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    Notes:

    This paper has been downloaded from SMART Group or Nepcon web siThis paper has been downloaded from SMART Group or Nepcon web sitestes

    www.nepcon.co.ukwww.nepcon.co.uk www.smartgroup.orgwww.smartgroup.org

    Email SMART Group atEmail SMART Group [email protected]@smartgroup.org

    The SMART Group A guiding Influence in the Electronics IndustThe SMART Group A guiding Influence in the Electronics Industryry

    Notes:

    NEPCON Brighton 2 0 0 4

    Smart GROUP

    Lead-free Experience 2

    Components in a lead-free environment

    Angus Westwater

    2. Restriction of use of certain Hazardous Substances

    - RoHS Directive.

    1. Waste Electrical and Electronic Equipment

    - WEEE Directive.

    Cadmium Mercury Hexavalent Chromium

    Lead Polybrominated Biphenyls (PBBs)

    & - Polybrominated Diphenyl Ethers (PBDEs)

    Legislative Directives

    Components in a Lead-Free Environment

    Termination plating Lead-free

    Solderability

    Increased process temperature.

    - Thermo mechanical fatigue (TMF)

    - Moisture sensitivity level (MSL)

    Placement accuracy Self alignment

    Lead contamination Transition period

    Tin whiskers

    Lead Free Component

    1. No change to functionality specification.

    2. Qualified to 260 C- 265C soldering temperatures

    3. One or Two passes through the soldering process.

    Typical Termination

    Lead-Free Solder Plating

    Tin, Silver, Copper SnAgCu

    Tin, Silver - SnAg

    Tin, Copper - SnCu

    Nickel, Gold (on Copper) - CuNiAu

    Tin (on Nickel) - Sn

    Palladium, Gold - PdAu

    Tin, Bismuth - SnBi*

    * Will become more viable when lead has been removed

    from the soldering process (PbBi low melting phase)

    Reflow Process Temperature Profiles

    - 183C (eutectic)

    - 215HHHHC

    - 235HHHHCSMD reflow

    - 250HHHHC

    flow/wave

    67HHHHC

    Leaded (SnPb) process

    Component durability

    re-qualification increase 10C

    flow/wave

    - 217HHHHC (Sn3Ag0.5Cu)

    - 235HHHHC

    - 240HHHHC

    SMD reflow

    - 260HHHHC

    33HHHHC

    Note: Sn2Cu for wave

    melting point = 227HHHHC)

    Lead-free process

    +10HHHHC

    Possibility to reduce

    the superheat zone to 12HHHHC

    (229C)

    Superheat zone

    32HHHHCSuperheat zone

    18HHHHC

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    Notes:

    This paper has been downloaded from SMART Group or Nepcon web siThis paper has been downloaded from SMART Group or Nepcon web sitestes

    www.nepcon.co.ukwww.nepcon.co.uk www.smartgroup.orgwww.smartgroup.org

    Email SMART Group atEmail SMART Group [email protected]@smartgroup.org

    The SMART Group A guiding Influence in the Electronics IndustThe SMART Group A guiding Influence in the Electronics Industryry

    Notes:

    Reflow Soldering Profiles for Leadfree Solder

    Time

    a) High peak soldering temperature -Pb free

    b) Longer a bove process temp. Pb

    free

    150HHHHC

    260 HHHHC

    230 HHHHC

    Temperature

    Typi cal SnPb soldering

    temperature profile

    SnPb melting point

    183 HHHHC

    SnAgCu melting point

    217 HHHHC

    C) Higher and longer preheating - Pb free

    Ramp Soak Spike Cool

    Increased heat Longer duration

    Solder print area

    Solder Bath

    Fluxsprayer

    Lead-frame

    Die attach

    Bond wires

    Epoxy Molding

    Termination Solder Plating Processes

    Solder Dipping

    Barrel Electroplating

    +

    -Electroplating anode

    material (tin)

    Marking Cropping

    Final tes t Tape& Reel

    Electroplating

    solution

    Hopper/feeder

    approx.

