System Test Design SYSTTCON 1 The Location of Test Design Test Design Structure Test Design Content...

28
System Test Design SYST TCON 1 The Location of Test Design Test Design Structure Test Design Content by ANSI/IEEE- 829 System Test Requirements System Test Approaches Random Testing Architectural Testing Use Case Testing Calender Use Cases Live Testing Regression Testing System Test Scenarios Defining Test Scenarios 2 3 6 7 5 4 8 9 10 14 Calender Test Scenarios System Test Objects Calender Test Objects Potential Test End Criteria Calender Test End Criteria Test case / Requirement Table Test case / Use Case Table Test case / Test object Table Test case / Database Table Requirement/Test case Table for Calender Use case /Test case Table for Calender Test Object / Test case Table for Calender 15 16 19 20 18 17 21 22 23 11 24 12 25 26 13

Transcript of System Test Design SYSTTCON 1 The Location of Test Design Test Design Structure Test Design Content...

Page 1: System Test Design SYSTTCON 1 The Location of Test Design Test Design Structure Test Design Content by ANSI/IEEE-829 System Test Requirements System Test.

System Test Design

SYST TCON

1 The Location of Test Design

Test Design Structure

Test Design Content by ANSI/IEEE-829

System Test Requirements

System Test Approaches

Random Testing

Architectural Testing

Use Case Testing

Calender Use Cases

Live Testing

Regression Testing

System Test Scenarios

Defining Test Scenarios

2

3

6

7

5

4

8

9

10

14 Calender Test Scenarios

System Test Objects

Calender Test Objects

Potential Test End Criteria

Calender Test End Criteria

Test case / Requirement Table

Test case / Use Case Table

Test case / Test object Table

Test case / Database Table

Requirement/Test case Table for Calender

Use case /Test case Table for Calender

Test Object / Test case Table for Calender

Test Design of a Data Feed Process

15

16

19

20

18

17

21

22

23

11 24

12 25

2613

Page 2: System Test Design SYSTTCON 1 The Location of Test Design Test Design Structure Test Design Content by ANSI/IEEE-829 System Test Requirements System Test.

Location of Test Design in the Test Process

SYST TCON-1

Test-planning

Testdesign

Testspec.

Testexecution

Testevaluation

Test Plan

TestDesign

TestCases

TestResults

TestDocu.

Closure

Init

Result of

Test Design

Activity of Designing the System Test

Page 3: System Test Design SYSTTCON 1 The Location of Test Design Test Design Structure Test Design Content by ANSI/IEEE-829 System Test Requirements System Test.

Structure of Test Design

SYST TCON-2

TestFunctions

TestObjects

TestEnd Criteria

TestGoals

TestRequire-

ments

TestCases

TestCases

TestCycles

TestCycles

Test-scenarios

Test-scenarios

TestDesign

TestMetrics

TestMetrics

Relationship of Test Design Entities

Page 4: System Test Design SYSTTCON 1 The Location of Test Design Test Design Structure Test Design Content by ANSI/IEEE-829 System Test Requirements System Test.

Test Design Content according to ANSI/IEEE-829

SYST TCON-3

Test Design Id (Calender\Test\Design\Header.doc)

Test Requirements (Calender\Test\Design\Require.doc)

Test Approaches (Calender\Test\Design\Approach.doc)

Test Scenarios (Calender\Test\Design\Scenario.doc)

Test Objects (Calender\Test\Design\Objects.doc)

Test End Criteria (Calender\Test\Design\Criteria.doc)

1

2

3

6

5

4

Page 5: System Test Design SYSTTCON 1 The Location of Test Design Test Design Structure Test Design Content by ANSI/IEEE-829 System Test Requirements System Test.

System Test Requirements

SYST TCON-4

Requirements need to be validated

Functional Requirements Non-functional Requirements

Create a Calender Bad inputs should be tested

Open a week Table overflow should be tested

Open a day Network disruption should be tested

Insert Activities Database deadlock should be tested

Delete aktivities Response time should be tested

Close a day Recovery/Restart should be tested

Close a week Transaction Load should be tested

Print a calender Usability should be tested

Delete a calender Security should be tested

Page 6: System Test Design SYSTTCON 1 The Location of Test Design Test Design Structure Test Design Content by ANSI/IEEE-829 System Test Requirements System Test.

