Structure and magnetic properties of Fe- Cr-N sputter-deposited … · 2016. 7. 7. · Structure...

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See discussions, stats, and author profiles for this publication at: https://www.researchgate.net/publication/243287129 Structure and magnetic properties of Fe- Cr-N sputter-deposited films Article in Journal of Magnetism and Magnetic Materials · August 1997 Impact Factor: 1.97 · DOI: 10.1016/S0304-8853(97)00122-4 CITATIONS 9 READS 17 5 authors, including: Dong-Liang Peng Xiamen University 178 PUBLICATIONS 2,045 CITATIONS SEE PROFILE Available from: Dong-Liang Peng Retrieved on: 07 July 2016

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Page 1: Structure and magnetic properties of Fe- Cr-N sputter-deposited … · 2016. 7. 7. · Structure and magnetic properties of Fe-Cr-N ternary films prepared by DC magnetron facing-target

Seediscussions,stats,andauthorprofilesforthispublicationat:https://www.researchgate.net/publication/243287129

StructureandmagneticpropertiesofFe-Cr-Nsputter-depositedfilms

ArticleinJournalofMagnetismandMagneticMaterials·August1997

ImpactFactor:1.97·DOI:10.1016/S0304-8853(97)00122-4

CITATIONS

9

READS

17

5authors,including:

Dong-LiangPeng

XiamenUniversity

178PUBLICATIONS2,045CITATIONS

SEEPROFILE

Availablefrom:Dong-LiangPeng

Retrievedon:07July2016

Page 2: Structure and magnetic properties of Fe- Cr-N sputter-deposited … · 2016. 7. 7. · Structure and magnetic properties of Fe-Cr-N ternary films prepared by DC magnetron facing-target

ELSEVIER Journal of Magnetism and Magnetic Materials 172 (1997) 41-52

Structure and magnetic properties of Fe-Cr-N sputter-deposited films

D.L. Peng*, T.J. Konno, K. Sumiyama, H. Onodera, K. Suzuki Institute for Materials Research, Tohoku Universi@ Sendai 980-77, Japan

Received 27 January 1997

Abstract

Structure and magnetic properties of Fe-Cr-N ternary films prepared by DC magnetron facing-target sputtering have been investigated by X-ray diffraction (XRD), scanning electron microscopy (SEM), transmission electron microscopy (TEM), vibrating sample magnetometry (VSM) and Mossbauer effect. These films exhibit perpendicular magnetic anisotropy. We found that Nz-to-Ar flow ratio, Fe-Cr target area ratio and substrate temperature during film preparation are the factors influencing the anisotropy. Adjusting the chemical composition and deposition parameters, we obtained saturation magnetization of 300-400 emu/cm3 and perpendicular coercivity of 80&l 100 Oe. XRD measure- ments show that the films generally consist of the a-Fe(Cr) and y’-(Fe,Cr),N, (x < 1) phases, and that the enhancement of perpendicular anisotropy is always accompanied by a decrease in the grain size of cc-Fe(Cr) phase and growth of the y’-(Fe,Crk,N, phase with a pronounced (2 0 0) texture. The Mossbauer spectra show that the y’-(Fe, Cr)4N, phase is nonmagnetic at room temperature. Using the SEM and TEM, we found that the nonmagnetic y’-(Fe,Cr)4N, phase displays columnar growth and that the small ferromagnetic cc-Fe(Cr) grains of about 2-20 nm in diameter are located at grain boundaries of y’-(Fe,Crk+N, grains. Shape anisotropy seems to play an important part in the perpendicular magnetic anisotropy in these Fe-Cr-N films.

PACS: 75.70.Ak; 75.50.Bb; 68.55.Jk; 81.15.Cd

Kevwor&: Perpendicular magnetic anisotropy; Fe-Cr-N film; Sputter-deposition; Structure and morphology; Mos- sbauer effect

1. Introduction

In the past few years, there has been a great deal of interest in the study of ternary Fe-X-N (X = Zr,

*Corresponding author. Fax: + 81 22 215 2076; e-mail: [email protected].

