Paul Scherrer Institute The PSI DRS4 Integrated Circuit Chip Stefan Ritt.
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Transcript of Paul Scherrer Institute The PSI DRS4 Integrated Circuit Chip Stefan Ritt.
Paul Scherrer Institute
The PSI DRS4 Integrated Circuit Chip
Stefan Ritt
Stefan Ritt March 15th, 2011DPP Workshop PSI 2
Agenda
• Introduction to Switched Capacitor Array Chips–Comparison with FADCs–Overview of chips on the market
• The DRS4 chip–Design principles–Special features–Some applications
• New ideas for DRS5 chip to be designed in 2011–Increased bandwidth–Zero dead time
Stefan Ritt March 15th, 2011DPP Workshop PSI 3
Introduction toSwitched Capacitor
ArrayChips
Stefan Ritt March 15th, 2011DPP Workshop PSI 4
Detectors in Particle Physics
Particles interact with matter and produce light:
Signal: ~ 100’s mV
10-100 ns
Stefan Ritt March 15th, 2011DPP Workshop PSI 5
Flash ADC Technique
60 MHz12 bit
Q-sensitivePreamplifierPMT/APD
WireShaper
• Shaper is used to optimize signals for “slow” 60 MHz FADC• Shaping stage can only remove information from the signal• Shaping is unnecessary if FADC is “fast” enough• All operations (CFD, optimal filtering, integration) can be done digitally
• Shaper is used to optimize signals for “slow” 60 MHz FADC• Shaping stage can only remove information from the signal• Shaping is unnecessary if FADC is “fast” enough• All operations (CFD, optimal filtering, integration) can be done digitally
FADC
TDC
“Fast”12 bit
TransimpedancePreamplifier FADC
PMT/APDWire
DigitalProcessing
Amplitude
Time
BaselineRestoration
Stefan Ritt March 15th, 2011DPP Workshop PSI 6
Nyquist-Shannon Theorem
If a function x(t) contains no frequencies higher than F Hertz, it is completely determined by giving its ordinates at a series of points spaced 1/(2F) seconds apart.
If a detector produces frequencies up to 500 MHz (0.6 ns rise time), all information from that detector is recorded if sampled at 1 GSPS with good enough signal-to-noise ratio
Stefan Ritt March 15th, 2011DPP Workshop PSI 7
How to measure best timing?
Simulation of MCP with realistic noise and different discriminatorsSimulation of MCP with realistic noise and different discriminators
K. Byrum, H. Frisch, J.-F. Genat et al., IEEE Trans.Nucl.Sci.57, 525 (2010)
Stefan Ritt March 15th, 2011DPP Workshop PSI 8
Currently available fast ADCs
• 8 bits – 3 GS/s – 1.9 W 24 Gbits/s• 10 bits – 3 GS/s – 3.6 W 30 Gbits/s• 12 bits – 3.6 GS/s – 3.9 W 43.2 Gbits/s• 14 bits – 0.4 GS/s – 2.5 W 5.6 Gbits/s