    10,000 pcs/lot

    PrinterStrain gauge

    & Controller

    Sample

    Heated block

    Molten

    Solder pellet

    Component Termination SolderabilityForce +

    Force -

    TimeA

    Downward Force

    Solder

    wetting

    B

    Point B

    Point C

    C Max wetting force

    Key parameter

    Wetting time

    A D seconds

    D

    Upward Force

    Immersion depth

    0.1 mm

    Solder surface

    (meniscus)

    IPC/EIA J-STD-002A

    PCB solder pad wetting - SnPb versus Pb free

    SnPb solder paste

    Total pad coverage

    with SnPb solder

    Leadfree solder paste

    Pb free higher surface tension produces slower wetting

    (Improvements in nitrogen gas environment)

    Copper hallow

    REFLOW

    HEAT

    REFLOW

    HEAT

    The lead-free Solder Joint

    Copper hallow

    Sn10Pb plating

    Sn37Pb solder

    Sn plating SnAgCu

    Not a solderability iss ue: Inspection & training

    Solder paste 70%

    PCB platting 25%

    Component plating 5% (SnPb)

    Solder joint material

    by volume

    Pb diffusion into so lder

    Pb free solder

    paste SnAgCu

    SnPb platting 10 thick

    Lead collects in l ast area to cool.

    Pb rich region with poor thermal cycling

    fatigue characteristics

    Lead Contamination of Solder Joint.

    (Thermal cycling - Increase in mechanical fatigue.)

    SnAgCu+Pb Meltingpoint and solidification can be

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    Notes:

    This paper has been downloaded from SMART Group or Nepcon web siThis paper has been downloaded from SMART Group or Nepcon web sitestes

    www.nepcon.co.ukwww.nepcon.co.uk www.smartgroup.orgwww.smartgroup.org

    Email SMART Group atEmail SMART Group [email protected]@smartgroup.org

    The SMART Group A guiding Influence in the Electronics IndustThe SMART Group A guiding Influence in the Electronics Industryry

    Notes:

    Reflow /Flow Process(Lead contamination of PCB top side leadfree solder)

    Lead bearing terminations (SnPb)

    Leadfree solder SnAgCu (MP 217HHHHC)

    Courtesy Seiko Epson

    Top si de >170 HHHHC

    (high risk of lifting)

    Top side max 150 HHHHC

    Lifting prevented

    Top side solder alloy SnAgCu +Pb (MP < 180 HHHHC)

    Flow process

    Lead-free Introduced Tombstone Failures

    Lead-Free solders Increased su rface tension

    Increased solidification temperature range

    Com ponent miniaturisation

    PCB component pad dimensions/tracking

    and heat transfer route become critical

    Further reduction in the PCB assembly process window

    Heat

    transfer

    Heat

    transfer

    Faster solidification

    Solder shrink force

    Tin (Sn) plating has many desirable qualities.

    Easily applied, non toxic

    Good corrosion protection (shelf life)

    Excellent solderability.

    Tin Plating

    Down Side

    Under certain circumstances, spontaneous growths of

    metallic filaments will grow on the tin termination surfaces.

    Tin Whiskers

    Sn Sn

    SMT Capacitors & Resistors

    Alumina substrate

    Chip Resistor Construction

    Glass under coatingInner termination Ag/Pd

    Top, side & bottom (10 - 30m)

    Glass middle coating

    Glass* over coating

    Marking

    Resistor element RuOxLaser trim

    Nickel plating Ni (2 - 12m)

    Lead-Free outer termination Sn/Pb replaced with Sn (5 -12m)

    *Pb Glass replaced with resin 1206 and smaller

    Tin Whiskers

    Whiskers also grow on cadmium, zinc, aluminium & lead.

    Growth is encouraged in tin layers under stress,

    i.e. electroplated layers ?

    Electroplated stress, is linked to high plating currents & rapid

    electroplating process.

    Electroplating processes can therefore be optimised by

    component manufacturers to minimise plating stress

    Sn

    Critical Parameters Encouraging

    Whisker Growth in Component Tin Plating

    1. Stress in the tin coating

    2. Tin purity

    3. Plating thickness

    1000 cyc 8.2 m

    * 70 minutes @ 55 C - 30 minutes @ 125 C

    All controllable during the

    component plating process Note: human h airapproximately 50m

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    Notes:

    This paper has been downloaded from SMART Group or Nepcon web siThis paper has been downloaded from SMART Group or Nepcon web sitestes

    www.nepcon.co.ukwww.nepcon.co.uk www.smartgroup.orgwww.smartgroup.org

    Email SMART Group atEmail SMART Group [email protected]@smartgroup.org

    The SMART Group A guiding Influence in the Electronics IndustThe SMART Group A guiding Influence in the Electronics Industryry

    Notes:

    Tin Whisker Growth Prevention

    Optimise electroplating current & plating time.

    Electroplate Tin (Sn) on nickel (Ni). Similar CTE.

    During PCB reflow or flow soldering processes.

    1. Diffusion of alloys (%%%% 1%) from bulk solder.

    2. Action of heating and cooling tin plating

    relaxes lattice structure.