System Test Approaches

SYST TCON-5

System Test Approaches

Random Testing

Architectural Testing

Functional Testing

Live Testing

Regression Testing

Ways to validate the Test Requirements

Arbitrary Test against randomly selected data

Systematic Test of the System Design

Systematic Test of the System Use Cases

Test of the System in the Production Environment

Test of the System against the preceeding system.

Page 7: System Test Design SYSTTCON 1 The Location of Test Design Test Design Structure Test Design Content by ANSI/IEEE-829 System Test Requirements System Test.

Random Testing

SYST TCON-6

S y s t e m

Randomdata

DataGenerator

DataStructure

Parameter

Random test leads to random results in the Database

System spits out random results Mouse runs over the User

Interface

There is no real way toValidate random results

Page 8: System Test Design SYSTTCON 1 The Location of Test Design Test Design Structure Test Design Content by ANSI/IEEE-829 System Test Requirements System Test.

Architectural Testing

SYST TCON-7

Paths

DB

------------------Inputs Outputs

Terminal

DataEditor

Access Module

User Interface

Control Module

ModuleModule

Selected Data

S y s t e m

--------

Path totraverse

Page 9: System Test Design SYSTTCON 1 The Location of Test Design Test Design Structure Test Design Content by ANSI/IEEE-829 System Test Requirements System Test.

Use Case Testing

SYST TCON-8

Use Case

Use Case

Use CaseUse Case

Pre Conditions

Post Condiutions

Steps

Exceptions

Actor Actor

Page 10: System Test Design SYSTTCON 1 The Location of Test Design Test Design Structure Test Design Content by ANSI/IEEE-829 System Test Requirements System Test.

Calender Use Cases

SYST TCON-9

Open aWeek

CreateCalender

Insert anActivity

Open aDay

Preconditions:

calender does not exist Calender exists Woche exits Day exists

Week does not exist Day does not exist Time slot is freePost conditions:

Calender stored new Week is stored new day is stored new Activity stored. Error Message Error Message Error Message Error Message

Calender Processing

Mitarbeiter

Page 11: System Test Design SYSTTCON 1 The Location of Test Design Test Design Structure Test Design Content by ANSI/IEEE-829 System Test Requirements System Test.

Live Testing

SYST TCON-10

------------------

S y s t e m

User interface

Access Functions

Imp

ort

Fun

ctio

n

Exp

ort

Fu

nctio

n

Input Script

OutputScript

Production Inputs Produktion Outputs

Masterdata Test-DB Prod-DB

Production data Mutations

ImportFiles

ExportFiles

Compare

From Production To Production

Page 12: System Test Design SYSTTCON 1 The Location of Test Design Test Design Structure Test Design Content by ANSI/IEEE-829 System Test Requirements System Test.

Regression Testing

SYST TCON-11

------------------

S y s t e m

Masken

Access Functions

Inpu

t F

unct

ions

Out

put

Fu

nctio

ns

Replay-script

Capturescript

Test-DB NewData

OldInputFiles

NewOutputFiles

OldData

Page 13: System Test Design SYSTTCON 1 The Location of Test Design Test Design Structure Test Design Content by ANSI/IEEE-829 System Test Requirements System Test.

System Test Scenarios

SYST TCON-12

Test of theData Entry

Test of the Data Update

Test of ther Data Queries

Test of theReport

Generation

Test Scenario

Correctness,Error HandlingData Overflow Response Time

Correctness,Error Handling,Deadlocking

Correctness,Data Overflow Response Time

What should be tested when Test Goals?

Preciseness,Layout Correctness

Page 14: System Test Design SYSTTCON 1 The Location of Test Design Test Design Structure Test Design Content by ANSI/IEEE-829 System Test Requirements System Test.

