Summary of 2 measurements at Super KEKB Hirokazu Ishino Tokyo Institute of Technology 19 Dec.,...

28
Summary of 2 measurements at Super KEKB Hirokazu Ishino Tokyo Institute of Technology 19 Dec., 2006

Transcript of Summary of 2 measurements at Super KEKB Hirokazu Ishino Tokyo Institute of Technology 19 Dec.,...

Page 1: Summary of  2 measurements at Super KEKB Hirokazu Ishino Tokyo Institute of Technology 19 Dec., 2006.

Summary of 2 measurements at Super KEKB

Hirokazu Ishino

Tokyo Institute of Technology

19 Dec., 2006

Page 2: Summary of  2 measurements at Super KEKB Hirokazu Ishino Tokyo Institute of Technology 19 Dec., 2006.

• current status

• 2 constraint with a 50ab-1 data sample

– • time-dependent Dalitz plot analysis

– • time-dependent CP violation (tCPV) parameter• isospin analysis including 00

– • tCPV parameter measurements and isospin analysis

• S00 measurement

• Summary

Contents

Page 3: Summary of  2 measurements at Super KEKB Hirokazu Ishino Tokyo Institute of Technology 19 Dec., 2006.

Notes

2• Almost all the measurement errors are

systematic dominant with 50ab-1 data.– except for 00, A00 and S00

• For the 2 constraints, we use the R-fit. – J. Charles et al., Eur. Phys. J. C 41, 1 (2005)

• Theoretical uncertainties are not taken into account.– will be summarized later.

Page 4: Summary of  2 measurements at Super KEKB Hirokazu Ishino Tokyo Institute of Technology 19 Dec., 2006.

Current Status

Dalitz+isospin

~10 degrees

Page 5: Summary of  2 measurements at Super KEKB Hirokazu Ishino Tokyo Institute of Technology 19 Dec., 2006.

00 B

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B0→(

time-dependent Dalitz plot analysis involves cos(22)

27 parameter fit: one of the most complicate analyses!

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B→systematic errors

by A. Kusaka in BNM

Page 8: Summary of  2 measurements at Super KEKB Hirokazu Ishino Tokyo Institute of Technology 19 Dec., 2006.

B→ errors

by A. Kusaka in BNM

Page 9: Summary of  2 measurements at Super KEKB Hirokazu Ishino Tokyo Institute of Technology 19 Dec., 2006.

2 constraints with B→at Super B factory

by A. Kusaka in BNM

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B

Page 11: Summary of  2 measurements at Super KEKB Hirokazu Ishino Tokyo Institute of Technology 19 Dec., 2006.

Isospin relation

M. Gronau and D. London, PRL 65, 3381 (1990)

)22sin(1 22 AS

The cleanest method to extract 2

The measurements we need are branching fractions, CP asymmetry parameters and longitudinal polarization fraction in B→.

Page 12: Summary of  2 measurements at Super KEKB Hirokazu Ishino Tokyo Institute of Technology 19 Dec., 2006.

B→ measurements

HFAG2006

01.001.011.0)(

01.002.006.0)(

01.001.086.0)(

10)05.005.016.1()(

002.0002.0968.0)(

10)4.13.01.23()(

005.0005.0912.0)(

10)4.13.02.18()(

00

600

6

0

60

A

S

f

Br

f

Br

f

Br

L

L

L

Super B 2020(?)

Page 13: Summary of  2 measurements at Super KEKB Hirokazu Ishino Tokyo Institute of Technology 19 Dec., 2006.

B→systematic errors

• Branching fraction– PDF shapes, B.G. fractions, track , 0 – assume PDF and B.G. errors reduce to 1/10– assume track and 0 reduce to half: still

dominant• assign track = 1%, 0 = 2%

• CP asymmetries– assign 1% error to both A and S

• fL

– the current error: PDF shape and B.G. fractions– assume those are reduced to 1/10

Page 14: Summary of  2 measurements at Super KEKB Hirokazu Ishino Tokyo Institute of Technology 19 Dec., 2006.

2 constraint with B→at Super B factory

without asymmetries in B→00

We definitely need the asymmetries in B→00 for more constraints.

2

1

Page 15: Summary of  2 measurements at Super KEKB Hirokazu Ishino Tokyo Institute of Technology 19 Dec., 2006.

B0→asymmetries

• With 50ab-1 data, we assume– number of signal events: 5000– number of background events 22500

• assume the CP asymmetries of the main backgrounds such as continuum and a1 are well known.

• Toy MC using E and Mbc in the PDF

– (S)=0.10, (A)=0.08• Note: if we use LR (fisher discriminant), the error would be improved.• assume systematic error is much smaller than the statistics.

