Side-by-Side Comparison of Agilentand Tektronix Probing Measurementson High-Speed Signals

Application Note 1491

Introduction

When you make signal-integritymeasurements on high-speedsignals, the oscilloscope andprobe you use can have a bigimpact on the accuracy of yourmeasurements. You may want to compare scopes and probingsystems made by differentmanufacturers to find the bestones for your application. Whenyou do so, it is important toreference test techniques thatprovide true comparisons ofsimilar probe-type connectionsthat also include effects of probe loading.

In this application note, wedemonstrate a methodology foraccurately comparing oscilloscopemeasurements on high-speedsignals using Tektronix, Inc. and Agilent 6 GHz bandwidthreal-time oscilloscopes anddifferential active probingsolutions. We document results ofside-by-side tests on signals with50 ps and 100 ps edge speeds(10% to 90%), and we discussdifferences in Agilent andTektronix test philosophies andprobe specification techniques that should be important tohigh-speed digital designers.

Table of Contents

Introduction . . . . . . . . . . . . . . . . . . . . . . . . 1

Test Methodology . . . . . . . . . . . . . . . . . . . 2

Side-By-Side Probing Measurementson a 50 ps Edge-Speed Signal . . . . . . . . 3

Browser connection . . . . . . . . . . . . . . . . . . 3

Solder-in connection . . . . . . . . . . . . . . . . . . 5

Side-By-Side Probing Measurementson a 100 ps Edge-Speed Signal . . . . . . . 6

Browser connection . . . . . . . . . . . . . . . . . . 6

Solder-in connection . . . . . . . . . . . . . . . . . . 8

Should You Measure “What was” or “What is”? . . . . . . . . . . . . . . . . . . . . . . 9

Different Probe Specification Methodologies . . . . . . . . . . . . . . . . . . . . 10

Conclusion . . . . . . . . . . . . . . . . . . . . . . . . 11

Glossary . . . . . . . . . . . . . . . . . . . . . . . . . . 12

High-Performance InfiniiumOscilloscopes and Probes . . . . . . . . . . 13

Support, Services, and Assistance . . . 14

2

We used an Agilent 8133Apulse/pattern generator toproduce a 2.5 Gb/s serial datatest signal with edge speeds ofapproximately 50 ps (10% to 90%).Accurately digitizing signals thisfast is beyond the measurementcapability of the 6 GHzmeasurement systems we tested,and measurement results actuallyshow the response of the scope as opposed to showing the actualsignal. But it may be constructiveto look at the response of ameasurement system when itencounters an out-of-band signal,especially since real-time scopesare sometimes used in an attemptto measure some characteristicsof very high-speed signals.

In addition to testing this veryhigh-speed signal, we fed thissignal through a low-pass filter to generate edge speeds ofapproximately 100 ps, which isabout the fastest signal speedthat real-time scopes with 6 GHzbandwidth can measure withreasonable accuracy. Weconstructed a 50 Ω differentialmicrostrip test fixture that allowedus to probe the differential signalunder test. We did not tune thesetests to showcase the Agilentequipment’s strengths or tohighlight the Tektronix equipment’sweaknesses. As a matter of fact,we used a test setup similar toone used by Tektronix in a recentlypublished white paper and video,with one important difference:When we performed our tests, we were careful to comparesimilar probe connections usingreal-time sampling so we wouldget a valid comparison of the solutions from eachmanufacturer. We also capturedloaded as well as unloadedsignals using a high-bandwidthsampling scope for reference. Figure 1b. Test setup with probe attached to test

fixture using probe stand holder.

We captured the following signalsfor comparison:

1. Unloaded (not probed) signal captured by an Agilent 54750 20 GHz sampling oscilloscope

2. Loaded/probed signal capturedby an Agilent 54750 20 GHzsampling oscilloscope

3. Measured signal captured byTektronix and Agilent 6 GHzreal-time oscilloscopes anddifferential active probes withvarious connections/probe heads

Figure 1a shows a block diagramof the test setup, and Figure 1bshows an actual loaded test usingthe Tektronix TDS6604/P7350with a browser connection to the specially designed 50 Ωdifferential microstrip board. The sampling oscilloscopeprovides precision 50 Ωterminations for the test fixtureand measures the loaded andunloaded signals with repetitivehigh-bandwidth sampling forreference comparisons.

