Qualtest, Inc. Report: 05009 - Planar Monolithics · 2018. 12. 20. · Qualtest, Inc. Report: 05009...
Transcript of Qualtest, Inc. Report: 05009 - Planar Monolithics · 2018. 12. 20. · Qualtest, Inc. Report: 05009...
Qualtest, Inc. Report: 05009
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REPORT REVISION RECORD
REVISION DESCRIPTION OF CHANGE
INITIAL RELEASE
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TABLE OF CONTENTS
TITLE PAGE FOREWORD .........................................................................................................................................................5 SECTION 1............................................................................................................................................................6
RS03 RADIATED SUSCEPTIBILITY TEST SUMMARY..............................................................................6 1-1 TEST HARDWARE ....................................................................................................................................6 1-2 TEST REQUIREMENTS WITH TOLERANCES ......................................................................................6 1-3 TEST SETUP ...............................................................................................................................................7 1-4 TEST DESCRIPTION..................................................................................................................................8 1-5 ENVIRONMENTAL TEST DATA.............................................................................................................9
Figure 1-1: Test Hardware Identification ......................................................................................................10 Figure 1-2: RS03 14 kHz to 30 MHz Vertical ..............................................................................................10 Figure 1-3: RS03 30 MHz to 200 MHz Horizontal.......................................................................................11 Figure 1-4: RS03 30 MHz to 200 MHz Vertical ...........................................................................................11 Figure 1-5: RS03 200 MHz to 1 GHz Horizontal .........................................................................................12 Figure 1-6: RS03 200 MHz to 1 GHz Vertical..............................................................................................12 Figure 1-7: RS03 1 GHz to 10 GHz Horizontal ............................................................................................13 Figure 1-8: RS03 1 GHz to 10 GHz Vertical ................................................................................................13
SECTION 2..........................................................................................................................................................14 RS02 RADIATED SUSCEPTIBILITY TEST SUMMARY............................................................................14 2-1 TEST HARDWARE ..................................................................................................................................14 2-2 TEST REQUIREMENTS WITH TOLERANCES ....................................................................................14 2-3 TEST SETUP .............................................................................................................................................15 2-4 TEST DESCRIPTION................................................................................................................................15 2-5 ENVIRONMENTAL TEST DATA...........................................................................................................16
Figure 2-1: Test Hardware Identification ......................................................................................................17 Figure 2-2: RS02 Spike Injection ..................................................................................................................17
SECTION 3..........................................................................................................................................................18 CE03 CONDUCTED EMISSIONS TEST SUMMARY .................................................................................18 3-1 TEST HARDWARE ..................................................................................................................................18 3-2 TEST REQUIREMENTS WITH TOLERANCES ....................................................................................18 3-3 TEST SETUP .............................................................................................................................................18 3-4 TEST DESCRIPTION................................................................................................................................19 3-5 ENVIRONMENTAL TEST DATA...........................................................................................................20
Figure 3-1: USC-12708 (Asset #100893) Semi-Anechoic Chamber (14 x 10 x 10 feet) .............................21 Figure 3-2: Measurement Setup ....................................................................................................................22 Figure 3-3: Test Hardware Identification ......................................................................................................23 Figure 3-4: Test setup for 15 kHz to 50 MHz conducted emissions. ............................................................23
SECTION 4..........................................................................................................................................................30 RE02 RADIATED EMISSIONS TEST SUMMARY......................................................................................30 4-1 TEST HARDWARE ..................................................................................................................................30 4-2 TEST REQUIREMENTS WITH TOLERANCES ....................................................................................30 4-3 TEST SETUP .............................................................................................................................................30 4-4 TEST DESCRIPTION................................................................................................................................32
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4-5 ENVIRONMENTAL TEST DATA...........................................................................................................33 Figure 4-1: USC-12708 (Asset #100893) Semi-Anechoic Chamber (14 x 10 x 10 feet) .............................34 Figure 4-2: Test Hardware Identification ......................................................................................................35 Figure 4-3: Test setup for 14 kHz to 30 MHz radiated emissions.................................................................35 Figure 4-4: Test setup for vertical 30 MHz to 200 MHz radiated emissions. ...............................................36 Figure 4-5: Test setup for vertical 200 MHz to 1 GHz radiated emissions...................................................36 Figure 4-6: Test setup for vertical 1 GHz to 10 GHz radiated emissions. ....................................................37 Figure 4-7: Test setup for horizontal 30 MHz to 200 MHz radiated emissions............................................37 Figure 4-8: Test setup for horizontal 200 MHz to 1 GHz radiated emissions. .............................................38 Figure 4-9: Test setup for horizontal 1 GHz to 10 GHz radiated emissions. ................................................38
SECTION 5..........................................................................................................................................................45 CS06 CONDUCTED SUSCEPTIBILITY TEST SUMMARY .......................................................................45 5-1 TEST HARDWARE ..................................................................................................................................45 5-2 TEST REQUIREMENTS WITH TOLERANCES ....................................................................................45 5-3 TEST SETUP .............................................................................................................................................45 5-4 TEST DESCRIPTION................................................................................................................................46 5-5 ENVIRONMENTAL TEST DATA...........................................................................................................47
Figure 5-1: USC-12708 (Asset #100893) Semi-Anechoic Chamber (14 x 10 x 10 feet) .............................48 Figure 5-3: Parallel Injection Test Setup.......................................................................................................49 Figure 5-4: CS06 Calibration Set Up ............................................................................................................50 Figure 5-5: CS06 Test setup ..........................................................................................................................50
SECTION 6..........................................................................................................................................................51 CS02 CONDUCTED SUSCEPTIBILITY TEST SUMMARY .......................................................................51 6-1 TEST HARDWARE ..................................................................................................................................51 6-2 TEST REQUIREMENTS WITH TOLERANCES ....................................................................................51 6-3 TEST SETUP .............................................................................................................................................51 6-4 TEST DESCRIPTION................................................................................................................................53 6-5 ENVIRONMENTAL TEST DATA...........................................................................................................55
Figure 6-1: USC-12708 (Asset #100893) Semi-Anechoic Chamber (14 x 10 x 10 feet) .............................56 Figure 6-2: Calibration Setup ........................................................................................................................57 Figure 6-3: Test Setup ...................................................................................................................................58 Figure 6-4: Test setup for 50 kHz to 400 MHz conducted susceptibility......................................................59
SECTION 7..........................................................................................................................................................61 CS01 CONDUCTED SUSCEPTIBILITY TEST SUMMARY .......................................................................61 7-1 TEST HARDWARE ..................................................................................................................................61 7-2 TEST REQUIREMENTS WITH TOLERANCES ....................................................................................61 7-3 TEST SETUP .............................................................................................................................................61 7-4 TEST DESCRIPTION................................................................................................................................62 7-5 ENVIRONMENTAL TEST DATA...........................................................................................................62
Figure 7-1: USC-12708 (Asset #100893) Semi-Anechoic Chamber (14 x 10 x 10 feet) .............................63 Figure 7-2: Test Setup ...................................................................................................................................64 Figure 7-3: Test setup for 30 Hz to 35 kHz conducted susceptibility. ..........................................................65
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Qualtest operates under the relevant quality system requirements of ISO-9001:2000 for providing environmental simulation services as recognized by TRC Registration Certificate #00018. This laboratory also maintains A2LA accreditation to ISO/IEC 17025 for the specific tests listed in A2LA Certificate #1805.01. However, the test results included in this report are not covered by the accreditation.