1.8 GHz!
24x1.8 Gbits/s
• Requires high-end FPGA• Complex board design• FPGA power
• Requires high-end FPGA• Complex board design• FPGA power
Stefan Ritt March 15th, 2011DPP Workshop PSI 9
ADC boards
• PX1500-4: 2 Channel3 GS/s8 bits
• ADC12D1X00RB: 1 Channel 1.8 GS/s 12 bits
1-10 k€ / channel
Stefan Ritt March 15th, 2011DPP Workshop PSI 10
Switched Capacitor Array
Shift RegisterClock
IN
Out
“Time stretcher” GHz MHz“Time stretcher” GHz MHz
Waveform stored
Inverter “Domino” ring chain0.2-2 ns
FADC 33 MHz
Stefan Ritt March 15th, 2011DPP Workshop PSI 11
Switched Capacitor Array
• Cons• No continuous acquisition• Limited sampling depth• Nonlinear timing
• Pros• High speed (5 GHz) high resolution (11.5 bit)• High channel density (9 channels on 5x5 mm2)• Low power (10-40 mW / channel)• Low cost (~ 10€ / channel)
t t t t t
Goal: Minimize Limitations
STRAW3 TARGET
LABRADOR3
G. VarnerUniv. of Hawaii
AFTER
MATACQ
SAM
D. BretonE. DelagnesCEA Saclay
DRS1 DRS2
DRS3 DRS4
This talk
Stefan Ritt March 15th, 2011DPP Workshop PSI 12
The DRS4 Chip
Stefan Ritt March 15th, 2011DPP Workshop PSI 13
• CMOS process (typically 0.35 … 0.13 m) sampling speed• Number of channels, sampling depth, differential input• PLL for frequency stabilization• Input buffer or passive input• Analog output or (Wilkinson) ADC• Internal trigger• Exact design of sampling cell
Design Options
PLL
ADC
Trigger
Stefan Ritt March 15th, 2011DPP Workshop PSI 14
DRS History
TemperatureDependence~kT
DRS2DRS2
I
DRS3DRS3
0.2 pF 20 pF
DRS1DRS1
Tiny signal
DRS4DRS4PLL-regulated
Sampling Speed
DSCDSC1995
2002
2004
2007
2008
Roger Schnyder, Christian Brönnimann,
Roberto Dinapoli
Stefan Ritt March 15th, 2011DPP Workshop PSI 15
DRS4
• Fabricated in 0.25 m 1P5M MMC process(UMC), 5 x 5 mm2, radiation hard
• 8+1 ch. each 1024 bins,4 ch. 2048, …, 1 ch. 8192
• Passive differential inputs/outputs
• Sampling speed 700 MHz … 5 GHz
• On-chip PLL stabilization• Readout speed
30 MHz, multiplexedor in parallel
IN0
IN1
IN2
IN3
IN4
IN5
IN6
IN7
IN8
STOP SHIFT REGISTER
READ SHIFT REGISTER
WSROUT
CONFIG REGISTER
RSRLOAD
DENABLE
WSRIN
DWRITE
DSPEED PLLOUT
DOMINO WAVE CIRCUIT
PLL
AGND
DGND
AVDD
DVDD
DTAPREFCLKPLLLCK A0 A1 A2 A3
EN
AB
LE
OUT0
OUT1
OUT2
OUT3
OUT4
OUT5
OUT6
OUT7
OUT8/MUXOUT
BIASO-OFS
ROFSSROUT
RESETSRCLK
SRIN
F U N C T IO N A L B L O C K D IA G R A M
MUX
WR
ITE
SH
IFT
RE
GIS
TE
R
WR
ITE
CO
NF
IG R
EG
IST
ER
CHANNEL 0
CHANNEL 1
CHANNEL 2
CHANNEL 3
CHANNEL 4
CHANNEL 5
CHANNEL 6
CHANNEL 7
CHANNEL 8
MUX
LVDS
Stefan Ritt March 15th, 2011DPP Workshop PSI 16
12 bit resolutionW
AV
EF
OR
M [
V]
TIME [ns]0 20 40 60 80 100 120 140 160 180 200
0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1
11.5 bits effective resolution <8 bits effective resolution
Stefan Ritt March 15th, 2011DPP Workshop PSI 17
Bandwidth
Bandwidth is determined by bond wire and internalbus resistance/capacitance:
850 MHz (QFP), 950 MHz (QFN), ??? (flip-chip)
850 MHz (-3dB)
QFP package
finalbus width
SimulationMeasurement
Ueli Hartmann
~2 nH
Bond wire Parasitic ~10 pF
Stefan Ritt March 15th, 2011DPP Workshop PSI 18
Bump Bonding
Reduce input inductance by usingbump bonding instead of wire bonding
200 m
75 m
Stefan Ritt March 15th, 2011DPP Workshop PSI 19
How to minimize dead time ?
