MunEDA Tools and R&D Roadmap
Transcript of MunEDA Tools and R&D Roadmap
MunEDA WiCkeD 6Integration into Design Architect ICOktober 2008
Christian PargSenior Application EngineerMENTOR GRAPHICS Central Europe
Dr. Volker GlöckelSenior Technical Account ManagerMunEDA GmbH
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Agenda
Mentor IC-Flow— Frontend Overview
MunEDA WiCkeD Overview
MunEDA WiCkeD Integration to DA-IC
On Semi customer reference cases using WiCkeD/DA-IC integration
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Mentor Graphics Custom IC-FlowInteractive Design & Analysis— Interactive Simulation control— DSPF Flow: Parasitic debug— Case frames & Function blocks
Interactive Layout & Verification— In-line Calibre DRC/LVS— Real-time DRC with Calibre rules— IRoute: Interactive routing— Aroute: Integrated auto routing— Device generators and editing— Connectivity-driven layout & ECO
Interactive Data Management— ICstudio environment— Revision control & multi-site collaboration
Migration from Competing flows— Compatible Use models and UI— Design conversion
Design kits (TDKs): Enabling interactive design— TDK Automation
Functional Verification
Eldo, Eldo RFADMS
VerificationExtraction
Calibre DRC/LVSCalibre xRC
LayoutIC Station
AssemblyICassemble
GDS
InteractiveAnalysis
SchematicCapture
DA-IC
SimulationControl
DA-IC SimICstudio
Design & DataManagement
VerilogVHDL
Verilog-AMSVHDL-AMS
3rd PartySynthesis
P&R
RevisionControl
powered byCliosoft
DesignSync
InteractiveVerification
Schematic-drivenLayout
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AgendaInteractive Simulation Control
Interactive Design & Analysis— Interactive Simulation control— DSPF Flow: Parasitic debug— Case frames & Function blocks
Interactive Layout & Verification— In-line Calibre DRC/LVS— Real-time DRC with Calibre rules— IRoute: Interactive routing— Aroute: Integrated auto routing— Device generators and editing— Connectivity-driven layout & ECO
Interactive Data Management— ICstudio environment— Revision control & multi-site collaboration
Migration from Competing flows— Compatible Use models and UI— Design conversion
Design kits (TDKs): Enabling interactive design— TDK Automation
Functional Verification
Eldo, Eldo RFADMS
VerificationExtraction
Calibre DRC/LVSCalibre xRC
LayoutIC Station
AssemblyICassemble
GDS
InteractiveAnalysis
SchematicCapture
DA-IC
SimulationControl
ICanalystICstudio
Design & DataManagement
VerilogVHDL
Verilog-AMSVHDL-AMS
3rd PartySynthesis
P&R
RevisionControl
powered byCliosoft
DesignSync
InteractiveVerification
Schematic-drivenLayout
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Design Architect-ICUnified Design Capture Cockpit
Modern, productive schematic entry with rich feature set
Supports mixed-mode design— Schematic, VHDL, Verilog, SPICE, VHDL-
AMS, or Verilog-A
Special constructs for effective circuit modeling— Case frames, function blocks
Multiple power supply support
Integrated design checking
Integrated netlisting, simulation, and result viewing for:— Eldo, Eldo-RF, ADMS, ModelSim
Back annotation of simulation data— Parasitics, model selections, DCOP, transient
values
Interactive parasitic debug with visual cross-probing
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DA-IC’s Built-in Simulation EnvironmentRapid Setup & Control of Simulation inside DA-IC
Drive analogue, mixed signal, & RF simulations from single cockpitIntegrated netlisting, simulation, and cross-probing of waveformsMulti-run capabilities: sweep, corner case, Monte Carlo setupBack annotation— Parasitics (DSPF) — Digital delays (SDF) — Simulation data: model selections, DCOP,
transient valuesRun
View WavesCross Probe
End Sim
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DA-IC’s Built-in Simulation EnvironmentEfficiently Verify Mixed-signal designs with ADMS
Registration of HDL modelsColors-coded signal typesAutomated insertion of A2D/D2A elementsHierarchical model selectorEZwave cross-probing
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AgendaInteractive Debug of Errors Due to Parasitics