FOREWORD The objective of this test program was to subject customer provided test hardware to environmental simulation in compliance with customer stated specifications, including any authorized modifications, deviations or concessions to the original requirements. Test hardware consisted of items identified in the appropriate sections of this report. In addition to test hardware identification, each section contains information that describes the associated test setup and performance, and the resulting data. Qualtest measuring instruments used in testing were calibrated according to the requirements of ANSI/NCSL Z540-1-1994 and are NIST traceable. Calibration records are on file and available for inspection by request. Because the test methods are well established and are qualitative or semi-quantitative in nature, Qualtest does not apply measurement uncertainty unless obligated by contract. Measured value related to the corresponding tolerance requirement is used to decide whether a test meets the requirements of the specification. Any test hardware operational setups and resulting evaluations or inspections performed by the customer are not included in this report, unless they were explicitly requested. While observations and/or specification compliance statements may be reported, no interpretations or opinions regarding customer product performance are intended. Unless otherwise indicated in the appropriate report section, all contract obligations were met and the test objective achieved.
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SECTION 1
RS03 RADIATED SUSCEPTIBILITY TEST SUMMARY
Test Start-Finish Dates: 23 through 24 February 2006
Responsible Test Technician: Carl M. Hebda
1-1 TEST HARDWARE One (1) PMI Model Number RFOC-811-QRC, S/N PM602916 1-2 TEST REQUIREMENTS WITH TOLERANCES Test Setup
General Requirements Install the test item(s) on a ground plane that simulates actual installation. If unknown or multiple installations are expected, then use a metallic ground plane that measures 2.25 square meters minimum with a smaller size no less than 76 centimeters (30 inches). Ensure that the DC resistance between the ground plane and the shielded enclosure is 2.5 milliohms or less. When a ground plane is not present in the test item installation, place the test item on a non-conductive surface. Use only the provisions included in the design of the test item, or identified in the test plan, to bond units together or to the ground plane. Use electrical cable assemblies that simulate actual installation and usage. Use shielded cables or leads only if they have been specified in installation requirements or identified in the test plan. Run at least the first 2 meters of each cable (except for cables that are shorter in the actual installation) parallel to the front boundary of the setup. Route the remaining cable lengths to the back of the setup and arrange in a zigzag fashion. Separate individual cables by 2 centimeters as measured from the outer circumference. Support all cables 5 centimeters above the ground plane.
Method Specific Use a peak detector for all frequency domain emissions and susceptibility measurements. For swept frequency susceptibility testing, frequency scan rates and frequency step sizes of signal sources shall not exceed the values listed in Table III. The rates and step sizes are specified in terms of a multiplier of the tuned frequency (fo) of the signal source. Analog scans refer to signal sources which are continuously tuned. Stepped scans refer to signal sources which are sequentially tuned to discrete frequencies. Stepped scans shall dwell at each tuned frequency for the greater of 3 seconds or the EUT response time. Scan rates and step sizes shall be decreased when necessary to permit observation of a response.
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Susceptibility test signals shall be continuous wave. Test Performance Note that the customer is responsible for all test item operational requirements and evaluations. Energize the test items with a DC power supply set at +15, -15, and +5. Slowly scan a radiated electric field at 20 V/m continuous wave from 14 kHz to 10 GHz in the vertical polarity. Repeat this process for the horizontal polarity from 30 MHz to 10 GHz. Tolerance Frequency: ±2%; Field Level: Minimum; Distance: ±5%; Time (Duration): Minimum
1-2.1 Test Specification: MIL-STD 461C, Method RS03 for Category A1b (Air Force) equipment 1-3 TEST SETUP
TABLE 1-1: QUALTEST FURNISHED MEASUREMENT & TEST EQUIPMENT QTI # Item Manufacturer Model Number Calibration Due
100343 E-Field Generator Antenna Antenna Research EFG-1030/A NCR 100317 Hi-Pwr Biconical Antenna A.H. Systems SAS-543 NCR 100316 Double Ridged Waveguide A.H. Systems SAS-570 8/27/06 100321 Double Ridged Waveguide A.H. Systems SAS-571 8/27/06 100315 Thermo Hygrometer Mannix SAM990DW 11/14/06
NA Tape Measure Stanley 33-158 Indefinite 100893 * EMI Chamber Universal Shielding USC-26 NCR 100306 Signal Generator Hewlett Packard 8662A 10/22/06 100307 Signal Generator Hewlett Packard 8341B 10/18/06 100344 RF Amplifier Ophir 5127 NCR
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QTI # Item Manufacturer Model Number Calibration Due 100368 RF Amplifier Varian VZL-6943G5 NCR 100336 RF Amplifier Amplifier Research 500A100M2 NCR 100358 RF Amplifier CPI VZV-2776K4 NCR 100338 Field Monitor Display Amplifier Research FM5004 10/27/06 100339 Field Monitor Probe Amplifier Research FP5000 10/27/06 100340 Field Monitor Probe Amplifier Research FP5080 10/27/06
* The Qualtest EMI chamber is a Universal Shielding Corporation USC-26 Radio Frequency Shielded Enclosure measuring 10 high by 10 wide by 14 long. The enclosure is designed to provide an attenuation of 100 dB to electric field and plane waves from 10 kHz to 10 GHz and 60 dB to magnetic fields at 10 kHz rising to 100 dB at 200 kHz. The test bench height is 85.5 cm with a ground plane measuring 246.5 cm x 91.5 cm (2.5 m2).
TABLE 1-2: CUSTOMER FURNISHED SUPPORT EQUIPMENT P/N S/N Nomenclature (description, model, manufacturer, etc)
E3631A NA Agilent DC Power Supply 1-4 TEST DESCRIPTION
1-4.1 Non-Qualtest Personnel, Including Organization, Present for All or Part of the Test: Rene Afable, a representative from American Microwave Corporation
1-4.2 Powered/Operational State of the Hardware and by Whom: The customer representative is responsible for test item setup. Qualtest personnel have been trained in the operation and functional evaluation of the test item for purposes of performing the test. Because the customer is not present for the performance of this test, Qualtest personnel are responsible for any associated documentation activities. Any results related to test item performance were retained by the customer, and are not included in this summary.
1-4.3 Test Activities and Resulting Measurements from Observed/Recorded Data: Atmospheric Conditions: Temp (°C): 23 Relative Humidity (%): 48 Pressure: Site Ambient Ground Plane resistivity check:
Far Left: 0.0 mΩ, Center Left: 0.2 mΩ, Center Right: 0.0 mΩ, Far Right: 0.0 mΩ
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Test Performance (02/23/06 16:05) The radiated susceptibility test system was powered and allowed to stabilize for 60 minutes prior to use. The test item was powered and tested at the frequency ranges and durations shown in the following table. Actual scan duration was timed using a clock.
TABLE 1-3: RADIATED SUSCEPTIBILITY Frequency Range (MHz) Field Level (V/m) Antenna Polarity Actual Scan Time (Minutes)
.014 to .10 20 Vertical 4.5 .10 to 1 20 Vertical 4.7 1 to 5 20 Vertical 10.3
5 to 30 20 Vertical 12.7 30 to 100 20 Vertical 12.0 30 to 100 20 Horizontal 12.0
100 to 200 20 Vertical 5.2 100 to 200 20 Horizontal 5.2 200 to 400 20 Vertical 5.3 200 to 400 20 Horizontal 5.3
400 to 1000 20 Vertical 7.8 400 to 1000 20 Horizontal 7.8
1000 to 2000 20 Vertical 25.5 1000 to 2000 20 Horizontal 25.5 2000 to 4000 20 Vertical 25.5 2000 to 4000 20 Horizontal 25.5 4000 to 8000 20 Vertical 25.5 4000 to 8000 20 Horizontal 25.5
8000 to 10000 20 Vertical 12.6 8000 to 10000 20 Horizontal 12.6
02/24/06 1233: Scans are complete.
