Panorama of the Coated Conductor Developments in Europe · 2004. 3. 25. · Panorama of the Coated...

Panorama of theCoated Conductor

Developments in Europe

Herbert C. FreyhardtUniversität Göttingen & ZFW gGmbH Göttingen

WAMS 2004_CERN_22-24 March 2004

Field of ApplicationCCCC

Pro

du

cts

& M

arke

t

Products and Market

MotorGenerator

SMES

Cable

Transformer

Current Limiter

MRI

Medical engineering &Life Science

Drive Engineering &Automation

Power- Management

Generation Transportation Distribution of Energy

c&c technologies

Performance of FCL5,5x50 modules based on CC

0-2

0

2

5 time [ms]1 5

4

6

-4

-6

curre

nt[k

A]

4.13 kA3.2 kA

- 3.1 kA

2.8 kA

0.4 ms

non-limited current with50kA amplitude

Max. peak power in 3 modules: > 450 kWMax. voltage for 3 modules: 150 V

2 01 0

NMR+

HTS-CC Products & Market

HTS-CC

Electrical & Power Engineering, Magnet Technology


Magnets+

Japan targets 2007

• ≈70 $/kAm• 500 m, 5 m/h• Ic=300 A/cm-w

•High performance•High processeing rate•Low production costs

Coated conductors: challengesCoated conductors: challenges

Yu. Shiohara / ISTEC

RobustProcessingTechnology

High Jceng4 … 7 x 104 A/cm2

@ 77KHigh-Jc Conductors

Assembled Conductors

Availabilityin long lengths

(x 100m)

MechanicalProperties &Compatibility

QualityControl &Standards

Current CarryingCapability

100 … 600 A

Cost=50€/kAm

AC Losses10…25 €/kAm

Below Cu:15…25 €/kAm

CC for Applications in Electrical & Power Engineering

HTS must be available as

wires, tapes or assembled conductors

HTS conductors

1st generation

Bi-HTS

HTS conductors

2nd generation

YBaCuO Coated Conductors


What is required for? Jc high @ 77K, moderate magn. fields

@ 4.2K and below, high fields

IrreversibilityField YBCO

BSCCO

D.Larbalestier K.Guth

Grain Boundaries? Weak Links

Highly textured films• sufficient film thickness for high Ic• thermal & mechanical stability …


Coated Conductors: A Multilayer Architecture

SUBSTRATES •poly: SS, Hastelloy, ... •Thermo-Mech. Treatment: Ni, Ni alloys,...

BUFFER ARCHITECTURES•Diffusion barrier; Thermal Expansion •Adhesion; Interface Reactions•Texture transfer; Epitaxy•Lattice matching; Surface Reconstruction

HIGH TEMP. SUPERCONDUCTOR•Jc(T,B), Jc(e), ac losses

CAP LAYER•Proctective;•Conductive

HTS Coated Conductor


perovskiterocksaltfcc structurespinelfluoriteC-type REpyrochlore

Material Structure Tm/oC a0 (300K) Lm

MisfitYBCO (%)

Misfit to Ni (%)

Misfit to NiO

(%)Ni fcc 1455 3.52 3.52 -9.38 0.00 -18.47

YSZ cubic / fluorite 2680 5.13 3.63 -6.06 3.03 -14.88

Gd2Zr 2O7 cubic / pyrochlore 10.52 3.72 -3.49 5.38 -12.10Y2O3 cubic / Mn 2O3 >2400 10.6 3.75 -2.67 6.13 -11.20

LaAlO3 rhombohedral / perovskite 2100 5.36 3.79 -1.58 7.12 -10.03

La 2Zr 2O7 cubic / pyrochlore 2300 10.8 3.81 -1.05 7.61 -9.45Gd2O3 cubic / Mn 2O3 >2400 10.81 3.82 -0.79 7.85 -9.16

CaTiO3 orthorhombic / perovskite 5.38x5.44 3.82 -0.79 7.85 -9.16

CeO2 cubic / fluorite 2600 5.41 3.83 -0.52 8.09 -8.88Eu2O3 cubic / Mn 2O3 >2300 10.87 3.84 -0.26 8.33 -8.59

LaNiO3 rhombohedral / perovskite 5.45 3.84 -0.26 8.33 -8.59YBCO orthorhombic 3.83x3.88 3.85 0.00 8.57 -8.31

