Quality assurance and Certification - Sensing, Fluid Management, … · 2019. 12. 16. · Quality...

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QUALITY SYSTEM OVERVIEW–REDMOND AND KAOHSIUNG The quality management system of Crane Electronics, Inc., Redmond and Crane Electronics Corporation, Kaohsiung have been certified to ISO 9001:2015 and AS9100D on certificates 1655 and 1657 by the International Standards Authority, Inc. (www.isaregistrar.com). Our Redmond and Kaohsiung facilities are on the Defense Logistics Agency’s (DLA) Qualified Manufacturers List (QML) of hybrid microcircuits with products compliant up to Class H (Redmond and Kaohsiung) and Class K (Redmond) of MIL-PRF-38534. Our manufacturing facilities are audited by a US government organization with customer participation. The certificate number for Kaohsiung Class H is VQH-18-032974, for Redmond Class H and K it is VQH-10-019519. Standard Microcircuit Drawings (SMD) of our DC-DC converters are available to Class H and K of MIL-PRF-38534. DLA Drawing EMI filters are available to Class H and K of MIL-PRF- 38534. The government documents may be viewed at https://landandmaritimeapps.dla.mil/ programs/smcr/. Components and materials used in product assembly are purchased against published revision controlled source control drawings (SCD). Characteristics and allowed suppliers are controlled by specific SCD. A system is in place to review components and materials prior to stocking. Instruments such as the X-ray fluorescence (XRF) are used to ensure that supplier certifications accurately describe the material. Our high reliability QML products comply with MIL-PRF-38534 specifications, which do not allow the use of pure tin. Our other products may have pure tin. Refer to our “Lead and Other RoHS Materials” letter for more information. www. interpoint.com/011. Documented revision controlled procedures and work instructions are in use for all operations that affect quality. Radiation hardness assurance (RHA) levels available referenced to MIL-PRF-38534. Our Redmond facility has a DLA approved RHA plan for Interpoint power products. Our SMD products with RHA “P,” “L”, “R” and “H” level meet DLA RHA requirements. Travelers are used to sequence and control operations at in-process, final and special inspection situations. Quality documents are specifically identified and retained as specified in our document control procedure. The standard retention period for critical documents is 15 years. Personnel performing quality functions are given the responsibility, authority and organizational freedom to identify and evaluate quality concerns as well as to initiate corrective action. Contracts are reviewed to identify and make timely provisions for special or unusual circumstances. As a minimum, self audits of the quality system are completed annually. The application note is an overview of the Crane quality system for Interpoint® products. It includes a list of certifications and qualifications, an explanation of our model numbering system and tables of the screening levels offered. This is to certify that the Quality Management System of Crane Electronics, Inc. (Campus Structure) (Additional Sites Listed on the Attachment) Certificate of Registration International Standards Authority, Inc. www.isaregistrar.com 525 Queensland Cir. Corona, CA 92879. USA Tel: 951-736-0035 The conditions for maintaining this certificate of registration are set forth in ISA’s Registration Policies 5.1. This registration is granted subject to the organization maintaining compliance to the noted standard. The validity of this certificate is dependent upon ongoing surveillance audits. ISO 9001:2015 AS9100D The assessment was performed in accordance with the requirements of the latest version of AS9104 /1:2012-01 ISA is accredited under the ICOP Scheme. has been assessed for conformance with the provisions set forth by Certificate No. 1655 Issue Date: 06/26/2018 Expiration Date: 06/25/2021 Certified since June 15, 2016 President_________________________________ Scope of Registration Design, Manufacture, and Sales of Hybrid DC/DC Converters, Electromagnetic Interference Filters, And Custom Microelectronics. This is to certify that the Quality Management System of Crane Electronics Inc. Crane Electronics Corporation - Power Solution No. 198 Xinsheng Rd., Qianzhen District, Kaohsiung City, R.O.C., 80672 Taiwan (Single Site Structure) Certificate of Registration International Standards Authority, Inc. 525 Queensland Cir. Corona, CA 92879. USA Tel: 951-736-0035 The conditions for maintaining this certificate of registration are set forth in ISA’s Registration Policies 5.1. This registration is granted subject to the organization maintaining compliance to the noted standard. The validity of this certificate is dependent upon ongoing surveillance audits. ISO 9001:2015 AS9100D Scope of Registration Manufacture of Hybrids, DC/DC Converters, EMI Filters, Microelectronics, Magnetics Transformer Rectifier Units and Custom Power Products for Aircraft, Aerospace and Defense Systems. The assessment was performed in accordance with the requirements of the latest version of AS9104 /1:2012-01 ISA is accredited under the ICOP Scheme. has been assessed for conformance with the provisions set forth by Certificate No. 1657 Issue Date: 07/20/2018 Expiration Date: 07/19/2021 Certified since June 15, 2016 President_________________________________ D E F E N S E L O G I S T I C S A G E N C Y LAND AND MARITIME POST OFFICE BOX 3990 COLUMBUS, OH 43218-3990 Mr. Dale Fakkema September 4, 2018 Crane Electronics, Inc. P.O. Box 97005 Redmond, WA 98073-9705 Dear Mr. Fakkema: Re: Class H Manufacturer Certification, Hybrid Microcircuits, MIL-PRF-38534, FSC 5962, VQ(VQH-18-032974) , CN 064074 Your hybrid facility at No.198, Xinsheng Rd., Qianzhen Dist., Kaohsiung City 80672, Taiwan (R.O.C.) was sample audited the week of March 21-23, 2018 for compliance with the requirements of MIL-PRF-38534. An acceptable level of confidence has been established that the compliance with these requirements exists. Therefore, Crane Electronics Corporation is considered a certified Classes H manufacturer (certificate enclosed) effective August 30, 2018 retaining a Certification effective date of September 10, 1997. This certification is for the following: a. Product Assurance Program Plan: QA-083 Rev. AL. b. Conversion of Customer Requirements: ENG-002 Rev. AT. c. Controlled documentation baseline for processing MIL-PRF-38534 devices: QA-039 Rev. AP. This certification is valid until terminated by written notification from the qualifying activity. The normal period of certification is two years from the date of the audit and, if warranted, may be withdrawn by DLA Land and Maritime-VQ at any time. Your facility may be re-audited on a drop-in basis at any time. All screening, qualification, conformance, and periodic inspection must be performed at a facility, which has a DLA Land and Maritime-VQ letter of Laboratory Suitability for the applicable test method and condition. If you have any questions, please contact Mr. Barker at (614) 692-0596. Sincerely, ALAN WILL Chief Sourcing and Qualifications Division WILL.ALAN.J.1230 187076 Digitally signed by WILL.ALAN.J.1230187076 Date: 2018.09.06 13:11:21 -04'00' Crane Aerospace & Electronics Power Solutions Quality Assurance and Certification APPLICATION NOTE APP-009 Rev AL - 2018.12.07 Crane Aerospace & Electronics Power Solutions – Interpoint ® Products 10301 Willows Road NE, Redmond, WA 98052 +1 425-882-3100 [email protected] www.craneae.com/interpoint Page 1 of 15

