Rew Test1 Spr 13

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1 MSOE EECS EE-1910-11/2905-011 Winter 2012 Professor Hue Tran Topics covered for test 1 ate! Tuesda" of t#e $ t#  %ee&  'Marc# 2( ) 201*+ ,ocation! oo. S-*(5 Ti.e! 9!00a. to 10!00a. Checkoff: 10:00am – 10:50am (or earlier).  The checkoff session: Roll call will start with the last name starting with character A. Student nterit"! The student must perform this test without getting assistances from any other persons or any references unless otherwise i nstructed. If the student viol ates these rules, s/he wi ll e  penali!ed with a failure grade "#$ for the test and other additional penalties according to the %&'( policy of dishonesty. The student is advised to try his/her est to protect his/her work from eing copied y other persons. )lease refer to the %&'( )olicy on &tudent Integrity stated in the %&'( Undergraduate Catalog . ote! The test has two parts ! Part : *o references e+cept an engineering calculator Part : 'pen however, wire/wireless access to e+ternal sources will not e allowed  344 pro 4e.s in part are raded in inar" for.at! Pass or fai4 It is completely your responsiilities to make sure that your hardware and software needed for the test are in e+cellent working order Ma4function of t#e #ard%are and soft%are cannot e used as an e6cuse -ou may have different test uestions from the persons sitting ne+t to you. The test will e terminated immediately if the instructor decides that your system may cause harm/damage to you, other persons in the room, and/or euipments. -ou will receive !ero points for this test. The grade for this test will count 10 toward the course grade. )lease e reminded that make up test is not availale e+cept for special cases. )lease refer to The conduct of the course2 discussed during the first meeting of the course and/or contact the course instructor if you do not fully understand this policy. )lease contact your instructor efore the test day if you have any uestions. Any uestions related to the grading of the course must e cleared with the course3s professor within one week after the grade was reported. Topics! Topics in prereuisites course: %A415 "implicit and e+plicit$ &oftware/ha rdware reuired for the development of programs for the Atmega657) and the AR89I *'4 9*' with support components/devices "the kit$.  *umer systems and related ope rations, codes. The first three steps of software design life cycle: )rolem/specifica tions formulation/investigat ion, flowchart, pseudo4code, Arduino/ire/; language

Transcript of Rew Test1 Spr 13

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1

MSOE

EECS

EE-1910-11/2905-011

Winter 2012

Professor Hue Tran

Topics covered for test 1

• ate! Tuesda" of t#e $t# %ee&  'Marc# 2( ) 201*+

• ,ocation! oo. S-*(5

• Ti.e! 9!00a. to 10!00a.

• Checkoff: 10:00am – 10:50am (or earlier). The checkoff session: Roll call will

start with the last name starting with character A.

Student nterit"!

The student must perform this test without getting assistances from any other persons or

any references unless otherwise instructed. If the student violates these rules, s/he will e

 penali!ed with a failure grade "#$ for the test and other additional penalties according to

the %&'( policy of dishonesty. The student is advised to try his/her est to protecthis/her work from eing copied y other persons.

)lease refer to the %&'( )olicy on &tudent Integrity stated in the %&'( UndergraduateCatalog . 

ote!

• The test has two parts!

Part : *o references e+cept an engineering calculator 

Part : 'pen however, wire/wireless access to e+ternal sources will not e allowed  344 pro4e.s in

part are raded in inar" for.at! Pass or fai4

• It is completely your responsiilities to make sure that your hardware and software needed for the test

are in e+cellent working order Ma4function of t#e #ard%are and soft%are cannot e used as an

e6cuse

• -ou may have different test uestions from the persons sitting ne+t to you.

• The test will e terminated immediately if the instructor decides that your system may cause

harm/damage to you, other persons in the room, and/or euipments. -ou will receive !ero points for

this test.

• The grade for this test will count 10 toward the course grade.

• )lease e reminded that make up test is not availale e+cept for special cases. )lease refer to The

conduct of the course2 discussed during the first meeting of the course and/or contact the course

instructor if you do not fully understand this policy.

• )lease contact your instructor efore the test day if you have any uestions.

Any uestions related to the grading of the course must e cleared with the course3s professor within

one week after the grade was reported.

Topics!• Topics in prereuisites course: %A415 "implicit and e+plicit$

• &oftware/hardware reuired for the development of programs for the Atmega657) and the AR89I*'4

9*' with support components/devices "the kit$.

•  *umer systems and related operations, codes.

• The first three steps of software design life cycle: )rolem/specifications formulation/investigation,

flowchart, pseudo4code,

• Arduino/ire/; language

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• )rogram I/' pins

• )rogram pull4up resistors for input pins

• 8ata types

• 8eclare data type of variales

•  I/' statements "write/read to/from pins and display to monitor$

•  8elay function

• Arithmetic operators and statements

• ;omparison "relational$ operators and e+pressions

• <oolean "=ogical$ operators and statements

• ;ontrol structure: I#,I#>(lse, *ested>I#, &witch>case

• %ust e ale to draw a flowchart from a program

• Analy!e/design circuits to interface =(8s to AR89I*'>9*'

• %ust e ale to design a program from a flowchart and/or word specification using all aove

Atmega657) architecture and ; language features.

• %ust e ale to use the I8( to create, compile, and deug, download, and e+ecute a program

• ;lass discussion and la sessions of weeks: 1,5,6