Ca0.6 Sr 0.4 TiO3 orthorhombic / perovskite 5.46x5.46 3.86 0.26 8.81 -8.03

NdGaO3 orthorhombic / perovskite 1670 5.43x5.5 3.86 0.26 8.81 -8.03

Sm2O3 cubic / Mn 2O3 >2300 10.93 3.86 0.26 8.81 -8.03La 2NiO4 tetragonal 3.86 3.86 0.26 8.81 -8.03

Sr 2RuO4 tetragonal 3.87 3.87 0.52 9.04 -7.75LSMO rhombohedral / perovskite 5.49 3.88 0.77 9.28 -7.47

NdBCO orthorhombic 3.87x3.92 3.89 1.03 9.51 -7.20Pd fcc 1555 3.89 3.89 1.03 9.51 -7.20

Gd2CuO4 tetragonal 3.89 3.89 1.03 9.51 -7.20SrTiO3 cubic / perovskite 2080 3.91 3.91 1.53 9.97 -6.65

LaMnO3 orthorhombic / perovskite 5.54x5.74 3.91 1.53 9.97 -6.65

Nd2O3 cubic / Mn 2O3 >2300 11.08 3.92 1.79 10.20 -6.38

SrRuO 3 orthorhombic / perovskite 5.57x5.54 3.93 2.04 10.43 -6.11

Nd2CuO4 tetragonal 3.94 3.94 2.28 10.66 -5.84

BaTiO3 tetragonal / perovskite 3.99 3.99 3.51 11.78 -4.51Ag fcc 961 4.09 4.09 5.87 13.94 -1.96

SrZrO 3 orthorhombic / perovskite 2800 5.79x5.82 4.10 6.10 14.15 -1.71

BaSnO3 cubic / perovskite 4.12 4.12 6.55 14.56 -1.21NiO cubic / rocksalt 1984 4.17 4.17 7.67 15.59 0.00

BaZrO 3 cubic / perovskite 2690 4.19 4.19 8.11 15.99 0.48MgO cubic / rocksalt 3100 4.21 4.21 8.55 16.39 0.95TiN cubic / rocksalt 4.24 4.24 9.20 16.98 1.65

J.E.EvettsJ.E.Evetts

Polycrystalline SubstrateTape or Sheet

Biaxially aligned buffer layer:

Ion-Beam-Assisted Deposition: IBADInclined-Substrate Deposition: ISD

YSZ, CeO , CGO, MgO,... 2Protective Coating (Ag, Au, ...)optional “cap layer”:

CeO , Y O2 2 3

Biaxially aligned YBCO film(PLD, Thermal Coevaporation, ...)

Rolling-Assisted-Biaxially-Textured SubstratesNi, NiCr, NiV, ...

Buffer-layer Architecture... CeO, REO, . . .

YSZ, 2 2 3

RE OCeO

2 3

2

YBCO

Forced Texturing

IBAD, ISD

Thermo-mechanical

Texturing of Substrates

(TMT), RABiTS

Coated Conductors: two different routes


CCA2003 Orta S. Giulio SEP 12-13, 2003

Essential Development Lines

•Ni-Cr SS /IBAD-YSZ/CeO2/PLD-YBCO ZFW, UGoe•Hastelloy/ISD-MgO/homo-MgO/TCE-YBCO or –R.E.BCO Theva•TMT-Ni,Ni-W/TCE-CeO2/TCE-YBCO EDISON,IMEM-CNR,Europa Metalli•development of TMT substrates

-Ni and Ni alloys together with CSD buffers mainly IFW Dresden-Cu based substrates La Farga Lacambra, Univ. Barcelona

•development of -MOCVD for buffer architectures and YBCO deposition on TMT and IBADsubstrates mainly INPG-CSD buffer systems and TFA-YBCO on TMT and IBAD substrates

mainly ICMAB•SOE (Surface Oxidation Epitaxy) of TMT tapes together with MOD and PLD buffers in combination with high-rate hybride LPE UCam

CC Developments in Europe

Nexans,

Essential CC Developments

Substrates

Buffer

Layer

Architect.