Transcript of Quality assurance and Certification - Sensing, Fluid Management, … · 2019. 12. 16. · Quality...

Page 1: Quality assurance and Certification - Sensing, Fluid Management, … · 2019. 12. 16. · Quality SyStem Overview–redmOnd and KaOhSiung • The quality management system of Crane

Quality SyStem Overview–redmOnd and KaOhSiung• ThequalitymanagementsystemofCraneElectronics,Inc.,RedmondandCraneElectronics

Corporation,KaohsiunghavebeencertifiedtoISO9001:2015andAS9100Doncertificates1655and1657bytheInternationalStandardsAuthority,Inc.(www.isaregistrar.com).

• OurRedmondandKaohsiungfacilitiesareontheDefenseLogisticsAgency’s(DLA)QualifiedManufacturersList(QML)ofhybridmicrocircuitswithproductscompliantuptoClassH(RedmondandKaohsiung)andClassK(Redmond)ofMIL-PRF-38534.OurmanufacturingfacilitiesareauditedbyaUSgovernmentorganizationwithcustomerparticipation.ThecertificatenumberforKaohsiungClassHisVQH-18-032974,forRedmondClassHandKitisVQH-10-019519.

• StandardMicrocircuitDrawings(SMD)ofourDC-DCconvertersareavailabletoClassHandKofMIL-PRF-38534.DLADrawingEMIfiltersareavailabletoClassHandKofMIL-PRF-38534.Thegovernmentdocumentsmaybeviewedathttps://landandmaritimeapps.dla.mil/programs/smcr/.

• Componentsandmaterialsusedinproductassemblyarepurchasedagainstpublishedrevisioncontrolledsourcecontroldrawings(SCD).CharacteristicsandallowedsuppliersarecontrolledbyspecificSCD.Asystemisinplacetoreviewcomponentsandmaterialspriortostocking.InstrumentssuchastheX-rayfluorescence(XRF)areusedtoensurethatsuppliercertificationsaccuratelydescribethematerial.OurhighreliabilityQMLproductscomplywithMIL-PRF-38534specifications,whichdonotallowtheuseofpuretin.Ourotherproductsmayhavepuretin.Refertoour“LeadandOtherRoHSMaterials”letterformoreinformation.www.interpoint.com/011.

• Documentedrevisioncontrolledproceduresandworkinstructionsareinuseforalloperationsthataffectquality.

• Radiationhardnessassurance(RHA)levelsavailablereferencedtoMIL-PRF-38534.OurRedmondfacilityhasaDLAapprovedRHAplanforInterpointpowerproducts.OurSMDproductswithRHA“P,”“L”,“R”and“H”levelmeetDLARHArequirements.

• Travelersareusedtosequenceandcontroloperationsatin-process,finalandspecialinspectionsituations.

• Qualitydocumentsarespecificallyidentifiedandretainedasspecifiedinourdocumentcontrolprocedure.Thestandardretentionperiodforcriticaldocumentsis15years.

• Personnelperformingqualityfunctionsaregiventheresponsibility,authorityandorganizationalfreedomtoidentifyandevaluatequalityconcernsaswellastoinitiatecorrectiveaction.

• Contractsarereviewedtoidentifyandmaketimelyprovisionsforspecialorunusualcircumstances.

• Asaminimum,selfauditsofthequalitysystemarecompletedannually.

TheapplicationnoteisanoverviewoftheCranequalitysystemforInterpoint®products.Itincludesalistofcertificationsandqualifications,anexplanationofourmodelnumberingsystemandtablesofthescreeninglevelsoffered.

This is to certify that the Quality Management System of

Crane Electronics, Inc. (Campus Structure)

(Additional Sites Listed on the Attachment)

Certificate of Registration

International Standards Authority, Inc. www.isaregistrar.com

525 Queensland Cir. Corona, CA 92879. USA

Tel: 951-736-0035

The conditions for maintaining this certificate of registration are set forth in ISA’s Registration Policies 5.1. This registration is granted subject to the organization maintaining compliance to the noted standard. The validity of this certificate is dependent upon ongoing surveillance audits.