Hf, Nb, Ta, Ti) systems [l-S]. This is because the third element X has strong affinity for nitrogen and ability of amorphous formation, and thus cause good soft magnetic properties, high saturation flux density, small magnetostriction and better thermal stability than binary Fe-N film. However, perpen- dicular magnetic anisotropy in Fe-based ternary nitride films has not been reported so far. Recently,

0304-8853/97/$17.00 0 1997 Elsevier Science B.V. All rights reserved PII SO304-8853(97)00122-4

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42 D.L. Peng et al. /Journal oj’Magnetism and Magnetic Materials 172 (1997) 41-52

Honda et al. reported that the addition of a nitro- gen gas during the deposition of Co-Cr films by sputtering has a remarkable effect on increasing perpendicular coercivity, HcI [9]. We reported that ternary Fe-Cr-N films deposited by DC reactive sputtering also show perpendicular magnetic an- isotropy [lo], and described detailed X-ray diffrac- tion studies and X-ray photoelectron spectra of these films [l 11.

Perpendicular magnetic anisotropy has been ob- served in binary Fe-Cr films [12, 133. In sputtered Fe1 _xCrx (x = 0.334.4) films, coexistence of Cr- rich and Fe-rich phases was detected by SEM and X-ray diffraction. The Fe-rich and Cr-rich BCC phase regions grow in the direction normal to the film plane and the nonmagnetic Cr-rich grains sep- arate the ferromagnetic Fe-rich grains. The perpen- dicular magnetic anisotropy is attributed to the shape anisotropy of the isolated ferromagnetic re- gions.

In this paper, we report in detail microstructure and magnetic properties of the Fe-Cr-N ternary films prepared by DC reactive sputtering. We show that the structure of the films and thereby the perpendicular magnetic anisotropy of these films depends sensitively on preparation conditions in- cluding nitrogen flow ratio, chemical composition and the substrate temperature.

2. Experimental

Fe-Cr-N films were deposited on glass and alu- minium foil substrates by facing-target-type DC magnetron sputtering in mixed Ar + Nz plasma, using a composite target consisting of pure Fe (99.9%) and Cr (99.9%) plates. The alloy composi- tion was adjusted by changing the Cr target area ration, Ac,, defined as Acr = [the area of Cr]/[the total area of Fe and Cr targets]. In order to obtain Fe-Cr-N films with various nitrogen contents, a Nz flow ratio, R(iV,) = [N,-flow rate]/[Ar-flow rate + N,-flow rate], was changed with mass flow controllers. The substrate temperature, Ts, during the sputtering deposition was kept at about 50°C by water cooling and at 150, 250 and 350°C by indirect resistive heating. The detail of sputtering conditions were described previously [lo]. The

chemical composition of deposited films was deter- mined by inductively coupled plasma (ICP) optical emission spectrometry and helium carrier fusion- thermal conductivity methods.

Structures of the films were analyzed by XRD. We used Rigaku 4037 XRD apparatus in the Bragg-Brentano geometry with Cu K, radiation monochromatized by a graphite crystal for the XRD study, while we employed Hitachi HF-2000 operating at 200 kV for the TEM study. The frac- tured cross-section morphology of the sputter-de- posited films was observed by a SEM. Miissbauer spectra were measured by a conventional multi- channel spectrometer in a transmission geometry with the incident y-rays perpendicular to the film planes. We used 57Co source in Rh matrix and calibrated the velocity scale using pure a-Fe. Mag- netic properties of the films were measured by a VSM in a magnetic field up to 16 kOe applied parallel or perpendicular to the plane of the films.

3. Results

3. I. Magnetic properties and structure

3.1.1. Effects of nitrogen Jlow ratio Fig. 1 shows (a) the saturation magnetization,

. MS, m-plane coercivlty, H, 11, and perpendicular co- ercivity, HcI, and (b) the nitrogen content, CN, of the Fe-Cr-N films sputter-deposited at Ts = 50°C and Acr = 33% as a function of R(N,). The ICP measurement showed that the ratios of Fe and Cr atoms in these films are not influenced by R(N,), being constant at about 77 : 23. The MS value of the films decreases monotonically with increasing R(N,), but H, first increases and then decreases. Thus, there is a maximum in H, near R(N,) = 35%. Moreover, H,, is always larger than H,,, and it is about twice as large as H,II for R(N,) = 35%. As seen from Fig. lb, CN increases as R(N,) increases and is 18 at% at R(N,) = 40% for A,, = 33%. This value is slightly smaller than the theoretical nitro- gen content, 20 at%, of stoichiometric y’-Fe,N.

