Photodetectors and Solar Cells - Cornell University · Photodetector Bandwidth: Small Signal Model...
Transcript of Photodetectors and Solar Cells - Cornell University · Photodetector Bandwidth: Small Signal Model...
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ECE 407 – Spring 2009 – Farhan Rana – Cornell University
Photodetectors and Solar Cells
In this lecture you will learn:
• Photodiodes• Avalanche Photodiodes• Solar Cells• Fundamentals Limits on Solar Energy Conversion • Practical Solar Cells
ECE 407 – Spring 2009 – Farhan Rana – Cornell University
Photodiodes
x-xpxn
1 (p doped) 2 (n doped)+ ++ ++ +
- -- -- -
V+ -
Wn-Wp
I
1KT
qV
o eII
Consider the standard pn diode structure:
The pn diode can be used as a photodiode
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ECE 407 – Spring 2009 – Farhan Rana – Cornell University
Photogeneration in the Quasineutral Region
x-xpxn
1 (p doped) 2 (n doped)+ ++ ++ +
- -- -- -
Wn-Wp
Light
IL
Consider an unbiased photodiode with light shining on the p quasineutral region:
We need to compute the current IL in the external circuit
Start from:
xGxRxGxJxqt
nLeee
1
Generation term due to light0
LL
e
poee
ee
GxG
nxnxRxG
xxn
qDxJ
constant
only diffusion by current carrier minority
1
1
Assumptions:
ECE 407 – Spring 2009 – Farhan Rana – Cornell University
Shockley’s Equations for Photodiodes: Electron Density
x-xp xn
1 (p doped) 2 (n doped)+ ++ ++ +
- -- -- -
Wn-Wp
Light
IL
We get for the minority carrier density:
1
21
2
2
e
L
e
po
DG
L
nxn
x
xn
Boundary conditions:
pop
poKTqV
pop
nWxn
nenxxn
At depletion region edge
At the left metal contact
Solution:
1
1111
sinh
sinhsinh
e
pp
e
p
e
p
eLeLpo
L
xW
L
xx
L
xW
GGnxn
Solution in the short base limit is:
ppe xWL 1
2
1
2
1 2222
pp
e
Lpp
e
Lpo
xWx
DGxW
DG
nxn
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ECE 407 – Spring 2009 – Farhan Rana – Cornell University
Shockley’s Equations for Photodiodes: Electron and Hole Currents
x
-xpxn Wn-Wp
npo
n(x)
1
111
1
sinh
sinhsinh
e
pp
e
p
e
p
eL
eLpo
L
xW
L
xx
L
xW
G
Gnxn
Electron Current:Electron (minority carrier) current flows by diffusion:
limit base Short 2
sinh
coshcosh
1
1111
ppL
e
pp
e
p
e
p
eLee
xWxqG
L
xW
L
xx
L
xW
LqGxn
DqxJ
ECE 407 – Spring 2009 – Farhan Rana – Cornell University
Shockley’s Equations for Photodiodes: Electron and Hole Currents
Total Current:Total current is due to the electrons that reach the depletion region edge
limit base Short 2
sinh
1cosh
1
11
ppL
e
pp
e
pp
eLpeT
xWqG
L
xW
L
xW
LqGxJJ x-xp xn Wn-Wp
npo
n(x)
Hole Current:
xJJxJ eTh
x-xpxn Wn-Wp
Jh(x)
Je(x)
JT
Je(x)=JT
Jh(x)=00
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ECE 407 – Spring 2009 – Farhan Rana – Cornell University
Shockley’s Equations for Photodiodes: Hole Currents
Quasineutrality implies:
xnxp
x-xp xn Wn-Wp
npo
n(x)
x-xp xn Wn-Wp
ppo
p(x)
Hole Diffusion Current:
xJDD
xn
Dq
xp
DqxJ
ee
hh
hdiffh
1
11
1,
Hole Drift Current:
xJDD
JxJ
xJxJJxJ
xJJxJxJ
xJJxJ
ee
hTdrifth
diffheTdrifth
eTdiffhdrifth
eTh
1
1,
,,
,,
1
ECE 407 – Spring 2009 – Farhan Rana – Cornell University
External Circuit Current
x-xpxn
1 (p doped) 2 (n doped)+ ++ ++ +
- -- -- -
Wn-Wp
Light
IL
limit base Short 2
sinh
1cosh
1
11
ppL
e
pp
e
pp
eLL
TL
xWAqG
L
xW
L
xW
ALqGI
AJI
Even if one ignores recombination inside the quasineutral region (short base limit), the circuit current corresponds to only half the total number of electron-hole pairs generated by light inside the detector (why?)
