Scanning Probe Microscopy - Lecture By Prof. Dr. Othmar ... · Scanning Probe Microscopy - Lecture...
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Scanning Probe Microscopy - Lecture By Prof. Dr. Othmar Marti Summer Term 2011, Tuesdays from 13:00 till 16:00 in N24/252 Contents 1. Overview on Scanning Microscope Techniques 1. Principles of Operation 2. Scanners and Scanning Stages 3. Sampling 2. Scanning Tunnelling Microscopy 1. Theory 2. Instruments 3. Probes 4. Specific Modes 5. Tunnelling Spectroscopy 6. Noise in STM 3. Atomic Force Microscopy 1. Theory 2. Instruments 3. Probes 4. Specific Modes 1. Contact Mode AFM 2. Tribology 3. Non-Contact AFM 4. Force Spectroscopy 5. Capacitance Measurements 6. Intermittent Contact AFM 7. Higher Harmonic Modes 8. Dissipation Processes 4. Scanning Near Field Optical Microscopy 1. Aperture Based Microscopes 2. Scattering Microscopes 3. Optical Spectroscopy 5. Other Scanned Probe Microscopies 1. Scanning Ion Conductance Microscopy 2. Scanning Electrochemical Microscopy 3. Scanning Acoustical Microscopy 4. Photonic Force Microscopy 6. Image Analysis and Processing 1. Data Storage and Rendering 2. Filtering 3. Fourier-Methods Description Scanning Probe Methods (SPM) are ubiquitous in laboratories today. Based on the invention of the Scanning Tunnelling Microscope (STM) of the Nobel laureates Binnig and Rohrer (1986) a broad range of instruments emerged, such as the Atomic Force Microscope (AFM) and its descendants, Scanning Near- Field Optical Microscope (SNOM) and many more of them. Nowadays SPM is used in basic research (surface science, molecules at surfaces, electrochemistry, superconductivity) as well as in the life sciences and in industry (process monitoring, polymers, ceramics, semiconductors). This lecture in English gives an introduction to this family of techniques. It will explain the theoretical foundations of the tools, show how the corresponding microscopes are constructed and how they are used. Selected key experiments carried out using these techniques are explained. The lecture will conclude with an introduction to data handling, treatment and visualization in the scanning probe techniques. This lecture starts on Tuesday, April 12 th . Contact: Othmar Marti ([email protected], 23011) Left side: Scanning Tunneling Microscope, right side: Photonic Force Microscope
Transcript of Scanning Probe Microscopy - Lecture By Prof. Dr. Othmar ... · Scanning Probe Microscopy - Lecture...
Scanning Probe Microscopy - Lecture By Prof. Dr. Othmar Marti
Summer Term 2011, Tuesdays from 13:00 till 16:00 in N24/252
Contents1. Overview on Scanning Microscope Techniques
1. Principles of Operation2. Scanners and Scanning Stages3. Sampling
2. Scanning Tunnelling Microscopy1. Theory2. Instruments3. Probes4. Specific Modes5. Tunnelling Spectroscopy6. Noise in STM
3. Atomic Force Microscopy1. Theory2. Instruments3. Probes4. Specific Modes
1. Contact Mode AFM2. Tribology3. Non-Contact AFM4. Force Spectroscopy5. Capacitance Measurements6. Intermittent Contact AFM7. Higher Harmonic Modes 8. Dissipation Processes
4. Scanning Near Field Optical Microscopy1. Aperture Based Microscopes2. Scattering Microscopes3. Optical Spectroscopy
5. Other Scanned Probe Microscopies1. Scanning Ion Conductance Microscopy2. Scanning Electrochemical Microscopy3. Scanning Acoustical Microscopy4. Photonic Force Microscopy
6. Image Analysis and Processing1. Data Storage and Rendering2. Filtering3. Fourier-Methods
DescriptionScanning Probe Methods (SPM) are ubiquitous in laboratories today. Based on the invention of the Scanning Tunnelling Microscope (STM) of the Nobel laureates Binnig and Rohrer (1986) a broad range of instruments emerged, such as the Atomic Force Microscope (AFM) and its descendants, Scanning Near-Field Optical Microscope (SNOM) and many more of them. Nowadays SPM is used in basic research (surface science, molecules at surfaces, electrochemistry, superconductivity) as well as in the life sciences and in industry (process monitoring, polymers, ceramics, semiconductors).This lecture in English gives an introduction to this family of techniques. It will explain the theoretical foundations of the tools, show how the corresponding microscopes are constructed and how they are used. Selected key experiments carried out using these techniques are explained. The lecture will conclude with an introduction to data handling, treatment and visualization in the scanning probe techniques.This lecture starts on Tuesday, April 12th.
Contact: Othmar Marti ([email protected], 23011)
Left side: Scanning Tunneling Microscope, rightside: Photonic Force Microscope