1-4.4 Limitations or Departures from the Test Requirements and Authorizing Source: None 1-5 ENVIRONMENTAL TEST DATA Compliance verified through test setup and observation (reference photos Figures 1-1 through 1-8).
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Figure 1-1: Test Hardware Identification
Figure 1-2: RS03 14 kHz to 30 MHz Vertical
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Figure 1-3: RS03 30 MHz to 200 MHz Horizontal
Figure 1-4: RS03 30 MHz to 200 MHz Vertical
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Figure 1-5: RS03 200 MHz to 1 GHz Horizontal
Figure 1-6: RS03 200 MHz to 1 GHz Vertical
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Figure 1-7: RS03 1 GHz to 10 GHz Horizontal
Figure 1-8: RS03 1 GHz to 10 GHz Vertical
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SECTION 2
RS02 RADIATED SUSCEPTIBILITY TEST SUMMARY
Test Start-Finish Dates: 24 February 2006
Responsible Test Technician: Carl M. Hebda
2-1 TEST HARDWARE One (1) PMI Model Number RFOC-811-QRC, S/N PM602916 2-2 TEST REQUIREMENTS WITH TOLERANCES Test Setup
General Requirements Install the test item(s) on a ground plane that simulates actual installation. If unknown or multiple installations are expected, then use a metallic ground plane that measures 2.25 square meters minimum with a smaller size no less than 76 centimeters (30 inches). Ensure that the DC resistance between the ground plane and the shielded enclosure is 2.5 milliohms or less. When a ground plane is not present in the test item installation, place the test item on a non-conductive surface. Use only the provisions included in the design of the test item, or identified in the test plan, to bond units together or to the ground plane. Use electrical cable assemblies that simulate actual installation and usage. Use shielded cables or leads only if they have been specified in installation requirements or identified in the test plan. Run at least the first 2 meters of each cable (except for cables that are shorter in the actual installation) parallel to the front boundary of the setup. Route the remaining cable lengths to the back of the setup and arrange in a zigzag fashion. Separate individual cables by 2 centimeters as measured from the outer circumference. Support all cables 5 centimeters above the ground plane.
Method Specific Use a peak detector for all frequency domain emissions and susceptibility measurements. Injection will be a 200 volt (peak) pulse at a 6 pulse per second (p.p.s.) rate for a duration of 5 minutes, minimum. Pulses will be both a 10uS and a 0.15uS and injected in both the positive and negative polarity. Test Performance Note that the customer is responsible for all test item operational requirements and evaluations. Energize the test items with a DC power supply set at +15, -15, and +5. Inject the coiled wire as follows:
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TABLE 2-1: INJECTION PULSES
Injection Level Polarity Duration (Minimum) Pulse Width 200 Volts Peak Positive 5 minutes 10 uS 200 Volts Peak Negative 5 minutes 10 uS 200 Volts Peak Positive 5 minutes 0.15 uS 200 Volts Peak Negative 5 minutes 0.15 uS
Tolerance Frequency: ±2%; Field Level: Minimum; Time (Duration): Minimum
2-2.1 Test Specification: MIL-STD 461C, Method RS02 for Category A1b (Air Force) equipment 2-3 TEST SETUP
TABLE 2-2: QUALTEST FURNISHED MEASUREMENT & TEST EQUIPMENT QTI # Item Manufacturer Model Number Calibration Due
100315 Thermo Hygrometer Mannix SAM990DW 11/14/06 NA Tape Measure Stanley 33-158 Indefinite
100893 * EMI Chamber Universal Shielding USC-26 NCR 100328 Transient Generator Solar 8282-1 01/10/07
* The Qualtest EMI chamber is a Universal Shielding Corporation USC-26 Radio Frequency Shielded Enclosure measuring 10 high by 10 wide by 14 long. The enclosure is designed to provide an attenuation of 100 dB to electric field and plane waves from 10 kHz to 10 GHz and 60 dB to magnetic fields at 10 kHz rising to 100 dB at 200 kHz. The test bench height is 85.5 cm with a ground plane measuring 246.5 cm x 91.5 cm (2.5 m2).
TABLE 2-3: CUSTOMER FURNISHED SUPPORT EQUIPMENT P/N S/N Nomenclature (description, model, manufacturer, etc)
E3631A NA Agilent DC Power Supply 2-4 TEST DESCRIPTION
2-4.1 Non-Qualtest Personnel, Including Organization, Present for All or Part of the Test: Rene Afable, a representative from American Microwave Corporation
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2-4.2 Powered/Operational State of the Hardware and by Whom: The customer representative is responsible for test item setup. Qualtest personnel have been trained in the operation and functional evaluation of the test item for purposes of performing the test. Because the customer is not present for the performance of this test, Qualtest personnel are responsible for any associated documentation activities. Any results related to test item performance were retained by the customer, and are not included in this summary.
2-4.3 Test Activities and Resulting Measurements from Observed/Recorded Data: Atmospheric Conditions: Temp (°C): 23 Relative Humidity (%): 45 Pressure: Site Ambient Ground Plane resistivity check:
Far Left: 0.0 mΩ, Center Left: 0.2 mΩ, Center Right: 0.0 mΩ, Far Right: 0.0 mΩ Test Performance (02/24/06 14:35) The radiated susceptibility test system was powered and allowed to stabilize for 60 minutes prior to use. The test item was powered and tested at the injection level and pulses shown in the following table. Actual scan duration was timed using a clock.
TABLE 2-4: RADIATED SUSCEPTIBILITY Injection Level Polarity Actual Duration Pulse Width 200 Volts Peak Positive 5 minutes, 2 seconds 10 uS 200 Volts Peak Negative 5 minutes, 3 seconds 10 uS 200 Volts Peak Positive 5 minutes, 3 seconds 0.15 uS 200 Volts Peak Negative 5 minutes, 2 seconds 0.15 uS
02/24/06 1458: Scans are complete.
2-4.4 Limitations or Departures from the Test Requirements and Authorizing Source: None 2-5 ENVIRONMENTAL TEST DATA Compliance verified through test setup and observation (reference photos Figures 2-1 through 2-2).