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ECE 407 – Spring 2009 – Farhan Rana – Cornell University
Photogeneration in the Depletion Region
x-xpxn
1 (p doped) 2 (n doped)+ ++ ++ +
- -- -- -
Wn-Wp
Light
IL
Electron Current:
pnLxx Lphnh
Lh
pnLxx Lnepe
Le
xxqGdxGqxJxJ
Gx
xJq
xxqGdxGqxJxJ
Gx
xJq
np
np
1
1
Hole Current:
ECE 407 – Spring 2009 – Farhan Rana – Cornell University
Electron, Hole, and Total Currents
x-xpxn
1 (p doped) 2 (n doped)+ ++ ++ +
- -- -- -
Wn-Wp
Light
IL
Electron and Hole Current:The electric field inside the depletion region sweeps the electrons towards the n-side and the holes towards the p-side. Consequently, it must be that:
0
0
nh
pe
xJ
xJ
pnLneph xxqGxJxJ Therefore,
Total Current:
pnL
phpenhneT
xxqG
xJxJxJxJJ
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ECE 407 – Spring 2009 – Farhan Rana – Cornell University
x-xpxn Wn-Wp
Je(x)=0
JT Je(x)=JT
Jh(x)=0
Jh(x)=JT
Electron, Hole, and Total Currents
0
x-xpxn
1 (p doped) 2 (n doped)+ ++ ++ +
- -- -- -
Wn-Wp
Light
IL
External Circuit Current
pnLTL xxqGAJI
The circuit current corresponds to the total number of electron-hole pairs generated by light inside the detector!
ECE 407 – Spring 2009 – Farhan Rana – Cornell University
Photodetector Circuits: Electrical Characteristics
x-xpxn
1 (p doped) 2 (n doped)+ ++ ++ +
- -- -- -
VR
+-
Wn-Wp
I
+ -V
R
Photodetectors are operated in reverse bias (why?)
The circuit current I has two components:
i) The current due to the biased pn junction given as:
ii) The current IL due to photogeneration
These two components can be added together (why?) to give the total current:
1KTqVo eI
LKTqV
o IeII 1
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ECE 407 – Spring 2009 – Farhan Rana – Cornell University
Photodetector Circuits: Electrical Characteristics
x-xp xn
1 (p doped) 2 (n doped)+ ++ ++ +
- -- -- -
VR+-
Wn-Wp
I
+ -V
R
We had:
LKTqV
o IeII 1 (1)
Kirchhoff’s Voltage Law gives:
0 VVIR R (2)
V
I
Isc = -( Io + IL )
Increasing R
Voc-VR
The solution of these two equations gives the circuit current and the junction voltage
Open circuit voltage (R = ∞):
1ln
o
Loc I
Iq
KTVV
Short circuit current (R = 0): :
Losc IIII
Current due to photogeneration
Current due to thermal generation
(1)(2)
ECE 407 – Spring 2009 – Farhan Rana – Cornell University
Common Photodetector Structures
n doped substrate
p+ doped
Light
x
0
AR coatingPassivation
Metal contacts
Front side illuminated homojunction photodetector
n doped substrate
p+ doped
Light
x
0
AR coating
intrinsic
Passivation
Metal contacts
Front side illuminated homojunction pin photodetector
x
o
L
eI
xI
RRxG
xoeIxI
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ECE 407 – Spring 2009 – Farhan Rana – Cornell University
Common Photodetector Structures
n doped substrate (InP)
p+ doped (InP)
Light
x
0
AR coating
Intrinsic In0.53Ga0.47As
Passivation
Metal contacts
Front side illuminated heterojunction pin photodetector(used for 1550 nm fiber optic communications)
Photogeneration only in the intrinsic region!
