SHARISM AT WORK LIMITED -...
Transcript of SHARISM AT WORK LIMITED -...
SHARISM AT WORK LIMITED
Handheld Computer
Model: Ben NanoNote December 09, 2009 Report No.: 902535-2
(This report supersedes NONE)
Modifications made to the product : See page 6
This Test Report is Issued Under the Authority of:
Andy.Hao
Compliance Engineer
Jackson.Chen
Director of Certification
This test report may be reproduced in full only. Test result presented in this test report is applicable to the representative sample only.
Title: EMC Test Report for Handheld Computer Model: Ben NanoNote To: EN55022:2006+A1:2007, EN55024:1998+A1:2001+A2:2003
Serial#: 902535-2 Issue Date: December 09, 2009 Page: 2 of 48 www.siemic.com.cn
This page has been left blank intentionally.
Title: EMC Test Report for Handheld Computer Model: Ben NanoNote To: EN55022:2006+A1:2007, EN55024:1998+A1:2001+A2:2003
Serial#: 902535-2 Issue Date: December 09, 2009 Page: 3 of 48 www.siemic.com.cn
CONTENTS
1 EXECUTIVE SUMMARY & EUT INFORMATION .............................................................................................................4
2 TECHNICAL DETAILS ..................................................................................................................................................5
3 MODIFICATION ............................................................................................................................................................6
4 TEST SUMMARY ..........................................................................................................................................................7
5 MEASUREMENTS, EXAMINATION AND DERIVED RESULTS ........................................................................................8
ANNEX A. TEST INSTRUMENTATION.................................................................................................................................17
ANNEX B. EUT AND TEST SETUP PHOTOGRAPHS ...........................................................................................................22
ANNEX C. TEST SETUP AND SUPPORTING EQUIPMENT...................................................................................................29
ANNEX D. USER MANUAL / BLOCK DIAGRAM / SCHEMATICS / PART LIST .......................................................................34
ANNEX E. SIEMIC ACCREDITATION CERTIFICATES ..........................................................................................................35
Title: EMC Test Report for Handheld Computer Model: Ben NanoNote To: EN55022:2006+A1:2007, EN55024:1998+A1:2001+A2:2003
Serial#: 902535-2 Issue Date: December 09, 2009 Page: 4 of 48 www.siemic.com.cn
1 Executive Summary & EUT information
The purpose of this test program was to demonstrate compliance of the Sharism At Work Limited, Handheld Computer , against the current Stipulated Standards. The Handheld Computer has demonstrated compliance with the EN55022:2006+A1:2007, EN55024:1998+A1:2001+A2:2003.
EUT Information
EUT Description
Handheld Computer
Model No Ben NanoNote
Serial No N/A
Input Power Li-ion 3.7V 850mAh Battery charged by USB 5VDC
Classification Per Stipulated Test Standard
Class B Emission Product
Title: EMC Test Report for Handheld Computer Model: Ben NanoNote To: EN55022:2006+A1:2007, EN55024:1998+A1:2001+A2:2003
Serial#: 902535-2 Issue Date: December 09, 2009 Page: 5 of 48 www.siemic.com.cn
2 TECHNICAL DETAILS
Purpose
Compliance testing of Handheld Computer with stipulated
standards
Applicant / Client
Sharism at Work Limited
Unit 2503, China Insurance Group Building 141 Des Voeux Road Central Hong Kong
Manufacturer
Sharism At Work Limited
Unit 2503, China Insurance Group Building 141 Des Voeux Road Central
Hong Kong
Laboratory performing the tests
SIEMIC Laboratories 2206 Ringwood Avenue
San Jose, CA 95131, USA Tel: 1(408) 526 1188 Fax: 1(408) 526 1088
Email: [email protected]
Test report reference number 902535-2
Date EUT received August 28, 2009
Standard applied EN55022:2006+A1:2007, EN55024:1998+A1:2001+A2:2003
Dates of test (from – to) August 28- September 14 2009
No of Units #2
Equipment Category ITE
Trade Name N/A
Microprocessor (s) unidentified
RF Operating Frequency (ies) N/A
Clock/Oscillator Frequency (ies)
N/A
Rated Input Power Li-ion 3.7V 850mAh Battery charged by USB 5VDC
Port/Connectors Mini USB Port, Earphone, Micro SD Card Slot
Title: EMC Test Report for Handheld Computer Model: Ben NanoNote To: EN55022:2006+A1:2007, EN55024:1998+A1:2001+A2:2003
Serial#: 902535-2 Issue Date: December 09, 2009 Page: 6 of 48 www.siemic.com.cn
3 MODIFICATION
As shown below, BN1 & BN2 should be changed to 600ohm@100MHz beads;BD4 changed to 220ohm@100MHz bead.
There should be connection between the shielding of signal line and the GND of vice board. As shown below, add 0.1Uf/16V Capacity to U6 between 1 pin and 2 pin in parallel.