ISO 9001:2015 AS9100D

The assessment was performed in accordance with the requirements of the latest version of AS9104 /1:2012-01 ISA is accredited under the ICOP Scheme.

has been assessed for conformance with the provisions set forth by

Certificate No. 1655Issue Date: 06/26/2018 Expiration Date: 06/25/2021 Certified since June 15, 2016

President_________________________________

Scope of Registration

Design, Manufacture, and Sales of Hybrid DC/DC Converters, Electromagnetic Interference Filters, And Custom Microelectronics.

This is to certify that the Quality Management System of

Crane Electronics Inc. Crane Electronics Corporation - Power Solution

No. 198 Xinsheng Rd., Qianzhen District, Kaohsiung City, R.O.C., 80672 Taiwan (Single Site Structure)

Certificate of Registration

International Standards Authority, Inc.

www.isaregistrar.com 525 Queensland Cir.

Corona, CA 92879. USA Tel: 951-736-0035

The conditions for maintaining this certificate of registration are set forth in ISA’s Registration Policies 5.1. This registration is granted subject to the organization maintaining compliance to the noted standard. The validity of this certificate is dependent upon ongoing surveillance audits.

ISO 9001:2015 AS9100D

Scope of Registration Manufacture of Hybrids, DC/DC Converters, EMI Filters, Microelectronics, Magnetics Transformer Rectifier Units and Custom Power Products for Aircraft, Aerospace and Defense Systems.

The assessment was performed in accordance with the requirements of the latest version of AS9104 /1:2012-01 ISA is accredited under the ICOP Scheme.

has been assessed for conformance with the provisions set forth by

Certificate No. 1657 Issue Date: 07/20/2018 Expiration Date: 07/19/2021 Certified since June 15, 2016

President_________________________________

DEFENSE LOGISTICS AGENCY LAND AND MARITIME

POST OFFICE BOX 3990 COLUMBUS, OH 43218-3990

Mr. Dale Fakkema September 4, 2018Crane Electronics, Inc.P.O. Box 97005Redmond, WA 98073-9705

Dear Mr. Fakkema:

Re: Class H Manufacturer Certification, Hybrid Microcircuits, MIL-PRF-38534, FSC 5962,VQ(VQH-18-032974) , CN 064074

Your hybrid facility at No.198, Xinsheng Rd., Qianzhen Dist., Kaohsiung City 80672, Taiwan (R.O.C.) was sample audited the week of March 21-23, 2018 for compliance with the requirements of MIL-PRF-38534.

An acceptable level of confidence has been established that the compliance with these requirements exists. Therefore, Crane Electronics Corporation is considered a certified Classes H manufacturer (certificate enclosed) effective August 30, 2018 retaining a Certification effective date of September 10, 1997.

This certification is for the following:

a. Product Assurance Program Plan: QA-083 Rev. AL.

b. Conversion of Customer Requirements: ENG-002 Rev. AT.

c. Controlled documentation baseline for processing MIL-PRF-38534 devices: QA-039 Rev. AP.

This certification is valid until terminated by written notification from the qualifying activity. The normal period of certification is two years from the date of the audit and, if warranted, may be withdrawn by DLA Land and Maritime-VQ at any time. Your facility may be re-audited on a drop-in basis at any time.

All screening, qualification, conformance, and periodic inspection must be performed at a facility, which has a DLA Land and Maritime-VQ letter of Laboratory Suitability for the applicable test method and condition.

If you have any questions, please contact Mr. Barker at (614) 692-0596.

Sincerely,

ALAN WILLChiefSourcing and Qualifications Division

WILL.ALAN.J.1230187076

Digitally signed by WILL.ALAN.J.1230187076 Date: 2018.09.06 13:11:21 -04'00'

Crane Aerospace & Electronics Power Solutions

Quality assurance and CertificationApplicAtion note

APP-009RevAL-2018.12.07Crane Aerospace & ElectronicsPower Solutions – Interpoint® Products10301 Willows Road NE, Redmond, WA 98052+1 425-882-3100 • [email protected]/interpoint

Page1of15

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Quality aSSuranCe CertifiCatiOnS and StandardS redmOnd and KaOhSiung• ANSI/ESDS20.20—ElectrostaticDischargeControlProgram.Weuseamulti-levelESDdamagepreventionapproachincluding

operatortraining,continuouslymonitoringwristgrounding-straps,staticdissipativesmocksforpersonnel,staticdissipativeworksurfacesandfloors,airionizersatworkstationsandfaradaycagesforpartsmovement.

• ANSI/IPC-A-600—AcceptabilityofPrintedBoards• ANSI/IPC-A-610—AcceptabilityofElectronicAssemblies.TheRedmondfacilityhasIPC-610certifiedoperators.• ANSI-Z540—CalibrationLaboratoriesandMeasuringandTestEquipment—GeneralRequirements• ASQC-Z1.4—Procedures,SamplingandTablesforInspectionbyAttributes• ISO9001:2008/AS9100C—QualitySystems.Modelforqualityassuranceindesign,development,production,installation,and

servicing.RedmondandKaohsiungfacilitiesareregisteredwithQMI-SAIGlobalforISO9001:2008/AS9100C.• ISO14644—CleanroomsandControlledEnvironments.Particlecountmonitoring,laminarflowbenchesandcontamination

preventingsmocksforpersonnelallcontributetomaintainingtherequiredlevelsofcleanliness.• MIL-STD-883—TestMethodStandardforMicrocircuits• MIL-PRF-38534—HybridMicrocircuits,GeneralSpecificationsfor• QualityCertification—Employeeswhoworkwithproductsareindividuallycertifiedintherequiredskills.Trainingand

certificationaredocumentedandrecordsaremaintained.Inspectorsaretestedforcolorvisionandvisualacuity.• QML-38534—QualifiedManufacturer’sListofProductsQualifiedunderPerformanceSpecificationMIL-PRF-38534Hybrid