ECE 407 – Spring 2009 – Farhan Rana – Cornell University
Figures of Merit of Photodetectors
Responsivity (units: Amps/Watt):
inc
L
PI
R
External Quantum Efficiency:
RqP
IqP
qI
inc
L
inc
Lext
W
External quantum efficiency measures the fraction of photons incident on the photodetector that ended up producing an electron in the external circuit
Internal Quantum Efficiency:
abs
L
abs
L
PI
qPqI
int
Internal quantum efficiency measures the fraction of photons that caused photogeneration and also ended up producing an electron in the external circuit
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ECE 407 – Spring 2009 – Farhan Rana – Cornell University
Figures of Merit of Photodetectors
Dark Current:
The dark current of a photodetector is the current present even if there no light and limits the detector sensitivity
Lo III
When VR=0:
Current due to thermal generation → dark current
Device leakage current also contributes to dark current
kT
E
vciio
g
eNNnAnI 222 where
Recall that:
Small bandgaps and high temperatures increase dark current
ECE 407 – Spring 2009 – Farhan Rana – Cornell University
Photodetector Bandwidth
We assume that the optical power incident of the photodiode is time dependent:
ftjoinc efPPtP 2Re
Suppose the current in the external circuit is:
tI
ftjo efIItI 2Re
We know that: oo PRI
But how do we relate I(f ) to P(f )?
tPinc
tI
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ECE 407 – Spring 2009 – Farhan Rana – Cornell University
Photodetector Bandwidth: Small Signal Model
RdRext
Cj R h(f ) P(f )
I(f)
Cd
dR Differential resistance of the pn junction KTqV
o
KTqV
o
ReqIkT
eqIkT
jC Diode junction capacitance
dC Diode depletion capacitance due to charge storage in the quasineutral regions and can be ignored in a reverse biased pn junction
fh A frequency dependent function that describes the intrinsic frequency response of the photogenerated carriers inside the photodiode
extjextdjextd
d
RCfjfhfRP
RRCfjRR
RfhfRPfI
211
2
The RC limit of the detector bandwidth
0
10
fh
fhLimiting behavior of h(f ):
ECE 407 – Spring 2009 – Farhan Rana – Cornell University
Intrinsic Frequency Limitations of Photodetectors: h(f )
x-xp xn
1 (p-doped) 2 (n-doped)
VR
+-
Wn-Wp
I
+ -V
x
Consider an electron generated at point x inside the junction at time t=0
t t
pn
e
xx
Eq
pn
h
xxEq
E
xx
e
n
E
xx
h
p
tIxe tIxh
Ramo-Shockley Theorem:As the electron and hole move inside the depletion region under the influence of the electric field, there is current flow in the external circuit due to image charges (or capacitive coupling)
qE
xx
xxE
qE
xxxx
EqdttItI
h
p
pn
h
e
n
pn
e
oxhxe
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ECE 407 – Spring 2009 – Farhan Rana – Cornell University
Intrinsic Frequency Limitations of Photodetectors: h(f )
hhh
eee
x
xxhxe
pn
ttq
ttq
dxtItIxx
tIn
p
01
011
The actual detector current consists of photogenerated pairs at all locations inside the depletion region. So the average current waveform due to one photogeneration event is:
The above transients can be approximated as:
E
xx
e
pne
E
xx
h
pnh
Electron and hole transit times through the entire depletion region are:
022
teq
eq
tI he
t
h
t
e
t t
e
q
h
q
e h
tIxe tIxh
ECE 407 – Spring 2009 – Farhan Rana – Cornell University
Intrinsic Frequency Limitations of Photodetectors: h(f )
022
teq
eq
tI he
t
h
t
e
The average current waveform due one photogeneration event is:
This is the impulse response h(t ) of the detector: q
tIth
The Fourier transform of the impulse response will give h(f ):
he fjfj
fh 21
212121
Describes the frequency limitations due to the electron and hole transit times through the depletion region
extjhe
extj
RCfjfjfjfRP
RCfjfPfRhfI
211
2121
2121
211
Finally we have:
Describes the frequency limitations due both intrinsic and extrinsic (circuit level) factors
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ECE 407 – Spring 2009 – Farhan Rana – Cornell University
Avalanche Photodiodes (APDs): Basic Principle
