MunEDA Tools and R&D Roadmap

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MunEDA WiCkeD 6 Integration into Design Architect IC Oktober 2008 Christian Parg Senior Application Engineer MENTOR GRAPHICS Central Europe Dr. Volker Glöckel Senior Technical Account Manager MunEDA GmbH

Transcript of MunEDA Tools and R&D Roadmap

Page 1: MunEDA Tools and R&D Roadmap

MunEDA WiCkeD 6Integration into Design Architect ICOktober 2008

Christian PargSenior Application EngineerMENTOR GRAPHICS Central Europe

Dr. Volker GlöckelSenior Technical Account ManagerMunEDA GmbH

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Agenda

Mentor IC-Flow— Frontend Overview

MunEDA WiCkeD Overview

MunEDA WiCkeD Integration to DA-IC

On Semi customer reference cases using WiCkeD/DA-IC integration

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Mentor Graphics Custom IC-FlowInteractive Design & Analysis— Interactive Simulation control— DSPF Flow: Parasitic debug— Case frames & Function blocks

Interactive Layout & Verification— In-line Calibre DRC/LVS— Real-time DRC with Calibre rules— IRoute: Interactive routing— Aroute: Integrated auto routing— Device generators and editing— Connectivity-driven layout & ECO

Interactive Data Management— ICstudio environment— Revision control & multi-site collaboration

Migration from Competing flows— Compatible Use models and UI— Design conversion

Design kits (TDKs): Enabling interactive design— TDK Automation

Functional Verification

Eldo, Eldo RFADMS

VerificationExtraction

Calibre DRC/LVSCalibre xRC

LayoutIC Station

AssemblyICassemble

GDS

InteractiveAnalysis

SchematicCapture

DA-IC

SimulationControl

DA-IC SimICstudio

Design & DataManagement

VerilogVHDL

Verilog-AMSVHDL-AMS

3rd PartySynthesis

P&R

RevisionControl

powered byCliosoft

DesignSync

InteractiveVerification

Schematic-drivenLayout

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AgendaInteractive Simulation Control

Interactive Design & Analysis— Interactive Simulation control— DSPF Flow: Parasitic debug— Case frames & Function blocks

Interactive Layout & Verification— In-line Calibre DRC/LVS— Real-time DRC with Calibre rules— IRoute: Interactive routing— Aroute: Integrated auto routing— Device generators and editing— Connectivity-driven layout & ECO

Interactive Data Management— ICstudio environment— Revision control & multi-site collaboration

Migration from Competing flows— Compatible Use models and UI— Design conversion

Design kits (TDKs): Enabling interactive design— TDK Automation

Functional Verification

Eldo, Eldo RFADMS

VerificationExtraction

Calibre DRC/LVSCalibre xRC

LayoutIC Station

AssemblyICassemble

GDS

InteractiveAnalysis

SchematicCapture

DA-IC

SimulationControl

ICanalystICstudio

Design & DataManagement

VerilogVHDL

Verilog-AMSVHDL-AMS

3rd PartySynthesis

P&R

RevisionControl

powered byCliosoft

DesignSync

InteractiveVerification

Schematic-drivenLayout

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Design Architect-ICUnified Design Capture Cockpit

Modern, productive schematic entry with rich feature set

Supports mixed-mode design— Schematic, VHDL, Verilog, SPICE, VHDL-

AMS, or Verilog-A

Special constructs for effective circuit modeling— Case frames, function blocks

Multiple power supply support

Integrated design checking

Integrated netlisting, simulation, and result viewing for:— Eldo, Eldo-RF, ADMS, ModelSim

Back annotation of simulation data— Parasitics, model selections, DCOP, transient

values

Interactive parasitic debug with visual cross-probing

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DA-IC’s Built-in Simulation EnvironmentRapid Setup & Control of Simulation inside DA-IC

Drive analogue, mixed signal, & RF simulations from single cockpitIntegrated netlisting, simulation, and cross-probing of waveformsMulti-run capabilities: sweep, corner case, Monte Carlo setupBack annotation— Parasitics (DSPF) — Digital delays (SDF) — Simulation data: model selections, DCOP,

transient valuesRun

View WavesCross Probe

End Sim

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DA-IC’s Built-in Simulation EnvironmentEfficiently Verify Mixed-signal designs with ADMS

Registration of HDL modelsColors-coded signal typesAutomated insertion of A2D/D2A elementsHierarchical model selectorEZwave cross-probing

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AgendaInteractive Debug of Errors Due to Parasitics

Interactive Design & Analysis— ICanalyst: Interactive Simulation— DSPF Flow: Parasitic debug— Case frames & Function blocks