Microcircuits,GeneralRequirementsfor• RestrictionofHazardousSubstances(RoHS),WasteElectricalandElectronicEquipment(WEEE)andRegistration,Evaluation,

andAuthorizationofChemicals(REACh)areaddressedin“LeadandOtherRoHSMaterials”availableatwww.interpoint.com/011

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part numberingOurpartnumberingindicatestheseries(family),inputvoltage,outputvoltage,numberofoutputs,packageconfigurationandscreeninglevel.ThescreeningandRHAlevelsfoundinthisQualityAssurancedocumentappearattherightendofthepartnumber.Productswithstandardscreeningdonothaveascreeninglevelinthepartnumber:e.g.MTR2812DistheMTRSeries™28voltinput(nominal),±12voltoutputs,flangedpackageandstandardscreening.Refertoindividualdatasheetstodeterminewhatscreeningoptionsareavailableforaparticularproduct.ScreeningmethodsarereferencedtoMIL-STD-883perMIL-PRF-38534.

MTR 28 12 D F / 883 Base Model

Input Voltage

Output Voltage

Screening

Number of Outputs

Case/Lead Option(Standard case has no designator in thisposition. F=flanged model; U, V, W, Y and Zrefer to various options on select products. See individual products for more information.)

(S = single, D = dual, T = triple)

(Main and aux. VOUT for triple models)

(Standard screening has no designatorin this position. See screening levels at right.)

TheexampleshowsanMTR,28Vin,±12Vout,flangedcasewith/883(ClassH)screening.MTR2812D/883isamodelintheMTRSeries™.

SMHF 28 05 S F / K RBase Model

Input VoltageOutput Voltage

Environmental Screening

Number of Outputs(S = single, D = dual)

Radiation HardnessAssurance (RHA)

Case Option(Non-flanged case has no designator in this position)

TheexamplebelowshowsanSMHF,28Vin,+5Vout,flangedcase,ClassKscreeningandRHAlevelR.SMHF2805SF/KRisamodelintheSMHFSeries™.

Table 1: Screening levelS (non Space)level DeScripTion of levelS

883 ClassH,QML,hasanSMDnumber,markedwith“QML”

883 ClassH,QML,doesnothaveanSMDnumber,markedwith“CH”.

8831 MIL-STD-883screening,nonQML,markedwith“SX”ES1 Extendedscreening,pertheproduct’sdatasheetStandard1 Standardscreening,pertheproduct’sdatasheet1.Non-compliantproductsmaynotmeetalloftherequirementsofMIL-PRF-38534.

Table 2: Screening anD rHa levelS, Space proDucTS

level DeScripTion of levelS

KR ClassK,QML,RHAlevelR,100krad(Si)KL ClassK,QML,RHAlevelL,50krad(Si)KP ClassK,QML,RHAlevelP,30krad(Si)ER ClassE,QML,RHAlevelR,100krad(Si)EL ClassE,QML,RHAlevelL,50krad(Si)EP ClassE,QML,RHAlevelP,30krad(Si)HR ClassH,QML,RHAlevelR,100krad(Si)HL ClassH,QML,RHAlevelL,50krad(Si)HP ClassH,QML,RHAlevelP,30krad(Si)KH ClassK,QML,filtersonlyRHAlevelH1

HH ClassH,QML,filtersonlyRHAlevelH1

BR ClassKscreening,non-QML2,RHAlevelR,100krad(Si)BL ClassKscreening,non-QML2,RHAlevelL,50krad(Si)BP ClassKscreening,non-QML2,RHAlevelP,30krad(Si)AR ClassHscreening,non-QML2,RHAlevelR,100krad(Si)

AL ClassHscreening,non-QML2,RHAlevelL,50krad(Si)

AP ClassHscreening,non-QML2,RHAlevelP,30krad(Si)OO Spaceprototype,screening(non-QML2)pertheproduct’s

datasheet.“O”intheRHAdesignatorpositioninInterpointmodelnumbersindicatesDLARHA“-”definedasnoRHA.

NotesTable21.RHA“H”appliestofiltersonly.OurEMIfiltersaredesignedwithpassivecomponentsprovidingmaximumtoleranceforspaceenvironmentrequirements.RHA“H”isdefinedasradiationtolerantupto1000krad(Si)totaldose.

2.Non-QMLproducts“A”,“B”and“O”maynotmeetalloftherequirementsofMIL-PRF-38534.

Iforderingbymodelnumberadda“-Q”torequestsolderdippedleads(e.g.MTR-2812DF/883-Q).AvailableonlyforClassH.

Iforderingbymodelnumberadda“-Q”torequestsolderdippedleads(e.g.SMHF2805SF/KR-Q).AvailableonlyforClassH,EandK.

