Noise in Circuits

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    NOISE IN CIRCUITS

    MOHAMMAD A MAKTOOMIM.TECH (CSD: 2011-2013)

    ELED,AMU

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    Noise: Definition & Classification

    EXTERNAL noise: Outside Interference- Even between different part of circuit

    (Electric & Magnetic interaction throughparasitic capacitor/ inductor)

    Everything except the desirable ones !

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    Contd

    External noise: periodic, intermittent, orrandom

    - Present, even if we could manage to remove allexternal noise !

    - Always random- due to random phenomena likethermal agitation of electrons in resistors/ randomEHP generation/recombination in semiconductors.

    INTERNAL noise: INHERENT NOISE

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    It limits minimum signal that can beprocessed/detected

    The noise level of a circuit directly tradeswith power dissipation and speed

    In most circuits, low noise dictates the useof large capacitors and/or large gm whichmeans high power dissipation

    But, Why do we care???

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    BASIC CONCEPTS

    RMS value:

    T is some suitable averaging interval. is mean-square value= average power

    dissipated by xn(t) in 1 resistor.

    NOISE SUMMATION: if the noise are

    uncorrelated then superposition holds forpower -

    1/ 2

    2

    0

    1( )

    T

    n nX x t dt

    T

    2

    nX

    2 2 2 2

    1 2 1 2

    0

    1[ ( ) ( )]

    T

    n n n n nX x t x t dt X X

    T

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    SPECTRAL DENSITY

    Power spectral density (PSD) shows howmuch power signal caries at a particularfrequency.

    Expressed as or !

    Total (mean) power is, then

    2/V Hz /V Hz

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    Noise Type: A brief description

    THERMAL NOISE

    Result of random motion of electrons in

    conductor due to thermal effectsWhite spectral density

    Proportional to absolute temperature

    Also known as Johnson or Nyquist noise

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    THERMAL NOISE

    r= NO NOISE (just in model) rb= NOISY (parasitic material resistance)

    (Pure) Capacitor, Inductor= No thermal Noise

    Purely reactive elements do not generate Noise !

    NOT associated with resistor symbol !

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    SHOT NOISE

    Occurs in pn Junction

    Result of discrete movement of chargeacross the barrier when current flowsthrough it.

    White noise

    Thermal noise is independent of biascurrent, Shot noise is not !

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    FLICKER NOISE

    Least understood noise!

    Found in all active devices (occurs onlywhen dc current flows)

    Due to carrier traps in semiconductorand released (randomly)

    Spectral density proportional to 1/f

    ,hence the other name- 1/f noise.

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    NOISE in Resistor

    Thermal noise is major source

    PSD: V2/Hz

    K= Boltzmann Const T= Temeperature in kelvin

    Could be modeled in Norton or Thevenin

    form

    2( ) 4RV f KTR

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    Noise in Resistor

    Spectrum is white !

    Practically, White only up to 100THz(then drops)

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    Input-referred noise

    A1 :noiseless As A1increases, outputNoise will also increasewrong conclusion, as itequally amplifies the signal.Hence the notionof input-referrednoise.

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    An Example

    Evaluate: output noise and input referred

    noise over DC to 1KHz

    (1)

    (2) Vout(f)= =

    2

    2 4 4( ) 18.26 24

    10 1R

    KT KT AI f E

    K K Hz

    1 .1018.26 24( )

    1 10

    k kE

    k k

    3.88 9

    VE

    Hz

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    Mean-power:

    RMS output noise = 122.67nV Input referred noise= 122.67nV/

    =1.35uV

    12 2 2

    0

    ( ) (3.88 9 ) .1k

    out out

    VV V f df E kHz

    Hz

    1( )1 10

    k

    k k

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    SPICE SIMULATION

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    NOISE in DIODES

    SHORT noise is major source

    Model: A current source in parallel toincremental resistance

    PSD: 2 ( ) 2d d

    I f qI

    d

    d

    KTr

    qI

    2/A Hz

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    NOISE IN BJTs

    Due to Shot noise of Base and collectorcurrent

    Flicker noise of base current

    Thermal noise of base resistance

    Common practice is to model all noise by

    two equivalent sources at the base:2 1( ) 4 ( )

    2i b

    m

    V f KT r g

    2

    2( ) 2 (

    ( )

    CBi B

    IKII f q I

    f f

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    NOISE IN MOSFET

    Dominant source is Flicker and Shot noise Flicker Noise Modeled by a voltage source in series

    with gate:

    K is device dependent parameter (lower for PMOSthan NMOS as their majority carrier is less likelyto be trapped) Large area device has low flicker noise !

    Thermal noise due to resistive channel In saturation, modeled by a drain to source current

    of

    2( )

    g

    ox

    KV f

    WLC f

    2 2( ) 4 ( )

    3d mI f KT g

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    Models could be simplified by

    Dividing current by in referring

    Back to input as voltage sourceOr vice versa. [ ]

    2

    mg

    d m gsi g v

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    Opamp Model

    Modeled by three uncorrelated

    Noise sources as shown.

    In CMOS opamp, Current sourcesmay be ignored, at low frequencies

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    SUMMARY of Noise

    Models

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    EXAMPLE-1

    An opamp Circuit

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    Integrate, and add.

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    EXAMPLE-2

    Common-source stage

    2 2 2

    ,

    2 4(4 . )

    3

    n out m m D

    ox D

    K KTV KT g g R

    C WLf R

    2V

    Hz

    Resistors thermal noiseMOS thermal & flicker noise

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    EXAMPLE-3

    Common-emitter

    Evaluate optimum

    IC, to minimize

    Equivalent input

    Noise

    Assume:

    Collector shot noise dominate input noise voltage

    Base current shot noise dominates input noise current

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    Given assumptions mean

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    Differentiate and equate to zero to obtain,

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    Conclusion

    Discussed various terminology

    Discussed Various noise mechanism

    Discussed noise models of variouselements

    Some examples were discussed

    SPICE simulation discussed

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    References

    John and Martin, Analog Integrated Circuit Design

    John Wiley & Sons, India, 1997

    Baker, R J, CMOS Circuit design, layout and

    simulation, John Wiley & sons, India, 2005 Razavi, B, Design of Analog CMOS Integrated

    Circuits, TMH, India, 2002

    Voss, 1/f(flicker noise): A brief review,33rd Annual Symposium on Frequency Control.

    1979, pn,40-46

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