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Figure 2-1: Test Hardware Identification
Figure 2-2: RS02 Spike Injection
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SECTION 3
CE03 CONDUCTED EMISSIONS TEST SUMMARY
Test Start-Finish Dates: 27 February 2006
Responsible Test Technician: Scott C. Williamson
3-1 TEST HARDWARE One (1) PMI Model Number RFOC-811-QRC, S/N PM602916 3-2 TEST REQUIREMENTS WITH TOLERANCES Evaluate whether or not the test item and its associated cabling exceed the following conducted emissions limits. Category A1b Limits: Narrowband: 86 dBµA at 15 kHz, 20 dBµA at 2 MHz, 20 dBµA at 50 MHz Broadband: 140 dBµA/MHz at 15 kHz, 50 dBµA/MHz at 2 MHz, 50 dBµA/MHz at 50 MHz Tolerance Laboratory Climate: 25±10°C, 20 to 80% Relative Humidity, Site Pressure Distance: ±5%; Frequency: ±2%; Amplitude: ±2 dB
3-2.1 Test Specification: MIL-STD-462, Method CE03 3-3 TEST SETUP
TABLE 3-1: QUALTEST FURNISHED MEASUREMENT & TEST EQUIPMENT Asset # Item Manufacturer Model Number Cal Due 100309 Spectrum Analyzer Hewlett Packard 8566B 09/08/06 None EMI Measurement Software Hewlett Packard 85969PC Rev. A.00.02 NA None Data Recording Device Hewlett Packard 7440A NA
100376 10 µF Feedthrough Capacitor Solar 6512-106R NA 100377 10 µF Feedthrough Capacitor Solar 6512-106R NA 100422 10 µF Feedthrough Capacitor Solar 6512-106R NA 100322 Current Probe A.H. Systems BCP-510 08/27/06 100323 Current Probe A.H. Systems BCP-511 08/27/06 100326 Milliohm Meter Extech 380460 10/17/06 100315 Thermo Hygrometer Mannix SAM990DW 11/14/06
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3-3.1 Measurement Equipment Power Up
Setup the test as shown in Figure 3-1. Power the measurement equipment and record the time allowed for stabilization: 30 minutes Note that the following table settings are entered into the test software setup file as an automated function. Video filtering is not used to limit bandwidth.
TABLE 3-2: BANDWIDTH AND MEASUREMENT TIME Frequency Range 6 dB Bandwidth Dwell Time Minimum Measurement Time
Analog Measurement Receiver 15 kHz 150 kHz 1 kHz 0.015 sec 0.015 sec/kHz 150 kHz 30 MHz 10 kHz 0.015 sec 1.5 sec/MHz 30 MHz 50 MHz 100 kHz 0.015 sec 0.15 sec/MHz
Load the CE03 measurement program. Verify the following criteria are present and correct:
• Gain/Loss file (includes cable loss) • Bandwidth and measurement time • Transducer (current probe factor) files
Software program concurrence (name/date): Carl Hebda 27 February 2006 Scale plots such that the minimum frequency resolution is twice the measurement receiver bandwidth, and that the minimum amplitude resolution is 1 dB. Ensure that the test limit line and plot scales clearly print. Identify each plot with the test lab name, job number and customer name, test type, test title, and test date and time. Record the cables used for the frequency ranges listed in Table 3-3.
TABLE 3-3: TEST SETUP CONFIGURATIONS Frequency Range Cable Identification 15 kHz 150 kHz Cable #006 150 kHz 30 MHz Cable #006 30 MHz 50 MHz Cable #006
3-4 TEST DESCRIPTION
3-4.1 Non-Qualtest Personnel, Including Organization, Present for All or Part of the Test: None
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3-4.2 Powered/Operational State of the Hardware and by Whom: The customer representative is responsible for test item setup. Qualtest personnel have been trained in the operation and functional evaluation of the test item for purposes of performing the test. Because the customer is not present for the performance of this test, Qualtest personnel are responsible for any associated documentation activities.
3-4.3 Test Activities and Resulting Measurements from Observed/Recorded Data: Test item source power: +15 VDC, -15 VDC, +5 VDC Power the test item and record the time allowed for stabilization: customer directed Laboratory Climate: Temperature (°C): 23 Relative Humidity (%): 43 Using the measurement setup shown in Figure 3-2, plot the conducted emissions from the test item and its associated power cabling.
TABLE 3-4: TEST DATA Scan # Date End Time Comments
C07 02/27/06 1419 -15 VDC Line; Narrowband; No over-limit emissions C08 02/27/06 1419 -15 VDC Line; Broadband; No over-limit emissions C09 02/27/06 1439 5 VDC Line; Narrowband; No over-limit emissions C10 02/27/06 1439 5 VDC Line; Broadband; No over-limit emissions C11 02/27/06 1458 +15 VDC Line; Narrowband; No over-limit emissions C12 02/27/06 1458 +15 VDC Line; Broadband; No over-limit emissions
3-4.4 Limitations or Departures from the Test Requirements and Authorizing Source:
None 3-5 ENVIRONMENTAL TEST DATA Data plots for the Operational Scans are located after Figure 3-4.
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Figure 3-1: USC-12708 (Asset #100893) Semi-Anechoic Chamber (14 x 10 x 10 feet) The shielded enclosure is OEM certified to attenuate 100 dB up to 18 GHz for electric field and plane waves. Note that power and data cables are kept as far apart as practical with any excess zig-zagged away from the ground plane edge. Copper ground plane measures 0.64 mm thick. Distance from the Ground Plane to the Enclosure Wall (≥30 cm): 45 cm Maximum Length to Width Ratio of the Solid Copper Ground Straps (≤ 5:1): 4.00:1 Bonding Measurements: Date (Measured Monthly): 2/15/06 Results (≤ 2.5 mΩ): Far Right: 0.0 Center Right: 0.0 Center Left: 0.2 Far Left: 0.0
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Figure 3-2: Measurement Setup
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Figure 3-3: Test Hardware Identification
Figure 3-4: Test setup for 15 kHz to 50 MHz conducted emissions.
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Operational Plot -15 VDC Narrowband
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Operational Plot -15 VDC Broadband
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Operational Plot -5 VDC Narrowband
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Operational Plot -5 VDC Broadband
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Operational Plot +15 VDC Narrowband
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Operational Plot +15 VDC Broadband
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SECTION 4
RE02 RADIATED EMISSIONS TEST SUMMARY
Test Start-Finish Dates: 28 February 2006
Responsible Test Technician: James N. Ellis Jr.
4-1 TEST HARDWARE One (1) PMI Model Number RFOC-811-QRC, S/N PM602916 4-2 TEST REQUIREMENTS WITH TOLERANCES Evaluate whether or not the test item and its associated cabling exceed the following radiated emissions limits. Above 30 MHz, test for both horizontally and vertically polarized fields. Category A1b (Broadband/Narrowband) Broadband Limits: 110 dBµV/m at 14 kHz, 65 dBµV/m at 200 MHz, 80 dBµV/m at 10 GHz Narrowband Limits: 45 dBµV/m at 14 kHz, 30 dBµV/m at 25 MHz, 70 dBµV/m at 10 GHz Tolerance Laboratory Climate: 25±10°C, 20 to 80% Relative Humidity, Site Pressure Distance: ±5%; Frequency: ±2%; Amplitude: ±2 dB; Capacitance: ±20%
4-2.1 Test Specification: MIL-STD-461C, Method RE02 4-3 TEST SETUP
TABLE 4-1: QUALTEST FURNISHED MEASUREMENT & TEST EQUIPMENT Asset # Item Manufacturer Model Number Cal Due 100320 Rod Antenna A.H. Systems SAS-550-1B 08/27/06 100318 Biconical Antenna A.H. Systems SAS-540 08/27/06
100316 Double Ridged Waveguide A.H. Systems SAS-570 08/27/06
100321 Double Ridged Waveguide A.H. Systems SAS-571 08/27/06
100309 Measurement Receiver Hewlett Packard 8566B 09/08/06 100355 Pre-Amplifier (to 1 GHz) Hewlett Packard 8447F NA 100319 Pre-Amplifier (to 18 GHz) A.H. Systems PAM-0118 NA 100326 Milliohm Meter Extech 380460 10/17/06 100315 Thermo Hygrometer Mannix SAM990DW 11/14/06 100893 Semi-anechoic Enclosure Universal Shielding USC-12708 (14/10/10 ft) NA None Verified Tape Measure Reference #100420 33-158 Indefinite
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Asset # Item Manufacturer Model Number Cal Due None Data Recording Device Hewlett Packard 7440A NA
100376 10 uF RF Capacitor Solar 6512-106R NA 100377 10 uF RF Capacitor Solar 6512-106R NA 100422 10 uF RF Capacitor Solar 6512-106R NA None Measurement Software Hewlett Packard 85869PC Rev A.00.02 NA
4-3.1 Measurement Equipment Power Up
Setup the test as shown in Figure 4-1. Power the measurement equipment and record the time allowed for stabilization: 35 minutes Note that the following table settings are entered into the test software setup file as an automated function. Video filtering is not used to limit bandwidth.