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SCreening tableS page

“Table3:ElementEvaluationSpaceDC-DCConvertersPrototype,ClassH,EandK”................ 5

“Table4:EnvironmentalScreeningSpaceDC-DCConvertersPrototype,ClassH,EandK”..... 6

“Table5:SpaceRadiationHardnessAssuranceDC-DCConvertersClassH,EandKwithRHAP,LandR”.......................................................................................................................................... 7

“Table6:EnvironmentalScreeningSpaceDC-DCConvertersPrototype,AandB,non-QML”.... 8

“Table7:SpaceRadiationHardnessAssuranceDC-DCConvertersAandBnon-QMLwithRHAP,LandR”...................................................................................................................................... 9

“Table8:ElementEvaluationSpaceEMIFiltersPrototype,ClassHandK”................................ 10

“Table9:EnvironmentalScreeningSpaceEMIFiltersPrototype,ClassHandK,withRHAH”.. 11

“Table10:ElementEvaluationHighReliabilityDC-DCConvertersandEMIFilters/883(ClassH)” ..................................................................................................................................................12

“Table11:EnvironmentalScreeningHighReliabilityDC-DCConvertersandEMIFiltersStandard,/ESand/883(ClassH)”.............................................................................................................. 13

“Table12:EnvironmentalScreeningDC-DCConvertersandEMIFiltersStandardand/ES,Non-QML”......................................................................................................................................... 14

“Table13:EnvironmentalScreeningIndustrialDC-DCConvertersandEMIFiltersStandard,Non-QML”......................................................................................................................................... 15

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Tableisforreferenceonly.SeeindividualSeries'datasheetsforspecificscreening.

Table 3: elemenT evaluaTion Space Dc-Dc converTerS proToType, claSS H, e anD K

ElEmEnt Evaluation SpacE Dc-Dc convErtErS prototypE, claSS H, E anD K

non-Qml 1 Qml

prototypE claSS H claSS E claSS K

componEnt-lEvEl tESt pErformED

/o /H /E 2 /Km/S 3 m/S 3 p 4 m/S 3 p 4 m/S 3 p 4

ElementElectrical n n n n n n n

Visual n n n n n n

InternalVisual n n n

TemperatureCycling n n n n

ConstantAcceleration n n n n

InterimElectrical n n

Burn-in n n

PostBurn-inElectrical n n

SteadyStateLife n n

VoltageConditioningAging n n

VisualInspection n n

FinalElectrical n n n n n n

WireBondEvaluation n n n n n n

SEM n n

C-SAM:Inputcapacitorsonly5 n n n

Notes1.Non-QMLproductsmaynotmeetalloftherequirementsofMIL-PRF-38534.2,ClassEisbasedonClassKrequirementsofMIL-PRF-38534withtheexceptionthatConstantAccelerationislimitedto3000gmaximumincludingqualificationtesting.

3.M/S=Activecomponents(microcircuitandsemiconductordie)4.P=Passivecomponents,ClassH,EandKelementevaluation.Notapplicabletospaceprototype(“O”)elementevaluation.5.AdditionaltestnotrequiredbyH,EorK.

DefinitionsElementEvaluation:Componenttesting/screeningperMIL-STD-883asdeterminedbyMIL-PRF-38534SEM:scanningelectronmicroscopyC-SAM:C–ModeScanningAcousticMicroscopy

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Tableisforreferenceonly.SeeindividualSeries'datasheetsforspecificscreening.

EnvironmEntal ScrEEning SpacE Dc-Dc convErtErS prototypE, claSS H, E anD K, rHa p, l anD r

non-Qml 1 Qml 2, 3

prototypE claSS H claSS E 4 claSS KtESt pErformED /oo 5 /Hp /Hl /Hr /EKp /EKl /EKr /Kp /Kl /Krnon-destruct wire bond pull, method 2023    n6    n6    n6 n n n n n n

pre-cap inspection, method 2017, 2032 n n n n n n n n n n

temperature Cycle (10 times)

Method1010,Cond.C,-65°Cto+150°C,ambient n n n n n n n n n n

Constant acceleration Method2001,3000g n n n n n n n n n n

pind, test method 2020, Cond. a    n6    n6    n6 n n n n n n

pre burn-in test, group a, Subgroups 1 and 4 n    n6    n6    n6 n n n n n n

burn-in method 1015, +125°C case, typical 7

96hours n

160hours n n n

2x160hours(includesmid-BItest) n n n n n n

final electrical test, mil-prf-38534, group a, Subgroups1and4:+25°Ccase n

Subgroups1through6,-55°C,+25°C,+125°Ccase n n n n n n n n n

hermeticity test, method 1014GrossLeak,Cond.B2,Kr85 n n n n n n

GrossLeak,Cond.C1,fluorocarbon n n n n

FineLeak,Cond.B1,Kr85 n n n n n n

FineLeak,Cond.A2,helium n n n n

radiography, method 2012 n n n n n n

post radiography electrical test, +25°C case    n6    n6    n6    n6    n6    n6

final visual inspection, method 2009 n n n n n n n n n n

TestmethodsarereferencedtoMIL-STD-883asdeterminedbyMIL-PRF-38534.

Notes1.Non-QMLprototypeproductsmaynotmeetalloftherequirementsofMIL-PRF-38534.

2.AllprocessesareQMLqualifiedandperformedbycertifiedoperators.3.ClassHorKQMLproductsthathavenoSMDnumberaremarked“CHP,CHL,CHR,CKP,CKLorCKR”perMIL-STD-38534,TableIIIinsteadof“QML”.

4.ClassEisbasedonClassKrequirementsofMIL-PRF-38534withtheexceptionthatConstantAccelerationislimitedto3000gmaximumincludingqualificationtesting.

5.“O”intheRHAdesignatorpositioninInterpointmodelnumbersindicatesDLARHA“-”definedasnoRHA.

6.NotrequiredbyDLAbutperformedtoassureproductquality.7.Burn-intemperaturedesignedtobringthecasetemperatureto+125°Cminimum.Burn-inisapoweredtest.