Title: EMC Test Report for Handheld Computer Model: Ben NanoNote To: EN55022:2006+A1:2007, EN55024:1998+A1:2001+A2:2003
Serial#: 902535-2 Issue Date: December 09, 2009 Page: 7 of 48 www.siemic.com.cn
4 TEST SUMMARY
The product was tested in accordance with the following specifications. The Pass / Fail Criteria for the immunity tests were specified in Annex Ciii. All Testing has been performed according to below product classification:
Class B Emission Product
Test Results Summary
Emissions
Test Standard Description Product Class
Pass / Fail
EN55022:2006+A1:2007 AC Line Conducted Emissions See Above Pass
EN55022:2006+A1:2007 Radiated Emissions See Above Pass
Immunity
Test Standard Description Criterion Pass / Fail
Electrostatic Discharge Immunity B Pass EN55024:1998+A1:2001+A2:2003
Radiated Immunity A Pass
All measurement uncertainty is not taken into consideration for all presented test result.
Title: EMC Test Report for Handheld Computer Model: Ben NanoNote To: EN55022:2006+A1:2007, EN55024:1998+A1:2001+A2:2003
Serial#: 902535-2 Issue Date: December 09, 2009 Page: 8 of 48 www.siemic.com.cn
5 MEASUREMENTS, EXAMINATION AND DERIVED RESULTS
5.1 AC Line Conducted Emissions Test Result
Note:
1. All possible modes of operation were investigated. Only the 6 worst case emissions measured, using the correct CISPR and Average detectors, are reported. All other emissions were relatively insignificant.
2. A "-ve" margin indicates a PASS as it refers to the margin present below the limit line at the particular frequency.
3. Conducted Emissions Measurement Uncertainty All test measurements carried out are traceable to national standards. The uncertainty of the measurement at a confidence level of approximately 95% (in the case where distributions are normal), with a coverage factor of 2, in the range 9kHz – 30MHz (Average & Quasi-peak) is ±3.86dB.
4. Environmental Conditions Temperature 26ºC Relative Humidity 49% Atmospheric Pressure 1012mbar 5. Test Date : August 28- September 14 2009
Tested By : Andy.Hao
Title: EMC Test Report for Handheld Computer Model: Ben NanoNote To: EN55022:2006+A1:2007, EN55024:1998+A1:2001+A2:2003
Serial#: 902535-2 Issue Date: December 09, 2009 Page: 9 of 48 www.siemic.com.cn
5.1.1 Test Result Complying For EN55022:2006+A1:2007 Report Information Test Engineer : Andy Date : 2009-09-15 Customer/Company : Sharism At Work Limited EUT Description : Handheld Computer Neutral / Line : Line Temperature (Celsius) : 25 Humidity (%) : 50%
Graph-EN55022 / EN55011 /FCC Class B
Test Data Frequency
(MHz)
Quasi Peak
(dBuV)
Limit (dBuV)
Margin (dB)
Average (dBuV)
Limit (dBuV)
Margin (dB)
Factors (dB)
0.62 44.56 56.00 -11.44 43.99 46.00 -2.01 10.15 3.79 43.06 56.00 -12.94 40.37 46.00 -5.63 10.47 3.87 42.24 56.00 -13.76 39.09 46.00 -6.91 10.49 3.65 41.54 56.00 -14.46 39.57 46.00 -6.43 10.42 3.57 41.60 56.00 -14.40 39.41 46.00 -6.59 10.40 3.95 40.54 56.00 -15.46 37.01 46.00 -8.99 10.51
Title: EMC Test Report for Handheld Computer Model: Ben NanoNote To: EN55022:2006+A1:2007, EN55024:1998+A1:2001+A2:2003
Serial#: 902535-2 Issue Date: December 09, 2009 Page: 10 of 48 www.siemic.com.cn
Report Information Test Engineer : Andy Date : 2009-09-15 Customer/Company : Sharism At Work Limited EUT Description : Handheld Computer Neutral / Line : Neutral Temperature (Celsius) : 25 Humidity (%) : 50 %
Graph-EN55022 / EN55011 /FCC Class B
Test Data Frequency
(MHz)
Quasi Peak
(dBuV)
Limit (dBuV)
Margin (dB)
Average (dBuV)
Limit (dBuV)
Margin (dB)
Factors (dB)
0.62 44.21 56.00 -11.79 43.42 46.00 -2.58 10.14 3.78 35.40 56.00 -20.60 19.25 46.00 -26.75 10.44 3.86 36.48 56.00 -19.52 23.57 46.00 -22.43 10.47 3.93 31.60 56.00 -24.40 17.26 46.00 -28.74 10.49 3.56 28.46 56.00 -27.54 18.07 46.00 -27.93 10.37 3.63 26.89 56.00 -29.11 17.34 46.00 -28.66 10.39
Title: EMC Test Report for Handheld Computer Model: Ben NanoNote To: EN55022:2006+A1:2007, EN55024:1998+A1:2001+A2:2003
Serial#: 902535-2 Issue Date: December 09, 2009 Page: 11 of 48 www.siemic.com.cn
5.2 Radiated Emissions Test Results
Note:
1. All possible modes of operation were investigated. Only the 6 worst case emissions measured,
using the correct CISPR detectors, are reported. All other emissions were relatively insignificant. 2. A "-ve" margin indicates a PASS as it refers to the margin present below the limit line at the
particular frequency. 3. Radiated Emissions Measurement Uncertainty
All test measurements carried out are traceable to national standards. The uncertainty of the measurement at a confidence level of approximately 95% (in the case where distributions are normal), with a coverage factor of 2, in the range 30MHz – 1GHz (QP only @ 3m & 10m) is +6.0dB/-6.0dB (for EUTs < 0.5m X 0.5m X 0.5m).