The XRD patterns of these films are shown in Fig. 2. The films consist of a-Fe(Cr) and y’- (Fe,Cr)4N, (x < 1) phases [ll]. For the a-Fe(Cr) phase, (1 1 0) peak broadens and becomes smaller

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D.L. Peng et al. /Journal of Magnetism and Magnetic Materials 172 (1997) 41-52 43

- Target(&=33%) _ Water-cooled substrate

600

0' I

0 N2 flow ratio, R&) (%)

40

Fig. 1. (a) Saturation magnetization, Ms. and in-plane coercivity, If,,,, and perpendicular coercivity, HcI, and (b) nitrogen content of the FeeCr-N films deposited at Ts = 50°C and Acr = 33% as a function of R(N,).

as R(N,) increases. This indicates that the size of c+Fe(Cr) grains becomes smaller as R(N,) increases. For the y’-(Fe,Cr),N, phase, the intensity of the (2 0 0) peak becomes larger and the (2 0 0) texture becomes more pronounced as R(N,) increases [ll]. At R(N,) = 40%, the cr-Fe(Cr)(l 1 0) peak is neg- ligibly small, indicating that the film mainly con- sists of the y’-(Fe,Cr),N, phase.

In order to further explain the change in the saturation magnetization described in Fig. 1, we measured Miissbauer spectra of these films at room temperature as a function of R(N,). Fig. 3 shows that the Mossbauer spectra of the films consist of

a ferromagnetic sextet and a paramagnetic doublet, corresponding to the c+Fe(Cr) and the y’- (Fe,Cr),N, phases, respectively. As shown here, the peak area of the sextet becomes smaller, while that of the doublet becomes larger with increasing R(N,). For the film made at R(N,) = 40%, the sextet is almost undetectable. These changes in the Mijssbauer spectra agree with the XRD results shown in Fig. 2. In addition, the peaks at about + 2.5 mm/s for the films deposited at R(N,) =

30% and 35% disappear almost completely. This also indicates that the films have strong perpen- dicular magnetic anisotropy.

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44 D.L. Peng et al. 1 Journal of Magnetism and Magnetic Materials I72 (1997) 41-52

Fig. 2. X-ray diffraction patterns of the Fe-Cr-N films depo- sited at Ts = 50°C and & = 33% with different R(N,).

3.1.2. Efsects of Cr contents Fig. 4 shows (a) MS, H,,,, and HcI and (b) the

Cr content, CCr, of the films deposited at TS = 50°C and R(N,) = 30% as a function of A,-,. The ICP measurement showed that the nitrogen contents in these films are about 11 at%. MS decreases rapidly with increasing Acr and becomes almost zero at & = 40%. On the other hand, H, first increases and then decreases with increasing Ac, Note that, for the film deposited at A,, = 35% with Cr con- tent Ccr = 25 at%, HcI is much larger than H,,,, displaying perpendicular magnetic anisotropy.

The XRD patterns of the films are shown in Fig. 5. As can be seen here, the films deposited at Acr = 33 and 35% exhibit broad cl-Fe(Cr)(l 10) peak and strong y’-(Fe,Cr),N,(2 0 0) peak, indicat- ing that these films are composed of a fine grain a-Fe(Cr) phase and the y’-(Fe,Cr),N, phase with a pronounced (2 0 0) texture. On the other hand, the film deposited at Acr = 40% which has the MS value of about zero (Fig. 4) is almost entirely composed of the single y’-(Fe,Cr),N, phase. There- fore, we can consider that the y’-(Fe,Cr),N, phase is

l.St_i ,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,, i_l

-8 -8 -4 -2 0 2 4 8 8

Velodty (mm/s)

Fig. 3. MGssbauer spectra of the Fe-Cr-N films deposited at Ts = 50°C and & = 33% with different R(N,).

paramagnetic. This result is also in agreement with the results of the Mossbauer spectra.