Test Methodology

Pulse/Pattern Generator

20 GHz Sampling Oscilloscope

6 or 7 GHz Real-Time Oscilloscope

Differential Test Fixture

DifferentialActive Probe

Figure 1a. Block diagram of test setup.

3

Figure 2. Unloaded 50 psedge-speed input test signal asmeasured by a high-bandwidthsampling oscilloscope.

Side-By-Side Probing Measurements on a 50 ps Edge-Speed Signal

We tested the 50 ps edge-speedsignal using a browser connectionand a solder-in connection withboth Tektronix and Agilent 6 GHzscopes and differential activeprobing solutions.

Browser connectionFigure 3 shows the test signal atthe probe tips during probing withthe Tektronix P7350 differentialactive probe, but captured with a high-bandwidth samplingoscilloscope connected in parallel.As you can see, the waveform doesnot exhibit an ideal flat responsebecause of probe loading. Figure 4shows the measured response of

this signal using the TektronixTDS6604/P7350 with the browserconnection. The Tektronix P7350differential active probe exhibitsa very peaked response and doesnot accurately show what is atthe probe tips (Figure 3). Theexcessive loading and peaking iscaused by the inherent parasiticcapacitance and inductance ofthe probe. Some people in theoscilloscope industry may claimthat this waveform (Figure 4)more accurately shows what“was” at the test points on thetest fixture before the probe was applied (Figure 2). We willdiscuss this issue in the section

Figure 3. Loaded/probed 50 ps edge-speed signalusing Tektronix P7350 browser connection asmeasured by a high-bandwidth sampling oscilloscope. Figure 4. Measured response of 50 ps edge-speed

signal using Tektronix P7350 browser connection.

titled “Should you measure ‘whatwas’ or ‘what is’?” on page 9.

We did not use the Tektronixbrowser probe-tip “saver” whenwe performed this test. In ourexperience, this adapter causeseven more loading and excessivepeaking (overshoot). Although the probe-tip saver enhancesusability and helps to keep thefixed and non-user-replaceableprobe tips from bending andbreaking, we recommend youavoid using this probing accessoryon high-speed signals whensignal-integrity measurements are important.

Figure 2 shows the eye-diagramof the output of the Agilent 8133Apulse/pattern generator (fedthrough the 50 Ω differential test fixture) with a very flatresponse as captured by theAgilent 54750 samplingoscilloscope with approximateedge speeds of 50 ps (10% to90%). This signal was capturedbefore any probes wereconnected to the test fixture.

4

Side-By-Side Probing Measurements on a 50 ps Edge-Speed Signal

Figure 5 shows the 50 psedge-speed input signal as it isbeing probed by Agilent’s 1134AInfiniiMax differential activeprobe with a browser connection.Notice that Agilent’s probe alsoloads the signal, but to a lesserdegree than the Tektronix probe.Figure 6 shows the measuredresponse using the Agilent54855A oscilloscope with the1134A InfiniiMax browserconnection. With this probeconnection, we see a very flatresponse that more closelyapproximates the originalunprobed input signal (Figure 2).But the unprobed signal is notwhat we should be comparing tothe measured response. Weshould compare the measuredresponse (Figure 6) to the actualsignal at the probe tips (Figure 5),as we will explain on page 9.

The Agilent browser probeexhibits some peaking due toparasitics, but the peaking is not as severe as the peakingcaused by the Tektronix probe.Unfortunately, these parasitics,and their measured behavior, are unavoidable when usinghigh-bandwidth browser-typeprobes that also exhibit goodusability characteristics. Themeasured response shown inFigure 6 is the best you can getwith a browser-type probe.

Figure 6. Measured response of 50 ps edge-speedsignal using Agilent 1134A with browser connection.

Figure 5. Loaded/probed 50 ps edge-speed signalusing Agilent 1134A with browser connection asmeasured by a high-bandwidth sampling oscilloscope.