4. Environmental Conditions Temperature 26ºC Relative Humidity 49% Atmospheric Pressure 1012mbar 5. Test date : August 28- September 14 2009
Tested By : Andy.Hao
Title: EMC Test Report for Handheld Computer Model: Ben NanoNote To: EN55022:2006+A1:2007, EN55024:1998+A1:2001+A2:2003
Serial#: 902535-2 Issue Date: December 09, 2009 Page: 12 of 48 www.siemic.com.cn
5.2.1 Test Result Complying For EN55022:2006+A1:2007 Report Information Test Engineer : Andy Date : 2009-9-16 Customer/Company : Sharism At Work Limited EUT Description : Handheld Computer Neutral / Line : EN55022 Class B Temperature (Celsius) : 25 Humidity (%) : 50%
Graph-EN55022 Class B
Test Data Frequency
(MHz)
Quasi Peak
(dBuV/m) Azimuth Polarity(H
/V) Height (cm)
Factors (dB)
Limit (dBuV/m)
Margin (dB)
168.01 29.98 40.00 H 352.00 -31.62 30.00 -1.72 529.22 21.59 314.00 H 99.00 -27.08 37.00 -15.41 730.82 38.31 282.00 H 121.00 -21.51 37.00 -1.81 680.42 37.47 173.00 H 169.00 -22.17 37.00 -2.47 629.99 35.12 327.00 H 101.00 -24.59 37.00 -1.88 159.59 25.06 62.00 H 367.00 -31.87 30.00 -4.94
Title: EMC Test Report for Handheld Computer Model: Ben NanoNote To: EN55022:2006+A1:2007, EN55024:1998+A1:2001+A2:2003
Serial#: 902535-2 Issue Date: December 09, 2009 Page: 13 of 48 www.siemic.com.cn
Report Information Test Engineer : Andy Date : 2009-9-16 Customer/Company : Sharism At Work Limited EUT Description : Handheld Computer Neutral / Line : EN55022 Class B Temperature (Celsius) : 25 Humidity (%) : 50 %
Graph-EN55022 Class B
Test Data Frequency
(MHz)
Quasi Peak
(dBuV/m) Azimuth Polarity(H
/V) Height (cm)
Factors (dB)
Limit (dBuV/m)
Margin (dB)
75.60 30.02 95.00 V 195.00 -38.70 30.00 -2.12 58.81 27.06 29.00 V 203.00 -38.18 30.00 -2.94 67.21 23.40 12.00 V 183.00 -38.66 30.00 -6.60 756.00 31.54 100.00 V 271.00 -21.73 37.00 -5.46 420.01 28.65 170.00 V 106.00 -29.20 37.00 -8.35 588.01 30.78 115.00 V 324.00 -26.21 37.00 -6.22
Title: EMC Test Report for Handheld Computer Model: Ben NanoNote To: EN55022:2006+A1:2007, EN55024:1998+A1:2001+A2:2003
Serial#: 902535-2 Issue Date: December 09, 2009 Page: 14 of 48 www.siemic.com.cn
5.3 EN55024:1998+A1:2001+A2:2003 Electrostatic Discharge Immunity Results Notes
1. Please refer to the Pass/Fail criteria to interpret the results. 2. Environmental Conditions Temperature 25oC Relative Humidity 48% Atmospheric Pressure 1019mbar 3. Human Body Model Storage Capacitor 150pF Discharge Resistor 330Ω
4. No. of Discharges / Point, Level & Polarity
10 air discharges 25 contact discharges
Discharge Details
Discharge Interval 1 second
5.
Measurement Uncertainty All test measurements carried out are traceable to national standards. The uncertainty of the measurement at a confidence level of approximately 95% (in the case where distributions are normal), with a coverage factor of 2, in the range ±2kV, ±4kV, ±8kV, ±10kV is ±7.12%.
6.