Table 4: environmenTal Screening Space Dc-Dc converTerS proToType, claSS H, e anD K

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Tableisgeneralinformationandisforreferenceonly.SeeindividualSeries'datasheetsforspecificscreening.

SpacE raDiation HarDnESS aSSurancE ScrEEning Dc-Dc convErtErS claSS H, E anD K, rHa 1 p, l anD r

non-Qml 2 Qml 3

prototypE claSS H claSS E 4 claSS KQualification pEr mil-StD /oo 5 /Hp /Hl /Hr /EKp /EKl /EKr /Kp /Kl /Krrha p: 30 krad(Si) total dose 1, 6, 7 n n n

rha l: 50 krad(Si) total dose 1, 6, 7 n n n

rha r: 100 krad(Si) total dose 1, 6, 7 n n n

See, let 86 mev cm2/mg 1, 8 n n n n n n n n n

TestmethodsarereferencedtoMIL-STD-883asdeterminedbyMIL-PRF-38534.

Notes1.OurRedmondfacilityhasaDLAapprovedRHAplanforInterpointpowerproducts.OurSMDproductswithRHA“P”,“L”or“R”codemeetDLArequirements.

2.Non-QMLprototypeproductsmaynotmeetalloftherequirementsofMIL-PRF-38534.

3.ClassHorKQMLproductsthathavenoSMDnumberaremarked“CHP,CHL,CHR,CKP,CKLorCKR”perMIL-STD-38534,TableIIIinsteadof“QML”.

4.ClassEisbasedonClassKrequirementsofMIL-PRF-38534withtheexceptionthatConstantAccelerationislimitedto3000gmaximumincludingqualificationtesting.

5.“O”intheRHAdesignatorpositioninInterpointmodelnumbersindicatesDLARHA“-”definedasnoRHA.

6.Radiationsensitivecomponentsinternaltothedevicesareprocuredwithradiationguaranteesorundergoradiationlotacceptancetesting(RLAT)performedperconditionA,method1019ofMIL-STD-883.

7.RepresentativedeviceswereinitiallyHighDoseRate(HDR)testedusingconditionAofmethod1019ofMIL-STD883toensureRHAdesignatorlevels.RepresentativedeviceshavealsobeenLowDoseRate(LDR)testedusingconditionDofmethod1019ofMIL-STD-883totheRHAdesignatorlevels.Representativedeviceswillalsobere-testedafterdesignorprocesschangesthatcanaffectRHAresponseofthisdevice.

8.Singleeventtestingwasperformedonaconverterto86MeV-cm2/mgusing15MeV/nucleongoldionswithnolatch-up,burn-out,functionalinterrupts,orgaterupturesexhibited.Singleeventupsets(outputvoltagetransients)maybepresentupto86MeV-cm2/mg.

Table 5: Space raDiaTion HarDneSS aSSurance Dc-Dc converTerS claSS H, e anD K wiTH rHa p, l anD r

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Tableisforreferenceonly.SeeindividualSeries'datasheetsforspecificscreening.

Table 6: environmenTal Screening Space Dc-Dc converTerS proToType, a anD b, non-Qml

EnvironmEntal ScrEEning SpacE Dc-Dc convErtErS prototypE, a anD B

non-Qml 1, 2

prototypE a BtESt pErformED /oo 3 /ap /al /ar /Bp /Bl /Brnon-destruct wire bond pull, method 2023    n4    n4    n4 n n n

pre-cap inspection, method 2017, 2032 n n n n n n n

temperature Cycle (10 times)

Method1010,Cond.C,-65°Cto+150°C,ambient n n n n n n n

Constant acceleration Method2001,3000g n n n n n n n

pind, test method 2020, Cond. a    n4    n4    n4 n n n

pre burn-in test, group a, Subgroups 1 and 4 n    n4    n4    n4 n n n

burn-in method 1015, +125°C case, typical 5

96hours n

160hours n n n

2x160hours(includesmid-BItest) n n n

final electrical test, mil-prf-38534, group a, Subgroups1and4:+25°Ccase n

Subgroups1through6,-55°C,+25°C,+125°Ccase n n n n n n

hermeticity test, method 1014GrossLeak,Cond.B2,Kr85 n n n

GrossLeak,Cond.C1,fluorocarbon n n n n

FineLeak,Cond.B1,Kr85 n n n

FineLeak,Cond.A2,helium n n n n

radiography, method 2012 n n n

post radiography electrical test, +25°C case    n4    n4    n4

final visual inspection, method 2009 n n n n n n n

TestmethodsarereferencedtoMIL-STD-883asdeterminedbyMIL-PRF-38534.

Notes1.Non-QMLprototypeproductsmaynotmeetalloftherequirementsofMIL-PRF-38534.

2.AllprocessesareQMLqualifiedandperformedbycertifiedoperators.AandBareonlyavailableonselectmodels.

3.“O”intheRHAdesignatorpositioninInterpointmodelnumbersindicatesDLARHA“-”definedasnoRHA.

4.NotrequiredbyDLAbutperformedtoassureproductquality.5.Burn-intemperaturedesignedtobringthecasetemperatureto+125°Cminimum.Burn-inisapoweredtest.

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Tableisgeneralinformationandisforreferenceonly.SeeindividualSeries'datasheetsforspecificscreening.