3.1.3. Effects of substrate temperature Fig. 6 shows the TS dependence of MS, H,II, and

HGI of the films deposited at R(N,) = 35% and Acr = 33%. The magnetic properties of the films change drastically around Ts = 250°C. HcI and H,,, increase and MS decreases with increasing Ts up to T,r250”C. At Ts = 25o”C, HcI is about three times as large as H,,,. However, above TS z 25O”C, H, decreases and MS increases rapidly.

Fig. 7 shows XRD patterns of the films deposited at different TS. The films deposited below Ts = 250°C show weak and broad a-Fe(Cr)(l 10) peaks combined with strong y’-(Fe,Cr),N,(2 0 0) peaks, indicating that the grain size of the a-Fe(Cr) phase is small. At TS = 35O”C, however, the (1 10) peak of a-Fe(Cr) phase becomes larger and sharper,

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D.L. Peng et al. J Journal of Magnetism and Magnetic Materials 172 (1997) 41-52 45

MS

Hell Hcl

l-

1 I I ,

30 Cr target are8Yrati0, kr (%)

40

Fig. 4. (a) Ms. H,,, and H,, and (b) the Cr content of the Fe-Cr-N films deposited at Ts = 50°C and R(N,) = 30% as a function of Ac,.

while the (2 0 0) peak of the y’-(Fe,Cr),N, phase becomes smaller.

These results indicate that the amount and grain size of the cl-Fe(Cr) phase increase with substrate temperatures above 250°C.

3.1.4. Eflect of nitrogen flow ratio at T, = 250°C Thus, the substrate temperature of 250°C seems

to be optimum for depositing films with large per- pendicular anisotropy. We therefore further exam- ined the effect of N2 flow ratio on the magnetic properties of the films deposited at Ts = 250°C. Fig. 8 shows the R(N,) dependence of MS, HCl and HCII for the Fe-Cr-N films prepared at Ts = 250°C

and Acr = 33%. With increasing R(N,) from 20 to 35%, MS decreases and H, increases. These features can be ascribed to the increase in the amount of the nonmagnetic y’-(Fe,Cr)4N, phase with increasing R(N,). Moreover, MS and H,* change drastically around R(N,) = 25%, while the change in H,a is only gradual, resulting in the strong perpendicular anisotropy above R(N,) = 25%.

As shown in Fig. 9, corresponding to the change in MS and H, with R(N,), the XRD patterns for the samples with R(N,) c 25% clearly show the (2 0 0) peak of the c+Fe(Cr) phase and only a moderate (2 0 0) texture of the nonmagnetic y’-(Fe,Cr)4N, phase. In addition, a diffraction peak at around

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46 D.L. Peng et al. /Journal of Magnetism and Magnetic Materials I72 (1997) 41-52

20 = 61”, which is not that of the fine-crystalline cl-Fe(Cr) and the y’-(Fe,Cr),N, phases, indicates that the grain texture is inhomogeneous. However, when R(N,) > 25%, the XRD patterns show the

strong (2 0 0) texture of the y’-(Fe,Cr),N, phase and almost no c+Fe(Cr)(2 0 0) peak. These results sug- gest that the appearance of the large perpendicular magnetic anisotropy in the Fe-Cr-N films is

L-J-- 30%

I * 1. 1 . 20 40 80 Km

28 &gree)

Fig. 5. X-ray diffraction patterns of the Fe&Z-N films depo- sited at Ts = 50°C and R(N,) = 30% at different Acr.

Target(Aa;;33%)

I I I I

20 40 28 (d&ree)

80 100

Fig. 7. X-ray diffraction patterns of the Fe-Cr-N films depo- sited at R(N,) = 35% and Ac, = 33% as a function of Ts.

Fig. 6. Ms. H,II and H,I of the Fe-Cr-N films deposited at R(N,) = 35% and & = 33% as a function of Ts.