YBCO

R.E.BCO

Polycrystalline SubstratesNi,Cr-based SS, Hastelloy, Inconel

poly Ni

Biaxially Textured S‘s : TMT, RABiTSNi, Ni-W, Ni-Mo, Ni-Cr, Ni-Cr-Al, Ni-V, …

composite tapes Cu-based tapes

Forced Texturing of Buffer LayerIBAD-YSZ; IBAD-ZGO; IBAD-MgO

+ CL or CLs

ISD-MgO/homo-MgO

CeO2, Y2O3,… MOCVD

perovskite-type,… CSD

PLD-YBCO, HoBCO

TCE-YBCO, DyBCO

on SS-IBAD-YSZ

MOCVD-YBCO TFA-YBCO

vac. deposition

non-vac. depos.

YBCO-PLD, YBCO-TCE

YBCO-MOCVD, spray pyrol.

YBCO BaF2-method

YBCO-TFA

LPE; HR hybride LPE

on Ni, Ni-alloys/Ni & Ni, Ni-alloys/SOE-NiO

no SOE-NiO CeO2:TCE,EB; Y2O3/YSZ/CeO2, …

MOCVD: CeO2, YSZ,Y2O3,Gd2O3,LNO

CSD: CeO2; BZO, STO, SZO, LAO, LZO, NCO,...

spray: CeO2

on SOE-NiO: PLD-BZO,-SZO,-CSTO

on SOE-NiO: MOD-BZO,-SZO


Imaging lensin vacuum chamberQuartz window

±α

Scanning mirror

Target scan

180° target turns

QE-heater

SS tape

TargetBeam-scan

x

Cr-Ni-SS / IBAD -YSZ / PLD -YBCO

IBAD

Ion Beam Assisted Deposition

substrate holder

YSZ target

source 1

sputter

550

source

2IB

ADspace for

transport systems

HR-PLD

1 7 3 7


IBAD YSZ

YBCO-PLD

High-Jc SS/IBAD-YSZ/PLD-YBCOZFW gGmbH


TEM & HR-TEM Investgations of the texture development

SS/IBAD-YSZ

1 7 3 7 WAMS 2004_CERN_22-24 March 2004

Coated Conductors: Long YBCO coated SS tapes

• SS tape (0.1 mm) // IBAD-YSZ (1.5 µm) // CeO2 ( Jc,min = 1.95 MA/cm2 & Ic/w = 214 A/cm (77K, SF)

Nov. 2002

0.05 m contact area

8.0m (between potential contacts) 0.05 m contact area

10.1 m

3.5 ±0.1

- YBCO with Au-shunt

- YBCO without Au-shunt

4-0.

05

1

10

100

1000

10 100current [A]

volt

age

[µV

]

Ic = 75 A

Tape NSS159, L = 10.1 m, wactive= 3.5 mm

A. UsoskinA. IssaevH. C. Freyhardt


N31906.2

3.72.890.177

125338

1.21338

136

Latest Results 08 2003: 357 A/cm-w (6.1m, 3.5mm, 3.2µm YBCO)

Parameter Unit Sample no.N1148 N1148 N2154 N2159N2161aN2161b

Length, L m 1.9 1.9 9.0 10.3 1.0 0.2

Effect. width, w* mm 9.2 9.2 3.4 3.5 9.5 3.5YBCO thickness µm 1.25 1.25 1.1 1.0 2.4 2.6

Tc K 89.5 89.5 89.5 91.2 90.0 90.0

Temp. of Ic Test K 77 67 77 77 77 77Ic A 142 290 67 78 301 137

Ic/w* A/cm 154 315 197 223 317 391Jc MA/cm2 1.23 2.52 1.79 2.23 1.32 1.51

Je kA/cm2 15.4 31.5 19.7 22.3 31.7 39.1Iquench A 153 - 67 79 310 153

391

10.3

301

2.23Engg.current d.


CCCC

77 K, SF

0 1 2 30

100

200

300

400

1

2

3

4

Ic/w

film thickness (µm)

criti

cal c

urre

nt d

ensi

ty (

MA

/cm

2 )

Jc

criti

cal c

urre

nt p

er c

m-w

idth

(A

/cm

)

Thickness Dependence of Jc & Ic


10°

5°

15°

1 2 30

FW

HM

of p

hi-s

cans

for

YB

CO

/CeO

2

YBCO/CeO2 thickness [µm]

FWHM=3.9°

YSZ with FWHM=11°

YSZ with FWHM=17°

CeO2

YBCO

YBCO

A. Issaev, 2003

0

1000

2000

3000

4000

5000

6000

7000

0

1000

2000

3000

4000

5000

6000

7000

Phi - Scale

-40 0 100 200 300

4)