SpacE raDiation HarDnESS aSSurancE ScrEEning Dc-Dc convErtErS a anD B, rHa 1 p, l anD r

non-Qml 2

prototypE a BQualification pEr mil-StD /oo 3 /ap /al /ar /Bp /Bl /Brrha p: 30 krad(Si) total dose 1, 4, 5 n n

rha l: 50 krad(Si) total dose 1, 4, 5 n n

rha r: 100 krad(Si) total dose 1, 4, 5 n n

See, let 86 mev cm2/mg 1, 6 n n n n n n

TestmethodsarereferencedtoMIL-STD-883asdeterminedbyMIL-PRF-38534.

Notes1.OurRedmondfacilityhasaDLAapprovedRHAplanforInterpointpowerproducts.OurSMDproductswithRHA“P”,“L”or“R”codemeetDLArequirements.

2.Non-QMLprototypeproductsmaynotmeetalloftherequirementsofMIL-PRF-38534.AandBareonlyavailableonselectmodels.

3.“O”intheRHAdesignatorpositioninInterpointmodelnumbersindicatesDLARHA“-”definedasnoRHA.

4.Radiationsensitivecomponentsinternaltothedevicesareprocuredwithradiationguaranteesorundergoradiationlotacceptancetesting(RLAT)performedperconditionA,method1019ofMIL-STD-883.

5.Arepresentativeconverterwashighdoserate(HDR)testedusingconditionAofmethod1019ofMIL-STD-883to150krads(Si)toensureRHAdesignatorlevel“R”(100krad(Si)).Arepresentativeconverterwasalsolowdoserate(LDR)testedusingconditionDofMethod1019ofMIL-STD-883to100krad(Si).

6.Singleeventtestingwasperformedonaconverterto86MeV-cm2/mgusing15MeV/nucleongoldionswithnolatch-up,burn-out,functionalinterrupts,orgaterupturesexhibited.Singleeventupsets(outputvoltagetransients)maybepresentupto86MeV-cm2/mg.

Table 7: Space raDiaTion HarDneSS aSSurance Dc-Dc converTerS a anD b non-Qml wiTH rHa p, l anD r

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Tableisforreferenceonly.SeeindividualSeries'datasheetsforspecificscreening.

Table 8: elemenT evaluaTion Space emi filTerS proToType, claSS H anD K

ElEmEnt Evaluation SpacE Emi filtErS prototypE, claSS H anD K

non-Qml 1 Qml

prototypE claSS H claSS K

componEnt-lEvEl tESt pErformED

/o /H /Kp 2 p 2

ElementElectrical n n n

Visual n n

TemperatureCycling n

ConstantAcceleration n

VoltageConditioningAging n

VisualInspection n

FinalElectrical n n

Notes1.Non-QMLproductsmaynotmeetalloftherequirementsofMIL-PRF-38534.2.P=Passivecomponents,ClassHandKelementevaluation.

DefinitionsElementEvaluation:Componenttesting/screeningperMIL-STD-883asdeterminedbyMIL-PRF-38534

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Tableisforreferenceonly.SeeindividualSeries'datasheetsforspecificscreening.

Table 9: environmenTal Screening Space emi filTerS proToType, claSS H anD K, wiTH rHa H

Notes1.OurRedmondfacilityhasaDLAapprovedRHAplanforInterpointpowerproducts.

2.Non-QMLproducts,prototype(OO),maynotmeetalloftherequirementsofMIL-PRF-38534.

3.AllprocessesareQMLqualifiedandperformedbycertifiedoperators.4.ClassHorKQMLproductsthathavenoSMDnumberaremarked“CHH,CKH”perMIL-STD-38534,TableIIIinsteadof“QML”.

5.“O”intheRHAdesignatorpositioninInterpointmodelnumbersindicatesDLARHA“-”definedasnoRHA.

6.OurEMIfiltersaredesignedexclusivelywithpassivecomponentsprovidingmaximumtoleranceforspaceenvironmentrequirements.

7.NotrequiredbyDLAbutperformedtoassureproductquality.8.Burn-intemperaturedesignedtobringthecasetemperatureto+125°Cminimum.Burn-inisapoweredtest.

9.InterpointEMIfiltersaredesignedexclusivelywithpassivecomponentsprovidingmaximumtoleranceforspaceenvironmentrequirements.RHAlevelHisguaranteedto1000krad(Si).

EnvironmEntal ScrEEning SpacE Emi filtErS prototypE, claSS H anD K, rHa1 H

non-Qml 2 Qml 3, 4

prototypE 5 claSS H claSS KtESt pErformED /oo 6 /HH 6 /KH 6

pre-cap inspection, method 2017, 2032 n n n

temperature Cycle (10 times)

Method1010,Cond.C,-65°Cto+150°C,ambient n n n

Constant accelerationMethod2001,3000g n n n

pind, test method 2020, Cond. a    n7 n

pre burn-in test, group a, Subgroups 1 and 4 n n n

burn-in method 1015, +125°C case, typical 8

96hours n

160hours n

2x160hours(includesmid-BItest) n

final electrical test, mil-prf-38534, group a, Subgroups1and4:+25°Ccase n

Subgroups1through6,-55°C,+25°C,+125°Ccase n n

hermeticity test, method 1014GrossLeak,Cond.B2,Kr85 n

GrossLeak,Cond.C1,fluorocarbon n n

FineLeak,Cond.B1,Kr85 n

FineLeak,Cond.A2,helium n n

radiography, method 2012 n

post radiography electrical test, +25°C case    n7

final visual inspection, method 2009 n n n

radiation tolerance 1, 9

Passivecomponents,radiationtolerant n n

TestmethodsarereferencedtoMIL-STD-883asdeterminedbyMIL-PRF-38534.

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Tableisforreferenceonly.SeeindividualSeries'datasheetsforspecificscreening.

