SiPs in Automotive Applications · Automotive Test Process Flow –A* Customer Incoming Inspection...

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© 2018 Amkor Technology, Inc. 1 1 © 2018 Amkor Technology, Inc. Prasad Dhond l Vice President, Automotive SiPs in Automotive Applications Amkor Technology PROPRIETARY/CONFIDENTIAL

Transcript of SiPs in Automotive Applications · Automotive Test Process Flow –A* Customer Incoming Inspection...

  • © 2018 Amkor Technology, Inc. 11© 2018 Amkor Technology, Inc.

    Prasad Dhond l Vice President, Automotive

    SiPs in Automotive

    Applications

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    Automotive Market

    Car Sales (Mu)

    95 96 98

    2017 2018 2019

    Car sales are flat Rising electronic content

    per car is driving

    semiconductor growth

    Average semi content

    per car is rising

    Auto Semi Sales ($B)

    37 41 44

    2017 2018 2019

    Semi Content per Car (S)

    389 427 448

    2017 2018 2019

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    Largest Growth Applications

    $5B2018

    $11B2023

    ADAS

    Rise of driver assist

    features and

    autonomous driving

    $7.4B2018

    $9.3B2023

    Infotainment

    Connected vehicle

    Electrification

    $4.3B2023

    $1.6B2018

    Conversion to hybrid

    and electric vehicles

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    Automotive Packaging Analog

    MCU, GPU

    RF/mmWave

    Transceivers

    Processor +

    Memory

    Accelerated

    adoption of

    Advanced

    Packaging

    Sensors

    LQFP CABGA

    WLFOfcCSP

    Power Dual LF MLF®

    SiP

    Overmolded CavityExposed Die

    FCBGA

    InfotainmentA/V, Center Stack,

    HUD, Telematics

    BGA, HZIP, QFN,

    QFP, SiP, SOP

    Body ElectronicsComfort, HVAC, Lighting

    BGA, QFN, QFP, SOPEV/HEV

    QFP, SOP

    ADASPark Assist, Radar,

    Blind Spot Detection

    BGA, WLFO

    PowertrainEngine Control Unit,

    Fuel Injection

    HQFP, QFP, Power Module

    Instrument

    Cluster

    QFP, SOP

    ChassisAntilock Brakes,

    Traction Control

    QFN, QFP

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    Automotive Products

    Long lifecycle products

    Built on long lifecycle silicon nodes

    and packages

    Supported by stable, long-term

    suppliers

    LIFECYCLE CURVE

    0.0

    0.5

    1.0

    1.5

    2.0

    2.5

    0

    10

    20

    30

    40

    50

    0 1 2 3 4 5 6 7 8 9 10

    Cars

    So

    ld

    Sm

    art

    ph

    on

    es S

    old

    Years

    Smartphone

    Car Platform

    Units In Millions

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    The Multiplier Effect

    Component System Car

    250 Components 40 Systems

    1 ppm 10,000 ppm (1.00%)250 ppmToo High

    ~0 ppm 10 ppm 400 ppm (0.04%)Target

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    Dealing with the Multiplier Effect

    Design Redundancy ScreeningIntegration

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    Meeting Automotive Requirements

    Quality

    Systems▶ Based on automotive standards

    ▶ Stringent process flow and controls

    ▶ Dedicated lines, equipment

    and people

    Process

    Flow &

    Controls

    Capability ▶ Automotive-grade facilities▶ Long-term stability

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    Automotive Quality Requirement: QMS

    QMS Non-Automotive Automotive

    Certification ISO9001:2015 IATF16949:2016

    Quality

    Management System

    (Automotive)

    Quality

    Management System

    (Overall Industry)

    Transition by

    2018

    Factory IATF16949:2016

    Amkor Korea Certified

    Amkor Philippines Certified

    Amkor China Certified

    Amkor Taiwan Certified

    Amkor Malaysia Certified

    J-Devices Japan Certified

    Amkor Portugal Certified

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    Typical Automotive Assembly Process FlowStandard process Recommendation

    Wafer Mount Laser Groove Dicing Saw/Clean2nd Opt AOI Inspection

    2nd Opt QA Gate Substrate Prebake

    Chip/Component Attach & Reflow

    Flux Clean Prebake Plasma Clean Underfill Dispense Underfill Cure

    CSAM InspectionIR Scope

    Inspection, Sampling

    Internal Visual Inspection Gate

    Heat Spreader Attach

    Heat Spreader Attach Cure

    Solder Ball Attach + Land Side

    Component Attach (Optional)

    Flux Clean100% Open/Short

    Test100% Dimensional

    Inspection

    Final Visual Inspection Gate

    Dry Packing/Packing

    Component AOI Inspection

    Wafer Incoming AOI Inspection

    Internal Visual Inspection

    Final Visual Inspection

    Laser Mark

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    Die-side via Design

    BGA-side via Design

    Product Quality Starts with Design

    ▶ Capture learning from prior

    experiences

    ▶ Develop automotive-specific

    design rules

    ▶ Study package & material

    interactions

    ▶ Use the standard BOM

    ▶ Design for process Cpk >1.67

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    16-Jan

    16-Feb

    16-Mar

    16-Apr

    16-May

    16-Jun

    16-Jul

    16-Aug

    16-Sep

    16-Oct

    16-Nov

    16-Dec

    17-Jan

    17-Feb

    Pkg chipout 367 633 578 376 457 542 444 590 385 378 267 273 218 181

    SMT 138 181 188 101 18 66 103 93 56 65 71 86 68 79

    Ball Attach 321 241 215 145 53 65 82 94 56 65 80 94 75 68

    Automotive SiP HVM Example

    ✓ 99.96% assembly yield

    ✓ No rework

    ✓ Continuous improvement

    Zero-Defect Escapes

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    Other Considerations for Automotive SiP