TABLE 4-2: BANDWIDTH AND MEASUREMENT TIME Frequency Range 6 dB Bandwidth Dwell Time Minimum Measurement Time
Analog Measurement Receiver 30 Hz 1 kHz 10 Hz 0.15 sec 0.015 sec/Hz
1 kHz 10 kHz 100 Hz 0.015 sec 0.15 sec/kHz 10 kHz 150 kHz 1 kHz 0.015 sec 0.015 sec/kHz 150 kHz 30 MHz 10 kHz 0.015 sec 1.5 sec/MHz 30 MHz 1 GHz 100 kHz 0.015 sec 0.15 sec/MHz
Above 1 GHz 1 MHz 0.015 sec 15 sec/MHz Scale plots such that the minimum frequency resolution is twice the measurement receiver bandwidth, and that the minimum amplitude resolution is 1 dB. Ensure that the test limit line and plot scales clearly print. Identify each plot with the test lab name, job number and customer name, test type, test title, and test date and time. Record the cables used for the frequency ranges listed in Table 4-3.
TABLE 4-3: TEST SETUP CONFIGURATIONS Frequency Range Cable Identification Pre-amp Identification 14 kHz 150 kHz Cables #10 & 11 None 150 kHz 30 MHz Cables #10 & 11 Hewlett Packard 8447F 30 MHz 200 MHz Cables #10 & 11 Hewlett Packard 8447F 200 MHz 1 GHz Cables #10 & 11 Hewlett Packard 8447F 1 GHz 10 GHz Cables #10 & 11 A.H. Systems PAM-0118
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4-3.2 Ambient Background Check Load the RE02 Test Data measurement program. Verify the following criteria are present and correct:
• Gain/Loss file (includes pre-amplifier gain and cable loss) • Transducer (antenna factors) files • Bandwidth and measurement time
Note: Test item used no support equipment and did not penetrate the semi-anechoic chamber to the outside; therefore an ambient scan was not required or performed. 4-4 TEST DESCRIPTION Compliance verified through test setup and observation (reference photos Figures 1-1 through 1-8).
4-4.1 Non-Qualtest Personnel, Including Organization, Present for All or Part of the Test: Yu Rong, a representative of American Microwave
4-4.2 Powered/Operational State of the Hardware and by Whom: The customer representative is responsible for test item setup, operation, functional evaluation, and any associated documentation activities. The test item was powered and operational performance verified by American Microwave representative, Yu Rong, throughout the radiated emissions test.
4-4.3 Test Activities and Resulting Measurements from Observed/Recorded Data: Test item source power: Vector-VID, Model WP-78 Power Supply (Qualtest supplied) Power the test item and record the time allowed for stabilization: 20 minutes Laboratory Climate: Temperature (°C): 23 Relative Humidity (%): 43 Using the measurement path shown in Figure 4-2, plot the radiated emissions from the test item and its associated cabling, and include both horizontal and vertical antenna polarities when above 30 MHz.
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TABLE 4-5: TEST DATA Scan # Date End Time Polarity Comments
1 02/28/06 11:32 Vertical Performed Broadband/Narrowband scan, 14 kHz to 1 GHz, No above limit emissions.
2 02/28/06 11:44 Vertical Performed Narrowband scan, 1 GHz to 10 GHz, No above limit emissions.
3 02/28/06 12:11 Horizontal Performed Broadband/Narrowband scan, 14 kHz to 1 GHz, No above limit emissions.
4 02/28/06 12:25 Horizontal Performed Narrowband scan, 1 GHz to 10 GHz, No above limit emissions.
4-4.4 Limitations or Departures from the Test Requirements and Authorizing Source:
None 4-5 ENVIRONMENTAL TEST DATA Data plots for the Vertical Polarity Ambient Check, Horizontal Polarity Ambient Check, Vertical Polarity Operational Scan, and Horizontal Polarity Operational Scan are located after Figure 4-9.
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Figure 4-1: USC-12708 (Asset #100893) Semi-Anechoic Chamber (14 x 10 x 10 feet) The shielded enclosure is OEM certified to attenuate 100 dB up to 18 GHz for electric field and plane waves. Note that power and data cables are kept approximately 2 cm apart with any excess zig-zagged away from the ground plane edge. Copper ground plane measures 0.64 mm thick. Distance from the Ground Plane to the Enclosure Wall (≥ 30 cm): 30 cm Maximum Length to Width Ratio of the Solid Copper Ground Straps (≤ 5:1): 4.95:1 Power Lead Length (2 to 2.5 meters, test item permitting): 2 m Bonding Measurements: Date (Measured Monthly): 02/14/06 Results (≤ 2.5 mΩ): Far Right: 0.1 Center Right: 0.1 Center Left: 0.0 Far Left: 0.1 Antenna Heights Relative to the Chamber Floor (cm): Rod: 85 Biconical: 120 Large Waveguide: 120 Small Waveguide: 120
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Figure 4-2: Test Hardware Identification
Figure 4-3: Test setup for 14 kHz to 30 MHz radiated emissions.
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Figure 4-4: Test setup for vertical 30 MHz to 200 MHz radiated emissions.
Figure 4-5: Test setup for vertical 200 MHz to 1 GHz radiated emissions.
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Figure 4-6: Test setup for vertical 1 GHz to 10 GHz radiated emissions.
Figure 4-7: Test setup for horizontal 30 MHz to 200 MHz radiated emissions.
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Figure 4-8: Test setup for horizontal 200 MHz to 1 GHz radiated emissions.
Figure 4-9: Test setup for horizontal 1 GHz to 10 GHz radiated emissions.