Test Date: August 28- September 14 2009 Tested By : Andy.Hao *the performance criteria B shall apply
Title: EMC Test Report for Handheld Computer Model: Ben NanoNote To: EN55022:2006+A1:2007, EN55024:1998+A1:2001+A2:2003
Serial#: 902535-2 Issue Date: December 09, 2009 Page: 15 of 48 www.siemic.com.cn
Discharge Type Test Severity Level Results
Air Discharges ±2kV, ±4kV ,±8kV Pass
Direct Contact Discharges ±2kV, ±4kV Pass
Indirect Contact Discharges ±2kV, ±4kV Pass
EUT
EUT
Air Discharges Contact Discharges
Contact Discharge
Air Discharge
Air Discharge
Title: EMC Test Report for Handheld Computer Model: Ben NanoNote To: EN55022:2006+A1:2007, EN55024:1998+A1:2001+A2:2003
Serial#: 902535-2 Issue Date: December 09, 2009 Page: 16 of 48 www.siemic.com.cn
5.4 EN55024:1998+A1:2001+A2:2003 Radiated Immunity Results
Notes
1. Please refer to the Pass/Fail criteria to interpret the results. 2. Environmental Conditions Temperature 25.5oC Relative Humidity 51% Atmospheric Pressure 1015mbar 3. Radiated Immunity Details Frequency Step 1% of fundamental Sweep Rate ≤ 1.5 X 10-3 decades/s
4. The test was carried out on one surface. The surface selected to face the source of the interference signal is the one anticipated to be the most susceptible.
5.
Measurement Uncertainty All test measurements carried out are traceable to national standards. The uncertainty of the measurement at a confidence level of approximately 95% (in the case where distributions are normal), with a coverage factor of 2, in the range from 80MHz-1GHz, test level ranges from 3V/m to 10V/m, is ±0.74V/m.
6.
Test Date : August 28- September 14 2009 Tested By : Andy.Hao *the performance criteria A shall apply
Sides Tested Frequency Range Test Severity Level Result
Front (H) 80MHz – 1GHz 3V/m, 80% AM (1kHz) Pass
Front (V) 80MHz – 1GHz 3V/m, 80% AM (1kHz) Pass
Right (H) 80MHz – 1GHz 3V/m, 80% AM (1kHz) Pass
Right (V) 80MHz – 1GHz 3V/m, 80% AM (1kHz) Pass
Left (H) 80MHz – 1GHz 3V/m, 80% AM (1kHz) Pass
Left (V) 80MHz – 1GHz 3V/m, 80% AM (1kHz) Pass
Back (H) 80MHz – 1GHz 3V/m, 80% AM (1kHz) Pass
Back (V) 80MHz – 1GHz 3V/m, 80% AM (1kHz) Pass
Title: EMC Test Report for Handheld Computer Model: Ben NanoNote To: EN55022:2006+A1:2007, EN55024:1998+A1:2001+A2:2003
Serial#: 902535-2 Issue Date: December 09, 2009 Page: 17 of 48 www.siemic.com.cn
Annex A. TEST INSTRUMENTATION
Annex A.i. TEST INSTRUMENTATION & GENERAL PROCEDURES
Instrument Model Serial # Calibration Due
Conducted Emissions R&S Receiver ESPI 3 101216 02/19/2010
Com-Power LISN LI 115 241090 05/02/2010 Com-Power LISN LI 115 241091 05/02/2010
Com-Power LIMITER LIT-153 531021 N/A
Radiated Emissions R&S Receiver ESPI 3 101216 02/19/2010
Sunol Sciences, Inc. Antenna (30MHz~2GHz) JB1 A112107 07/22/2010
HP Pre-amplifier 8447F 1937A01160 04/24/2010 Electrostatic Discharge Immunity
ESD Tester NSG433 192 01/16/2010 RF Radiated Immunity
IFR Signal Generator 2023B 202302/820 04/25/2010 AR Power Amplifier 50W1000B 311309 N/A
Sunol Sciences, Inc. Antenna (30MHz~2GHz) JB1 A112107 07/22/2010
Title: EMC Test Report for Handheld Computer Model: Ben NanoNote To: EN55022:2006+A1:2007, EN55024:1998+A1:2001+A2:2003
Serial#: 902535-2 Issue Date: December 09, 2009 Page: 18 of 48 www.siemic.com.cn
Annex A.ii. CONDUCTED EMISSIONS TEST DESCRIPTION Test Set-up 1. The EUT and supporting equipment were set up in accordance with the requirements of the standard on top of a 1.5m x 1m x
0.8m high, non-metallic table, as shown in Annex B.
2. The power supply for the EUT was fed through a 50Ω/50µH EUT LISN, connected to filtered mains. 3. The RF OUT of the EUT LISN was connected to the EMI test receiver via a low-loss coaxial cable. 4. All other supporting equipments were powered separately from another main supply. Test Method 1. The EUT was switched on and allowed to warm up to its normal operating condition. 2. A scan was made on the NEUTRAL line (for AC mains) or Earth line (for DC power) over the required frequency range using
an EMI test receiver. 3. High peaks, relative to the limit line, were then selected. 4. The EMI test receiver was then tuned to the selected frequencies and the necessary measurements made with a receiver
bandwidth setting of 10 KHz. For FCC tests, only Quasi-peak measurements were made; while for CISPR/EN tests, both Quasi-peak and Average measurements were made.