Table 10: elemenT evaluaTion HigH reliabiliTy Dc-Dc converTerS anD emi filTerS /883 (claSS H)

ElEmEnt Evaluation 1 HigH rEliaBility Dc-Dc convErtErS anD Emi filtErS /883 (claSS H)

Qml

claSS H /883

componEnt-lEvEl tESt pErformED m/S 2 p 3

ElementElectrical n n

Visual n n

InternalVisual n

FinalElectrical n n

WireBondEvaluation n n

Notes1.Elementevaluationdoesnotapplytostandardand/ESproduct.2.M/S=Activecomponents(microcircuitandsemiconductordie).3.P=Passivecomponents,ClassHelementevaluation.Notapplicabletostandardand/ESelementevaluation.

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Tableisforreferenceonly.SeeindividualSeries'datasheetsforspecificscreening.

Table 11: environmenTal Screening HigH reliabiliTy Dc-Dc converTerS anD emi filTerS STanDarD, /eS anD /883 (claSS H)

EnvironmEntal ScrEEning HigH rEliaBility Dc-Dc convErtErS anD Emi filtErS StanDarD, /ES anD /883 (claSS H)

non-Qml 1 claSS H Qml 2

tESt pErformEDStanDarD /ES /883

SX 3/883cH 4

/883Qml 5

pre-cap inspection, method 2017, 2032 n n n n n

temperature Cycle (10 times)

Method1010,Cond.C,-65°Cto+150°C,ambient n n n

Method1010,Cond.B,-55°Cto+125°C,ambient n

Constant accelerationMethod2001,3000g n n n

Method2001,500g n

pind, test method 2020, Cond. a n    n6    n6

burn-in method 1015, +125°C case, typical 7

96hours n

160hours n n n

final electrical test, mil-prf-38534, group a, Subgroups1through6,-55°C,+25°C,+125°Ccase n n n

Subgroups1and4,+25°Ccase n n

hermeticity testGrossLeak,Cond.C1,fluorocarbon n n n n

FineLeak,Cond.A2,helium n n n n

GrossLeak,Dip n

final visual inspection, method 2009 n n n n n

TestmethodsarereferencedtoMIL-STD-883asdeterminedbyMIL-PRF-38534.

Notes1.Non-QMLproductsmaynotmeetalloftherequirementsofMIL-PRF-38534.2.AllprocessesareQMLqualifiedandperformedbycertifiedoperators.3.SXscreeningisavailableonselectmodels.4.ClassHQMLproductswithnoSMDnumberaremarked“CH”perMIL-STD-38534RevJ,3.9.5.8.3,TableIII.5.ClassHQMLproductshaveanSMDnumber6.NotrequiredbyDLAbutperformedtoassureproductquality.7.Burn-intemperaturedesignedtobringthecasetemperatureto+125°Cminimum.Burn-inisapoweredtest.

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Tableisforreferenceonly.SeeindividualSeries'datasheetsforspecificscreening.

EnvironmEntal ScrEEning Dc-Dc convErtErS anD Emi filtErS StanDarD anD /ES, non-Qml1

tESt pErformED StanDarD /ES

pre-cap inspectionMethod2017,2032 n n

temperature Cycle (10 times)Method1010,Cond.B,-55°Cto+125°C,ambient n

Constant accelerationMethod2001,500g n

burn-in method 1015 2

96hours n

final electrical test mil-prf-38534, group a Subgroups1and4:+25°Ccase n n

hermeticity testGrossLeak,Cond.C1,fluorocarbon n

FineLeak,Cond.A2,helium n

GrossLeak,Dip n

final visual inspectionMethod2009 n n

TestmethodsarereferencedtoMIL-STD-883asdeterminedbyMIL-PRF-38534.

Notes1.Standardand/ES,non-QMLproducts,maynotmeetalloftherequirementsofMIL-PRF-38534.2.Burn-intemperaturedesignedtobringthecasetemperaturetothemaximumcasetemperatureoftheproduct.Refertothespecificproductinformationforthemaximumcasetemperature.Burn-inisapoweredtest.

Table 12: environmenTal Screening Dc-Dc converTerS anD emi filTerS STanDarD anD /eS, non-Qml

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Tableisforreferenceonly.SeeindividualSeries'datasheetsforspecificscreening.

EnvironmEntal ScrEEning inDuStrial Dc-Dc convErtErS anD Emi filtErS StanDarD, non-Qml1

tESt pErformED inDuStrial StanDarD

pre-cap inspectionMethod2017,2032 n

final electrical test mil-prf-38534, group aSubgroups1and4:+25°Ccase n

hermeticity testGrossLeak,Dip n

final visual inspectionMethod2009 n

TestmethodsarereferencedtoMIL-STD-883asdeterminedbyMIL-PRF-38534.

Notes1.Industrial,standard,non-QMLproducts,maynotmeetalloftherequirementsofMIL-PRF-38534.

Table 13: environmenTal Screening inDuSTrial Dc-Dc converTerS anD emi filTerS STanDarD, non-Qml

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QualityAssuranceandCertificationAPP-009RevAL-2018.12.07Allinformationisbelievedtobeaccurate,butnoresponsibilityisassumedforerrorsoromissions.CraneElectronics,Inc.reservestherighttomakechangesthatdonotaffectform,fitorfunctionofClassH,EorKproductsorspecificationswithoutnotice.InterpointisaregisteredtrademarkofCraneCo.TheproductseriesnamesaretrademarksofCraneElectronics,Inc.Copyright©1999-2018CraneElectronics,Inc.Allrightsreserved.http://www.craneae.com/interpoint

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