Overview of VAMAS activities for HTS conductor tests

Gen NISHIJIMA (NIMS) Kozo OSAMURA (RIAS)

Hitoshi KITAGUCHI (NIMS)

MEM2016@Tallahassee, US

• Formed as one of 18 cooperative projects at the 1982 G7 Economic Summit to stimulate trade in new technologies – only project still active

• Supports trade in products using advanced materials through pre-standards research

• Researchers drawn from VAMAS and non-VAMAS countries

VAMAS Versailles Project on Advanced

Materials and Standards

VAMAS current membership

Australia ItalyBrazil JapanCanada MexicoChina SouthAfricaChineseTaipei SouthKoreaFrance UKGermany USAIndia EC

To support world trade in products dependent on

advanced materials technologies by providing the technical basis for harmonized measurements, testing, specifications, and standards.

VAMAS mission

•  Each VAMAS member can send up to three representatives to Steering Committee meetings

•  Steering Committee

meets annually, hosted by one of the members

VAMAS is led by a Steering Committee

VAMAS activities conducted through Technical Work Areas (TWAs)

•  TWAs are created through proposals to the VAMAS Steering Committee

•  Requirements are participation from at least three members and industrial need

•  TWAs led by individuals from a number of VAMAS member states

•  Each TWA have one or more projects underway

•  Work within TWAs typically consists of interlaboratory studies which lead to new or improved test procedures or reference materials.

•  Results of TWA activities are submitted to ISO or Regional or National standards bodies.

VAMAS work

VAMAS Technical Work Areas Surface Chemical Analysis Superconducting Materials Thermoelectric materials Quantitative Microstructural Analysis Polymer Composites Nanoparticle Populations Nanomechanics Applied to SPM Spectrometry of Synthetic Polymers Crack Growth in Weldments Polymer Nanocomposites Modulus Measurements Organic Electronics Materials Databases Interoperability Mechanical Measurements of Thin

Films and Coatings Performance Properties for Electroceramics

Superconducting Materials

Solid Sorbents

•  ISO - 2014 •  IEC – 2014 •  IEA – 2002 •  BIPM- 2008 •  WMRIF - 2008

MoU with other organizations

•  Work has led to 85 national, regional or international standards

•  ~50 VAMAS reports

•  Five ISO Technology Trends Assessments

•  ~600 publications resulting from VAMAS work

VAMAS accomplishments

Liaison VAMAS-TWA16 & IEC-TC90

Project Working group Property VAMAS IEC WG 1-1,5

WG 1-2

WG 1-4

WG 2-1

WG 3-1

WG 4-1

WG 3

WG 11

WG 9

WG 10

WG 8

WG 5

IEC-TC90

Chair: C.E. Bruzek (Nexans, France)

TC90 Office ISTEC, Japan

VAMAS- TWA16

Chair: G. Nishijima (NIMS, Japan)

TWA16 Office NIMS, Japan

Ic

Tc

AC loss

Trapped field

Surface R.

Mechanical

VAMAS participants National Committees

11

Published International Standards for wires

Nb-Ti Nb3Sn BSCCO (wire)

REBCO (wire)

MgB2

General characteristics -21 -21 -21 -21 -21

Ic -1 -2 -3

AC Loss -8, -13

Tc -10 -10 -10

Mechanical property -6 -19 -18 NP

RRR -4 -11

Volume Ratio -5 -12

Ic retainment after bending CD

IEC 61788-#

12

VAMAS-TWA16 has contributed 16 IEC-TC90 standards.

Activity status of TWA16 WGs

Project Material Property Leader Participants Present status

WG1-1 Bi-2223 Bending effect

Y. Yamada 11 NP accepted CD under discussion

WG1-5 YBCO Ic G. Nishijima 10 NP under preparation

WG1-4 YBCO AC loss E. Collings (11) RRT under reconsideration

WG2-1 HTS bulk Trapped field

M. Tomita 12

WG3-1 Thin film Surface resistance

S. Ohshima 16

WG4-1 YBCO Mechanical property

K. Osamura 8 NP accepted

13

Recent International RRTs

14

Completed RRTs n  RT tensile test method for REBCO (K. Osamura,

RIAS, 2012) n  Retained Ic after double bending for Bi-2223

(Y. Yamada, SEI 2014) n  Ic (at 77 K, SF) for REBCO (G. Nishijima, NIMS,

2015)

Specimens used n  Commercially available wires (not custom-

made) n  Purchasing is better to avoid restriction for

publication

Importance of RRT

15

RRT is getting more and more important in IEC standards. n  At least an RRT is required for an NWIP.

n  RRT result (publication) needs to be cited in the standard.

n  Uncertainty shall be deduced from the RRT result and included in the standard. n UNCERTAINTY is being used instead of ACCURACY

and/or ERROR. n Visit NIST and NPL websites to learn UNCERTAINTY.

