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1999, XV, 175 p.
Printed book
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K. Lampaert, Katholieke Universiteit Leuven, Heverlee, Belgium; G. Gielen, KatholiekeUniversiteit Leuven, Heverlee, Belgium; W.M.C. Sansen, Katholieke Universiteit Leuven,Heverlee, Belgium
Analog Layout Generation Performance and ManufacturabilitySeries: The Springer International Series in Engineering and Computer Science, Vol. 501
Analog integrated circuits are very important as interfaces between the digital parts ofintegrated electronic systems and the outside world. A large portion of the effort involvedin designing these circuits is spent in the layout phase. Whereas the physical design ofdigital circuits is automated to a large extent, the layout of analog circuits is still a manual,time-consuming and error-prone task. This is mainly due to the continuous nature ofanalog signals, which causes analog circuit performance to be very sensitive to layoutparasitics. The parasitic elements associated with interconnect wires cause loading andcoupling effects that degrade the frequency behaviour and the noise performance ofanalog circuits. Device mismatch and thermal effects put a fundamental limit on theachievable accuracy of circuits. For successful automation of analog layout, advancedplace and route tools that can handle these critical parasitics are required.In the past, automatic analog layout tools tried to optimize the layout withoutquantifying the performance degradation introduced by layout parasitics. Therefore,it was not guaranteed that the resulting layout met the specifications and one ormore layout iterations could be needed. In Analog Layout Generation for Performanceand Manufacturability, the authors propose a performance driven layout strategy toovercome this problem. In this methodology, the layout tools are driven by performanceconstraints, such that the final layout, with parasitic effects, still satisfies the specificationsof the circuit. The performance degradation associated with an intermediate layoutsolution is evaluated at runtime using predetermined sensitivities. In contrast with otherperformance driven layout methodologies, the tools proposed in this book operatedirectly on the performance constraints, without an intermediate parasitic constraintgeneration step. This approach makes a complete and sensible trade-off between thedifferent layout alternatives possible at runtime and therefore eliminates the possiblefeedback route between constraint derivation, placement and layout extraction.Besides its influence on the performance, layout also has a profound impact on the yieldand testability of an analog circuit. In Analog Layout Generation for Performance andManufacturability, the authors outline a new criterion to quantify the detectability ofa fault and combine this with a yield model to evaluate the testability of an integratedcircuit layout. They then integrate this technique with their performance driven routingalgorithm to produce layouts that have optimal manufacturability while still meeting theirperformance specifications.Analog Layout Generation for Performance and Manufacturability will be of interest toanalog engineers, researchers and students.
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