    Automotive Qualified Components

    ▶ Q200 for passives

    Die and Component Traceability

    ▶ Track die location on wafer

    ▶ Track component details

    (supplier lot #, reel position)

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    Automotive

    Factory

    Setup

    Cleaner Environment

    Quality Indices

    Monitoring

    Incoming Material

    Inspection

    Certified Operators

    Automation

    Designated

    Equipment

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    ▶ Grade 0 (-40°C to 150°C)

    ▶ Grade 1 (-40°C to 125°C)

    ▶ Grade 2 (-40°C to 105°C)

    ▶ Grade 3 (-40°C to 85°C)

    ▶ Grade 4 (0 to 70°C)

    AEC Q-100 Qualification Test FlowAEC-Q100 ambient operating temperature ranges

    Qualification tests

    specifically related

    to package and

    assembly

    “In process”

    testsAmkor

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    AEC Q-100 Test Group A

    Precondition

    Level 1

    85°C, 85% RH, 168 hours

    3x Reflow, 260°C

    Temperature Cycling

    (77 units x 3 lots)

    Grade 0: -55°C to 150°C for 2000 cyc

    Grade 1: -55°C to 150°C for 1000 cyc

    Precondition

    Level 2

    85°C, 60% RH, 168 hours

    Precondition

    Level 3

    30°C, 60% RH, 192 hours

    Unbiased HAST

    (77 units x 3 lots)

    130°C/85% RH for 96 hours, or 110°C/85% RH for 264 hours.

    Test @ Room & Hot Test @ Hot Wirebond Pull Test @ Room

    Test @ Room

    Test @ Hot

    Test @ RoomTest @ Hot

    SAT

    SAT

    JEDEC J-STD-020, JESD22-A113

    JESD22-A118

    (uHAST)JESD22-A104JESD22-A103

    High Temp Storage Life (45 units)

    Grade 0: 175°C/1000 hours, 150°C/2000 hours

    Grade 1: 150°C/1000 hours, 175°C/500 hours

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    Enabling Automotive Supply Chain

    ▶ Supplier qualification minimum requirements

    ▷ ISO9001:2015 certified & IATF16949 compliant

    ⨠ Encouraging IATF16949 certification

    ⨠ 72% of suppliers certified or to be certified

    ▷ VDA6.3 process audit (Grade A, 90%)

    ▶ Intensive supplier quality & process control

    ▷ Supplier outgoing control by commodity

    ⨠ FCBGA: 100% AOI + 4 wire test + 100% AFVI + 100% FVI

    ▷ Amkor incoming eCoC control with SPC

    ⨠ Real time & Statistical incoming quality control

    ▷ Robust quality probation and release process

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    Automotive Infotainment SiP

    1st Gen Device in

    Card Configuration

    2nd Gen Device in

    BGA Configuration

    50% Area reduction

    component count

    reduction better

    electrical performance

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    LiDAR Sensors

    ▶ Package requirements (detector)

    ▷ Multi-dies integration

    ▷ Anti-reflectivity coating glass

    ▷ Particle reduction

    ▷ Good thermal performance

    ▷ High reliability requirement

    ▷ Hermetic seal (option)

    CeramicProcessor

    Sensor

    Glass

    Substrate

    SensorGlassMold

    Resin

    Processor

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    32-Bit

    MCU

    Power

    CAN

    Transceiver

    77GHz

    Transmit

    77GHz

    Receive

    VCO

    77GHz Radar Module

    QFN

    SOIC

    CABGA

    WLFO + Antenna PCB

    SiliconAntenna Layer

    WLFO Antenna in Package

    Integration

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    Turnkey Capabilities

    ▶ Fast feedback loop

    ▶ Reduced shipping and handling

    ▶ Reduced cycle time and WIP

    Burn-InFinal TestAssemblyProbe

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    Automotive Test Process Flow – A* Customer

    Incoming Inspection

    Final Test 1

    Hot Temp: 105°C

    Final Test 2

    Room Temp: 25°C

    Final Test 3

    Cold Temp: -40°C

    Burn-in Test 1

    (Stress Test:

    85°C & High Voltage)

    Final Test 6

    (Post Fuse Blown)

    Room Temp: 25°CShip to Customer

    SLT

    (System Level Test)

    (Ambient)

    Final Test 4

    (Post Burn-In)

    Hot Temp: 105°C

    Burn-in Test 2

    (Stress Test:

    85°C & High Voltage)

    Final Test 5

    (Post Burn-In)

    Hot Temp: 105°C

    Automotive Test Added

    Scan/Bake/

    Tray-Packing

    15.2 hours 12 hours

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    Summary

    ▶ Automotive Advanced Packaging market growing strongly

    ▶ Automotive demands are challenging

    ▶ Focus on long-term suppliers with a proven automotive track record

    Experience

    40+yrs

    Capability Quality

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    Thank YouAmkor Techno

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