3)

2)

1)

d:\Alexander\nss160.RAW - File: nss160.RAW - Type: Phi-scan - Start: -45.00 ° - End: 315.00 ° - Step: 1.00 ° - Step time: 1. s - Temp.: 25 °C (Room) - Time Started: 1 s - 2-Th

FWHM: 3.93 ° - Obs. Max: 268.45 ° - Gravity C.: 268.42 ° FWHM: 3.87 ° - Obs. Max: 177.39 ° - Gravity C.: 177.50 ° FWHM: 4.07 ° - Obs. Max: 86.50 ° - Gravity C.: 86.72 ° FWHM: 3.72 ° - Obs. Max: -2.77 ° - Gravity C.: -2.93 °

1 7 3 7Coated Conductors: YBCO Texture


PLD/IBAD(Fujikura/ISTEC)

IBAD-GZO ∆φ ~ 10º

PLD-CeO2 (GZO) ∆φ ~ 5º

PLD-YBCO ∆φ~ 3-4 º

∆φ

(deg

.)

Thickness (µ m)

0

2

4

6

8

10

12

0 0.5 1 1.5

Gd2Zr 2O7

Y2O3

CeO 2

PLD secondary template

IBAD-GZO

SelfSelf--epitaxyepitaxy ofof buffer buffer layerslayers

∆Φ(d

egre

e)

Deposition time ( min.)

IBAD-Gd2Zr2O7240min?10°

Single Crystal Level

Practical Conductor Level( > 1MA/cm2)

PLD-CeO2

PLD-CeO2

1

10

100

0 50 100 150 200 250 300

75min?10°80min?5.6°

IBAD-GZO+PLD-CeO2


1 7 3 7 Coated ConductorsYBCO coated SS tapes

10m

m

500 mm

6 m / 4 mm 10.3 m / 3.5 mm

2 m / 10 mm

Diam = 50 mm, L = 50 cm

3 YBCO FCL

modules


1 7 3 7

0

10

20

30

40

50

60

70

80

90

100

3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37

Tape sector (each is 22 cm long)

Cri

tica

l Cur

rent

at 7

7 K

[A

]

Ic [A] measuredIc [A] guessIc [A] extrapolationIQue [A]

Tape testing:Best IC measurement result (NSS 170)

IC/width = 234 A/cm

width = 3.5 mm

IC/width = 234 A/cm

width = 3.5 mm

IC = 82 A over 7.7 m


1,0E-09

1,0E-08

1,0E-07

1,0E-06

1,0E-05

1,0E-04

1,0E-03

1,0E-02

10 100 1000Current [A]

Co

nta

ct V

olt

age

[V]

Ic- criterion 1µV/cm

Ic=82A Ic=106A

Measured at Siemens: n=31

Measured at ZFW: n=35

Measured at Siemens: n=37

Coated Conductors: Long YBCO coated SS tapes

Measurements performed at both Siemens and ZFW

Attractive n values: 31 … 35 @ 77K, sf


1 7 3 7

Tape Testing:IC Degradation by Mechanical Stress (NSS 158)

0,00

0,20

0,40

0,60

0,80

1,00

1,20

0 100 200 300 400 500 600 700

Axial Stress [MPa]

Deg

rad

atio

n o

f cr

itic

al C

urr

ent

Ic/Ic

0

Tape NSS 158, Ic = 103 A



Substrates

Buffer

Layer

Architect.

YBCO

R.E.BCO


poly Ni




+ CL or CLs

ISD-MgO/homo-MgO



PLD-YBCO, HoBCO

TCE-YBCO, DyBCO

on SS-IBAD-YSZ

MOCVD-YBCO TFA-YBCO

vac. deposition

non-vac. depos.