Defining Test Scenarios

SYST TCON-13

1

2

3

4

5

6

7

2

Initialize the Databasewith a batch process

Enter initial data via aDialog process

Generate reportsvia a Batch process

Import the Import files via aBatch process

Update the Data via aDialog process

Generate reports via aBatch process

Query the Database in a Dialog process

Page 15: System Test Design SYSTTCON 1 The Location of Test Design Test Design Structure Test Design Content by ANSI/IEEE-829 System Test Requirements System Test.

Calender Test Scenario

SYST TCON-14.1

1221

1

11

12

121

122

1222

123

Calender Test

create a Calender

for unauthorized persons

for authorized persons

Open week with an invalid week

Open week with a valid week

Open day with an invalid day

Open day with a valid day

Close the week

Page 16: System Test Design SYSTTCON 1 The Location of Test Design Test Design Structure Test Design Content by ANSI/IEEE-829 System Test Requirements System Test.

SYST TCON-14.2

122211

13

1223

12221

122212

122213

122214

122215

122216

Insert activities

With a bad start time

With a bad end time

With an inavlid Description

With a valid Description

Delete an activity

Insert too many activities

Close a day

Close the calender

Page 17: System Test Design SYSTTCON 1 The Location of Test Design Test Design Structure Test Design Content by ANSI/IEEE-829 System Test Requirements System Test.

Test Objects

SYST TCON-15

TestObjects

Was is to be tested What Objects?

Systems

Components

Modules

Classes

Interfaces

Data BaseTables

Page 18: System Test Design SYSTTCON 1 The Location of Test Design Test Design Structure Test Design Content by ANSI/IEEE-829 System Test Requirements System Test.

Calender Test Objects

SYST TCON-16

------------------

Calender

WeekWeek

DayDay

ActivityActivity

Error Message

User Interface

Name

Number

Start Time

End Time

Description

Page 19: System Test Design SYSTTCON 1 The Location of Test Design Test Design Structure Test Design Content by ANSI/IEEE-829 System Test Requirements System Test.

Potential Test End Criteria

SYST TCON-17

ArchitecturalCoverage

Data Coverage

FunctionalCoverage

SecurityCoverage

Projected Error Coverage

PerformanceCoverage

Erfüllungsgrad = IstSoll

Page 20: System Test Design SYSTTCON 1 The Location of Test Design Test Design Structure Test Design Content by ANSI/IEEE-829 System Test Requirements System Test.

Calender Test End Criteria

SYST TCON-18

All 4 use cases have been tested.

All 16 use case steps have been tested.

All 26 data attributes have been validated

All 8 error messages have been provoked.

System was tested with 20 simultaneous users.

Response Time is in 90% of the cases under 2 Seconds.

8 of 9 predicted errors were found..

1

2

3

4

5

6

7

Page 21: System Test Design SYSTTCON 1 The Location of Test Design Test Design Structure Test Design Content by ANSI/IEEE-829 System Test Requirements System Test.

Test Case/Requirement Relationship Table

SYST TCON-19

TEST CASES REQU_1 REQU_2 REQU_3 REQU_4 REQU_5 REQU_6 REQU_7 REQU_8

TEST-CASE-1 X

TEST-CASE-2 X

TEST-CASE-3 X

TEST-CASE-4 X

TEST-CASE-5 X

TEST-CASE-6 X

TEST-CASE-7 X

TEST-CASE-8 X

TEST-CASE-9 X

TEST-CASE-10 X

TEST-CASE-11 X

TEST-CASE-12 X

TEST-CASE-13 X

..... X

R E Q U I R E M E N T S

Page 22: System Test Design SYSTTCON 1 The Location of Test Design Test Design Structure Test Design Content by ANSI/IEEE-829 System Test Requirements System Test.

Test Case / Use Case Relationship Table

SYST TCON-20

TEST CASES CASE_1 CASE_2 CASE_3 CASE_4 CASE_5

TEST-CASE-1 X

TEST-CASE-2 X

TEST-CASE-3 X

TEST-CASE-4 X

TEST-CASE-5 X

TEST-CASE-6 X

TEST-CASE-7 X

TEST-CASE-8 X

TEST-CASE-9 X

TEST-CASE-10 X

TEST-CASE-11 X

TEST-CASE-12 X

TEST-CASE-13 X

U S E C A S E S

Page 23: System Test Design SYSTTCON 1 The Location of Test Design Test Design Structure Test Design Content by ANSI/IEEE-829 System Test Requirements System Test.

