WBUT - Applied Electronics & Instrumentation Engineering Syllabus Old
SOPHISTICATED INSTRUMENTATION CENTRE FOR APPLIED ...
Transcript of SOPHISTICATED INSTRUMENTATION CENTRE FOR APPLIED ...
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SOPHISTICATED INSTRUMENTATION CENTRE FOR APPLIED RESEARCH
AND TESTING (SICART )
(Sponsored by Department of Science and Technology, Govt. of India, New Delhi)
Sardar Patel Centre for Science and Technology
Vallabh Vidyanagar- 388120,
Dist: Anand, Gujarat, India
Phone: +91-2692-234966 Fax: +91-2692-238355
E-mail: [email protected] Website: www.sicart.res.in
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Inauguration Picture of SICART
Major Objectives of SICART
Vision: To serve the industry and academic institutes persuing scientific research for building a better society by providing total scientific solutions.
Mission:
To bridge the gap between industries and academic research institutes by
spreading awareness of the importance of Material Analysis.
SICART is committed to the pursuit of excellence and its objectives are:
1. To provide instrument facilities to Research Institutions, Universities and Industries
within and outside Gujarat state.
2. To help and provide Consultation/R&D facilities to nearby industries.
3. To establish linkages with various National level and other reputed laboratories so
as to collaborate in research projects.
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4. To help industries in developing indigenous instrumentation systems/products for
measurement, calibration and testing and issuing certification on the quality of raw
materials and products.
Authorization
1. Sophisticated Analytical Instruments Facility Supported by
Department of Science & Technology (Govt. of India)
2. Recognized by DSIR as a Research Centre
3. Recognized by Gujarat Pollution Control Board as External
Environmental Auditor, Schedule- I
4. Recognized by NABL
5. Recognized by Sardar Patel University as Research Centre for Ph.D.
study
List of Technical Staff
Sr. No.
Employee Name Designation Qualification
1 Prof. (Dr.) A. R. Jani
Hon. Director
M.Sc. (Physics) Ph.D. (Physics)
2 Dr. S. V. Patel
Sr. Scientific Officer
M.Sc. (Chemistry) Ph.D. (Polymer Chemistry)
3 Dr. M. P Patel
Jr. Scientific Officer
M.Sc. (Materials Science) Ph.D. (Materials Science)
4 Dr. K. K. Tiwari
Jr. Scientific Officer
M.Sc. (Environment Science) Ph.D. (Botany)
5 Dr. M. R. Tiwari
Jr. Scientific Officer
M.Sc. (Inorganic Chemistry) Ph.D. (Industrial Chemistry)
6 Dr. G. R. Chauhan
Jr. Scientific Officer
M.Sc. (Analytical Chemistry) Ph.D. (Chemistry)
7 N. B. Patel
Technician M.Sc. (Industrial Chemistry)
8 V. J. Patel
Technician M.Sc. (Solid State Physics)
9 Rima Sheth Technician M.Sc. (Analytical Chemistry)
10 V. A. Patel Technical Assistant
M.Sc. (Electronics)
11 Dhanvi Patel Technical Assistant
M. Sc. (Bio- Technology)
12 Dipen Patel Trainee Technician
M.Sc. (Analytical Chemistry)
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Sophisticated Instrumentation Facility Available in SICART
(1) Field Emission Gun Scanning Electron Microscopy (FEG-
SEM)
Make: FEI Ltd Model: Nova NanoSEM 450
Resolution: 1.0nm at 15kV, 1.4nm at 1kV , 3.5nm at 100V,Accelerating
Voltage: 20V to 30kV, Beam current: upto
200nA Magnification: X25 to X10,00,000Field Emission Gun:Ultra-high
brightness Schottky emitter
(2) Environment Scanning Electron Microscope with EDAX
Philips, Holland, ESEM TMP+EDAX
Emission Current: 0 to 200 µA, Accelerating Voltage: 0.2 to 30 kV, Resolution with
Tungsten filament 3.5 nm at 30 kv, Magnification 10x to 400000x, Automatic scaled
micron marker, Specimen movement: X = 50 mm, Y = 50 mm, Secondary and
Gaseous Secondary with Energy Dispersive X- ray Analysis (EDAX) for qualitative
element analysis
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(3) Transmission Electron Microscope (TEM) 200 kV
Technai-20, Phillips, Holland
Electron Source: LaB6 and Tungsten Filament, Accelerating Voltage
Point Resolution: 0.27nm, Magnification: 25x to 7,50,000x,
Single tilt sample holder with CCD Camera (Ultra microtome and Ultra Cutter for
sample Preparation)
(4) Inductively Coupled Plasma Spectrometer (ICP-OES)
Perkin Elmer,USA, Optima 3300 RL
Simultanious detection ,RF frequency:40MHz,RF power:750 to 1500 watts,Pump: 3
channel peristaltic pump 0.2 to 2.5 ml/m,spectrometer:6000pixel SCD Detector ,5000
Emission line resolution,Range:165 to 782nm for UV & VIS,Results:60 elements can
be detected in 1 min.