5

Side-By-Side Probing Measurements on a 50 ps Edge-Speed Signal

Solder-in connectionFigure 7 shows the same test on the50 ps edge-speed signal, but nowusing Tektronix’ recommendedsolder-in connection. Thissolder-in connection wasestablished using a Tektronixsupplied solder-in adapter withdamping resistors trimmed asshort as possible and thensoldered onto the differential testfixture. Notice the significantloading on the input signal.Figure 8 shows the measuredresponse using this test setup.The edge speeds are reducedsignificantly due to the reducedbandwidth limitation of thisconnection, and the measured

Figure 7. Loaded/probed 50 ps edge-speed signalusing Tektronix P7350 with solder-in connection asmeasured by a high-bandwidth sampling oscilloscope. Figure 8. Measured response of 50 ps edge-speed

signal using Tektronix P7250 with solder-in connection.

response also exhibits excessivepeaking. Whether you comparethis measured response (Figure 8)to the original unloaded/unprobedinput signal (Figure 2) or to theloaded/probed signal (Figure 7),which is a more meaningfulcomparison, it is a poorapproximation of the signal under test.

Figure 9 shows loading effects onthe 50 ps edge-speed signal whenwe probed with Agilent’s 1134AInfiniiMax solder-in probe head.Again, there is some loading, butmuch less than that exhibited bythe Tektronix probing solutions.Figure 10 shows the measured

Figure 9. Loaded/probed 50 ps edge-speed signal usingAgilent’s 1134A InfiniiMax solder-in probe head asmeasured by a high-bandwidth sampling oscilloscope. Figure 10. Measured response of 50 ps edge-speed signal

using Agilent’s 1134A InfiniiMax solder-in probe head.

response using the Agilentsolder-in probe head. Notice thatthis response is a very goodapproximation of the actualsignal at the probe tips (Figure 9),given the 6 GHz scope/probesystem bandwidth limitation. UsingAgilent’s 54855A oscilloscopewith the 1134A InfiniiMaxsolder-in probe head provides thehighest-fidelity active probingmeasurements in the industrytoday. This combination (54855Aoscilloscope/1134A InfiniiMaxsolder-in probe head) is as good asit gets for real-time high-bandwidthoscilloscope measurements usingactive probes!

6

The previous section of thisapplication note comparedprobing measurements on a veryhigh-speed signal (50 ps edgespeed). However, a more realistictest is to compare measurementson a signal with slower edgespeeds (100 ps or greater) thatare within the bandwidthmeasurement capability of a6 GHz oscilloscope/probingmeasurement system. Figure 11shows the unloaded/unprobedtest signal with an edge speed ofapproximately 100 ps as capturedby a high-bandwidth samplingoscilloscope. The followingscreen-shots show the sameprobing measurements wedocumented in the first part ofthis application note. Again, theAgilent oscilloscope and probingsystem outperformed Tektronixoscilloscope and probing systemon all counts.

Browser connectionFigure 12 shows the signal duringprobing with the Tektronix P7350differential active probe. Figure 13shows the measured response ofthis signal using the TektronixTDS6604/P7350 with the browserconnection. As with the 50 psedge-speed input signal, theTektronix P7350 differential activeprobe exhibits a very peakedresponse and does not accuratelyshow the signal as it appears atthe probe tips (Figure 12).

Side-By-Side Probing Measurements on a 100 ps Edge-Speed Signal

Figure 11. Unprobed/unloaded input test signal with100 ps edge speed as measured by a high-bandwidthsampling oscilloscope.

Figure 13. Measured response of 100 ps edge-speedsignal using Tektronix P7250 active probe withbrowser connection.

Figure 12. Loaded/probed 100 ps edge-speed signalwith Tektronix P7250 active probe with browserconnection as measured by a high-bandwidthsampling oscilloscope.

7

Figure 14 shows the 100 psedge-speed input signal as it isbeing probed by Agilent’s 1134AInfiniiMax differential activeprobe with a browser connection.Figure 15 shows the measuredresponse using the Agilent 54855Aoscilloscope with the 1134AInfiniiMax browser connection.Again, Agilent’s browser-typeprobe connection measurementexhibits some peaking, but showsa more accurate reproduction ofthe signal under.