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D.L. Peng et al. J Journal of Magnerlsm ana Magnenc Malerlals I IL (IYY/) 41-3~

o- 1200 , E I I I _ Y - Target(@33%) - 1ocM

- 800 3 e

- 600 4 A p

- 400 ‘2

$ u

- 200

B z 0 ’ I I I 0

20 N2 F& Ratio, R(N;; (9%)

35

Fig. 8. Ms. H,,, and H,, of the Fe-Cc-N films deposited at Acr = 33% and Ts = 250°C as a function of R(N,).

R(N9=35% -

20 40 2e Gw=d

80 100

Fig. 9. X-ray diffraction patterns of the Fe-Cr-N films depo- sited at & = 33% and Ts = 250°C as a function of R(N,).

closely related to the amount of the (2 0 0) textured y’-(Fe,Cr),N, phase.

Fig. 10 shows the magnetization curves of the Fe-Cr-N films deposited at (a) Ts = 50 and

Fig. 10. Magnetization curves at room temperature in magnetic fields parallel and perpendicular to the film planes for the Fe-Cr-N films deposited at R(N,) = 35% and A-r = 33% at (a) Ts = 50°C and (b) Ts = 250°C.

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48 D.L. Peng et al. J Journal qf Magnetism and Magnetic Materials I72 (1997) 41-52

(b) 250°C with R(N,) = 35% and Acr = 33%. For the Fe-Cr-N film deposited at Ts = 50°C (Fig. lOa), HcI is twice as large as H,,, but the field dependence of residual magnetization in the per- pendicular direction (M,,) is the same as that in the in-plane (M,lt). In Fig. lob, however, the magnetiz- ation curve more easily saturates in the perpendicu- lar direction than in the in-plane direction and HCI is much larger than HCII for the FeeCr-N film deposited at Ts = 250°C.

3.2. Structural observation by electron microscopy

In order to examine the origin of perpendicular magnetic anisotropy, we observed microstructures of the Fe-Cr-N films with large perpendicular magnetic anisotropy using SEM and TEM. Fig. 11

Fig. 11. Fractured cross-sectional SEM image of the Fe7,Cr,,Ng film deposited at T, = 25o”C, & = 33% and R(N,) = 25%.

shows a fractured cross-sectional SEM image of the Fe7iCr2eN9 film deposited at Ts = 250°C Acr = 33% and R(N,) = 25%. This picture clearly shows the columnar structure of the film.

To determine the distribution of the y’- (Fe,Cr),N, and cc-Fe(Cr) phases, we carried out a TEM study. Fig. 12 show plan-view and cross- sectional images of the film. The bright field images in Fig. 12a and d show that the film is composed mainly of the columnar grains of 2WlO nm in dia- meter. Fig. 12b and e show dark field (DF) images of the same area obtained with the objective aper- ture set at the (2 0 01 position of the y’-(Fe,Cr),N, phase. These pictures demonstrate that the colum- nar grains of about 20-40 nm in diameter are com- posed of the y’-(Fe,Cr),N, phase, even though their orientations are not fixed throughout a column. Fig. 12c and f show DF images of the same area with the aperture set at the (1 1 0) position of the rx-Fe(Cr) phase. These pictures show that the fer- romagnetic a-Fe(Cr) grains have a pin-like shape with a size distribution of about 2-20 nm in dia- meter, and are distributed or ‘segregated’ at the grain boundaries of the columnar y’-(Fe,Cr),N, phase. Therefore, the shape anisotropy seems to play an important role in the perpendicular anisot- ropy of the Fe-Cr-N films.

Fig. 13 is diffraction patterns of the same film taken from (a) plan-view and (b) cross-sectional sample. The spots in the latter arises from the Si substrate. All the diffraction rings can be identified with either the y’-(Fe,Cr),N, or the c.+Fe(Cr) phase. For example, the rings 1,3 and 5 are { 1 1 l}, (2 0 O> and {2 2 O> of the y’-(Fe,Cr),N, phase, respectively, while the rings 2 and 4 are (1 1 O> and (2 0 0) of the cx-Fe(Cr) phase, respectively. The cross-sectional diffraction pattern clearly show that the y’- (Fe,Cr),N, and c+Fe(Cr) phases possess pro- nounced (2 0 0) and (1 1 0) texture, in agreement with the XRD results.

