCS OBJECTIVES • Rapid inspection • Non-contact sensors • Fixtureless Inspection • Complex/Free-form sensors APPROACH • Online sensor standoff control • In-process registration • Initial alignment • Registration refinement Linear Motion Stages Rotary Stage Inspecte d Part Compute r Non-Contact Laser Probe ACCOMPLISHMENTS WORK IN PROGRESS Fixtureless sensor standoff control In-process registratio n BLADE INSPECTION MACHINE REGISTRATION SENSOR STANDOFF CONTROL IN-PROCESS REGISTRATION

description

MCS. MCS. PCS. PCS. Computer. Inspected Part. Linear Motion Stages. Rotary Stage. Non-Contact Laser Probe. Fixtureless sensor standoff control. In-process registration. TA3-2. Student: Vijay Srivatsan Faculty: Reuven Katz Debasish Dutta. Rapid Inspection of Complex Surfaces. - PowerPoint PPT Presentation

Transcript of TA3-2

Page 1: TA3-2

NSF Engineering Research Center forReconfigurable Manufacturing SystemsNSF Engineering Research Center forReconfigurable Manufacturing SystemsUniversity of Michigan College of EngineeringUniversity of Michigan College of Engineering

October 2006

TA3-2

Student:Vijay SrivatsanFaculty:Reuven KatzDebasish Dutta

Rapid Inspection of Complex SurfacesRapid Inspection of Complex Surfaces

MCS

PCS

PCS

MCS

OBJECTIVESOBJECTIVES

• Rapid inspection• Non-contact sensors• Fixtureless Inspection• Complex/Free-form sensors

APPROACHAPPROACH

• Online sensor standoff control• In-process registration• Initial alignment• Registration refinement

Linear Motion Stages

Rotary Stage

Inspected Part

Computer

Non-Contact Laser Probe

ACCOMPLISHMENTSACCOMPLISHMENTS

WORK IN PROGRESSWORK IN PROGRESS

Fixtureless sensor standoff control

In-process registration

BLADE INSPECTION MACHINE

REGISTRATION SENSOR STANDOFF CONTROL

IN-PROCESS REGISTRATION