YBCO-PLD, YBCO-TCE


YBCO BaF2-method

YBCO-TFA

LPE; HR hybride LPE





spray: CeO2




ISD – texturing & DyBCO - evaporation

50 µm Hastelloy

MgO

MgO

DyBCOAu

2500 nm MgO

200 nm MgO

600 nm DyBCO

200 nm Au

CC cross section

THEVA WAMS 2004_CERN_22-24 March 2004

Reel to reel DyBCO - evaporation

Refillable sources

AAS rate control

Oxygen shuttle

Tape winder

DyBa

Cu

Chamber pressure

7-8·10-5 mbar

Deposition temperature

670°C

THEVA EUCAS 2003 September 14 – 18, 2003 Sorrento

Latests results(all reel to reel ISD)

• Short samples (5 – 20 cm)

10 m DYBCO tape

• 30 m ISD – MgO buffer deposition (10 mm wide)

• 10 m DyBCO by evaporation

Problems to be solved:

Local defects due to handling problems

jc = 1.6 – 1.9 MA/cm2

Ic = 340 A/cm @ 2.4 µm

• 1m tape samples Ic = 60 – 80 A

THEVA WAMS 2004_CERN_22-24 March 2004


Substrates

Buffer

Layer

Architect.

YBCO

R.E.BCO


poly Ni




+ CL or CLs

ISD-MgO/homo-MgO



PLD-YBCO, HoBCO

TCE-YBCO, DyBCO

on SS-IBAD-YSZ

MOCVD-YBCO TFA-YBCO

vac. deposition

non-vac. depos.

YBCO-PLD, YBCO-TCE


YBCO BaF2-method

YBCO-TFA

LPE; HR hybride LPE





spray: CeO2




Moving Moving tapes: TCEtapes: TCEØ Deposition rate = 3 Å/sec

Ø Simple single-pass systemto investigate deposition undertape movement

CCA 2003, 12CCA 2003, 12--13 Sept., 13 Sept., OrtaOrta San GiulioSan Giulio, Italy, Italy

Sample length = 20 cmYBCO width = 0.7 cmYBCO thickness = 0.6 µm

Ic/w (77 K) = 110 A/cm-width(stationary) 220 A/cm-w

Jc (77K) = 1.8 MA/cm2

0,10

1,00

10,00

100,00

0,00 5,00 10,00 15,00

B (T)

Ic/Ic

0@77

K

4.2K

20K

40K

50K

,

JJcc vs vs B at B at low low temperaturetemperature

D. Uglietti, R. FlukigerDépartement de Physique de la Matière Condensée, Université de Genève

B // ab

CCA 2003, 12CCA 2003, 12--13 Sept., 13 Sept., OrtaOrta San GiulioSan Giulio, Italy, Italy


Substrates

Buffer

Layer

Architect.

YBCO

R.E.BCO


poly Ni




+ CL or CLs

ISD-MgO/homo-MgO



PLD-YBCO, HoBCO

TCE-YBCO, DyBCO

on SS-IBAD-YSZ

MOCVD-YBCO TFA-YBCO

vac. deposition

non-vac. depos.

YBCO-PLD, YBCO-TCE


YBCO BaF2-method

YBCO-TFA

LPE; HR hybride LPE





spray: CeO2




TMT / RABiTS METHOD poly Ni alloy/multi buffer/TFA-YBCO

0 10 20 30 40 50 60 700.00

0.05

0.10

0.15

0.20 Ni-4.5% W / Ni-15% Cr 40 nm CeO2 by PLD 250 nm Ni e-beam evaporation

freq

uenc

yMisorientation angle (°)

Deviation from cube orientation (°)GBs > 15°

Texture in the Ni-4.5%W/ Ni-15% Cr composite after

recrystallisation

IFW/DD


TMT tapes : IFW DresdenNi, Ni5W, Ni0.1Mo, Ni13Cr, Ni9V: up to 30m, in-plane FWHM = 8º

Ni4.5W/Ni15Cr composite tapes (yield strength 200 MPa)

RT Yield Strength EBSD maps after 2-step recrystallization

CC Development in Europe


100 102 104 106

Length (Grains)

NLNl

NlNW

Development of C.C. by TFA Processing(SRL-ISTEC)

Improvement of Ic by Thickening YBCO Layer on IBAD by TFA-MOD

Coating

Substrate

TFAPrecursor

O2H2O

CO2HF

Calcination( ~ 400? )

1Substrate

YBCO Film

Ar/O2H2O HF

Firing( 775? )

2Substrate

CeO2 / IBAD-Zr2Gd2O7/ Hastelloy

YBCO Film

210A

77K,0T

0

50

100

150

200

250

300

0 0.5 1 1.5 2Film thickness (µ m)

Ic(A

)


High Production Rate usingNew Starting Materials (SRL-ISTEC)

0

100

200

300

400

500

600

0 500 1000 1500Time (min)

??