Photomultiplier tubes:
Provide high sensitivity for light detection even at the single photon level Employs electron multiplication to increase the charge output per photon
Impact Ionization in Semiconductors:
he
eg mm
mEE 1electronmin
he
hg mm
mEE 1holemin
Highly energetic electrons and holes in semiconductors can create electron-hole pairs via impact ionization
ECE 407 – Spring 2009 – Farhan Rana – Cornell University
Modeling Impact Ionization in Semiconductors
e
Impact Ionization Coefficients:
The electron ionization coefficient (units: 1/cm) defined as the number of electron-hole pairs created by one electron in unit distance of travel
h The hole ionization coefficient (units: 1/cm) defined as the number of electron-hole pairs created by one hole in unit distance of travel
EChh
ECee
h
e
eB
eA
Electrons and holes in high electric fields gain enough energy to cause impact ionization
cE
vE
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ECE 407 – Spring 2009 – Farhan Rana – Cornell University
Avalanche Photodiodes
xxn -xp
-qV
Avalanche pin photodiode
Light
xqGxJxJx
xJ
xqGxJxJxGxGqx
xJ
Lhheee
LhheeLee
The equation for the electron current is:
The equation for the hole current is:
xqGxJxJx
xJ
xqGxJxJxGxGqx
xJ
Lhheeh
LhheeLhh
ECE 407 – Spring 2009 – Farhan Rana – Cornell University
Avalanche Photodiodes
xxn-xp
-qV
Light
The equation for the electron current becomes:
Total current is:
xJxJJ heT
xqGJxJx
xJLThehe
e
he
xx
ThLxx
pene
pnhe
pnhee
JqGexJxJ
1
Solution, assuming uniform illumination, is:
0 pe xJ 0nh xJ
Boundary conditions:
Total current is:
nenhneT xJxJxJJ
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ECE 407 – Spring 2009 – Farhan Rana – Cornell University
Avalanche Photodiodes
xxn-xp
-qV
Light
Total current is:
nenhneT xJxJxJJ
1
1
pnhe
pnhe
xxhhe
xx
LTe
eqGJ
The multiplication gain M of the photodetector is:
1
11pnhe
pnhe
xxhhe
xx
pnpnL
T
e
e
xxxxqGJ
M
ECE 407 – Spring 2009 – Farhan Rana – Cornell University
Avalanche Photodiodes
n doped substrate (InP)
p+ doped (InP)
Light AR coating
Intrinsic In0.53Ga0.47As (Light absorption)
Passivation
Metal contacts
n- doped InP (Multiplication layer)
n+ doped InP
Front side illuminated heterostructure avalanche photodiode with separate photogeneration and multiplication layers
Avalanche photodiodes are good for high sensitivity but low speed applications
Most avalanche photodiodes have separate regions for light absorption and carrier multiplication.
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ECE 407 – Spring 2009 – Farhan Rana – Cornell University
Solar Cell Basics
ECE 407 – Spring 2009 – Farhan Rana – Cornell University
Solar Cell Basics
x-xpxn
1 (p doped) 2 (n doped)+ ++ ++ +
- -- -- -
Wn-Wp
Light Pinc
I
R
V+ -
LKT
qV
o IeII
1
0VIR
V
I
Isc = -( Io + IL )
Increasing R
Voc
LKTqV
o IeII
1
RV
I
How to deliver the maximum power to the resistor R?
01
VIeI
dVd
LKT
qV
o
VIeIP LKTqV
oout
1
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ECE 407 – Spring 2009 – Farhan Rana – Cornell University
Maximizing Output Power of Solar Cells
V
I
Isc = -( Io + IL )
Increasing R
VocVm
Im
LKTqV
o IeII
1
RV
I
Area of rectangle = -ImVm = Pout = Power delivered to the resistor R
Vm = Voltage at maximum output power Im = Current at maximum output power
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01
o
LmKTqV
LKT
qV
o
II
KTqV
e
VIeIdVd
m
ocscmmout VIVIP
LKT
qV
om IeIIm
1
x-xpxn
1 (p doped) 2 (n doped)+ ++ ++ +
- -- -- -
Wn-Wp
Light Pinc
I
R
V+ -
ECE 407 – Spring 2009 – Farhan Rana – Cornell University
Resistance Matching in Solar Cells
V
I
Isc = -( Io + IL )
Increasing R
VocVm
Im
LKTqV
o IeII
1
RV
I
What value of the resistor R lets one achieve the maximum output power?
dm
KT
qVo
Re
KT
qI
R
m 11
ocsc
mm
VIVI
FF
Solar cell Fill Factor (FF):
Solar Efficiency:
inc
mm
PVI
x-xpxn
1 (p doped) 2 (n doped)+ ++ ++ +
- -- -- -
Wn-Wp
Light Pinc
I
R
V+ -
Solar cells are always operated in forward bias!