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Vertical Broadband 14 kHz 1 GHz Plot
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Vertical Narrowband 14 kHz 1 GHz Plot
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Vertical Narrowband 1 GHz 10 GHz Plot
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Horizontal Broadband 30 MHz 1 GHz Plot
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Horizontal Narrowband 30 MHz 1 GHz Plot
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Horizontal Narrowband 30 MHz 1 GHz Plot
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SECTION 5
CS06 CONDUCTED SUSCEPTIBILITY TEST SUMMARY
Test Start-Finish Dates: 28 February through 01 March 2006
Responsible Test Technician: Scott C. Williamson
5-1 TEST HARDWARE One (1) PMI Model Number RFOC-811-QRC, S/N PM602916 5-2 TEST REQUIREMENTS WITH TOLERANCES Evaluate whether or not the test item and its associated cabling are susceptible when exposed to pulses injected onto its power leads. Tolerance Laboratory Climate: 25±10°C, 20 to 80% Relative Humidity, Site Pressure Distance: ±5%; Amplitude (waveform): minimum; Duration (waveform): ±20%
5-2.1 Test Specification: MIL-STD-461C, Method CS06 5-3 TEST SETUP
TABLE 5-1: QUALTEST FURNISHED MEASUREMENT & TEST EQUIPMENT Asset # Item Manufacturer Model Number Cal Due 100328 Transient Pulse Generator Solar 8282-1 01/10/07 100312 Digital Oscilloscope GW Instek GDS-840C 10/25/06 100348 Voltage Probe Hewlett Packard 10002A NA 100379 Isolation Transformer Solar 6220-1A NA 100335 5 Ω Load Solar 7144-5.0 NA None Tape Measure Reference #100420 33-158 Indefinite
100315 Thermo Hygrometer Mannix SAM990DW 11/14/06
5-3.1 Measurement Equipment Power Up Setup the test as shown in Figure 5-3. Power the measurement equipment and record the time allowed for stabilization: 33 minutes
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5-3.2 Waveform Calibration Using the waveform calibration setup shown in Figure 5-2, apply a pulse signal to the injection probe. Increase the amplitude of this signal until the voltage across the 5 Ω resistor is equal to 200 Vpk, and record the generator setting. Record the amplitude and duration of the pulse.
TABLE 5-2: SYSTEM CALIBRATION RESULTS
Test Waveform Waveform Amplitude
(Vpk)
Waveform Duration (µs)
Generator Setting (V)
10 µs, Positive 200 8.2 230 10 µs, Negative -204 8.0 230 0.15 µs, Positive 216 0.15 70 0.15 µs, Negative -220 0.148 70
5-4 TEST DESCRIPTION
5-4.1 Non-Qualtest Personnel, Including Organization, Present for All or Part of the Test: Yu Rong, a representative from American Microwave Corporation
5-4.2 Powered/Operational State of the Hardware and by Whom: The customer representative is responsible for test item setup, operation, functional evaluation, and any associated documentation activities.
5-4.3 Test Activities and Resulting Measurements from Observed/Recorded Data: Test item source power: +15 VDC, -15 VDC, 5 VDC Power the test item and record the time allowed for stabilization: customer directed Laboratory Climate: Temperature (°C): 23 Relative Humidity (%): 44 Using the measurement setup shown in Figure 5-3, inject the pulse signal on each designated injection point for a minimum of five minutes.
TABLE 5-3: TEST DATA Injection Point Date Injection Time (min) Peak Voltage (Vpk) Comments +5 VDC Line 2/28/06 5.0 148 10 µs Positive; No effects +5 VDC Line 3/01/06 5.0 -164 10 µs Negative; No effects +5 VDC Line 3/01/06 5.0 192 0.15 µs Positive; No effects +5 VDC Line 3/01/06 5.0 -196 0.15 µs Negative; No effects
+15 VDC Line 3/01/06 5.0 -188 0.15 µs Negative; No effects +15 VDC Line 3/01/06 5.0 184 0.15 µs Positive; No effects +15 VDC Line 3/01/06 5.0 -160 10 µs Negative; No effects
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Injection Point Date Injection Time (min) Peak Voltage (Vpk) Comments +15 VDC Line 3/01/06 5.3 168 10 µs Positive; No effects -15 VDC Line 3/01/06 5.0 164 10 µs Positive; No effects -15 VDC Line 3/01/06 5.0 -152 10 µs Negative; No effects -15 VDC Line 3/01/06 5.0 188 0.15 µs Positive; No effects -15 VDC Line 3/01/06 5.0 -232 0.15 µs Negative; No effects
5-4.4 Limitations or Departures from the Test Requirements and Authorizing Source:
Customer placed a 2200 µF series capacitor in the line being tested, external to the test item. 5-5 ENVIRONMENTAL TEST DATA Data for the Waveform Calibration is located in Table 5-2. Data for the injections is located in Table 5-3. Compliance verified through test setup and observation (reference photos Figures 5-1 through 5-5).
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Figure 5-1: USC-12708 (Asset #100893) Semi-Anechoic Chamber (14 x 10 x 10 feet) The shielded enclosure is OEM certified to attenuate 100 dB up to 18 GHz for electric field and plane waves. Note that power and data cables are kept approximately 2 cm apart with any excess zig-zagged away from the ground plane edge. Copper ground plane measures 0.64 mm thick. Distance from the Ground Plane to the Enclosure Wall (≥30 cm): 45 cm Maximum Length to Width Ratio of the Solid Copper Ground Straps (≤ 5:1): 4.00:1 Bonding Measurements: Date (Measured Monthly): 2/15/06 Results (≤ 2.5 mΩ): Far Right: 0.0 Center Right: 0.0 Center Left: 0.0 Far Left: 0.0
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Figure 5-2: Calibration Setup
Figure 5-3: Parallel Injection Test Setup
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Figure 5-4: CS06 Calibration Set Up
Figure 5-5: CS06 Test setup
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SECTION 6
CS02 CONDUCTED SUSCEPTIBILITY TEST SUMMARY
Test Start-Finish Dates: 09 March 2006
Responsible Test Technician: Scott C. Williamson
6-1 TEST HARDWARE One (1) PMI Model Number RFOC-811-QRC, S/N PM602916 6-2 TEST REQUIREMENTS WITH TOLERANCES Evaluate whether or not the test item and its associated cabling are susceptible when exposed to 1 Vrms injected onto its input power line, over the frequency range from 50 kHz to 400 MHz. Tolerance Laboratory Climate: 25±10°C, 20 to 80% Relative Humidity, Site Pressure Distance: ±5%; Frequency: ±2%; Amplitude: ±2 dB
6-2.1 Test Specification: MIL-STD-461C, Method CS02 6-3 TEST SETUP
TABLE 6-1: QUALTEST FURNISHED MEASUREMENT & TEST EQUIPMENT Asset # Item Manufacturer Model Number Cal Due 100362 RF Coupler Solar 7415-3 NA 100306 Signal Generator Hewlett Packard 8662A 10/22/06 100389 RF Amplifier Amplifier Research 500A100 NA 100390 RF Amplifier Amplifier Research 500W1000M5 NA 100407 Spectrum Analyzer Hewlett Packard 8591EM 02/09/07 100375 50 Ω Resistor Ohmite L225J 50R NA None Tape Measure Reference #100420 33-158 Indefinite
100301 Stopwatch Oakton 220 08/01/06 100315 Thermo Hygrometer Mannix SAM990DW 11/14/06
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6-3.1 Measurement Equipment Power Up Setup the test as shown in Figure 6-1. Power the measurement equipment and record the time allowed for stabilization: 30 minutes Note that the following sweep settings are used in accordance with MIL-STD-461E.
TABLE 6-2: SUSCEPTIBILITY SCANNING Frequency Range Analog Scans Maximum Scan Rates Stepped Scans Maximum Step Size
30 Hz 1 MHz 0.0333 f0/sec 0.05 f0 1 MHz 30 MHz 0.00667 f0/sec 0.01 f0 30 MHz 1 GHz 0.00333 f0/sec 0.005 f0
6-3.2 System Calibration
Using the system calibration setup shown in Figure 6-2, apply a 50 kHz continuous waveform (CW) signal to the RF coupler. Increase the amplitude of this signal until the voltage across the 50 Ω resistor is equivalent to a 1 W power dissipation, and record the signal source setting. Scan from 50 kHz to 400 MHz and record the signal source settings.