Side-By-Side Probing Measurements on a 100 ps Edge-Speed Signal

Figure 14. Loaded/probed 100 ps edge-speed signalusing Agilent 1134A active probe with browserconnection as measured by a high-bandwidthsampling oscilloscope.

Figure 15. Measured response of 100 ps edge-speedsignal using Agilent 1134A active probe withbrowser connection.

8

Side-By-Side Probing Measurements on a 100 ps Edge-Speed Signal

Solder-in connectionFigure 16 shows the same probe loading test on the 100 ps edge-speed signal usingTektronix’s solder-in connection.Figure 17 shows the measuredresponse using this test setup.Again, we observe significantloading and excessive peaking.

Figure 18 shows loading effectson the 100 ps edge-speed signalwhen we probed with Agilent’s1134A InfiniiMax solder-in probe head. Figure 19 shows themeasured response using theAgilent solder-in probe head.Notice that this response is a verygood approximation of the actualsignal at the probe tips (Figure 18)and with minimal loading.

Figure 16. Loaded/probed 100 ps edge-speed signalusing Tektronix P7250 active probe with solder-inconnection as measured by a high-bandwidthsampling oscilloscope.

Figure 17. Measured response of 100 ps edge-speedsignal using Tektronix P7250 active probe withsolder-in connection.

Figure 18. Loaded/probed 100 ps edge-speed signalusing Agilent 1134A active probe with solder-inconnection as measured by a high-bandwidthsampling oscilloscope.

Figure 19. Measured response of 100 ps edge-speedsignal using Agilent 1134A active probe withsolder-in probe head.

9

Should You Measure “What was” or “What is”?

Agilent and Tektronix havedifferent philosophies aboutwhether an oscilloscope andprobing system should attempt toshow “what was” or “what is” atthe inputs to the differential activeprobe tips. This philosophicaldifference also extends to howhigh-bandwidth probes arecharacterized and specified byeach vendor. “What was” refers tothe signal that was present at thetest points before the probe wasconnected. “What is” refers to theactual signal at the probe’s tipswhile the probe is connected andloading the device under test.

In an ideal world, probes wouldhave infinite input impedanceand induce zero loading on acircuit under test. In the realworld, all probes load circuits to some degree, especially athigher frequencies, and therebychange/alter the signal that isbeing tested.

With inductive peaking due to probe parasitics, a probe may be able to restore somehigh-frequency characteristics ofthe original unprobed/unloadedsignal. But the degree of loadingand artificial signal restoration is heavily dependent upon the

source impedance of the deviceunder test. In the testingdocumented in this applicationnote, the effective sourceimpedance of the device undertest was a fixed 25 Ω, as definedby the designed-in sourceimpedance of the pulse/patterngenerator and the load impedanceof the sampling oscilloscope. But in real-world measurementsituations, engineers rarelymeasure the characteristics of aterminated 50 Ω generator. Thesource impedance of a real circuitunder test can vary significantly,so the effects of probe loadingand induced measured peakingalso can vary significantly andcan be unpredictable.

As shown in some of the previousmeasurement examples, circuitloading and signal alteration canbe significant. Unfortunately, you may never know that thisunwanted side effect of probing iscausing a problem in your circuitunder test. The parasitic peakingof the probes can mask loadingproblems. In some cases, probingthe device can actually cause ahigh-speed digital system tocrash. Agilent active probesexhibit less peaking and lesscircuit loading, so they give you

a better idea as to why a circuitproblem may have occurred.

When you are stress-testinghigh-speed devices, (for example,testing differential receiversensitivity) there is anotherreason why it is important to know“what is,” rather than estimating“what was.” When you performstress tests with a stimulussource such as a high-speedpulse/pattern generator, you usethe oscilloscope to measure theactual signal at the differentialinputs of the receiver to find outexactly when and why it fails,based on various types ofstimulus testing, includinginduced jitter and reduced signallevels. Estimating what mighthave been at the input withoutthe probe attached will not giveyou information on the specificinput level that caused a failurecondition. You need to know theexact failure condition at theinput of the device with the probe attached. In this case, theoscilloscope and active probeactually become part of the systemunder test, and its effects must beincluded. Induced peaking willmask real failure conditions andwill indicate smaller marginsthan are actually present.