Interactive Layout & Verification— In-line Calibre DRC/LVS— Real-time DRC with Calibre rules— IRoute: Interactive routing— Aroute: Integrated auto routing— Device generators and editing— Connectivity-driven layout & ECO

Interactive Data Management— ICstudio environment— Revision control & multi-site collaboration

Migration from Competing flows— Compatible Use models and UI— Design conversion

Design kits (TDKs): Enabling interactive design— TDK Automation

Functional Verification

Eldo, Eldo RFADMS

VerificationExtraction

Calibre DRC/LVSCalibre xRC

LayoutIC Station

AssemblyICassemble

GDS

InteractiveAnalysis

SchematicCapture

DA-IC

SimulationControl

ICanalystICstudio

Design & DataManagement

VerilogVHDL

Verilog-AMSVHDL-AMS

3rd PartySynthesis

P&R

RevisionControl

powered byCliosoft

DesignSync

InteractiveVerification

Schematic-drivenLayout

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Challenge: Post-layout Verification Critical to Si-Success Solution: DSPF Flow – Interactively Isolate Problems

Parasitic browsingSelective net expansionX-probe between schematic, layout, waveform

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AgendaDesign Re-Use in DA-IC

Interactive Design & Analysis— ICanalyst: Interactive Simulation— DSPF Flow: Parasitic debug— Case frames & Function blocks

Interactive Layout & Verification— In-line Calibre DRC/LVS— Real-time DRC with Calibre rules— IRoute: Interactive routing— Aroute: Integrated auto routing— Device generators and editing— Connectivity-driven layout & ECO

Interactive Data Management— ICstudio environment— Revision control & multi-site collaboration

Migration from Competing flows— Compatible Use models and UI— Design conversion

Design kits (TDKs): Enabling interactive design— TDK Automation

Functional Verification

Eldo, Eldo RFADMS

VerificationExtraction

Calibre DRC/LVSCalibre xRC

LayoutIC Station

AssemblyICassemble

GDS

InteractiveAnalysis

SchematicCapture

DA-IC

SimulationControl

ICanalystICstudio

Design & DataManagement

VerilogVHDL

Verilog-AMSVHDL-AMS

3rd PartySynthesis

P&R

RevisionControl

powered byCliosoft

DesignSync

InteractiveVerification

Schematic-drivenLayout

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Challenge: Schematic Re-use Solution: Case Frames

Use Case Frames in DA-IC to model:— Pre-Layout parasitics— Off-Chip components— Testbench components— Bondwires

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Challenge: Accelerate Design EntrySolution: Function Blocks to Model Repeated Circuits

Full adder schematic

8-bit adder schematic

8-bit adder function block

Single-bit adder schematic

8-bit adder schematic

8-bit adder function block

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Agenda

Mentor IC-Flow— Frontend Overview

MunEDA Wicked Overview

MunEDA Wicked Integration to DA-IC

On Semi customer reference cases using WiCkeD/DA-IC integration

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MunEDA WiCkeD* – Focus: Analysis & Optimization of Circuit Designs

Software tool suit for circuit designersAnalog & mixed-signal transistor levelFull custom digital & library cells

Numerous analysis & optimization modules

* WiCkeD: Worst Case Distances

Improve and optimize Circuit design feasibility & functionalityCircuit design performances & robustnessCircuit design yield & reliability

Seamlessly integrated into Cadence-, Mentor-, Synopsys-based design environmentsNetlist-based standalone & customer SPICE environmentsIndustrial standard SPICE support e.g. Spectre, ELDO, HSpice

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MunEDA DFM-DFY Modules & Features

• MunEDA offers a tool suite for circuit analysis, diagnosis, modeling & optimization • All tools are well integrated with industrial standard and in-house design

environments and simulators

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Analysis and Sizing of AMS Circuits in Designflow with MunEDA WiCkeD Tools

Microchip-Development

Customer Specification LayoutDesign

time to market

Trash

SalesMicrochip-Production

TestProcess Higher Yield !

Design of AMS & Library Components

Topology-design Simulation

MunEDA: Analysis, Modeling and Optimization of Analog, Mixed-Signal and Digital Circuits & Libraries

Faster by 10-100X!!!