5. Steps 2 to 4 were then repeated for the LIVE line (for AC mains) or DC line (for DC power).
Sample Calculation Example
At 20 MHz limit = 250 µV = 47.96 dBµV Transducer factor of LISN, pulse limiter & cable loss at 20 MHz = 11.20 dB
Q-P reading obtained directly from EMI Receiver = 40.00 dBµV (Calibrated for system losses) Therefore, Q-P margin = 47.96 – 40.00 = 7.96 i.e. 7.96 dB below limit
Title: EMC Test Report for Handheld Computer Model: Ben NanoNote To: EN55022:2006+A1:2007, EN55024:1998+A1:2001+A2:2003
Serial#: 902535-2 Issue Date: December 09, 2009 Page: 19 of 48 www.siemic.com.cn
Annex A. iii RADIATED EMISSIONS TEST DESCRIPTION
EUT Characterisation
EUT characterisation, over the frequency range from 30MHz to 1GHz (for FCC tests, until the 5th harmonic for operating frequencies > 108MHz), was done in order to minimise radiated emissions testing time while still maintaining high confidence in the test results.
The EUT was placed in the chamber, at a height of about 0.8m on a turntable. Its radiated emissions frequency profile was observed, using a spectrum analyzer /receiver with the appropriate broadband antenna placed 3m away from the EUT. Radiated emissions from the EUT were maximised by rotating the turntable manually, changing the antenna polarisation and manipulating the EUT cables while observing the frequency profile on the spectrum analyzer / receiver. Frequency points at which maximum emissions occurred, clock frequencies and operating frequencies were then noted for the formal radiated emissions test at the Open Area Test Site (OATS).
Test Set-up 1. The EUT and supporting equipment were set up in accordance with the requirements of the standard on top of a 1.5m X 1.0m
X 0.8m high, non-metallic table as shown in Annex B. 2. The filtered power supply for the EUT and supporting equipment were tapped from the appropriate power sockets located on
the turntable. 3. The relevant broadband antenna was set at the required test distance away from the EUT and supporting equipment
boundary. Test Method 1. The EUT was switched on and allowed to warm up to its normal operating condition. 2. The test was carried out at the selected frequency points obtained from the EUT characterisation. Maximization of the
emissions, was carried out by rotating the EUT, changing the antenna polarization, and adjusting the antenna height in the following manner:
a. Vertical or horizontal polarisation (whichever gave the higher emission level over a full rotation of the EUT) was
chosen. b. The EUT was then rotated to the direction that gave the maximum emission.
c. Finally, the antenna height was adjusted to the height that gave the maximum emission. 3. A Quasi-peak measurement was then made for that frequency point. 4. Steps 2 and 3 were repeated for the next frequency point, until all selected frequency points were measured. 5. The frequency range covered was from 30MHz to 1GHz (for FCC tests, until the 5th harmonic for operating frequencies >
108MHz), using the Biconical antenna for frequencies from 30MHz to 230MHz, Log-periodical antenna for frequencies from 230MHz to 1GHz, and the Horn antenna above 1GHz.
Sample Calculation Example At 300 MHz limit = 200 µV/m = 46.00 dBµV/m Log-periodic antenna factor & cable loss at 300 MHz = 18.50 dB Q-P reading obtained directly from EMI Receiver = 40.00 dBµV/m (Calibrated level including antenna factors & cable losses) Therefore, Q-P margin = 46.00 – 40.00 = 6.00 i.e. 6 dB below limit
Title: EMC Test Report for Handheld Computer Model: Ben NanoNote To: EN55022:2006+A1:2007, EN55024:1998+A1:2001+A2:2003
Serial#: 902535-2 Issue Date: December 09, 2009 Page: 20 of 48 www.siemic.com.cn
Annex A.iv. ELECTROSTATIC DISCHARGE IMMUNITY TEST DESCRIPTION (EN61000-4-2:1998)
Test Set-up 1. The test set-up was in accordance with the standard. 2. The electrostatic discharge (ESD) gun was loaded with the correct charging / discharge network specified by the standard. 3. A 0.8m high, non-metallic table, with a Horizontal Coupling Plane (HCP) placed on the tabletop, was used as a test bench.
The EUT and supporting equipment were placed on the test bench, isolated from the HCP by a thin insulating sheet (0.5mm thick).