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(5) X- Ray Diffractometer (XRD)
Philips, Holland, X-pert MPD
Source: Cu target X-Ray tube,X-Ray Power: 2KW,
Detector: Xe-filled Proportional detector,Software:JCPD data base for powder
diffractometry,2 theta Measurement range: 2 to 136, Diffractometer radius: 130 to
230mm
(6) Wavelength Dispersive-X-Ray Fluorescence (WD-XRF)
Description: 4Kw, WD-XRF sequential basic system, X ray tube: Ultra thin Be
window (75µm) Detectors: Scintillation and flow counter detection Software:
Omnian software, TOXAL module, WROXI Mineral and mining Modules.
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(7) 400 MHz FT-NMR Spectrometer (FT-NMR)
Model- Bruker, Switzerland, Avance III, Topspin 2.1
Liquid and Solid multi nuclei probe
Low-Temperature Facility (Range up to -800C)
Timing Resolution 12.5 ns, Minimum event time 25 ns, Single Chip RF generation,
Highest Phase resolution (0.0055°), Highest Frequency resolution (0.005 Hz)
Solid nuclei(31P ,29Si ,23Na ,27Al ,51V ,71Ga ,119Sn ,201Pb )
Useful for structure identification of organic, inorganic and polymer compound.
(8) Fourier Transform Infrared Spectrometer (FTIR)
Perkin Elmer,USA:Spectrum-GX
FTIR Spectrometer: Normal range: 4000-400cm-1
Operating Mode:MIR and NIR (Absorbance, Transmittance and Reflectance )
Scanning range: 15600-30cm-1
Scan time: 20scan/second
Resoluiton:0.15cm-1
Single Beam/Ratio:Single,Ditector:MIRTGS
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(9) UV-VIS-NIR Spectrometer
Model-Perkin Elmer, USA, Lambda 19
Wavelength Range: 185-3200 nm for Absorbance/Transmission and 200-2500 for
Reflectance
Double Beam, Double Monochromator, Ratio Recording
Lamp: Deuterium (UV), Tungsten-Halogen (VIS/NIR)
Detectors: Photomultiplier tube for UV/Vis
Solid sample attachment: Lead-Sulphide cell (PbS) for NIR
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(10) LC-MS-MS (LCQ Fleet, TSQ Quantum Access)
Thermofisher scientific, USA
LCQ fleet and TSQ Quantum Access: ESI and APCI Source Quantum with HPLC
System
Mass range: LCQ Fleet: 50-2000 Daltons, TSQ-30-3000 Daltons
Pump: dual piston delivery system, built-in vacuum degasser.
Pressure range: 0 to 5800 PSI (0 to 400 bar) at flow rates up to 2 ml/min.
Operating temperature: 10°C to 40°C. Quaternary low pressure system.
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(11) High Performance Liquid Chromatograph (HPLC)
Perkin Elmer, USA, Series-200
Quaternary gradient system ,flow rate 0.1 to 10ml/min variable operating back
pressure 5000psi,C-18,C-8 column, Detectors: Photo Diode Array (PDA
),range:190nm to 800nm,UV-VIS:190nm to 800nm,Flurescence Detector;range-
200nm to 900nm,sensitivity range 0.0001 to 2.0 AUS
(12) Gel Permeation Chromatography (GPC)
Perkin Elmer, USA, Series-200:
Determinations of Molecular weight of Polymer samples (Mn & Mw), Polydispersity.
Column: PL gel, Mixed-B, Mixed-D.
Molecular Weight distribution (range: 500-300000gm/mol)
Detector: Refractive Index (RI)
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(13) High Performance Thin Layer Chromatograph (HPTLC)
Camag-Switzerland WinCat
Automatic applicator (Linomat-5) of selectable sample volume. GMP, GLP compliant
image plate scanner-3 and documentation (reproster-3) system.Scane range :( 190nm
to 800nm) Deuterium lamp tungsten lampand mercury lamp.
