QM ZG528-L3.pptx

download QM ZG528-L3.pptx

of 21

Transcript of QM ZG528-L3.pptx

  • 7/25/2019 QM ZG528-L3.pptx

    1/21

    BITSPilaniPilani Campus

    QM ZG528 L-3

    Reliability EngineeringGajanand Gupta

    Department of Mechanical Engineering

    1

  • 7/25/2019 QM ZG528-L3.pptx

    2/21

    BITSPilaniPilani Campus

    Constant Failre Rate Mo!elChapter - 3

  • 7/25/2019 QM ZG528-L3.pptx

    3/21

    BITS Pilani, Pilani Campus

    Models useful in describing failure process

    -Eponential

    - !eibull

    -"ormal -#ognormal

    $ailure distribution ha%ing constant failure rate is called

    exponential probability distribution

    Intro!"tion

    3

  • 7/25/2019 QM ZG528-L3.pptx

    4/21

    BITS Pilani, Pilani Campus

    &ne of the most common failure distribution in reliabilit'

    engineering is eponential or C$( )Constant $ailure

    (ate*model+

    ssume )t*., t /. 0, /0

    hen .222)3+1*

    E#$onential Reliability Fn"tion

  • 7/25/2019 QM ZG528-L3.pptx

    5/21

    BITS Pilani, Pilani Campus

    222222+)3+4*

    5ariance

    . 222)3+3*

    6tandard de%iation . . M$ 7t implies that %ariabilit' of failure increases as the

    reliabilit')M$* increases

    E#$onential Reliability Fn"tion

    8

  • 7/25/2019 QM ZG528-L3.pptx

    6/21

    BITS Pilani, Pilani Campus

    . . 0+39:

    7t means component ha%ing C$( has slightl' better than

    one-third chance of sur%i%ing to its mean time to failure

    Design life of component ha%ing eponentiall' distributedfailure time can be obtained as-

    . (

    ;ence 222+)3+*

    !hen (.0+8 median of distribution is obtained as i+e+.0+9

  • 7/25/2019 QM ZG528-L3.pptx

    7/21BITS Pilani, Pilani Campus

    micro=a%e transmitter has ehibited a constant failure

    rate of 0+0003 failure per operating hour+ $ind out the

    reliabilit' o%er a 30 da' continuous operating period+

    lso find the M$, med and design life for a reliabilit'

    of 0+

  • 7/25/2019 QM ZG528-L3.pptx

    8/21BITS Pilani, Pilani Campus

    :

  • 7/25/2019 QM ZG528-L3.pptx

    9/21BITS Pilani, Pilani Campus

    Comple s'stem =ill fail through %arious means

    useful anal'sis approach is to separate these failures

    according to mechanism or component causing failure

    7f is reliabilit' function of ith failure mode then s'stemreliabilit' R(t) is

    .(3.6)

    Failre Mo!es

  • 7/25/2019 QM ZG528-L3.pptx

    18/21BITS Pilani, Pilani Campus

    7f failure ne%er occurs prior to some time then is

    threshold time or called as guaranteed lifetime+

    his is e@ui%alent to re=riting densit' function b'

    replacing t=ith t-

    $or this probabilit' densit' function becomes

    (eliabilit' function =ill be-

    T&o (ara%eter E#$onential )istribtion

    1:

  • 7/25/2019 QM ZG528-L3.pptx

    19/21BITS Pilani, Pilani Campus

    $ailure (ate but mean is no longer but is shifted

    distance along t ais+

    Bsing integration b' parts

    he design life

    ( can be found as-

    T&o (ara%eter E#$onential )istribtion

    1