RT tensile test of REBCO tapes

16

n  Lead by Prof. Osamura, RIAS n  7 participants from 4 countries n  RRT completed in 2012

Specimens after tensile tests (Twente)

RT tensile test of REBCO tapes

17

0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.00

100

200

300

400

500

600

700

800

900

AMS C

S UNAM

S uperpower

F ujikuraUniaxialten

silestren

gth

,MPa

Un iax ials train ,%

Typical stress-strain curves (Andong Nat Univ)

0

50

100

150

200

250

300

350

0 0.1 0.2 0.3 0.4 0.5 0.6

R (M

Pa)

A (%)

E0

EU

Rp0.2-0

Rp0.2-U

"D"

0

1

2

3

4

5

6

7

8

100 120 140 160 180 200

Labo

rato

ry

E0 (GPa)

"B"

Analyses

18

TotalaverageofthemodulusandtheirrelaDvestandarduncertainty,whereNisthetotalnumberofexperiments.

Sample N E0 EU

<E0> (GPa)

RSU (N,m) (%)

<EU> (GPa)

RSU(N,m) (%)

A 35 143.0 1.28 155.5 0.70

B 35 142.3 2.23 142.4 0.92

C 35 130.2 0.72 133.6 0.83

D 35 109.2 0.91 112.9 0.78

Publication

19

Bi-2223 Ic retainment after double bending

Superconductingwire pulley pulley

Pulley orDancer-roll for tension

Supply Pass-line Coiling

Bending direction

Bending direction

n  Lead by Mr. Yamada, SEI n  6 participants from 4 countries n  RRT completed in 2014

Publication

REBCO Ic measurement (at 77 K, SF)

n  Lead by Dr. Nishijima, NIMS n  10 participants from 5 countries n  RRT completed in 2015

Manufacturer A B C D Rare earth Y Gd Y and Gd Gd Deposition processes RABiTS/MOD IBAD/RCE-DR IBAD/MOCVD IBAD/PLD Tape width [mm] 4.4 4.1 4 5 Tape thickness [mm] 0.4 0.1 0.095 0.16 Superconductor thickness [µm] 1 1.0-1.5 no info no info Substrate Ni-5W Hstelloy C-276 Hstelloy C-276 Hstelloy C-276 Substrate thickness [µm] 50-75 60 50 75 Lamination Brass n/a n/a n/a Lamination thickness [µm] 150 n/a n/a n/a Copper stabilizer n/a Both sides Both sides SC side Copper thickness [µm] n/a no info 20x2 75 Typical Ic [A] @77K, SF 80-100 >180 - >250

REBCO Ic measurement (at 77 K, SF)

92

88

84

80

76

I c [

A]

10987654321

Institution

1.0

0.8

0.6

0.4

0.2

0.0

Standard u

ncertain

ty o

f I c

[A]

108642

Institution1.2

1.1

1.0

0.9

0.8

0.7

0.6

0.5

0.4

0.3

Rela

tiv

e s

tandard u

ncertain

ty o

f I c

108642

Institution

• Article being prepared • NP will be submitted in 2016

Uncertainties

  Tape A Tape B Tape C Tape D N 50 45 50 45 Ic,avg [A] 103.4 192.4 90.19 300.1 SD [A] 3.176 4.447 2.189 5.746 SU [A] 0.449 0.663 0.310 0.857 RSU [%] 0.434 0.345 0.343 0.285

T change caused by pressure change

1020

1010

1000

990

980

Pres

sure

[hP

a]

Jan 1, 14 May 1, 14 Sep 1, 14 Jan 1, 15dat

Tsukuba

500

400

300

200

100

0

I c [

A]

908580757065

Temperature [K]

FUJ (Tape D) SN (Tape B) SP (Tape C)

Ic=901.72-10.486T

Ic=2178.3-24.725T

Ic=1361.4-15.056T

90

85

80

75

70

65

60

T [

K]

0.300.250.200.150.100.050.00

P [MPa]

Liquid Nitrogen

Antoine equation

T=B/(A-log(10*P))-C

A=3.63792

B=257.877

C=-6.344

T [K], P [MPa]

Uncertainties

  B C D # of specimens 45 50 45 Ic,avg [A] 192.4 90.19 300.1 SD [A] 4.447 2.189 5.746 SU [A] 0.663 0.310 0.857 RSU [%] 0.345 0.343 0.285

Component B C D SU caused by L [A] 0.017 0.011 0.027 SU caused by U [A] 0.37 0.17 0.58 SU caused by I [A] 0.37 0.17 0.58 SU caused by T [A] 0.94 0.60 1.53

Intrinsic SU [A] 5.11 2.05 7.74 RSU [%] for N=1 2.7 2.4 2.6

RSU [%] for N=45 (50) 0.41 0.34 0.40

Type A uncertainties

Type B uncertainties

Implication: The biggest source of uncertainty is intrinsic Ic non-uniformity

3 RRTs being planned

n  MgB2 Ic measurement (at 4 K, in-field) n  Lead by Dr. Troppeano, Columbus n  15 participants from 12 countries (hopefully)

n  LT (77 K and optional 4 K) tensile test of REBCO n  Lead by Dr. Bagrets, KIT n  8 participants from 6 countries (under negotiation)

n  Ic-tension of REBCO n  Lead by Prof. Osamura, RIAS

Summary

29

n So far VAMAS-TWA16 has contributed 16 IEC-TC90 standards.

n In the last 5 years, VAMAS-TWA16 has contributed 3 RRTs of HTS testing. 2 of 3 were submitted to IEC-TC90 as NP.

n 3 RRTs are being planned.