Structure of thin films by electron diffraction János L. Lábár.
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Transcript of Structure of thin films by electron diffraction János L. Lábár.
![Page 1: Structure of thin films by electron diffraction János L. Lábár.](https://reader037.fdocuments.us/reader037/viewer/2022110206/56649d045503460f949d754e/html5/thumbnails/1.jpg)
Structure of thin films by electron diffraction
János L. Lábár
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Usage of diffraction data in structure determination
• Identifying known structures
• Solving unknown structures– Structure determination
• Unit cell dimensions• Space group symmetry• Unit cell content (atoms and their appr. coordinates)
– Structure refinement• More accurate atomic coordinates• Validation of the structure (attainable match)
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Structure determination• Periodic functions Fourier coefficients
– Amplitude : diffraction the phase problem
– Phase : real space (HRTEM, fragment)
reciprocal space (Direct methods)
• Single crystal diffraction– X-rays, neutrons electrons
• Powder diffraction– X-rays, neutrons electrons
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Single crystal diffraction
• Tilting experiments
• Identification of reflections: indexing– Unit cell dimensions– Space group symmetry (XRD, SAED, CBED)
• Integration of individual intensities– Background
• Phases (real reciprocal space)– Dynamic intensities in SAED
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Single crystal diffraction• XRD:
– Up to 2000 atoms in the asymmetric unit– Up to 100 atoms: guaranteed success– Rule of thumb: # refl > 10 * # atoms
• SAED:– CRISP, ELD Direct methods (EDM)– Dynamic intensities in SIR97– Up to 30 atoms in the asymmetric unit– Size, image
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Powder diffraction
• Collapse of 3D into 1D– Types:
• Equivalent reflections, multiplicity• Exact overlap: e.g. (43l) (50l) in tetragonal• Accidental: within instrumental resolution
– Indexing programs– Peak decomposition
• La Bail• Pawley
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Powder diffraction• Degree of overlap: Resolution
• Background
• Instability: negative peaks / oscillating int.
• XRD (+ refinement from neutrons) :– Synchrotron: 60 atoms in asymmetric unit– Laboratory: 30 atoms in asymmetric unit
• Neutron: better for refinement
• SAED: instrumental resolution limit, BKG
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Powder diffraction: SAED resolution (peak width)
• Beam convergence
• Elliptical distortion
• OL spherical aberration size of selected area
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Powder diffraction: SAED elliptical distortion
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Powder diffraction: SAED spherical aberration
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Powder diffraction: Pattern decomposition with ProcessDiffraction• Background
– Normal, log-Normal– Polynomial, Spline
• Peak shapes– Gaussian,
Lorentzian– Pseudo-Voigt
• Global minimum– Downhill SIMPLEX– Manual control
• Example: Al + Ge: SAED on film– Large crystal Al:
Gaussian– Small crystal Ge:
Lorentzian
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Pattern decomposition with ProcessDiffraction
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Structure refinement: The Rietveld method
• Start from assumed structure• Least-square fitting of whole-pattern• Fitting parameters:
– Scale-factor– Atomic positions– Temperature factors– Cell parameters– Peak shape parameters (instrumenal sample)– Background– Additional peaks (phase)
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The Rietveld method
• Most known structures from Rietveld refinement• Scaling factors Quantitative phase analysis
(volume fractions)• Neutrons: no angle dependence best for
refinement• Resolution (peak width) is less important
SAED can also be used efficiently for refinement• SAED: Cell parameters camera length
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Quantitative phase analysis for nanocrystalline thin films from SAED
• Example:
100 Å Al + 100 Å NiO
• Measured volume fraction by ProcessDiffraction: 51% Al + 49% NiO
• Fitted parameters: peak parameters, L, scaling factors, DW
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Structure refinement from SAED
• Integrated intensities:– ELD– ProcessDiffraction
• Refinement:– FullProf– ProcessDiffraction
• Simple example: TiO2 – Anatase– Selection of origin transform „z” before compare
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Structure refinement with ProcessDiffraction
• Structure definition modul– Checks: coordinates site symmetry
• Options modul checks – if selected site is „refinable” (variation of coordinate
value does not change site symmetry)– If selected options are reasonable
• Cross-checking for nanocrystalline samples– Pair correlation function (different models
measured)
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ProcessDiffraction: Options for refinement
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Structure refinement with ProcessDiffraction
• Example: Anatase 4 nm powder
• Acceptable match• Refined position of
oxygen: z=0.217• Compare to
z=0.2064 (Pearson’s)z=0.2094 (Weirich transformed)
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Is the example result acceptable?Independent test
• Pair correlation function– Measured– Calculated for
both structures
• Refined result is in agreement with g(r)
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Remarks to refinement
• Nanocrystalline films are strained
• Exact shape and size of the background is ambiguous in electron diffraction
• Refined position is also a function of refined cell dimensions (accurate calibration of camera length)
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Conclusions: structure of thin films by electron diffraction
• Phase identification from both single crystal and powder patterns
• Quantitative phase analysis from nanocrystalline powder patterns
• Structure determination from single crystal patterns (SAED, CBED)
• Structure refinement from nanocrystalline powder patterns
• Limits are still to be examined