    NOTE: Sn plated component terminations utilising low temperature

    conductive adhesive, remain a risk f or whisker growth

    Tin plating alloys with base SnAgCu solder

    Solder heat

    Lead-free BGA Placement, in SnPb Process

    (Placement Tolerance)

    215C Reflow temperature

    SnAgCu Solder balls

    MP 217C

    SnPb Solder paste

    MP 183 C

    SnAgCu solder ball will not melt, flow and

    create surface tension at < 217C

    SnPb

    50% placement

    error tolerance.

    Self alignment

    SnPb paste

    SnAgCu

    Placement error

    tolerance reduced

    Self alignment

    reduced

    SnPb paste

    Lead-free BGA

    SnAgCu

    SnAgCu Solder balls

    MP 217 C

    SnPb Solder paste

    (reflow 215 C)Solder ball Coplanarity tolerances cause open

    solder ball connections if SnAgCu balls do notcollapse during SnPb process reflow.

    Coplanarity tolerance

    Lead-free BGA Placement in SnPb Process

    (Coplanarity Tolerance)

    Component Durability to Lead-Free

    Soldering Temperatures

    Higher Temperature

    Longer Duration

    Moisture Sensitive Device (MSD)

    Electronic devices encapsulated with plastic compounds

    and organic packaging materials, absorb moisture.

    Humidity enters the package by diffusion, collecting

    at dissimilar material interfaces.

    Device sensitivity to moisture is classified* by

    Moisture Sensitivity Level (MSL)

    * IPC/JEDEC J-STD-020B

    Impact of Moisture Ingression

    Rapid heating during soldering, creates internal vapour pressure

    and accelerated expansion within the device.

    Important - Catastrophic failure or LONG TERMRELIABILITY compromised.

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    Notes:

    This paper has been downloaded from SMART Group or Nepcon web siThis paper has been downloaded from SMART Group or Nepcon web sitestes

    www.nepcon.co.ukwww.nepcon.co.uk www.smartgroup.orgwww.smartgroup.org

    Email SMART Group atEmail SMART Group [email protected]@smartgroup.org

    The SMART Group A guiding Influence in the Electronics IndustThe SMART Group A guiding Influence in the Electronics Industryry

    Notes:

    Component Moisture

    Ingression Induced Failures

    Popcorn effect

    Distortion / cracking

    Bond wire damage

    Vapour Delamination

    Impact of Lead-free Temperatures on MSL

    Existing Component MSL classification

    Existing storage & handling procedures

    Increased soldering heat

    Longer heat duration

    New potential for moisture ingression / solder heat failures

    Particularly where existing procedures are marginal

    Actions

    1. Re-qualify component MSL. - Component manufacturer

    2. Review component storage conditions. Component user

    Industry Standard

    IPC/JEDEC J-STD - 033A

    Handling, Packing, Shipping and Use of

    Moisture / Reflow Sens itive Surface

    Mount Devices

    Component Moisture Sensitivity Classification

    MSL Time Conditions

    1 Unlimited 30C/85%RH

    2 1 Year 30C/60%RH

    2a 4 weeks 30C/60%RH

    3 168 hrs 30C/60%RH

    4 72 hrs 30C/60%RH

    5 48 hrs 30C/60%RH

    5a 24 hrs 30C/60%RH

    6 Tim e on label 30C/60%RH

    (TOL)

    Component floor life

    * IPC/JEDEC J-S TD-020B

    Infinite floor life

    One year

    One month

    One week

    Three days

    Two days

    One day

    Dry before use

    MSD Component Storage

    MSL 3

    Remove from packing at production line

    Return components to hermetically sealed

    packing during further storage

    Humidity ingression is cumulative.

    If MSL violated, bake and dry as per

    IPC/JEDEC J-STD - 033A

    Sealing Zip

    MSL 6

    Dry Pack

    Dry Pack

    Maintain Reliability

    Lead-Free Soldering Process

    Moisture Ingression

    Electrostatic Discharge ESD*

    * Nepcon 13.00 - 27th May. ESD and ho w components are damaged

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    Notes:

    This paper has been downloaded from SMART Group or Nepcon web siThis paper has been downloaded from SMART Group or Nepcon web sitestes

    www.nepcon.co.ukwww.nepcon.co.uk www.smartgroup.orgwww.smartgroup.org

    Email SMART Group atEmail SMART Group [email protected]@smartgroup.org

    The SMART Group A guiding Influence in the Electronics IndustThe SMART Group A guiding Influence in the Electronics Industryry

    Notes:

    Safe Handling and Storage

    Very likely to be less

    than the cost of component

    final test and field failure.

    IPC/JEDEC J-STD - 033A (MSL)

    BS EN61340-5-1: 2001 (ESD)

    Compliance Training - Education & Audit