4. Discussion

According to the results described in the pre- vious sections, the quality of the perpendicular magnetic anisotropy of the Fe-Cr-N films strongly depends on the deposition parameters R(N,),

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D.L. Peng et al. 1 Journal of Magnetism and Magnetic Materials I72 (1997) 41-52 49

Fig. 12. TEM images of the Fe,,Cr,,N, film deposited at Ts = 25o‘C. & = 33% and R(N,) = 25%. (aHc) are plan-view BF. DF (y’-(Fe,Cr).,N, phase) and DF (r*-Fe(Cr) phase). respectively, while (dHf) are the same set images of the cross-sectional specimen.

Acr and Ts. The increase of R(N,), Act and Ts ( < 25OC) all causes the increase in the amount of the y’-(Fe,Cr)4N, phase and a decrease in the size of the a-Fe(Cr) pin-like crystalline grains, and thus also results in the decrease in Ms. On the other hand, the change in H, is complicated because it involves the uninterrupted decreasing of the fer- romagnetic rx-Fe(Cr) grain size with increasing the amount of the y’-(Fe,Cr),N, phase. As described in Fig. la, H, first increases and then decreases, and a maximum in H, appears around R(N,) = 35%. The XRD patterns (Fig. 2) show a tendency of the decrease in the size of the rx-Fe(Cr) crystal grains as R(N,) increases. The cross-sectional TEM images also show that the size of most of the cl-Fe(Cr) grains along the in-plane direction is 2-10 nm in the Fe-Cr-N film at R(N,) = 25%. Therefore, it can be said that very small cl-Fe(Cr) grains formed

in the film deposited at R(N,) = 40% have shape anisotropy and show superparamagnetism. Fig. 14 shows the magnetization curves at room temper- ature and 4.2 K for the films deposited at Ts E 50°C and at (a) R(N,) = 35% and (b) 40%, respectively. At room temperature, the coercivity (H,, = 580 Oe) of the film deposited at R(N,) = 35% is larger than that (H,, = 345 Oe) of the film depos- ited at R(N2) = 40%, while the results obtained at 4.2 K are on the contrary (H,, = 700 Oe for R(N,) = 35%; HcL = 750 Oe for R(N,) = 40%). Moreover, the magnetization at 4.2 K under ap- plied field of 10 kOe is about twice of that at room temperature for the film deposited at R(N,) = 40%, while the ratio of the magnetization at 4.2 K to that at 300 K is small for the film deposited at R(N,) = 35%. These results suggest that the fine- crystalline a-Fe(Cr) in the Fe-Cr-N film deposited

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50 D.L. Peng et al. J Journal qf‘Magnetism and Magnetic Materials I72 (1997) 41-52

Fig. 13. Electron diffraction pattern of the film shown in Fig. 12. (a) Plan-view specimen and (b) cross-sectional speci- men. The spots in the latter arise from the Si substrate. The diffraction rings are: 1, 3 and 5 for (I I 1 j. (2 0 0) and 12 2 0) of the y’-(Fe,Cr),N, phase, respectively. and 2 and 4 for f 1 1 0) and 12 0 O] of the a-Fe(Cr) phase, respectively.

at R(N,) = 40% has a size distribution and very small a-Fe(Cr) grains display the superparamag- netism. The a-Fe(Cr) crystallite size decreases and the amount of the nonmagnetic y’-(Fe,Cr)4N, phase increases with increasing &NJ, accom- panied by the decrease of the saturation magnetiz- ation. Therefore, we can suggest that the Fe-Cr-N films with large perpendicular anisotropy and large

- Target(&=33%) ‘Is=50°c

1 R(N9=35% p 50_

3

Target(A,=33%) Ts=50°c

R(N,)=40%

t

(4

- 3OOK, Hcl=58OOe

‘----- 4.2K, Hcl=7OOOe

,’ , L$ , ,I’ ,

- 300K, Hcl=3450e

----- 4.2K, Hck7500e __

1.. . I . . *

-10 -5 Magnetic :eM

5

(kOe)

Fig. 14. Magnetization curves at room temperature and 4.2 K in magnetic fields perpendicular to the film planes for the Fe-Cr-N films deposited at Ts = 50°C and Acr = 33% at (a) R(NZ) = 35. (b) 40%.