Interactive Design & Analysis— ICanalyst: Interactive Simulation— DSPF Flow: Parasitic debug— Case frames & Function blocks
Interactive Layout & Verification— In-line Calibre DRC/LVS— Real-time DRC with Calibre rules— IRoute: Interactive routing— Aroute: Integrated auto routing— Device generators and editing— Connectivity-driven layout & ECO
Interactive Data Management— ICstudio environment— Revision control & multi-site collaboration
Migration from Competing flows— Compatible Use models and UI— Design conversion
Design kits (TDKs): Enabling interactive design— TDK Automation
Functional Verification
Eldo, Eldo RFADMS
VerificationExtraction
Calibre DRC/LVSCalibre xRC
LayoutIC Station
AssemblyICassemble
GDS
InteractiveAnalysis
SchematicCapture
DA-IC
SimulationControl
ICanalystICstudio
Design & DataManagement
VerilogVHDL
Verilog-AMSVHDL-AMS
3rd PartySynthesis
P&R
RevisionControl
powered byCliosoft
DesignSync
InteractiveVerification
Schematic-drivenLayout
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Challenge: Post-layout Verification Critical to Si-Success Solution: DSPF Flow – Interactively Isolate Problems
Parasitic browsingSelective net expansionX-probe between schematic, layout, waveform
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AgendaDesign Re-Use in DA-IC
Interactive Design & Analysis— ICanalyst: Interactive Simulation— DSPF Flow: Parasitic debug— Case frames & Function blocks
Interactive Layout & Verification— In-line Calibre DRC/LVS— Real-time DRC with Calibre rules— IRoute: Interactive routing— Aroute: Integrated auto routing— Device generators and editing— Connectivity-driven layout & ECO
Interactive Data Management— ICstudio environment— Revision control & multi-site collaboration
Migration from Competing flows— Compatible Use models and UI— Design conversion
Design kits (TDKs): Enabling interactive design— TDK Automation
Functional Verification
Eldo, Eldo RFADMS
VerificationExtraction
Calibre DRC/LVSCalibre xRC
LayoutIC Station
AssemblyICassemble
GDS
InteractiveAnalysis
SchematicCapture
DA-IC
SimulationControl
ICanalystICstudio
Design & DataManagement
VerilogVHDL
Verilog-AMSVHDL-AMS
3rd PartySynthesis
P&R
RevisionControl
powered byCliosoft
DesignSync
InteractiveVerification
Schematic-drivenLayout
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Challenge: Schematic Re-use Solution: Case Frames
Use Case Frames in DA-IC to model:— Pre-Layout parasitics— Off-Chip components— Testbench components— Bondwires
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Challenge: Accelerate Design EntrySolution: Function Blocks to Model Repeated Circuits
Full adder schematic
8-bit adder schematic
8-bit adder function block
Single-bit adder schematic
8-bit adder schematic
8-bit adder function block
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Agenda
Mentor IC-Flow— Frontend Overview
MunEDA Wicked Overview
MunEDA Wicked Integration to DA-IC
On Semi customer reference cases using WiCkeD/DA-IC integration
MunEDA WiCkeD* – Focus: Analysis & Optimization of Circuit Designs
Software tool suit for circuit designersAnalog & mixed-signal transistor levelFull custom digital & library cells
Numerous analysis & optimization modules
* WiCkeD: Worst Case Distances
Improve and optimize Circuit design feasibility & functionalityCircuit design performances & robustnessCircuit design yield & reliability
Seamlessly integrated into Cadence-, Mentor-, Synopsys-based design environmentsNetlist-based standalone & customer SPICE environmentsIndustrial standard SPICE support e.g. Spectre, ELDO, HSpice
MunEDA DFM-DFY Modules & Features
• MunEDA offers a tool suite for circuit analysis, diagnosis, modeling & optimization • All tools are well integrated with industrial standard and in-house design
environments and simulators
Analysis and Sizing of AMS Circuits in Designflow with MunEDA WiCkeD Tools
Microchip-Development
Customer Specification LayoutDesign
time to market
Trash
SalesMicrochip-Production
TestProcess Higher Yield !
Design of AMS & Library Components
Topology-design Simulation
MunEDA: Analysis, Modeling and Optimization of Analog, Mixed-Signal and Digital Circuits & Libraries
Faster by 10-100X!!!
