Qualification Test of UFE Board

· Schematic diagram of UFE · Board types and current status · Qualification test procedures · VA & UFE test setup · Test results · Conclusion

C. H. ChungAMS TRD Meeting, July 16 ~17. 2002 @CERN

Schematic Diagram of UFE

VA32 HDR12Preamp.ShapingMultiplexingPeak. T = 2.4msPower:55mW

Applied Power

HCC Chip

12 bit ADC AD7476

UFE Board Types

UFE45M21 UFE45S17

UFE90S96 UFE90M18

UFE development made up to the present

ADC Op. AmpVA

Test Procedures

Measurements : Gain, Pedestals, Noise, Linearity, Connectivity

VA Hybrid

UFE w.o VA

· Peaking Time = 2.4 ms · Gain = 2.0 [ADC counts / fC] · Pedestals and Noise · All channels within ± 1% of the mean gain · All channels within 3% non-linearity · Connection test with external CAL

Production More Qualification Tests · Mechanical Vibration ·Thermo Vacuum · EMI

VA Hybrid Test Setup

VA-DAQ setup* IDE Co.* Type of VA-chip: VA32HDR12* Number of channels/chip: 32* Number of chips/board: 1* Value (pF) of calibration capacitor:10.00E+0

Labview w. ROOTVA DAQ PCB and Adapter board

VA Test Results(1)

Peaking time & Linearity / channel

Signal waveform of channel Oscilloscope

Gain fitting vs. input charge

VA Test Results (2)

VA Test Results (3)

Click to add text

Typically all channels within 1% of the mean gainMean = 1.198 [mV/fC], Sigma = 0.00337

UFE Board Test Setup

Board Box Block diagram of DAQ system

Control signal

WIN NTCVI, ROOT

Real mode : Pedestal and NoiseCAL mode : Gain and Nonlinearity

4m

UFE Test Results (1)

One Channel Pedestals and Gain linearity

Noise = 1.705 ADC counts

Gain = 2.01 [ADC counts/fC]

MIP signal in TRD = 55 [fC] @80% Xe + 20%CO

2, gain = 3000(3.5´105 e-)

S/N = 55/0.86 = 64

UFE Test Results (2)

Pedestals and Noise

UFE Test Results (3)

Non-Linearity = [Fit-Measured]/Fit upto 1.5[pC]Linear range : 0~1.5pC within 2% nonlinearity

UFE Test Results (4)

External Connection Test

Conclusion

Qualification test setup for VA and UFE board is ready and working successfully.

40 VA Hybrid were tested and two chips were malfunctioning.

12 UFE boards were produced and tested. Pedestal, Noise, Gain, Linearity, Nonlinearity, Peaking Time, Connectivity /Channel/ VA chip/ UFE-Board

Some problems are under investigation. Defect on VAs after soldering with UFE, connectivity improvement.

Calibration const. DB : data sheet in ASCII format on the WWW. http://accms04.physik.rwth-aachen.de/~chchung/ams/trd/ufe/

WWW