• Fast analog readout: 30 ns / sample• Parallel readout• Region-of-interest
readout• Simultaneous
write / readIN0
IN1
IN2
IN3
IN4
IN5
IN6
IN7
IN8
STOP SHIFT REGISTER
READ SHIFT REGISTER
W SRO UT
CO NFIG REGISTER
RSRLO AD
DENABLE
W SRIN
DW RITE
DSPEED PLLO UT
DO MINO WAVE CIRCUIT
PLL
AGND
DG ND
AVDD
DVDD
DTAPREFCLKPLLLCK A0 A1 A2 A3
EN
AB
LE
OU T0
OU T1
OU T2
OU T3
OU T4
OU T5
OU T6
OU T7
OU T8/MUXOUT
BIASO-O FS
RO FSSROUT
RESETSRCLK
SRIN
F U N C T IO N A L B L O C K D IA G R A M
MUX
WR
ITE
SH
IFT
RE
GIS
TE
R
WR
ITE
CO
NF
IG R
EG
IST
ER
CHANNEL 0
CHANNEL 1
CHANNEL 2
CHANNEL 3
CHANNEL 4
CHANNEL 5
CHANNEL 6
CHANNEL 7
CHANNEL 8
MUX
LVDS
AD922212 bit
8 channels
Stefan Ritt March 15th, 2011DPP Workshop PSI 20
ROI readout mode
readout shift register
Triggerstop
normal trigger stop after latency
Delay
delayed trigger stop
Patent pending!
33 MHz
e.g. 100 samples @ 33 MHz 3 us dead time
300,000 events / sec.
e.g. 100 samples @ 33 MHz 3 us dead time
300,000 events / sec.
Stefan Ritt March 15th, 2011DPP Workshop PSI 21
Daisy-chaining of channels
Channel 0
Channel 1
Channel 2
Channel 3
Channel 4
Channel 5
Channel 6
Channel 7
Domino Wave
1
clock
0
1
0
1
0
1
0
enableinput
enableinput
Channel 0
Channel 1
Channel 2
Channel 3
Channel 4
Channel 5
Channel 6
Channel 7
Domino Wave
1
clock
0
1
0
1
0
1
0
enableinput
enableinput
DRS4 can be partitioned in: 8x1024, 4x2048, 2x4096, 1x8192 cellsChip daisy-chaining possible to reach virtually unlimited sampling
depth
DRS4 can be partitioned in: 8x1024, 4x2048, 2x4096, 1x8192 cellsChip daisy-chaining possible to reach virtually unlimited sampling
depth
Stefan Ritt March 15th, 2011DPP Workshop PSI 22
Simultaneous Write/Read
Channel 0
Channel 1
Channel 2
Channel 3
Channel 4
Channel 5
Channel 6
Channel 7
0
FPGA
0
0
0
0
0
0
0
1 Channel 0
Channel 11
Channel 0 readout
8-foldanalog multi-event
buffer
Channel 21
Channel 10
Expected crosstalk ~few mVExpected crosstalk ~few mV
Stefan Ritt March 15th, 2011DPP Workshop PSI 23
DRS4 around the world
Shipped (-Jan 2011):2200 Chips120 Evaluation Boards
Shipped (-Jan 2011):2200 Chips120 Evaluation Boards
Stefan Ritt March 15th, 2011DPP Workshop PSI 24
• MEG experiment @ PSI searches for e decay
• After ~10 years of chip design, DAQ setup, firmware programming, MEG runs with 3000 channels as designed
• 40 ps timing resolutions between all channels, running at 1.6 GS/s
• “Double buffer” readout mode increases life time to 99.7 % at 10 Hz event rate (3 MB/event)
• Took 400 TB in 2010
MEG Experiment
Stefan Ritt March 15th, 2011DPP Workshop PSI 25
DRS4 @ MEG
4 x DRS4LMK03000
32 c
hann
els
3000 Channels
Stefan Ritt March 15th, 2011DPP Workshop PSI 26
On-line waveform display
click
templatefit
pedestalhisto
848PMTs
“virtual oscilloscope”“virtual oscilloscope”
Stefan Ritt March 15th, 2011DPP Workshop PSI 27
Crosstalk elimination
Crosstalk removal by subtracting empty channelCrosstalk removal by subtracting empty channel
Hit Hit
subtract
Stefan Ritt March 15th, 2011DPP Workshop PSI 28
Template Fit
• Determine “standard” PMT pulse by averaging over many events “Template”
• Find hit in waveform• Shift (“TDC”) and scale (“ADC”)
template to hit• Minimize 2
• Compare fit with waveform• Repeat if above threshold
• Store ADC & TDC values
Experiment500 MHz sampling
Stefan Ritt March 15th, 2011DPP Workshop PSI 29
Trigger and DAQ on same board