10

Different Probe Specification Methodologies

As previously mentioned, Agilentand Tektronix also have differentphilosophies about how tocharacterize and specifyhigh-speed active probes. In thepast, when lower-bandwidthprobes were tested and specified,you could assume that VIN (inputto the probe) and VSOURCE (testgenerator output) were essentiallythe same. With this assumption,all oscilloscope/probe vendorsused to characterize a probe’sresponse as VOUT/VSOURCE. But when characterizinghigher-frequency probes, such asAgilent’s 7 GHz 1134A InfiniiMaxactive probe or Tektronix’ 5 GHzP7350 active probe, you can nolonger assume that VSOURCE andVIN are the same. In order tomore accurately characterizehigher-bandwidth active probesin both the time domain andfrequency domain, Agilent nowmeasures VIN using a test fixturethat allows observation of theinput signal.

An oscilloscope probe is a voltagemeasuring device, so its transferfunction should be specified asVOUT/VIN. If VIN changes as afunction of frequency-dependentloading, then VIN must be

accurately measured along withVOUT. Unfortunately, Tektronixstill uses the old method ofmeasuring and computing thetransfer function of their activeprobes as VOUT/VSOURCE. But aswe have shown in this paper,VSOURCE and VIN can be verydifferent due to high-frequencyloading. If the only type of deviceyou ever test is the output of agenerator, or if the degree ofloading is predictable with a fixedamount of source impedance,then you could argue thatVOUT/VSOURCE is a validestimation. But the sourceimpedance of a real device undertest can vary significantly.

Since you must now take circuit loading into account with higher-frequency activeprobes, in addition to thespecified time-domain andfrequency-domain transfer functioncharacteristics/specifications(based on VOUT/VIN), Agilent alsoprovides frequency-dependentimpedance plots and SPICEmodels for all probe headconnections so that designers canaccurately predict the loadingeffects when connecting Agilentactive probes to their circuits.

11

Regardless of whether you use Tektronix’ or Agilent’smeasurement performancestandards for characterizing theperformance of high-bandwidthactive probes, Agilent’s probesoutperform Tektronix probes onall counts as documented in thisapplication note. Agilent’s 1134AInfiniiMax active probes usingvarious probe heads (browser,solder-in) demonstrate less probeloading and more accuratereproduction of the signal appliedto the probe tips. Even if youapply a Tektronix standard whereyou ignore probe loading andcompare measured signals tounloaded/unprobed signals,Agilent’s probes still out-performTektronix probes when youcompare the same probingconfigurations (Tektronixbrowser connection versusAgilent browser connection,Tektronix solder-in connectionversus Agilent solder-inconnection) and when you useidentical sampling techniques(real-time), as shown in thisapplication note.

Conclusion

With the introduction of the new 1130 Series InfiniiMaxdifferential active probes, Agilent adopted a new probearchitecture/topology where the probe amplifier is physicallydisplaced from the probe headusing precision RF transmissionline technology for high-impedanceconnections. This new probetechnology enhances usabilityand measurement performancefor high-bandwidth applications.In fact, Agilent’s new 1130 SeriesInfiniiMax active probing systemwas recently selected as the 2002 Test & MeasurementProduct-of-The-Year awardsponsored by EDN magazine. To our knowledge, this is the first time EDN has selected an“accessory” for this award in theTest & Measurement category.

InfiniiMax: The Worlds Best High-Speed Probing System

EDN Magazine has awardedAgilent’s InfiniiMax active probesystem the 2002 Innovation of theYear Award.

12

Glossary

Browser-Type Probe Probe or probe head designed to be held in theuser’s hand or to be used in conjunction with a probe stand holder.

Damping Resistors Low-value resistors (typically 100 Ω) located nearthe tips of high-bandwidth probes, used to minimize high-frequencyprobe loading and for reducing in-band resonance (ringing/peaking).