(?

)20 h for TFA

5 MA/cm2on LAO~2h for “X”

5 MA/cm2 on LAOAll TFA Salts

Y(CF3COO)3Ba(CF3COO)2Cu(CF3COO)2

New MaterialsY(CF3COO)3Ba(CF3COO)2

Cu(F-free)X

Reduction of F WAMS 2004_CERN_22-24 March 2004

AMSC Results: March 2004WAMS 2004_CERN_22-24 March 2004

Sandwich Architecture

Neutral-axis CC

Buffer layers : SS/YSZ// YSZ

èèImprovement of the BL qualityImprovement of the BL quality

FWHM of Rocking Curves:YSZ (200) = 9.6° → 5.5°

FWHM = 13.2° by IBAD

0 100 200 300 400 50010.0

10.5

11.0

11.5

12.0

12.5

13.0

13.5

FW

HM

(°)

Thickness of YSZ (nm)

FWHM = 11° by MOCVD

-180 -120 -60 0 60 120 1800

200

400

600

800

1000

1200

1400

Inte

nsi

ty (a

u)

φ (°)

Thickness of YSZ = 150 nm

RMS= 2nm

INPGrenoble

MOCVD


SS/YSZ //YSZ/CeO2/YBCO

80 81 82 83 84 85 86 87 88 89 90 91 92 93

0,1

0,2

0,3

0,4

0,5

0,6

0,7

Substrate: SS/YSZ

Layers: YSZ/CeO2/YBCO

YSZ dopé 10% Y

AC

sus

cept

ibili

ty (

a.u)

Temperature (K)

-150 -100 -50 0 50 100 1500

100

200

300

FWMH = 9.1°FWMH = 13.5°

FWMH = 9.5°

I (a.

u)

φ scan YSZ (111) / CeO2 (111) / YBCO (103)

SS/YSZ//YSZ/CeO2/YBCO

ROC YSZ (200) = 4.6°ROC CeO2 (200) = 4.6°ROC YBCO (005) = 2.8°

èèBest Best heterostructureheterostructure

Jc=106A/cm2

INPGrenoble WAMS 2004_CERN_22-24 March 2004

NiW/NiO//CeO2/YSZ/CeO2/YBCO

78 79 80 81 82 83 84 85 86 87 88 89 90 91 92 93

0,2

0,3

0,4

0,5

0,6

0,7

Substrate: NiD1W/NiO Layers : CeO2/YSZ/CeO2/YBCO

YSZ doped 10% YAC

sus

cept

ibili

ty (

a.u)

Temperature (K)

-150 -100 -50 0 50 100 1500

20

40

60

80

100

120

140

160

180

200

220

240

260

280

300

320

FWMH = 10.2°

FWMH = 11°FWMH = 10.7°

I (a.

u)

φ scan CeO2 (111) / YSZ (111) / YBCO (103)

NiW/NiO/CeO2/YSZ/CeO

2/YBCO

FWHM of Rocking Curves:CeO2 (200) =9.1°YSZ (200) = 10.2°YBCO (006)= 8.5°

Jc = 5.10 5 A/cm2

èèBest Best heterostructureheterostructureProject

INPGrenoble WAMS 2004_CERN_22-24 March 2004

All sol-gel coated conductor

Technical substrates

YBCOBuffer layers

Protective layer

MOD

Buffer layers:Compatibility with metallic substrates (RABiT and IBAD)Grain size, thickness and roughness can be modified by processing

Fluorite : CeO2

Perovskite :BaZrO3, SrTiO3, LaAlO30 50 100 150 200 250 300 350In

tens

ity(A

rbitr

ary

Uni

ts)