4. The HCP was grounded to the ground plane via two 470 k “bleed” resistors at each end of the ground cable. 5. A Vertical Coupling Plane (VCP) was also used during the test. The VCP was also grounded to the ground plane in a similar
manner as the HCP. Test Method 1. Direct Air & Contact Discharges
Applications of direct air and contact discharges to the discharge points specified by the customer were carried out in the following manner: a. The EUT was switched on and allowed to warm up to its normal operating condition. b. The test discharge points are shown in the ESD Test Points Section of Annex B.
c. For air discharges, the charged rounded electrode was positioned at a distance away from the test point and moved
towards the EUT at a steady rate until a discharge was made or until the electrode touched the EUT, whichever occurs first.
d. For contact discharges, the pointed electrode was applied directly to the test point, in contact with the conductive
surface of the EUT. The discharges were then made with the electrode in contact with the EUT.
e. The required number of positive and negative discharges was applied at each test point; with a one second interval between discharges.
f. The EUT was monitored during the test in accordance with the Pass / Fail criteria declared by the customer.
2. Indirect Coupling Plane Discharges
Indirect applications of discharges using the HCP & VCP were performed on the sides of the EUT in the following manner: a. The EUT was switched on and allowed to warm up to its normal operating condition. b. The discharges to the HCP / VCP were made 0.1m away from one side of the EUT.
c. The required numbers of positive and negative discharges were applied at each test point; with a one second
interval between discharges.
d. The EUT was monitored during the test in accordance with the Pass / Fail criteria declared by the customer.
e. The test was then repeated on the remaining necessary sides of the EUT.
Title: EMC Test Report for Handheld Computer Model: Ben NanoNote To: EN55022:2006+A1:2007, EN55024:1998+A1:2001+A2:2003
Serial#: 902535-2 Issue Date: December 09, 2009 Page: 21 of 48 www.siemic.com.cn
Annex A.v. RADIATED IMMUNITY TEST DESCRIPTION (EN61000-4-3:1998) Test Set-up 1. The EUT was set up inside a semi-anechoic chamber in accordance with the standard. 2. The EUT was placed on top of a 0.8m high, non-metallic table in a typical configuration. 3. An isotropic field probe was placed adjacent to the EUT. Test Method 1. The EUT was switched on and allowed to warm up to its normal operating condition. 2. The EUT was exercised and monitored in the manner specified by the customer. 3. All test instruments were PC controlled, via their IEEE 488.2 bus interfaces, and the test conducted in the following manner:
a. The testing frequencies were swept over the required frequency range, with a step frequency equal to 1% of fundamental. The sweep rate was < 1.5 x 10-3 decades/s.
b. For each frequency tested, the incident power to the antenna was adjusted to the required unmodulated test level, as
established during the chamber calibration. With the incident power at the correct level, the 80% AM 1kHz AF was switched on for the specified dwell time.
4. The EUT was continuously monitored during the test in accordance with the Pass / Fail criteria declared by the customer. 5. The test was done in both horizontal and vertical antenna polarizations, and for all necessary sides of the EUT.
Title: EMC Test Report for Handheld Computer Model: Ben NanoNote To: EN55022:2006+A1:2007, EN55024:1998+A1:2001+A2:2003
Serial#: 902535-2 Issue Date: December 09, 2009 Page: 22 of 48 www.siemic.com.cn
Annex B. EUT AND TEST SETUP PHOTOGRAPHS
Annex B.i. Photograph 1: EUT External Photo
Title: EMC Test Report for Handheld Computer Model: Ben NanoNote To: EN55022:2006+A1:2007, EN55024:1998+A1:2001+A2:2003
Serial#: 902535-2 Issue Date: December 09, 2009 Page: 23 of 48 www.siemic.com.cn
Title: EMC Test Report for Handheld Computer Model: Ben NanoNote To: EN55022:2006+A1:2007, EN55024:1998+A1:2001+A2:2003
Serial#: 902535-2 Issue Date: December 09, 2009 Page: 24 of 48 www.siemic.com.cn
Annex B.ii. Photograph 2: EUT Internal Photo
Title: EMC Test Report for Handheld Computer Model: Ben NanoNote To: EN55022:2006+A1:2007, EN55024:1998+A1:2001+A2:2003
Serial#: 902535-2 Issue Date: December 09, 2009 Page: 25 of 48 www.siemic.com.cn
Title: EMC Test Report for Handheld Computer Model: Ben NanoNote To: EN55022:2006+A1:2007, EN55024:1998+A1:2001+A2:2003
Serial#: 902535-2 Issue Date: December 09, 2009 Page: 26 of 48 www.siemic.com.cn
Annex B.iii. Photograph 2: Test setup Photo
Conducted Emissions Front View
Conducted Emissions Side View
Title: EMC Test Report for Handheld Computer Model: Ben NanoNote To: EN55022:2006+A1:2007, EN55024:1998+A1:2001+A2:2003
Serial#: 902535-2 Issue Date: December 09, 2009 Page: 27 of 48 www.siemic.com.cn
Radiated Emissions Front View
Radiated Emissions Rear View
Title: EMC Test Report for Handheld Computer Model: Ben NanoNote To: EN55022:2006+A1:2007, EN55024:1998+A1:2001+A2:2003
Serial#: 902535-2 Issue Date: December 09, 2009 Page: 28 of 48 www.siemic.com.cn
Radiated Immunity Front View
Radiated Immunity Rear View
Title: EMC Test Report for Handheld Computer Model: Ben NanoNote To: EN55022:2006+A1:2007, EN55024:1998+A1:2001+A2:2003
Serial#: 902535-2 Issue Date: December 09, 2009 Page: 29 of 48 www.siemic.com.cn
Annex C. TEST SETUP AND SUPPORTING EQUIPMENT
EUT TEST CONDITIONS
Annex C. i. SUPPORTING EQUIPMENT DESCRIPTION
The following is a description of supporting equipment and details of cables used with the EUT.