(14) Ion Chromatography (IC)
Dionex Dx – 600 IC System,
Electrochemical and absorbance detector
For sample separation of ions from one another, lanthanides, sugars, amino acids etc
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(15) Gas Chromatography with Head Space
Perkin Elmer, USA, Auto System XL
Detector: FID (100 oC - 450oC), TCD (100 oC - 350oC) Detector, NPD and ECD,
Auto sampler
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(16) Gas Chromatograph with mass spectroscopy (GC-MS)
Perkin Elmer, USA, System XL with NIST Library
Analyser: Single Quadrupole with prefilter, Mass range: 20-650 Daltans (amu), Mass
stability:0.1m/z mass accuracy over 48 hours, Ionization modes: electro ionization
positive / negative, chemical ionization.
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(17) Particle Size Analyzer (PSA)
Symantec-HELOS-BF, Germany
Laser Diffraction particle size determination system
Particle size range:0.5µm to 875 µm
Accuracy for Dry and Liquid sample
(18) CHN/S/O Elemental Analyser
2400 Series II, Perkin Elmer, USA,
Analyzed Elements: Carbon, Hydrogen, Nitrogen, Sulfur and Oxygen; Operating
Mode: CHN, CHNS and OXYGEN, Accuracy: 0.3 % abs, Analysis Time: 6 to 8
minutes per sample
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(19) Thermal Analysis (DSC, TGA, STA)
Perkin Elmer, USA, (DSC-PYRIS-1; TGA-7)
Temperature Range: DSC (0°C to 400°C)
TGA (RT to 1000°C)
Sensibility: 0.1 gm (0.0001 mg)
Atmosphere: Nitrogen or Air
(19) STA
Perkin Elmer, USA.
Model- STA 8000.
Specification - Simultaneous analysis of TG with DTA mode and DSC.
Temperature-30°C to 1000°C
Atmosphere: Nitrogen.
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(20) Mercury Porosimeter
ThermoQuest, USA, 440 & 140 with ultra Micropore
Operating Pressure:0.1to 400 Mpa,
Measuring Range for Pore Radius:
Pasal 140:1900 to 58,000 nm
Pasal 440: 31.8 to 7,500 nm
(21) Universal Testing Machine (UTM)
Shimadzu, Japan, AG 100 KNG
Capacity:100KN (10000 kgf),Load measuring accuracy :+0.5% of indicated load
,cross head speed range:0.05 to 1000mm/min,Cross head speed precision: :+0.1
,Effective test width :575nm,Load cell of 100KN,1kgf.
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(22) Total Organic Carbon (TOC) Analyzer
Shimadzu, Japan, TOC-VCSN/TNM-1
Measurement range: Total Carbon: 0 to 25000 mg/l; Inorganic Carbon: 0 to 3000
mg/l; Total Nitrogen: 0 to 4000 mg/l; Measurement Time: 10 minute per sample
(23) Micro Hardness Tester (MHT)
Shimadzu, Japan, HMV-2T
Maximum load: 19.61 N, Test load range: 10 to 2000 gf in 9 steps. Load duration: 5
second to 999 seconds in 1 sec increment High test measuring accuracy: 0.01 µ
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(24) Laser Flash Thermal Diffusivity
NETZSCH, Burlington-MA USA
Temperature Range: Ambient to300 Deg., Standard sample Size: 12.7 mm Diameter.
Thermal Diffusivity Range: 0.001 to 10cm²/S.
Laser Type: Nd glass
Accuracy: Thermal Diffusivity and Specific Heat: +/- 5%
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(25) Ambient Air Quality Monitoring Mobile Van
(Environnment SA, France)
Measurement of Carbon monoxide, Total hydrocarbons, Oxides of nitrogen, Ozone,
Particulate matter, Sulphur dioxide and meteorological parameters
Environmental Analysis/ Monitoring/ Auditing Facilities
Water and wastewater analysis
Solid waste and soil analysis
Stack pollution monitoring
Environmental Audit and Environmental Consultancy Services
Environmental Research & Development
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Contact for more information:
Prof. (Dr.) A. R. Jani, Hon. Director
SOPHISTICATED INSTRUMENTATION CENTRE FOR APPLIED
RESEARCH AND TESTING (SICART ) (Sponsored by Department of Science and Technology, Govt. of India, New Delhi)
Sardar Patel Centre for Science and Technology
Vallabh Vidyanagar – 388120, Dist: Anand, Gujarat, INDIA
Phone: +91-2692-234966, +91 9925520338 (M); Fax: +91-2692-238355
E-mail: [email protected]
Ex. Professor-Director
UGC-Human Resource Development Center
(UGC-HRDC) Sardar Patel University & Former Professor and Head & [Dean (Faculty of Science)]
P. G. Department of Physics, Sardar Patel University.
Vallabh Vidyanagar 388 120
Gujarat State, INDIA