(º)φ

∆φ=0.3º

Precursors: pentadionate, isopropoxide, acetate, sec-butoxide, ethylhexanoate

IBAD-YSZ : UGOT

RABiT Ni: IFW

Ni/NiO: UCAM

ICMAB WAMS 2004_CERN_22-24 March 2004

PerovskitePerovskite

FluoriteFluoriteCeOCeO22

PerovskitePerovskiteSrTiOSrTiO33

PerovskitePerovskiteSrTiOSrTiO3 3 : : NbNb

NiO-SOE/Ni RABiT YSZ-IBAD/SSMgO-IBAD/SS

With templates

Ni (Cu) RABiT

Non protected

Metallic substrates

PyrochlorePyrochloreLaLa22ZrZr22OO77

YBCOYBCO

PerovskitePerovskite(Ba,Ca)TiO(Ba,Ca)TiO33BaZrOBaZrO33

AllAll CSD tapes CSD tapes architecturesarchitectures

ICMAB

CSD of oxide buffer layersCSD of oxide buffer layers

2,4-X- Pentadionate

X=Ce, Zr

O

O

CH3

CH3

CH

z

X z+

0.0 0.1 0.2 0.3 0.4 0.5 0.6 0.70

20

40

60

80

100

Profilometry

Reflectometry

BaZrO3

CeO2

SrTiO3

CaZrO3

LaAlO3

CaTiO3

Thi

ckne

ss(n

m)

Concentration (M)

Thickness control through solutionconcentration and viscosity

Solvents :acetic acid, methanol,

methoxyethoxy

Soluble metallorganic chemicalprecursors Acetates

OCH3

O

2M

2+

M=Ba, Sr, Ca

Al, Ti, La isopropoxydes

Heterometallic alkoxydes : Sr-Ti, Ba-Zr

ICMAB

Non-reactive buffers matched with similar texture than the NiO template layer. Roughness must be improved

Collaboration with Univ. Cambridge and Dresden

SrTiO3/BaZrO3 on NiO/NiNiO grown by Surface Oxidation Epitaxy

BZOSTO

001001

NiONi

ε= 0.4%

-6.95%

rms ~ 45-100 nm

STO (850STO (850ººC)C)

ICMAB

YBCO : Trifluoroacetates routeCu(TFA)2 + Ba(TFA)2 + Y(TFA)3 → CuO + BaF2 + Y2O3 + (CF3CO)2O + CO2 + CO + H2O

2 BaF2 + 2 CuO + 1/2 Y2Cu2O5 +2 H2O YBa2Cu3O6.5 + 4 HF

Pyrolysis: T≈300ºC

Reaction: T≈700-800ºC

YBCO

Substrate

Growth

BaF2 Y2Cu2O5 CuO

H2O

H2O HF

HF

YBCO

Substrate

Growth

BaF2 Y2Cu2O5 CuO

H2O

H2O HF

HF Growth ? HF removalP(H20)PtotalTreactionGas flow

0.04 0.04 nmnm/s < G < 2 /s < G < 2 nmnm/s/sWAMS 2004_CERN_22-24 March 2004

High quality YBCO thin films

0 20 40 60 80 100105

106

107

108

250 nm

500 nm

J c

(A/c

m2 )

T (K)

T = 77 K

Jc= 3.3 MA/cm2

Jc= 1.0 MA/cm2

•Nucleation and growth rate can be controlled

•Multideposition can be performed

•Thickness dependence is still an issue

No porosity0 20 40 60 80 100 120 140 160 180 200 220 240 260 280 300 320 340 360

0

200

400

600

800

1000

1200

1400

1600

1800

2000

2200

45

134

224,

25

315

FWHM = 1,40 ºOS-35 YBCO + STO 816ºC Reflection 115

Inte

nsity

(A

.U.)

φ (Degrees)

∆φ=0.6º

18,5 19,0 19,5 20,0 20,5

∆ω = 0.4º

Inte

nsi

ty (

Arb

itrar

y U

nits

)

ω(º)

ICMABWAMS 2004_CERN_22-24 March 2004

n If CeO2CSD surface has been treated¨Excellent YBCO superconducting

properties••Metallic Metallic ρρ(T(T))••TTcc = 90 K= 90 K

••JJcc (5K) (5K) = 1.5 x 10= 1.5 x 1077 A/cmA/cm22

••JJcc (77K) = 1.6 x 10(77K) = 1.6 x 1066 A/cmA/cm22

••cc--axis fraction ~ 0.9axis fraction ~ 0.9

0 100 200 3000

200

400

ρ (µ

Ω c

m)

T (K)

CeOCeO22YBCOYBCO

YSZ

0 20 40 60 80 100

105

106

107

J c(A

/cm

2 )

T(K)

Model system – All fluoriteYBCO/CeO2CSD/YSZ

YBCO on CeO2PLD/YSZ-SS tapes

Jc (5K) = 1.4x106 A/cm2

ICMAB

Long length CSD superconducting tapesLong length CSD superconducting tapes

Batch furnace system for 35m CC tape with control of Ptot

•European project “Novel Sol Gel Technology For Long Length Superconducting Coated Tapes”(SOLSULET)

