S09 03 (Feldman) 110621 web · Ira Feldman Feldman Engineering Corp. Overview • Cost, Price, &...
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1 June 12 to 15, 2011 San Diego, CA Probe Card Cost Drivers from Architecture to Zero Defects Ira Feldman Feldman Engineering Corp. Overview • Cost, Price, & Cost Drivers • Serial Processing – Drilling Example NRE • NRE • Advanced Process Technology • Profitless Prosperity • Cost Savings June 12 to 15, 2011 IEEE SW Test Workshop 2 • Summary Note: price/cost examples are approximate and from multiple vendors not necessarily those identified or shown.
Transcript of S09 03 (Feldman) 110621 web · Ira Feldman Feldman Engineering Corp. Overview • Cost, Price, &...
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June 12 to 15, 2011San Diego, CA
Probe Card Cost Drivers from Architecture to Zero Defects
Ira FeldmanFeldman Engineering Corp.
Overview• Cost, Price, & Cost Drivers
• Serial Processing – Drilling Example
NRE• NRE
• Advanced Process Technology
• Profitless Prosperity
• Cost Savings
June 12 to 15, 2011 IEEE SW Test Workshop 2
• Summary
Note: price/cost examples are approximate and from multiple vendors not necessarily those identified or shown.
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Price
CostValue
Cost
June 12 to 15, 2011 IEEE SW Test Workshop 3
Gross Profit = Price – CostGross Margin = Gross Profit / Price
Vertical Probe Head
Printed Circuit Board
Space Transformer
BGA (Solder Attach)
Upper Guide Plate
Spacer
June 12 to 15, 2011 IEEE SW Test Workshop 4
MicroProbe Apollo
Lower Guide Plate
Spacer
Probes
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Machine ShopCost DriversCost DriversProgramming
MaterialSetup TimeRun Time
June 12 to 15, 2011 IEEE SW Test Workshop 5
Run TimeInspection
Yield
June 12 to 15, 2011 IEEE SW Test Workshop 6
Don’t bother… “Ferrari”
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June 12 to 15, 2011 IEEE SW Test Workshop 7
Don’t bother… “Ferrari”
Machine Cost $300,000 Annual Maintenance 7%
Useful Life 7 yearsTotal Cost $447,000
Facilities Annual Cost $35,000 Total Annual Cost $68,857
Machine Cost25% utilization $31.44 /hr85% utilization $9.25 /hr
Tooling per hole $ 0.05
Make vs. Buy
UtilizationLead Time
Quality
June 12 to 15, 2011 IEEE SW Test Workshop 8
Fixed vs. Variable CostCost (Make) vs. Price (Buy)
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Non Recurring EngineeringExpense
Architecture Design Tester CustomerR&D NRE NRE NRE
Design Input X XProbes ?
Guide Plates XSpace Transformer X
Interposer ?PCB Design X (External?) X ?
PCB Fab External ? ?M h i l H/W ? X ?
June 12 to 15, 2011 IEEE SW Test Workshop 9
NREMechanical H/W ? X ?
Electronics ? ? ?Metrology X X ?Packaging X ?
Outgoing Metrology
June 12 to 15, 2011 IEEE SW Test Workshop 10
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Interposers ISC
Spring Pin Elastomeric Molded Frame
Small Area NRE $.5 - 1 K $2 - 3 K $20 - 30 K
$ / contact $1 - 10 $ 50 - 60 < $ 20 - 40$ / contact $1 10 $.50 .60 < $.20 .40
Large Area(1/4 wafer +)
NRE $10 - 15 K $100 - 150 K
$ / contact $.40 - . 50 < $.10 - .20
June 12 to 15, 2011 IEEE SW Test Workshop 11
www.ksdk.co.jp ISC InterCon Systems
SequentialPunch
Space Transformers
SequentialPunch
Material & Material & Processing
June 12 to 15, 2011 IEEE SW Test Workshop 12
Processing
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Advanced Process TechnologyCost DriversProcess StepsMasksSubstrates
MaterialActive Area
YieldDefect Density
June 12 to 15, 2011 IEEE SW Test Workshop 13
Defect DensityLayers
EquipmentRework / Repair
Whitespace
Design 1 Design 2
Design 1 Design 2
June 12 to 15, 2011 IEEE SW Test Workshop 14
FormFactor Harmony XP
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Solution
June 12 to 15, 2011 IEEE SW Test Workshop 15
FormFactor Smart Matrix
ars;
VR
GY
-7 y
ears
rs
; MJC
–5
year
s; J
EM
-5 y
e
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FOR
M –
9 ye
a
9
Costs Savings
STANDARDSInput Data Formats
Probe DepthTesthead Configurations
Specifications
June 12 to 15, 2011 IEEE SW Test Workshop 17
Summary
• Understand true cost of architectures– Beware of NRE
– New architectures needed for cost reductions
• Maintain sufficient Gross Margin– Company health
– Funding for R&D
• Honest supplier – customer partnerships
June 12 to 15, 2011 IEEE SW Test Workshop 18
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Acknowledgments• Amphenol InterCon Systems
• BucklingBeam
• FormFactor• FormFactor
• ISC
• Kern
• Robin McAdams
• MicroProbe
• Sergio Perez
• SV Probe
• Frank Swiatowiec
June 12 to 15, 2011 IEEE SW Test Workshop 19
Thank You!Ira Feldman
Visit my blog
www.hightechbizdev.comwww.hightechbi dev.com
for my summary of SWTW
June 12 to 15, 2011 IEEE SW Test Workshop 20