Equipment Description (Including Brand Name)
Model & Serial Number Cable Description
(List Length, Type & Purpose)
Dell Computer INSPIRON 531 & 5N48F2X 2m VGA Cable
Dell Monitor T980KACDK21 & TWS20006045 N/A
Dell Mouse MOC5UO & H0S00A91 2m USB Cable
Dell Keyboard SK-8115 & N/A 2m USB Cable
Title: EMC Test Report for Handheld Computer Model: Ben NanoNote To: EN55022:2006+A1:2007, EN55024:1998+A1:2001+A2:2003
Serial#: 902535-2 Issue Date: December 09, 2009 Page: 30 of 48 www.siemic.com.cn
LISN 230V 50Hz
230V @ 50Hz, Power Input
Wooden table, 80cm above ground plane
Host Computer
EUT
Monitor
Keyboard Mouse
Block Configuration Diagram for Conducted Emissions
Title: EMC Test Report for Handheld Computer Model: Ben NanoNote To: EN55022:2006+A1:2007, EN55024:1998+A1:2001+A2:2003
Serial#: 902535-2 Issue Date: December 09, 2009 Page: 31 of 48 www.siemic.com.cn
Wooden table, 80cm above ground plane
Host Computer
EUT Monitor
Keyboard Mouse
Block Configuration Diagram for Radiated Emissions
Receiving Antenna
10 Meter
Title: EMC Test Report for Handheld Computer Model: Ben NanoNote To: EN55022:2006+A1:2007, EN55024:1998+A1:2001+A2:2003
Serial#: 902535-2 Issue Date: December 09, 2009 Page: 32 of 48 www.siemic.com.cn
Annex C.ii. EUT OPERATING CONDITIONS The following is the description of how the EUT is exercised during testing.
Test Description Of Operation
Emissions
The EUT is worked under test program to stimulate the worst case.
Immunity The EUT is worked under test program to stimulate the worst case.
Title: EMC Test Report for Handheld Computer Model: Ben NanoNote To: EN55022:2006+A1:2007, EN55024:1998+A1:2001+A2:2003
Serial#: 902535-2 Issue Date: December 09, 2009 Page: 33 of 48 www.siemic.com.cn
Annex C.iii. PASS / FAIL CRITERIA & MONITORING METHODS For compliance to the immunity requirements of the Directive, the EUT must comply with the correct Performance Criteria (A, B or C) stipulated in the relevant standard. Performance Criteria A – the equipment should continue as intended without operator intervention. No degradation of performance or loss of function is allowed below a performance level specified by the manufacturer when the equipment is used as intended. The performance level may be replaced by a permissible loss of performance. If the minimum performance level or the permissible loss is not specified by the manufacturer, then either of these may be derived from the product description and documentation, and by what the user may reasonably expect from the equipment id used as intended. Performance Criteria B – After the test, the equipment shall continue to operate as intended without operator intervention. No degradation of performance or loss of function is allowed, after the application of the phenomena below a performance level specified by the manufacturer, when the equipment is used as intended. The performance level mat be replaced by a permissible loss of performance. During the test, degradation of performance is allowed. However, no change of operating state or store data is allowed to persist after the test. If the minimum performance level (or the permissible performance loss) is not specified by the manufacturer, then either of these may be derived from the product description and documentation, and by what the user may reasonably expect from the equipment id used as intended. Performance Criteria C – Loss of function is allowed, provided the function is self-recoverable, or can be operation of the control by the user in accordance with the manufacturer’s instruction. Function, and/or information stored in non-volatile memory, or protested by a battery, shall not be lost. Please refer to the standard for the full Performance Criteria description.