• SCA can only sample a limited (1024-bin window) many application require a wider window, trigger capability would require continuous digitization
• Using a multiplexer in DRS4, input signals can simultaneously digitized at 120 MHz and sampled in the DRS
• FPGA can make local trigger(or global one) and stop DRSupon a trigger
• DRS readout (5 GSPS)though same 8-channel FADCs
an
alo
g fro
nt e
nd
DRSFADC12 bit
65 MHz
MU
X FPGA
trigger
LVDS
SRAM
DRS4
glo
bal tr
igger
bu
s
Stefan Ritt March 15th, 2011DPP Workshop PSI 30
“Slow” waveform and “Fast” window
Continuous Waveform 120 MSPS (8 ns bins)
Continuous Waveform 120 MSPS (8 ns bins)
TriggeredDRS Waveform 1 GSPS (1 ns bins)up to 5 GSPS
TriggeredDRS Waveform 1 GSPS (1 ns bins)up to 5 GSPS
Window only limited by RAM
Stefan Ritt March 15th, 2011DPP Workshop PSI 31
Sine Curve Fit Method
S. Lehner, B. Keil, PSI
i
j
500
0
1024
0
22 min)))2
sin(((j i
jijj
jji of
iay
yji : i-th sample of measurement jaj fj j oj : sine wave parametersi : phase error fixed jitter
“Iterative global fit”:
•Determine rough sine wave parameters for each measurement by fit
•Determine i using all measurements where sample “i” is near zero crossing
•Make several iterations
“Iterative global fit”:
•Determine rough sine wave parameters for each measurement by fit
•Determine i using all measurements where sample “i” is near zero crossing
•Make several iterations
Stefan Ritt March 15th, 2011DPP Workshop PSI 32
Fixed Pattern Jitter Results
• TDi typically ~50 ps RMS @ 5 GHz
• TIi goes up to ~600 ps
• Jitter is mostly constant over time, measured and corrected
• Residual random jitter 3-4 ps RMS
• Achievable resolution exceeds best CFD + HPTDC
Stefan Ritt March 15th, 2011DPP Workshop PSI 33
Time-of-Flight PET
• Conventional electronics:CFD – TDC: 500 ps RMS
• TOF needs:•100-200 ps•>1 MHz rate
• Conventional electronics:CFD – TDC: 500 ps RMS
• TOF needs:•100-200 ps•>1 MHz rate
C. Levin, Stanford University
Stefan Ritt March 15th, 2011DPP Workshop PSI 34
• Started fall 2010 after NSS/MIC in Knoxville (Siemens PET R&D home)• New project started to replace current PET electronics with DRS4 (5)• PCB ready summer 2011, firmware by Univ. Tübingen• Simulations show that SCA technique can achieve 100 ps easily
ToF-PET Project
Channel 0
Channel 1
Channel 2
Channel 3
Channel 4
Channel 5
Channel 6
Channel 7
1
FPGA
0
0
0
0
0
0
0
Channel 0
Channel 1 ROI
20 samples(10 ns @ 2 GS/s)* 30 ns / sample
= 600 ns+ 40 ns overhead
= 640 ns 1 MHz rate
20 samples(10 ns @ 2 GS/s)* 30 ns / sample
= 600 ns+ 40 ns overhead
= 640 ns 1 MHz rate
“Ping-Pong Scheme”
Stefan Ritt March 15th, 2011DPP Workshop PSI 35
DRS5 Chip Ideas
Stefan Ritt March 15th, 2011DPP Workshop PSI 36
Plans for DRS5
• Increase analog bandwidth ~5 GHz• Smaller input capacitance
• Increase sampling speed ~10 GS/s• Switch to 110 nm technology
• Deeper sampling depth• 8 x 4096 / chip
• Minimize readout time (“dead time free”) for muSR & ToF-PET
• (minor) reduction in analogreadout speed (30 ns 20 ns)
• Implement FIFO technology
J. Milnes, J. Howoth, Photek
~MHz event rateCTA
SR
Stefan Ritt March 15th, 2011DPP Workshop PSI 37
Next Generation SCA
• Low parasitic input capacitance High bandwidth
• Large area low resistance bus, lowresistance analog switches high bandwidth
Short sampling depth
• Digitize long waveforms
• Accommodate long trigger delay
• Faster sampling speed for a given trigger latency
Deep sampling depth
How to combinebest of both worlds?