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ECE 407 – Spring 2009 – Farhan Rana – Cornell University
Black Body Radiation
Solar radiation spectrum near Earth can be very well approximated as that of a black body at temperature Ts = 5760K
r
z T P
Consider a point P at a distance r from a black body at temperature T
We need to calculate the photon flux and the radiation power at the point P
Each mode of radiation emitted from the black body with wavevectior will have photon occupancy given by:
1
1
KTqeqn
q
The total photon flux per unit area at P can then be written as an integral:
ngdcqnc
dqqdF p
oN
o
0
2
0 03
2
4
sin
2
2cossin2
32
2
cgp
Where the photon density of states in free space is:
ECE 407 – Spring 2009 – Farhan Rana – Cornell University
Black Body Radiation
r
z T P
The energy flux at the point P is:
4232
422
0
2sin
60sin
4sin
Tc
KTngdcF oop
oE
428
K-m
Watts1067.5constant BoltzmannStephan
s
degrees267.0s 2Watts/m1350EF
Sun
Radiation at the surface of the Earth:
Ts
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ECE 407 – Spring 2009 – Farhan Rana – Cornell University
Fundamental Limits to Solar Energy Conversion Efficiency
Carnot engine
Sun
Device
Earth
A device at temperature Tc absorbs solar energy, radiates a part of it away, and then converts the rest into useful work W by an ideal heat engine operating between the temperature Tc and the ambient temperature on Earth Ta = 300K
Net radiative energy absorbed by the device (and which is available for useful work):
442sin css TT
Energy conversion efficiency of an ideal heat engine (Carnot engine):
ca TT1Energy conversion efficiency of the device:
42
442
sin
1sin
ss
c
acss
T
T
TTT
But the above expression does not consider the fact that solar energy can be concentrated!
ECE 407 – Spring 2009 – Farhan Rana – Cornell University
Solar Energy Concentration and Energy Conversion Efficiency
Suns
Device
Sun
actual
Lens
Device
One can increase the efficiency by focusing or concentrating sunlight
Focusing can increase the effective half-angle s of the Sun from 0.267 degrees to the maximum possible value of 90 degrees
s
actualX
2
2
sin
sin
Light concentration is measured in units of the parameter X:
42
106.4sin
11
s
X
c
a
s
c
ss
c
acss
T
T
T
T
T
T
TTT
11sin
1sin
4
4
42
442
With full concentration, the maximum efficiency for solar energy conversion is:
A maximum efficiency of close to 85% is achieved for Tc = 2450K
Ts Tc
Ts
Tc
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ECE 407 – Spring 2009 – Farhan Rana – Cornell University
Fundamental Energy Conversion Efficiency of a PhotodiodeConsider a solar cell made from a semiconductor with a bandgap Egat temperature Ta = 300K
Assumption: The solar cells absorbs all photons whose energies are larger than the bandgap
We know from Chapter 3 that in the spontaneously emitted radiation by a forward bias junction the occupancy of a radiation mode of frequency is:
1
1
aKTqVe
n
Sunlight
Ta
SPE
1
14
,,min
min
KTqVpNe
gdc
VTF
1
14
,,min
min
KTqVpEe
gdc
VTF
General expressions for emitted photon number and energy fluxes:
Cell
ECE 407 – Spring 2009 – Farhan Rana – Cornell University
Fundamental Energy Conversion Efficiency of a PhotodiodeSunlight
Ta
SPESun
s
Ta
Photodiode
Ts
The radiation power per unit area incident on the cell from the Sun is:
Cell
0,0,sin2sEs TFA
The photon flux per unit area incident on the cell from the Sun and absorbed by the cell is: gsNs ETFA ,0,sin2
A