TABLE 6-3: SYSTEM CALIBRATION RESULTS Freq (MHz) Cal Level (Vrms)1 Sig Gen Setting (dBm) Sig Gen Used Amp Used
0.05 7.07 -18.3 8662A 500A100 0.06 7.07 -18.6 8662A 500A100 0.07 7.07 -19.0 8662A 500A100 0.08 7.07 -19.3 8662A 500A100 0.09 7.07 -19.6 8662A 500A100 0.1 7.07 -20.0 8662A 500A100 0.2 7.07 -22.8 8662A 500A100 0.4 7.07 -24.4 8662A 500A100 0.6 7.07 -24.7 8662A 500A100 0.8 7.07 -24.6 8662A 500A100 1 7.07 -24.9 8662A 500A100 2 7.07 -23.9 8662A 500A100 3 7.07 -22.7 8662A 500A100 4 7.07 -22.3 8662A 500A100 5 7.07 -21.5 8662A 500A100 6 7.07 -22.3 8662A 500A100 7 7.07 -22.6 8662A 500A100 8 7.07 -22.3 8662A 500A100 9 7.07 -21.7 8662A 500A100
10 7.07 -20.9 8662A 500A100 15 7.07 -21.6 8662A 500A100 20 7.07 -22.9 8662A 500A100 25 7.07 -21.6 8662A 500A100
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Freq (MHz) Cal Level (Vrms)1 Sig Gen Setting (dBm) Sig Gen Used Amp Used 30 7.07 -22.1 8662A 500A100 40 7.07 -24.0 8662A 500A100 50 7.07 -20.0 8662A 500A100 60 7.07 -19.9 8662A 500A100 70 7.07 -19.5 8662A 500A100 80 7.07 -20.0 8662A 500A100 90 7.07 -16.0 8662A 500A100
100 7.07 -15.4 8662A 500W1000M5 120 7.07 -16.4 8662A 500W1000M5 140 7.07 -15.7 8662A 500W1000M5 160 7.07 -15.4 8662A 500W1000M5 180 7.07 -12.7 8662A 500W1000M5 200 7.07 -9.4 8662A 500W1000M5 220 7.07 -7.8 8662A 500W1000M5 240 7.07 -13.5 8662A 500W1000M5 260 7.07 -14.3 8662A 500W1000M5 280 7.07 -14.3 8662A 500W1000M5 300 7.07 -15.9 8662A 500W1000M5 320 7.07 -15.1 8662A 500W1000M5 340 7.07 -13.0 8662A 500W1000M5 360 7.07 -12.8 8662A 500W1000M5 380 7.07 -12.7 8662A 500W1000M5 400 7.07 -11.9 8662A 500W1000M5
1The Cal Level is based on 1 watt dissipated through a 50 Ω resistive load, using the following formula: • V(Vrms) = square root (P (watts) x R (ohms))
6-4 TEST DESCRIPTION
6-4.1 Non-Qualtest Personnel, Including Organization, Present for All or Part of the Test: Yu Rong, a representative from American Microwave Corporation
6-4.2 Powered/Operational State of the Hardware and by Whom: The customer representative is responsible for test item setup, operation, functional evaluation, and any associated documentation activities.
6-4.3 Test Activities and Resulting Measurements from Observed/Recorded Data: Test item source power: +5 VDC, +15 VDC, and -15 VDC Power the test item and record the time allowed for stabilization: customer directed Laboratory Climate: Temperature (°C): 20 Relative Humidity (%): 47
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Using the measurement setup shown in Figure 6-3, scan from 50 kHz to 400 MHz on each power input line using an un-modulated signal.
TABLE 6-4: TEST DATA Freq (MHz) Max Voltage (Vrms) Sig Gen Setting (dBm) Sig Gen Used Amp Used
0.05 1.0 -18.3 8662A 500A100 0.06 1.0 -18.6 8662A 500A100 0.07 1.0 -19.0 8662A 500A100 0.08 1.0 -19.3 8662A 500A100 0.09 1.0 -19.6 8662A 500A100 0.1 1.0 -20.0 8662A 500A100 0.2 1.0 -22.8 8662A 500A100 0.4 1.0 -24.4 8662A 500A100 0.6 1.0 -24.7 8662A 500A100 0.8 1.0 -24.6 8662A 500A100 1 1.0 -24.9 8662A 500A100 2 1.0 -23.9 8662A 500A100 3 1.0 -22.7 8662A 500A100 4 1.0 -22.3 8662A 500A100 5 1.0 -21.5 8662A 500A100 6 1.0 -22.3 8662A 500A100 7 1.0 -22.6 8662A 500A100 8 1.0 -22.3 8662A 500A100 9 1.0 -21.7 8662A 500A100
10 1.0 -20.9 8662A 500A100 15 1.0 -21.6 8662A 500A100 20 1.0 -22.9 8662A 500A100 25 1.0 -21.6 8662A 500A100 30 1.0 -22.1 8662A 500A100 40 1.0 -24.0 8662A 500A100 50 1.0 -20.0 8662A 500A100 60 1.0 -19.9 8662A 500A100 70 1.0 -19.5 8662A 500A100 80 1.0 -20.0 8662A 500A100 90 1.0 -16.0 8662A 500A100
100 1.0 -15.4 8662A 500W1000M5 120 1.0 -16.4 8662A 500W1000M5 140 1.0 -15.7 8662A 500W1000M5 160 1.0 -15.4 8662A 500W1000M5 180 1.0 -12.7 8662A 500W1000M5 200 1.0 -9.4 8662A 500W1000M5 220 1.0 -7.8 8662A 500W1000M5 240 1.0 -13.5 8662A 500W1000M5 260 1.0 -14.3 8662A 500W1000M5
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Freq (MHz) Max Voltage (Vrms) Sig Gen Setting (dBm) Sig Gen Used Amp Used 280 1.0 -14.3 8662A 500W1000M5 300 1.0 -15.9 8662A 500W1000M5 320 1.0 -15.1 8662A 500W1000M5 340 1.0 -13.0 8662A 500W1000M5 360 1.0 -12.8 8662A 500W1000M5 380 1.0 -12.7 8662A 500W1000M5 400 1.0 -11.9 8662A 500W1000M5
6-4.4 Limitations or Departures from the Test Requirements and Authorizing Source:
Customer placed a 2200 µF series capacitor in the line being tested, external to the test item. 6-5 ENVIRONMENTAL TEST DATA Data for the System Calibration is located in Table 6-3 above. Data tables for the Sweep Times are located after Figure 6-4.
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Figure 6-1: USC-12708 (Asset #100893) Semi-Anechoic Chamber (14 x 10 x 10 feet) The shielded enclosure is OEM certified to attenuate 100 dB up to 18 GHz for electric field and plane waves. Copper ground plane measures 0.64 mm thick. Distance from the Ground Plane to the Enclosure Wall: 45 cm Maximum Length to Width Ratio of the Solid Copper Ground Straps (≤ 5:1): 4.0:1 Power Lead Length (2 to 2.5 meters, test item permitting): NA Bonding Measurements: Date (Measured Monthly): 2/15/06 Results (≤ 2.5 mΩ): Far Right: 0.0 Center Right: 0.0 Center Left: 0.2 Far Left: 0.0
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Figure 6-2: Calibration Setup
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Figure 6-3: Test Setup
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Figure 6-4: Test setup for 50 kHz to 400 MHz conducted susceptibility.