Ms will be obtained if the size of the cl-Fe(Cr) crystallites is above the critical value at which superparamagnetic particles become ferromag- netic.

Finally, it is worth mentioning the effect of film thickness on the magnetic properties of the Fe-Cr-N films. Fig. 15 shows Ms, H,, and H,,I of the Fe-Cr-N films deposited at Ts = 25O”C, Acr = 32% and R(N,) = 30% as a function of film thickness. The film thickness is estimated from the deposition rate and deposition time. This figure indicates that the strong perpendicular magnetic anisotropy appears when films are thicker than about 0.5 pm. The in-plane and perpendicular co- ercivities have a same trend with increasing the thickness: H, gradually increases up to 7 pm and then becomes constant above 7 pm.

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D.L. Peng et al. J Journal of Magnetism and Magnetic Materials I72 (1997) 41-52 51

Fig. 15. Dependence of Ms, H,,, and HCL on deposition time and film thickness for the Fe-Cr-N films deposited at Ts = 25O”C,

Film Thickness (pm) 500° 1 2 3 4 5 6 7 8 9 10 11 12

, , , , , , , , , , , , Target(&32%) -

13=250°c 1000

=. 400 - R(N2)=30%

- 800 3 ov u

- 600 = 2

.z

- 400 ‘E 8

u

B d O.

I I I I I I I I I I, I. 0 50 100 150 250 300

Deposition Time $&)

& = 32% and R(N,) = 30%

The crystallized y’-(Fe,Cr),N, phase is essential for induction of the perpendicular anisotropy in the Fe-Cr-N ternary system. This phase is nonmag- netic, cutting off the exchange interaction between the ferromagnetic c+Fe(Cr) phases. As can be seen in Fig. 14, the perpendicular magnetic anisotropy is still retained at 4.2 K. Therefore, it can be con- sidered that the y’-(Fe,Cr),N, phase is still non- magnetic in Fe-Cr-N films deposited under this experimental conditions.

5. Conclusion

Ternary Fe-Cr-N films with large perpendicular magnetic anisotropy have been obtained by a react- ive sputtering (Ar + Nz mixture) using a facing target sputtering system. The Fe-Cr-N films con- sist of a mixture of the a-Fe(Cr) and y’-(Fe,Cr),N, (x < 1) phases, whose volume fraction depends on the deposition parameters R(N,), Acr and Ts. In particular, the Fe-Cr-N films with large perpen- dicular anisotropy are composed of the nonmag- netic y’-(Fe,Cr),N, phase which has a strong (2 0 0) texture and the ferromagnetic a-Fe(Cr) phase which has the pin-like shape grains with a size

distribution of about 2-20 nm in diameter located at the grains boundaries of the y’-(Fe,Cr),N, phase. The origin of the perpendicular anisotropy is as- cribed to the shape anisotropy of the c+Fe(Cr) fine grains.

Acknowledgements

The authors thank Dr. T. Takada and Mr. Y. Murakami for their help in the chemical analysis and Mr. T. Kamaya for the SEM observation. One of the authors (D.L.P) appreciates the financial support from the Ministry of Education, Science, Culture and Sports, Japan. This work was also partially supported by Grant-in-Aid for General Scientific Research (No. 08405043) given by the Ministry of Education, Science, Culture and Sports, Japan.

References

[l] N. Ishiwata, C. Wakabayashi, H. Urai, J. Appl. Phys. 69 (1991) 5616.

[2] K. Nakanishi, 0. Shimizi, S. Yoshida, J. Magn. Sot. Jpn. 15 (1991) 371.

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52 D.L. Peng et al. /Journal of Magnetism and Magnetic Materials I72 (1997) 41-52

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