Title: EMC Test Report for Handheld Computer Model: Ben NanoNote To: EN55022:2006+A1:2007, EN55024:1998+A1:2001+A2:2003
Serial#: 902535-2 Issue Date: December 09, 2009 Page: 34 of 48 www.siemic.com.cn
Annex D. USER MANUAL / BLOCK DIAGRAM / SCHEMATICS / PART LIST
Please see attachment
Title: EMC Test Report for Handheld Computer Model: Ben NanoNote To: EN55022:2006+A1:2007, EN55024:1998+A1:2001+A2:2003
Serial#: 902535-2 Issue Date: December 09, 2009 Page: 35 of 48 www.siemic.com.cn
Annex E. SIEMIC ACCREDITATION CERTIFICATES
SIEMIC ACREDITATION DETAILS: A2LA Certificate Number: 2742.01
Title: EMC Test Report for Handheld Computer Model: Ben NanoNote To: EN55022:2006+A1:2007, EN55024:1998+A1:2001+A2:2003
Serial#: 902535-2 Issue Date: December 09, 2009 Page: 36 of 48 www.siemic.com.cn
SIEMIC ACCREDITATION DETAILS: FCC Registration NO:986914
Title: EMC Test Report for Handheld Computer Model: Ben NanoNote To: EN55022:2006+A1:2007, EN55024:1998+A1:2001+A2:2003
Serial#: 902535-2 Issue Date: December 09, 2009 Page: 37 of 48 www.siemic.com.cn
SIEMIC ACCREDITATION DETAILS: FCC Listing, Registration NO:986914
Title: EMC Test Report for Handheld Computer Model: Ben NanoNote To: EN55022:2006+A1:2007, EN55024:1998+A1:2001+A2:2003
Serial#: 902535-2 Issue Date: December 09, 2009 Page: 38 of 48 www.siemic.com.cn
SIEMIC ACCREDITATION DETAILS: Industry of Canada Registration No. 4842
SIEMIC ACCREDITATION DETAILS: Japan VCCI Accreditation No. 3081
Title: EMC Test Report for Handheld Computer Model: Ben NanoNote To: EN55022:2006+A1:2007, EN55024:1998+A1:2001+A2:2003
Serial#: 902535-2 Issue Date: December 09, 2009 Page: 39 of 48 www.siemic.com.cn
SIEMIC ACCREDITATION DETAILS: Japan VCCI Accreditation No. 3081
Title: EMC Test Report for Handheld Computer Model: Ben NanoNote To: EN55022:2006+A1:2007, EN55024:1998+A1:2001+A2:2003
Serial#: 902535-2 Issue Date: December 09, 2009 Page: 40 of 48 www.siemic.com.cn
SIEMIC ACCREDITATION DETAILS: Japan VCCI Accreditation No. 3081
Title: EMC Test Report for Handheld Computer Model: Ben NanoNote To: EN55022:2006+A1:2007, EN55024:1998+A1:2001+A2:2003
Serial#: 902535-2 Issue Date: December 09, 2009 Page: 41 of 48 www.siemic.com.cn
SIEMIC ACCREDITATION DETAILS: Korea CAB from NIST: US0160
Title: EMC Test Report for Handheld Computer Model: Ben NanoNote To: EN55022:2006+A1:2007, EN55024:1998+A1:2001+A2:2003
Serial#: 902535-2 Issue Date: December 09, 2009 Page: 42 of 48 www.siemic.com.cn
SIEMIC ACCREDITATION DETAILS: Taiwan BSMI CAB Accreditation No. SL2-IN-E-1130R
Title: EMC Test Report for Handheld Computer Model: Ben NanoNote To: EN55022:2006+A1:2007, EN55024:1998+A1:2001+A2:2003
Serial#: 902535-2 Issue Date: December 09, 2009 Page: 43 of 48 www.siemic.com.cn
SIEMIC ACCREDITATION DETAILS: Taiwan NCC CAB ID: US0160
Title: EMC Test Report for Handheld Computer Model: Ben NanoNote To: EN55022:2006+A1:2007, EN55024:1998+A1:2001+A2:2003
Serial#: 902535-2 Issue Date: December 09, 2009 Page: 44 of 48 www.siemic.com.cn
SIEMIC ACCREDITATION DETAILS: Mexico NOM Recognition
Title: EMC Test Report for Handheld Computer Model: Ben NanoNote To: EN55022:2006+A1:2007, EN55024:1998+A1:2001+A2:2003
Serial#: 902535-2 Issue Date: December 09, 2009 Page: 45 of 48 www.siemic.com.cn
SIEMIC ACCREDITATION DETAILS: Hong Kong OFTA Recognition No. D23/16V
Title: EMC Test Report for Handheld Computer Model: Ben NanoNote To: EN55022:2006+A1:2007, EN55024:1998+A1:2001+A2:2003
Serial#: 902535-2 Issue Date: December 09, 2009 Page: 46 of 48 www.siemic.com.cn
SIEMIC ACCREDITATION DETAILS: OFTA CAB from NIST: US0160
Title: EMC Test Report for Handheld Computer Model: Ben NanoNote To: EN55022:2006+A1:2007, EN55024:1998+A1:2001+A2:2003
Serial#: 902535-2 Issue Date: December 09, 2009 Page: 47 of 48 www.siemic.com.cn
SIEMIC ACCREDITATION DETAILS: Australia NATA Recognition
Title: EMC Test Report for Handheld Computer Model: Ben NanoNote To: EN55022:2006+A1:2007, EN55024:1998+A1:2001+A2:2003
Serial#: 902535-2 Issue Date: December 09, 2009 Page: 48 of 48 www.siemic.com.cn