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Transcript of State Scientific Center of Russian Federation Institute for Theoretical and Experimental Physics (...
State Scientific Center of Russian Federation
Institute for Theoretical and Experimental Physics( ITEP )
FAIR meeting on 19 March 2009 (Protvino)
FAIR. Expression of interest from ITEP
SIS 300 beam diagnostics
FAIR meeting on 19 March 2009 (Protvino)
Diagnostic elementsComfort' In house' In collaboration'
SIS 100 BPM 50% 50%Closed orbit feedback 10%Wall current monitor 50%Ionization profile monitor 60%SEM grid 50%
SIS 300 BPM 50% 50%Wall current monitor 50%Ionization profile monitor 60% >60%SEM grid 50% >50%
CR BPM 50%Wall current monitor 50%
Ionization profile monitor 40%SEM grid 50%
RESR BPM 50%Ionization profile monitor 40%
HESR BPM 50%
---+++
>50%
FAIR meeting on 19 March 2009 (Protvino)
Beam position monitor challenges Wide range of currents Tight requirements for position accuracy for intense
beams – Δx < 0.1mm, x = ±100mm
Beam position monitor features A special attention to pick-up construction Careful design of front-end electronics
FAIR meeting on 19 March 2009 (Protvino)
BPM Applications
distortion
SIS100/300Turn-by-turn variation of any bunch in the train
Closed orbit feedback
Bunch-by-bunch operation to get a distinguish between bunches
reaction
Lattice function
FAIR meeting on 19 March 2009 (Protvino)
Example of a electrode arrangement for a linear-cut BPM and the scheme of the position determination.
FAIR meeting on 19 March 2009 (Protvino)
BPM electronics
Fast orbit correction
module
Fast longitudinal correction
module
Data concentrator5.4 MSPS per module
Data router
RAW data from selected chanels
On-line orbit analyzers
84(SIS100)/76(SIS300) modules
Visualization
~1.5GB/sec
Orbit correction
module
ITEP
800 MB/sec per module
BP
M a
nten
nas
Ana
log
fron
t-en
d
Dig
itize
rs a
nd
prim
ary
data
an
alys
is m
odul
es
FAIR meeting on 19 March 2009 (Protvino)
BPM basestation with analog front-end
FAIR meeting on 19 March 2009 (Protvino)
BPM timetable(rough estimation)
1469,2
I II III IV I II III IV I II III IVCommon technical requirements formulation 5Detailed technical requirements formulationBase station prototype design (10 prototypes)Base station firmware designBase station test on ITEP synchrotronBase station test on SIS18 (GSI)Base station design optimisationBase station manufacturing SIS100 & SIS300 (84+76+10%)System integrationOn-line orbit analyser preliminary designOn-line orbit analyser basic algorithms developingOn-line orbit analyser design optimisationOn-line orbit analyser manufacturing SIS100&SIS300 ->6User interface development
Software:Xilinx ISE 9.2 5Analog Device Visual DSP++ 5.0 2IAR Embedded WorkBench for ARM 2,7Boland Delphi for Windows 0,5OrCAD 16.0 (Capture+Pspice+PCB Designer) 15
Equipement:Oscilloscope TDS 15Development tools (eval. Boards, programmers etc.) 12
Transportation cost: 1 22
Consumables: 5Overheads: 10 10
10
9
15
15
12
1080
1620
6
660
264,2 1190
10015
5
10
FAIR meeting on 19 March 2009 (Protvino)
Ionization profile monitor Advanced concept with high resolution and
fast profile measurements IPM is a subject of GSI-ITEP collaboration
FAIR meeting on 19 March 2009 (Protvino)
Ionization profile monitor. Fast profile readout.
FAIR meeting on 19 March 2009 (Protvino)
Permanent magnet quadrupole at one of the ITEP synchrotron output
channel
Tuning plungerQuadrupole
lens
Drift tube
Cavity shellPost coupler
Tuning plungerQuadrupole
lens
Drift tube
Cavity shellPost coupler
Examples of ion beam optic elements constructed in ITEP on the base of permanent magnets
PM Lens design and rods magnetization scheme for 352 MHz Prototype Alvarez DTL
Tank for the CERN SPL
Secondary emission monitor
FAIR meeting on 19 March 2009 (Protvino)
Construction drawing (overview from the front side) of a typical profile grid. To reduce the number of required signal processing channels, a larger spacing outside the center has been chosen.
Roughly estimated number of secondary electrons per incident ion with the energy of incident ion as a parameter. The data have been scaled ~z1.5 from various data found in the literature
FAIR meeting on 19 March 2009 (Protvino)
SEM-grid timetable(rough estimation)
Common technical requirements formulation* 5Detailed technical requirements formulation*Prototype developing*Firmware preliminary design*Prototype test on SIS18(GSI)*Design correctionManufacturing of 8 units (SIS300+25% only)System integrationUser interface developing*SEM-grid thermal and mechanical behaviour simulation*Mechanical construction developingMechanical construction design and test (8 modules)delivering and installation
Software:COMSOL Multiphysics* 10Microsof Visual Studio* 5MATLAB* 12
EquipementCompact PCI Modules 72Development tools 10
Transportation costConsumables 1 1 1Overheads 5 5 5
Total 397* Costs are shared between SIS100 and SIS300 Cost Book 360
1020
2020
1015
1015
10
1520
9010
FAIR meeting on 19 March 2009 (Protvino)
Wall Current Monitor
Scheme of an inductive wall current monitor and the realization for CERN LINAC 2
The realization of a wall current monitor at a Ø 40 mm beam pipe
for CTF
FAIR meeting on 19 March 2009 (Protvino)
I II III IV I II III IV I II III IVCommon technical recuirements formulation* 5Detailed technical requirements formulation*Computer simulation of a detector*Technical drawing of a detector*Detector manufacturing and testElectronics. Analog part designSimulation and prototyping*manufacturingElectronics. Digital part designSimulation and prototyping*manufacturingfirmware developing*interface software developing*delivering and installation
SoftwareXilinx ISE 5 *IAR ARM Workbench 5 *
Equipement5GSPS Oscilloscope 15 *Network analyser 17 *Spectrum analyser 17 *
FPGA development tools (hardware) 2
Transportation cost 1,5Consumables 1 1 1Overheads 3 3 3
Total: 209,5* costs are shared between SIS100 and SIS300 Costbook: 150
10
1020
105
530
1510
105
WCM electronics timetable(rough estimation)
FAIR meeting on 19 March 2009 (Protvino)
Diagnostic elementsComfort' In house' In collaboration'
SIS 100 BPM 50%Closed orbit feedback 10%Wall current monitor 50%
Ionization profile monitor 60%SEM grid 50%
SIS 300 BPM 50% 50%Wall current monitor 50%Ionization profile monitor 60% >60%SEM grid 50% >50%
CR BPM 50%Wall current monitor 50%Ionization profile monitor 60%SEM grid 50%
RESR BPM 50%Ionization profile monitor 60%
HESR BPM 50%
---++
+
>50%
FAIR meeting on 19 March 2009 (Protvino)