Jitter Timing error associated with the placement of high-speed digitalsignal edge transitions relative to their ideal location. This timingerror, often referred to as time interval error (TIE) or phase jitter, canbe composed of both deterministic and random error sources.

Out-of-Band Frequency content of signals that is considered to be outof the bandwidth measurement capability of a test system.

Parasitics Unwanted capacitance, inductance, and resistance of aprobe that can create undesirable loading on a circuit under test.

Probe Head A probe technology developed by Agilent Technologieswhere oscilloscope/probe users can interchange a variety of passiveprobe connections from the displaced probe amplifier for various usemodels. This probe head technology enhances usability, reduces probeloading due to parasitics, and improves measurement accuracy.

Real-Time Oscilloscope An oscilloscope that uses high-speed sampling inorder to capture signals in a single-shot acquisition.

Sampling Oscilloscope An oscilloscope that uses repetitive samplingtechniques in order to capture high-bandwidth signals.

Solder-In Probe Probe head or accessory designed so that the probe canbe easily soldered to the circuit under test, providing either hands-freeprobing or to gain access to tight-fitting spaces where a browser-typeprobe head can’t fit.

Transfer Function The voltage transfer function, or gain, of a device orcircuit is always computed as the ratio of the output voltage relative tothe input voltage (VOUT/VIN). The ideal transfer function for a scope,probe, and scope/probing measurement system is always “1” whenattenuation factors are factored into the equation.

Related Literature

Publication Title Publication Type Publication Number

Infiniium 54850 Series Oscilloscopes InfiniiMax 1130 Series Probes Data Sheet 5988-7976EN

Restoring Confidence in Your High-Bandwidth Probe Measurements Application Note 1419-01 5988-7951EN

Improving Usability and Performance in High-Bandwidth Active Oscilloscope Probes Application Note 1419-02 5988-8005EN

Performance Comparison of Differential and Single-Ended Active Voltage Probes Application Note 1419-03 5988-8006EN

Ten Things to Consider When Selecting Your Next Oscilloscope Application Note 1490 5989-0552EN

Five Applications to Help You Decide: A Comparison between Tektronix TDS and Application Note 1489 5989-0526ENAgilent Infiniium Oscilloscopes

For copies of this literature, contact your Agilent representative or visit www.agilent.com/find/scopes

13

High-Performance Infiniium Oscilloscopes and ProbesUnmatched performance, accuracy, and connectivity

Figure 21. Compare the input on the toptrace to that of a competitive probe in thecenter and an InfiniiMax on the bottom.

• Choose between 6, 4, and 2.5 GHz bandwidth real-timeoscilloscopes with 20 GSa/ssample rate on all fourchannels simultaneously

• Track down elusive glitcheswith up to 1 M pointsMegaZoom deep memory on allsample rates and 32 M pointsMegaZoom deep memory at2 GSa/s and slower rates

• Improve reliability with solidstate attenuators

• Take advantage of trigger jitteras low as 1.0 ps rms

• Ensure probing accuracy with highest performancedifferential and single-endedprobes available (InfiniiMax 7, 5, and 3.5 GHzprobing systems)

Experienced scope users knowthat their measurements are onlyas good as their probing system.And as bandwidth increases, it isincreasingly important to makesure you are measuring yourcircuit, not your scope probe.Nothing is more frustrating thanchasing down an apparent designproblem, only to find that it wascaused by an inferior scope probe.

Together, the newest Infiniiumscopes and the breakthroughInfiniiMax high-performanceprobing systems offer anend-to-end measurement solutionwith unmatched performance,accuracy, and connectivity. Theresults are measurements you can trust and better insight intocircuit behavior.

Figure 20. The newest members of Agilent’s award-winning InfiniiumSeries are 6, 4, and 2.5 GHz high performance real-time oscilloscopes.The InfiniiMax high bandwidth active probe offers unmatchedperformance, accuracy, and connectivity.

Figure 22. InfiniiMax 7 GHz differential socketed probe head.

Figure 23. InfiniiMax 6 GHz differential browser probe head

Figure 24. InfiniiMax 7 GHz differential solder-in probe head.

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