The photon flux per unit area incident on the cell from the surrounding ambient and absorbed by the cell is:
gaNs ETFA ,0,sin1 2
The photon flux per unit area emitted by the cell is:
1
14
sin2
sg
KTpE
se
gdc
A
1
14
sin2
sg
KTpE
se
gdc
A
1
14
sin1 2
ag
KTpE
se
gdc
A
gaN EVTAF ,, 1
14
ag
KTqVpE e
gdc
A
20
ECE 407 – Spring 2009 – Farhan Rana – Cornell University
Fundamental Energy Conversion Efficiency of a PhotodiodeSunlight
Ta
SPESun
s
Ta
Photodiode
Ts
Cell
AAssumption: The internal quantum efficiency of the cell is 100% and each photon absorbed by the cell results in one electron flow in the external circuit:
I
gaNgaNsgsNs EVTAFETFAETFqAI ,,,0,sin1,0,sin 22
0,0,sin
,,,0,sin1,0,sin
0,0,sin
2
22
2
sEs
gaNgaNsgsNs
sEs
TFA
VEVTFETFETFqA
TFA
IV
The energy conversion efficiency of the cell is:
To find the maximum value of one must maximize the above w.r.t. to the voltage V
V+ -
R
ECE 407 – Spring 2009 – Farhan Rana – Cornell University
Shockley–Queisser LimitSunlight
Ta
SPE
Cell
AI
V+ -
R
No Concentration (s = 0.26o): A maximum efficiency of ~31% is reached at a bandgap of ~1.27 eV
Full Concentration (s = 90o): A maximum efficiency of ~41% is reached at a bandgap of ~1.1 eV.
Shockley–Queisser result
Bandgap too small Output voltage too small
goc EqVqV
Bandgap too large Low energy photons do not get absorbed
Why is there an optimal bandgap?
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ECE 407 – Spring 2009 – Farhan Rana – Cornell University
Material Voc (V) Jsc (Amp/cm2) FF (%) Efficiency (%)Crystalline Si 0.705 42.7 82.8 25.0Crystalline GaAs 1.045 29.7 84.7 26.1Poly-Si 0.664 38.0 80.9 20.4a-Si 0.859 17.5 63.0 9.5CuInGaSe2 (CIGS) 0.716 33.7 80.3 19.4CdTe 0.845 26.1 75.5 16.7
Typical Performances of Semiconductor Photocells (Green at al., Prog. Photovolt: Res. Appl., 17, 85 (2009))
Energy Conversion Efficiencies of Some Common Solar Cells
Shockley–Queisser result
ECE 407 – Spring 2009 – Farhan Rana – Cornell University
Design of Silicon Solar Cells
The PERL Si solar cell (Green et al., 1994)Efficiency ~25%
Light trapping by a top lambertiansurface and bottom reflector can increase the optical path length by ~4n2
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ECE 407 – Spring 2009 – Farhan Rana – Cornell University
Design of Solar Cell Modules
The IV characteristics of pn junctions connected in series must identical (or nearly so)
ECE 407 – Spring 2009 – Farhan Rana – Cornell University
Improving Efficiencies of Photodiode Solar Cells
Eg
Ec
Ev
qV
Efe
Efh
Energy loss
Light
X
0 1 2 3 4 50
0.2
0.4
0.6
0.8
1
1.2
Energy (eV)
So
lar
Sp
ectr
um
Ts = 5760K
Energy Loss Pathways:
i) Photons with energies smaller than the bandgap are not absorbed
ii) Photons with energies much larger than the bandgap generate electrons (holes) with energies much above (below) the band edge. This extra energy is lost to phonons and does not contribute to output electrical power. Recall that:
goc EqVqV
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ECE 407 – Spring 2009 – Farhan Rana – Cornell University
Improving Efficiencies of Solar Cells: Tandem Cells
Eg1
LightEg2
Eg3
Eg1 > Eg2 > Eg3
A three junction tandem cell
Eg1
Light
Eg2
Eg3
A three junction tandem cell with spectral filtering
ECE 407 – Spring 2009 – Farhan Rana – Cornell University
Improving Efficiencies of Solar Cells: Tandem Cells
InGaP/GaAs two-junction tandem cell with a reversed biased Esaki tunnel junction and an efficiency of 30.3% (w/o concentration) (Takamoto et al., 1997).