R. Kluit Electronics Department Nikhef, Amsterdam.

10
R. Kluit Electronics Department Nikhef, Amsterdam. Integrated Circuit Design

description

Integrated Circuit Design. R. Kluit Electronics Department Nikhef, Amsterdam. 19/12/2008. IC design @Nikhef, R. Kluit. 2. ASIC application’s. 2004. 2 IC’s: 0.25 µ CMOS 3 prototypes 9/2000 => prod 3/2004 1400 PCB’s, 1000+4500 IC’s (prod. $43k) - PowerPoint PPT Presentation

Transcript of R. Kluit Electronics Department Nikhef, Amsterdam.

Page 1: R. Kluit Electronics Department Nikhef, Amsterdam.

R. KluitElectronics Department

Nikhef, Amsterdam.

Integrated Circuit Design

Page 2: R. Kluit Electronics Department Nikhef, Amsterdam.

19/12/2008 IC design @Nikhef, R. Kluit 2

Page 3: R. Kluit Electronics Department Nikhef, Amsterdam.

19/12/2008 IC design @Nikhef, R. Kluit 3

ASIC application’s• 2 IC’s: 0.25µ CMOS • 3 prototypes• 9/2000 => prod 3/2004• 1400 PCB’s, 1000+4500

IC’s (prod. $43k)• Chip-on-board;

cleaning & bonding @ Nikhef

• ++ Radiation & Area

2004

V. Gromov, P. Timmer,J-D Schipper, R. Kluit

Page 4: R. Kluit Electronics Department Nikhef, Amsterdam.

19/12/2008 IC design @Nikhef, R. Kluit 4

Design in Collaborations:• Si-strip detector front-end (0.25µm)

Analog readout & Comparator• Contribution to new ATLAS Pixel FE chip

Design Internal:• IC’s for ALICE (0.25µm)• Bandgap reference (130nm)• GOSSIP frontend prototype’s (130nm)• Km3Net PMT front-end (0.35µm)

Most recent Designs

Page 5: R. Kluit Electronics Department Nikhef, Amsterdam.

CMOS IC technology

Design issues:• RregVt, 0Vt, HighVt, LowVt

transistors• Radiation tolerance (design)• Technology Design rules• Process variations & matching• ESD• Rules for

Manufacturability19/12/2008 IC design @Nikhef, R. Kluit 5

Bulk CMOS

Page 6: R. Kluit Electronics Department Nikhef, Amsterdam.

Present Technologies

19/12/2008 IC design @Nikhef, R. Kluit 6

Bulk CMOS SOIStrained silicon

Vdd 1.8-2.5V Vdd 1.2-1.5V Vdd 1-1.2V Vdd 1V Vdd 0.9-1V

6 Al 6 Cu 7 Cu 8 Cu 9 Cu

feature size:Mass prod. start:

Power & gate density scale relative to feature size scaling (x0.7).

Vsupply

Nr. metal layers

radiation tolerant ! ????

Page 7: R. Kluit Electronics Department Nikhef, Amsterdam.

“Features” of new Techn.• Random Dopant Fluctuations (RDF):

@45nm; ~100 atoms channel length, 1000 dopants in channel

• Variations in strain & Gate oxide thickness (~ 5 atoms @45nm)

• Line Edge effects: R of connectivity

Solutions in Foundry & Design techniques;Global process variations of 45nm improved w.r.t. 90nm & 65nm !

19/12/2008 IC design @Nikhef, R. Kluit 7

Page 8: R. Kluit Electronics Department Nikhef, Amsterdam.

Euro Practice Cadence platform:• Cadence:design entry & layout

+ analog & digital simulation.• Assura: Simulation & Verification• Mentor: Calibre for DRC & extraction (Ver.)• Synopsys: Logic Simulation, Digital Synthesis,

Clock tree generation, Place & Route.

Software via Educational programs; affordable (€) BUT maintenance ¼ fte.

19/12/2008 IC design @Nikhef, R. Kluit 8

Design Tools

Page 9: R. Kluit Electronics Department Nikhef, Amsterdam.

19/12/2008 IC design @Nikhef, R. Kluit 9

ET Design expertise

Technologies:Commercial CMOS• AMS 0.35µ:

Design-Kit + Lib.• IBM 0.25µ

PDK + Lib.• IBM 0.13µ:

PDK + Arm/IBM Lib.

People & Expertise :(Electronics department)

• 2+2 Designers have the skills for IC design.

• Analog front-ends; device level circuit design

• Digital design; control blocks & architectureVerilog => synthesis => routing.

Page 10: R. Kluit Electronics Department Nikhef, Amsterdam.

Present Technologies (2)

• Transition to SOI, Vdd to ~1V• Radiation tolerance: increasing up to 90nm. Beyond ???

19/12/2008 IC design @Nikhef, R. Kluit 10

~0.72

~0.7-2

~0.7

~0.7-2