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MunEDA Tools Application Flow

Circuit Schematic or Netlist DFM & DFY

Analysis and Optimization

Modules & FlowSized & Optimized Circuit Schematic

or Netlist

Nominal or Statistical Process

Data (PDK)

Analyze & Optimize for Performance, Robustness & Yield

Input Output

Layout

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Agenda

Mentor IC-Flow— Frontend Overview

MunEDA Wicked Overview

MunEDA Wicked Integration to DA-IC

On Semi customer reference cases using WiCkeD/DA-IC integration

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WiCkeD – Eldo Integration Overview

Three MunEDA WiCkeD flows supporting Mentor Graphics Eldo simulator:Standalone—WiCkeD is launched from command line—without cross probing to schematic— result: back-annotated Eldo netlist

Mentor Graphics DA-IC (available in WiCkeD 6) —WiCkeD is launched from DA-IC (both in ICStudio and classic mode) — cross probing to DA-IC schematic— result: back-annotated DA-IC schematic

Cadence Virtuoso-ADE—WiCkeD is launched from ADE— cross probing to Virtuoso schematic— result: back-annotated Virtuoso schematic

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WiCkeD Integration Into DA-IC Overview

Mentor Graphics DA-IC integration supports:

Launch WiCkeD from a DA-IC menu entry

Eldo netlist automatically passed to WiCkeD

Cross probing between DA-IC schematic and WiCkeD:—Selection of instances—Highlighting of instances

Back-annotation to DA-IC schematic of:—design parameters like width and length—operating parameters like supply voltage and temperature

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WiCkeD integration into DA-IC

Launch WiCkeD from a DA-IC menu entry

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WiCkeD integration into DA-IC

Cross probing between DA-IC schematic and WiCkeD— Selection of instances

—Highlighting of instances

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WiCkeD integration into DA-IC

Back-annotation to DA-IC schematic of:— design parameters like width and length— operating parameters like supply voltage and temperature

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Agenda

Mentor IC-Flow— Frontend Overview

MunEDA Wicked Overview

MunEDA Wicked Integration to DA-IC

On Semi customer reference cases using WiCkeD/DA-IC integration

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ON Semiconductor®

Optimization of Oscillator Design and Error Amplifier with MunEDA’s WiCkeD

David J. CretellaSenior Design Engineer

Automotive Business Unit, ON Semiconductor, East Greenwich, RI

MTF08-BostonMunEDA Technical Forum 2008 Boston

Tuesday, June 17th 2008Andover, MA

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Agenda

• Design Optimization Project 1: Reusing an Oscillator Design (in PS5) By Optimizing using MunEDA’s WiCkeD

• Design Optimization Project 2: Optimizing a Voltage Error Amplifier Using MunEDA’s WiCkeD

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Reusing an Oscillator Design (in PS5)By Optimizing using MunEDA’s WiCkeD

Dave Cretella, Naveen Lokam (ON Semiconductor)

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Executive Summary

• Circuit:– Sawtooth oscillator in PS5 process– Previously designed for f = 500 kHz

• Goal:– Architecture re-use for target frequency of 2 MHz– Minimize temperature influence on frequency and duty

cycle• Outcome:

– Using WiCkeD (MunEDA’s tool suite for optimization and analysis), a useful sizing is found in under 2 hrs

– Expected effort for manual transistor tuning: 1 week31

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Summary

• Fast design re-use with WiCkeD with Eldo in DA-IC for a 2MHz oscillator in PS5

• Challenge: balance comparators to minimize temperature dependency of duty cycle and frequency

• Optimization with WiCkeD is particularly useful to speed up iterative fine-tuning from 1 week (manually) to 2 hours (WiCkeD)

• Using WiCkeD, all specs fulfilled. Frequency vs. temperature spread reduced by 75%.

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Optimizing a Voltage Error AmplifierUsing MunEDA’s WiCkeD

ON Semiconductor, East Greenwich

WiCkeD Design Project in PS5

Naveen LokamDavid CretellaMarie CrowleySesha AkkinapallyMike Tedeschi

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David CretellaNaveen LokamMarie CrowleySesha AkkinapallyMike Tedeschi

Volker GloeckelTom VogelsAndreas Ripp

Rich DesMaraisAndy Nydell

Project Team

Design:DST:

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Executive Summary

• Circuit: Voltage Error Amplifier (PS5 process) • Goal:

– Meet aggressive specifications for Gain, Bandwidth, Phase margin, Gain margin.

– Test drive (phase 1) integration of WiCkeD with Eldo and DA-IC / IC Studio in ON Semi environment.

• Outcome:– Using WiCkeD, a useful sizing is found in under 2 days– Expected effort for manual transistor tuning: 2 weeks– WiCkeD enables specification-driven design reuse.

WiCkeD is MunEDA’s tool suite for optimization and analysis

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• Circuit optimization results meet expectations from designer:– Found best trade-off among all four performance goals– Used minimal changes of design sizes to meet goals

• Increased quality and efficiency of design phase:– Automatic and interactive circuit sizing facilitates specification-

driven approach– Architecture re-use and exploration of alternatives becomes

reasonable and accessible for designers

• Next steps:– Analyze process and mismatch sensitivities (once mismatch

models are part of setup for PS5)

Summary

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Initials Presentation Subject Month 2005/200637