Test Case / Test Object Relationship Table

SYST TCON-21

TEST CASES OBJ_A OBJ_B OBJ_C OBJ_D OBJ_E OBJ_F OBJ_G OBJ_H OBJ_I

TEST-CASE-1 X X

TEST-CASE-2 X X X

TEST-CASE-3 X X X

TEST-CASE-4 X X X X

TEST-CASE-5 X X X X

TEST-CASE-6 X X

TEST-CASE-7 X X

TEST-CASE-8 X X X

TEST-CASE-9 X X X X

TEST-CASE-10 X X X X

TEST-CASE-11 X X X X X

TEST-CASE-12 X X X X X X

TEST-CASE-13 X X X X X X

.....

T E S T O B J E K T E

Page 24: System Test Design SYSTTCON 1 The Location of Test Design Test Design Structure Test Design Content by ANSI/IEEE-829 System Test Requirements System Test.

Test Case / Database Table Relationship Table

SYST TCON-22

TEST CASES DB_1 DB_2 DB_3 DB_4 DB_5 TAB_A TAB_B

TEST-CASE-1 R U

TEST-CASE-2 R U R

TEST-CASE-3 R U R

TEST-CASE-4 R D R U

TEST-CASE-5 R U R U

TEST-CASE-6 R R

TEST-CASE-7 R R U

TEST-CASE-8 R R D

TEST-CASE-9 R R U

TEST-CASE-10 R R D

TEST-CASE-11 R R R U

TEST-CASE-12 R R U U

TEST-CASE-13 R R U D

.....

D A T A B A S E S

Page 25: System Test Design SYSTTCON 1 The Location of Test Design Test Design Structure Test Design Content by ANSI/IEEE-829 System Test Requirements System Test.

Requirement / Test Case Relationships for the Calender

SYST TCON-23

TEST CASES Create Open Open Insert Delete Provoke Table Calender Week Day Activity Activity Error Overflow

Invalid Name

Valid Name of user

Invalid week

Valid week

Invalid day of week

Valid day of week

Invalid start time

Invalid end time

Valid activity

> Max Activities

A N F O R D E R U N G E N

Page 26: System Test Design SYSTTCON 1 The Location of Test Design Test Design Structure Test Design Content by ANSI/IEEE-829 System Test Requirements System Test.

Use Case / Test Case Relationships for the Calender

SYST TCON-24

TEST CASES Create open a open a Insert an Calender Week Day Activity

Invalid Name

Valid Name of User

Invalid Week

Valid Week

Invalid day

Valid day of week

Invalid start time

Invalid end time

Valid Activity

> Max Activities

U S E C A S E S

Page 27: System Test Design SYSTTCON 1 The Location of Test Design Test Design Structure Test Design Content by ANSI/IEEE-829 System Test Requirements System Test.

Test Object / Test Case Relationsships for Calender

SYST TCON-25

TEST CASES Calender Week Day Aktivity Error Msg

Invalid Name

Valid Name of User

Invalid Week

Valid Week

Invalid Day

Valid Day of week

Invalid start time

Invalid end time

Valid Activity

> Max Activities

T E S T O B J E C T S

Page 28: System Test Design SYSTTCON 1 The Location of Test Design Test Design Structure Test Design Content by ANSI/IEEE-829 System Test Requirements System Test.

Test Design of a Data Feed Process

Use CasesUC-01UC-16UC-17

UpdateEvent

To be validatedby WSDLVal

XMLImport Interface

WSDLExport Interface

InputMessages

To be generatedby XMLGen

XML

Regel

BaseEventBenach-

richtigungNachricht

ManschaftLiga

FeedEventDelivered

FeedEventBenach.

Typ

To be validated byCSVVal

To be generated by CSVGen

WSDL

TCON-26SYST