MunEDA Tools Application Flow
Circuit Schematic or Netlist DFM & DFY
Analysis and Optimization
Modules & FlowSized & Optimized Circuit Schematic
or Netlist
Nominal or Statistical Process
Data (PDK)
Analyze & Optimize for Performance, Robustness & Yield
Input Output
Layout
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Agenda
Mentor IC-Flow— Frontend Overview
MunEDA Wicked Overview
MunEDA Wicked Integration to DA-IC
On Semi customer reference cases using WiCkeD/DA-IC integration
WiCkeD – Eldo Integration Overview
Three MunEDA WiCkeD flows supporting Mentor Graphics Eldo simulator:Standalone—WiCkeD is launched from command line—without cross probing to schematic— result: back-annotated Eldo netlist
Mentor Graphics DA-IC (available in WiCkeD 6) —WiCkeD is launched from DA-IC (both in ICStudio and classic mode) — cross probing to DA-IC schematic— result: back-annotated DA-IC schematic
Cadence Virtuoso-ADE—WiCkeD is launched from ADE— cross probing to Virtuoso schematic— result: back-annotated Virtuoso schematic
WiCkeD Integration Into DA-IC Overview
Mentor Graphics DA-IC integration supports:
Launch WiCkeD from a DA-IC menu entry
Eldo netlist automatically passed to WiCkeD
Cross probing between DA-IC schematic and WiCkeD:—Selection of instances—Highlighting of instances
Back-annotation to DA-IC schematic of:—design parameters like width and length—operating parameters like supply voltage and temperature
WiCkeD integration into DA-IC
Launch WiCkeD from a DA-IC menu entry
WiCkeD integration into DA-IC
Cross probing between DA-IC schematic and WiCkeD— Selection of instances
—Highlighting of instances
WiCkeD integration into DA-IC
Back-annotation to DA-IC schematic of:— design parameters like width and length— operating parameters like supply voltage and temperature
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Agenda
Mentor IC-Flow— Frontend Overview
MunEDA Wicked Overview
MunEDA Wicked Integration to DA-IC
On Semi customer reference cases using WiCkeD/DA-IC integration
ON Semiconductor®
Optimization of Oscillator Design and Error Amplifier with MunEDA’s WiCkeD
David J. CretellaSenior Design Engineer
Automotive Business Unit, ON Semiconductor, East Greenwich, RI
MTF08-BostonMunEDA Technical Forum 2008 Boston
Tuesday, June 17th 2008Andover, MA
Agenda
• Design Optimization Project 1: Reusing an Oscillator Design (in PS5) By Optimizing using MunEDA’s WiCkeD
• Design Optimization Project 2: Optimizing a Voltage Error Amplifier Using MunEDA’s WiCkeD
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Reusing an Oscillator Design (in PS5)By Optimizing using MunEDA’s WiCkeD
Dave Cretella, Naveen Lokam (ON Semiconductor)
Executive Summary
• Circuit:– Sawtooth oscillator in PS5 process– Previously designed for f = 500 kHz
• Goal:– Architecture re-use for target frequency of 2 MHz– Minimize temperature influence on frequency and duty
cycle• Outcome:
– Using WiCkeD (MunEDA’s tool suite for optimization and analysis), a useful sizing is found in under 2 hrs
– Expected effort for manual transistor tuning: 1 week31
Summary
• Fast design re-use with WiCkeD with Eldo in DA-IC for a 2MHz oscillator in PS5
• Challenge: balance comparators to minimize temperature dependency of duty cycle and frequency
• Optimization with WiCkeD is particularly useful to speed up iterative fine-tuning from 1 week (manually) to 2 hours (WiCkeD)
• Using WiCkeD, all specs fulfilled. Frequency vs. temperature spread reduced by 75%.
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Optimizing a Voltage Error AmplifierUsing MunEDA’s WiCkeD
ON Semiconductor, East Greenwich
WiCkeD Design Project in PS5
Naveen LokamDavid CretellaMarie CrowleySesha AkkinapallyMike Tedeschi
David CretellaNaveen LokamMarie CrowleySesha AkkinapallyMike Tedeschi
Volker GloeckelTom VogelsAndreas Ripp
Rich DesMaraisAndy Nydell
Project Team
Design:DST:
Executive Summary
• Circuit: Voltage Error Amplifier (PS5 process) • Goal:
– Meet aggressive specifications for Gain, Bandwidth, Phase margin, Gain margin.
– Test drive (phase 1) integration of WiCkeD with Eldo and DA-IC / IC Studio in ON Semi environment.
• Outcome:– Using WiCkeD, a useful sizing is found in under 2 days– Expected effort for manual transistor tuning: 2 weeks– WiCkeD enables specification-driven design reuse.
WiCkeD is MunEDA’s tool suite for optimization and analysis
• Circuit optimization results meet expectations from designer:– Found best trade-off among all four performance goals– Used minimal changes of design sizes to meet goals
• Increased quality and efficiency of design phase:– Automatic and interactive circuit sizing facilitates specification-
driven approach– Architecture re-use and exploration of alternatives becomes
reasonable and accessible for designers
• Next steps:– Analyze process and mismatch sensitivities (once mismatch
models are part of setup for PS5)
Summary
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