0

50

100

150

200

250

300

0,1 1 10 100

CC tape length (m)

Cri

tica

lcu

rren

tper

cm

-wid

th(A

/cm

)

PLD (LANL)

MOCVD (IGC)

BaF2 (3M)

PLD (IGC)

PLD (Sumitomo)

MOD TFA (AMSC/ORNL)

PLD (Fujikura)

392 A/cm in 0.2m length (ZFW)

HR

-PL

D (

ZF

W G

ött

ing

en)

HR-PLD new route (ZFW )

350

400357 A/cm in 6m length (ZFW)

RABiTSIBADISD

RABiTSIBADISD

PLD (Fujikura)

?July 2003

2002

2001-2002

MgO/PLD (LANL)

MOCVD (IGC)

PLD (IGC)

38A Fujikura

ZFW: 481A/cm-w

1 7 3 7

AMSC

TFAISTEC

&AMSC

March 2004

AMSCFeb 04

(IGC)March 04

SuperconductingSuperconducting performanceperformance VacuumVacuum vsvs

chemicalchemical depositiondeposition

0.0 0.5 1.0 1.5 2.0 2.5 3.0

1x106

2x106

3x106

4x106

5x106

PLD-Göttingen IBAD-YSZ 7º-4º

PLD-LANL IBAD-MgO 4º

BaF2-ORNL RABiT-6º

TFA-AMSC RABiT 4.6º

TFA-ISTEC IBAD-5º

TFA-AMSC RABiT 6.4º

J c (

A/c

m2 )

t (µm)

Commercial performance

Ic ˜ 300-400 A/cm-w


10 7

10 8

10 9

10 10

10 11

0 5 10 15 20 25 30

J c[A

/m2 ]

Magnetic Field, B [T]

50K77.3K30K

50K77.3K

30K

20K

20K(Measure)

core Jc

(@4.2K, Bronze-Processed)

non-Cu Jc

(@4.2K, Bronze-Processed)

4.2K

YBCO(IBAD-PLD)Bi2223(Ag-Sheath)Nb3Sn

Jc-B Properties in IBAD-PLD Tape(Fujikura Ltd. & Kyushu Univ.)

EHTS/ZFWNo failure @ 4.2K

20T: 485 A (4mm tape)

A.Usoskin\2003\SUITABLE\FCL&Limitation.ppt

FCL-modules based on YBCO coated SS tapes CCCC∅ 55 mm

500 mm

Performance of FCL5,5x50 modules based on CC

0

-2

0

2

5 time [ms]15

4

6

-4

-6

curr

ent

[kA

]

4.13 kA3.2 kA

- 3.1 kA

2.8 kA

0.4 ms

non-limited current with50kA amplitude

Max. peak power in 3 modules: > 450 kWMax. voltage for 3 modules: 150 V

2010

Nominal (non-limited) current 2 500 A (ampl.)

Nominal power losses ~ 0.5 W

Fault current, max. 50 000 A (ampl.)

Peak power at fault current: 150 000 W

SUPERPOLI

REQUIREMENTS & STRATEGIC GOALSReproducible Processing of YBCO-CC , S.E.BCO-

CC

? YBCO CC in lengths of 100 m Jceng 400-700A/mm2 @ 77K

•with cross-sectional architectures and properties (Ic (T,B,e,…), ac losses, mechanical & electro-mechanical prop. , ease of handling; … ) determinedby the particular application

•assembled conductors

? YBCO CC in km lengths (for use at 77K) until 2005/6 at costs of < 50 €/kAm

? Mass production in 2010/2012 at costs 10 ... 25 €/kAmWAMS 2004_CERN_22-24 March 2004

Jc : 1 MA/cm2

dYBCO : 1µm

Ic : 100A/cm-w

Ic : 300A/cm-w Ic : 600A/cm-w

Jc : 3 MA/cm2

dYBCO : 1µm

Jc : 1 MA/cm2

dYBCO : 3µm

Jc : 3 MA/cm2

dYBCO : 2µm

CC Tape

How to increase Ic ?

Panorama of the Coated Conductor Developments in Europe · 2004. 3. 25. · Panorama of the Coated...

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