How to combinebest of both worlds?
Stefan Ritt March 15th, 2011DPP Workshop PSI 38
Cascaded Switched Capacitor Arrays
shift registerinput
fast sampling stage secondary sampling stage
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
• 32 fast sampling cells (10 GSPS/110nm CMOS)
• 100 ps sample time, 3.1 ns hold time
• Hold time long enough to transfer voltage to secondary sampling stage with moderately fast buffer (300 MHz)
• Shift register gets clocked by inverter chain from fast sampling stage
• 32 fast sampling cells (10 GSPS/110nm CMOS)
• 100 ps sample time, 3.1 ns hold time
• Hold time long enough to transfer voltage to secondary sampling stage with moderately fast buffer (300 MHz)
• Shift register gets clocked by inverter chain from fast sampling stage
Stefan Ritt March 15th, 2011DPP Workshop PSI 39
How noise affects timing
voltage noiseband of signal
timing jitter arising from voltage noise
timing jitter is much smallerfor fasterrise-time
voltage noise u
timing uncertainty tsignal height U
rise time tr
s
r
sr
rrr
f
t
U
u
ft
t
U
ut
nU
ut
U
ut
number of samples on slope
SNR
1
Stefan Ritt March 15th, 2011DPP Workshop PSI 40
TDC vs. Waveform Digitizing
Q-sensitivePreamplifierPMT/APD
WireShaper
TDC
ConstantFraction
Discriminator
• CFD and TDC on same board crosstalk
• CFD depends on noise on single point,while waveform digitizing can average over several points
• Inverter chain is same both in TDCs and SCAs
• Can we replace TDCs by SCAs? yes if the readout rate is sufficient
• CFD and TDC on same board crosstalk
• CFD depends on noise on single point,while waveform digitizing can average over several points
• Inverter chain is same both in TDCs and SCAs
• Can we replace TDCs by SCAs? yes if the readout rate is sufficient
Stefan Ritt March 15th, 2011DPP Workshop PSI 41
Typical Waveform
Only short segments of waveform need high speed readoutOnly short segments of waveform need high speed readout
Stefan Ritt March 15th, 2011DPP Workshop PSI 42
Dead-time free acquisition
• Self-trigger writing of short 32-bin segments
• Simultaneous reading ofsegments
• Quasi dead time-free• Data driven readout
• Ext. ADC runs continuously• ASIC tells FPGA when there is new data
• Coarse timing from300 MHz counter
• Fine timing by waveformdigitizing and analysis in FPGA
• 20 * 20 ns = 0.4 s readout time 2 MHz sustained event rate
• Attractive replacement for CFD+TDC
coun
ter
latc
hla
tch
latc
hwrite
pointer
readpointer
digital readout
analog readout
trigger
FPGA
DRS5
Stefan Ritt March 15th, 2011DPP Workshop PSI 43
Plug & Play Firmware
• Emphasis shift from dedicated hardware to firmware• Pre-designed modules for CFD, TDC, peak sensing ADC, …• Modules can be configured by user and downloaded
ADCReadout FIFO
CFD TDC
SCALER FIFO
ADC FIFO
Interface
FIFO
Data bus
Parameter bus
Stefan Ritt March 15th, 2011DPP Workshop PSI 44
Conclusions
• DRS4 chip successfully used in many areas, true potential of SCA technology is just now discovered
• Planned DRS5 chip will increase BW and decrease readout dead time
• SCA technology should be able to replace most traditional electronics in particle detection
Stefan Ritt March 15th, 2011DPP Workshop PSI 45
Thanks to …
• Roland Horisberger: Original Idea
• Roberto Dinapoli: Analog Design of DRS3+4
• Ueli Hartmann: DRS4 Evaluation Boards
• PSI chip design core team