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Sweep Times Injection Point: +5 VDC Line
Frequency Range Date Start Time Stop Time Sweep Duration (min.) Comments 50 kHz 100 kHz 03/09/06 0845 0852 3.5 No effects 100 kHz 1 MHz 03/09/06 0854 0900 5.8 No effects 1 MHz 5 MHz 03/09/06 0901 0913 11.3 No effects
5 MHz 30 MHz 03/09/06 0914 0932 15.7 No effects 30 MHz 100 MHz 03/09/06 0933 0949 14.8 No effects
100 MHz 200 MHz 03/09/06 0951 1001 7.4 No effects 200 MHz 400 MHz 03/09/06 1003 1012 8.7 No effects
Injection Point: +15 VDC Line
Frequency Range Date Start Time Stop Time Sweep Duration (min.) Comments 50 kHz 100 kHz 03/09/06 1046 1051 3.9 No effects 100 kHz 1 MHz 03/09/06 1052 1059 6.1 No effects 1 MHz 5 MHz 03/09/06 1100 1112 11.3 No effects
5 MHz 30 MHz 03/09/06 1113 1129 15.1 No effects 30 MHz 100 MHz 03/09/06 1130 1146 14.8 No effects
100 MHz 200 MHz 03/09/06 1023 1032 7.3 No effects 200 MHz 400 MHz 03/09/06 1033 1043 8.5 No effects
Injection Point: -15 VDC Line
Frequency Range Date Start Time Stop Time Sweep Duration (min.) Comments 50 kHz 100 kHz 03/09/06 1308 1314 4.1 No Effects 100 kHz 1 MHz 03/09/06 1315 1323 6.1 No Effects 1 MHz 5 MHz 03/09/06 1324 1336 11.5 No Effects
5 MHz 30 MHz 03/09/06 1337 1354 15.8 No Effects 30 MHz 100 MHz 03/09/06 1355 1411 15.4 No Effects
100 MHz 200 MHz 03/09/06 1413 1422 7.6 No Effects 200 MHz 400 MHz 03/09/06 1423 1433 9.3 No Effects
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SECTION 7
CS01 CONDUCTED SUSCEPTIBILITY TEST SUMMARY
Test Start-Finish Dates: 10 March 2006
Responsible Test Technician: Scott C. Williamson
7-1 TEST HARDWARE One (1) PMI Model Number RFOC-811-QRC, S/N PM602916 7-2 TEST REQUIREMENTS WITH TOLERANCES Evaluate whether or not the test item and its associated cabling are susceptible when exposed to audio frequency voltages injected onto its input power line, over the frequency range from 30 Hz to 50 kHz. Test Limit: 10% of supply voltage or 5 Vrms (whichever is less, but not less than 1 Vrms) from 30 Hz to 1.5 kHz, decreasing logarithmically to 1 Vrms from 1.5 kHz to 50 kHz Tolerance Laboratory Climate: 25±10°C, 20 to 80% Relative Humidity, Site Pressure Frequency: ±2%; Amplitude: ±2 dB
7-2.1 Test Specification: MIL-STD-461C, Method CS01 7-3 TEST SETUP
TABLE 7-1: QUALTEST FURNISHED MEASUREMENT & TEST EQUIPMENT Asset # Item Manufacturer Model Number Cal Due 100379 Audio Isolation Transformer Solar 6220-1A NA 100438 Function Generator Agilent 33220A 02/06/07 100345 Audio Amplifier General Radio 1308 NA 100312 Digital Oscilloscope GW Instek GDS-840C 10/25/06 100347 Voltage Probe GW Instek GTP-250A NA 100375 50 Ω Resistor Ohmite L225J 50R NA 100301 Stopwatch Oakton 220 08/01/06 100315 Thermo Hygrometer Mannix SAM990DW 11/14/06
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7-3.1 Measurement Equipment Power Up Setup the test as shown in Figure 7-1. Power the measurement equipment and record the time allowed for stabilization: 30 minutes Note that the following sweep settings are used in accordance with MIL-STD-461E.
TABLE 7-2: SUSCEPTIBILITY SCANNING Frequency Range Analog Scans Maximum Scan Rates Stepped Scans Maximum Step Size
30 Hz 1 MHz 0.0333 f0/sec 0.05 f0 7-4 TEST DESCRIPTION
7-4.1 Non-Qualtest Personnel, Including Organization, Present for All or Part of the Test: Yu Rong, a representative from American Microwave Corporation
7-4.2 Powered/Operational State of the Hardware and by Whom: The customer representative is responsible for test item setup, operation, functional evaluation, and any associated documentation activities.
7-4.3 Test Activities and Resulting Measurements from Observed/Recorded Data: Test item source power: +5 VDC, +15 VDC, and -15 VDC Power the test item and record the time allowed for stabilization: customer directed Laboratory Climate: Temperature (°C): 23 Relative Humidity (%): 45 Using the measurement setup shown in Figure 7-2, scan from 30 Hz to 50 kHz on each power input line using an un-modulated signal.
7-4.4 Limitations or Departures from the Test Requirements and Authorizing Source: Because of large amount of capacitance to ground inside test item, testing was stopped at 35 kHz. 7-5 ENVIRONMENTAL TEST DATA Data tables for the Sweep Times are located after Figure 7-3.
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Figure 7-1: USC-12708 (Asset #100893) Semi-Anechoic Chamber (14 x 10 x 10 feet) The shielded enclosure is OEM certified to attenuate 100 dB up to 18 GHz for electric field and plane waves. Copper ground plane measures 0.64 mm thick. Distance from the Ground Plane to the Enclosure Wall: 45 cm Maximum Length to Width Ratio of the Solid Copper Ground Straps (≤ 5:1): 4.0:1 Power Lead Length (2 to 2.5 meters, test item permitting): NA Bonding Measurements: Date (Measured Monthly): 2/15/06 Results (≤ 2.5 mΩ): Far Right: 0.0 Center Right: 0.0 Center Left: 0.2 Far Left: 0.0
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Figure 7-2: Test Setup
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Figure 7-3: Test setup for 30 Hz to 35 kHz conducted susceptibility. Sweep Times Injection Point: +5 VDC Line
Frequency Range Date Start Time Stop Time Sweep Duration (min.) Comments 30 Hz 100 Hz 03/10/06 0930 0935 2.7 No effects 100 Hz 1 kHz 03/10/06 0936 0944 7.2 No effects 1 kHz 10 kHz 03/10/06 1041 1050 7.8 No effects
10 kHz 35 kHz 03/10/06 1051 1057 5.0 No effects Injection Point: +15 VDC Line
Frequency Range Date Start Time Stop Time Sweep Duration (min.) Comments 30 Hz 100 Hz 03/10/06 1123 1128 3.1 No effects 100 Hz 1 kHz 03/10/06 1129 1138 6.5 No effects 1 kHz 10 kHz 03/10/06 1139 1149 9.0 No effects
10 kHz 35 kHz 03/10/06 1149 1153 3.5 No effects Injection Point: -15 VDC Line
Frequency Range Date Start Time Stop Time Sweep Duration (min.) Comments 30 Hz 100 Hz 03/10/06 1156 1201 3.8 No effects 100 Hz 1 kHz 03/10/06 1202 1211 7.4 No effects 1 kHz 10 kHz 03/10/06 1211 1221 8.8 No effects
10 kHz 35 kHz 03/10/06 1222 1227 5.0 No effects