Page 16: Summary of  2 measurements at Super KEKB Hirokazu Ishino Tokyo Institute of Technology 19 Dec., 2006.

2 constraint with B→at Super B factory

2

1

dashed line: w/o 00 asymmetries

red solid line: w/ 00 asymmetries

9.02 @1

01.008.035.0)(

01.010.021.0)(00

00

A

S

Page 17: Summary of  2 measurements at Super KEKB Hirokazu Ishino Tokyo Institute of Technology 19 Dec., 2006.

0B

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B→at Super B factory

01.003.016.0)(

01.001.037.0)(

01.001.066.0)(

10)05.002.031.1()(

10)17.004.07.5()(

10)10.002.021.5()(

00

600

6

60

A

A

S

Br

Br

Br

Super B 2020(?)

The ambiguity can be reduced if we measure the mixing-induced CP violation parameter S00 in

B0→00 decays

Page 19: Summary of  2 measurements at Super KEKB Hirokazu Ishino Tokyo Institute of Technology 19 Dec., 2006.

B0→vertexing

• We need B0→00 decay vertex position• Use 0 Dalitz decay

– 0→e+e−

– but small B.R. of ~1.2%• photon conversion

– reconstruct a photon from a e+e− pair– B vertex reconstruction with the same technique

as KS

– Conversion probability ~3% per photon in the current Belle silicon detectorreconstruct photon track

from an electron-positron pair

the photon track is extracted to the IP position.

Page 20: Summary of  2 measurements at Super KEKB Hirokazu Ishino Tokyo Institute of Technology 19 Dec., 2006.

• generate 1M Geant MC events with Belle detector– 2.2% 0 Dalitz decay– 11.3% photon conversion – 0.2% 0 Dalitz + photon conversion

• reconstruction– one 0 from 2, the other 0 from + e+e− pair

• e+e− pair either from IP or V0finder

– B candidates within |E|<0.3GeV, Mbc>5.26GeV/c2

– require at least two hits in Silicon Vertex Detector (SVD)– reconstruction efficiency 1.4%– estimated signal events with vertex info. : 920 w/ 50ab-1 data

• Backgrounds estimated from Geant MC samples– +0: 300– continuum events: 20000

B0→event selection

Page 21: Summary of  2 measurements at Super KEKB Hirokazu Ishino Tokyo Institute of Technology 19 Dec., 2006.

B0→event selection

continuum suppression variable

signal+0

continuum

E, Mbc and LR are used for the fit to the time-dependent CP parameters.

signal+0

continuum

Toy MC projection plots

Page 22: Summary of  2 measurements at Super KEKB Hirokazu Ishino Tokyo Institute of Technology 19 Dec., 2006.

~120m ~150m

B0→vertex resolution

z(CP,rec) - z(CP,gen) dz(CP-tag, rec) - dz(CP-tag, gen)

Page 23: Summary of  2 measurements at Super KEKB Hirokazu Ishino Tokyo Institute of Technology 19 Dec., 2006.

• Toy MC– # of signal =920– resolution function obtained from Geant MC

• previous page

– tagging efficiency 30%– B+→+0 300 events– e+e- →qq (q=u,d,s,c) continuum background:

20000 events.

• RMS of fitted S00

– S00 = 0.23

B0→Toy MC

Page 24: Summary of  2 measurements at Super KEKB Hirokazu Ishino Tokyo Institute of Technology 19 Dec., 2006.

2 constraint with B→at Super B factory

01.023.080.0)(

01.003.016.0)(

01.001.037.0)(

01.001.066.0)(

10)05.002.031.1()(

10)17.004.07.5()(

10)10.002.021.5()(

00

00

600

6

60

S

A

A

S

Br

Br

Br

w/ S00 w/o S00

32

Page 25: Summary of  2 measurements at Super KEKB Hirokazu Ishino Tokyo Institute of Technology 19 Dec., 2006.

Theoreticaluncertainties on2

@CKM06

Page 26: Summary of  2 measurements at Super KEKB Hirokazu Ishino Tokyo Institute of Technology 19 Dec., 2006.

Summary

• 2 constraints at Super B factory

– B→• systematic error dominant: the size of total

error is 1/5 of the current Belle measurement.

• 2 ~ 2◯

– B→• systematic error dominant other than B0→00

• 2 < 1◯

– B→• systematic error dominant other than S00

• 2 ~ 3◯

• Theoretical uncertainty ~3◯, comparable with the experimental uncertainties

Page 27: Summary of  2 measurements at Super KEKB Hirokazu Ishino Tokyo Institute of Technology 19 Dec., 2006.

Back up

Page 28: Summary of  2 measurements at Super KEKB Hirokazu Ishino Tokyo Institute of Technology 19 Dec., 2006.

B→a

first tCPV measurements

additional constraints on (2) in near future!