IDENTIFICATION OF GENETIC VARIANTS RESPONSIBLE FOR BIOTECHNOLOGICALLY

IMPORTANT TRAITS AND THE DESIGN OF NEW GENERATION INDUSTRIAL YEAST STRAINS

Mojca Brložnik1, Tomaž Curk2, Klaus Natter3, Uroš Petrovič1

1 Jožef Stefan Institute, Ljubljana, Slovenia.2 University of Ljubljana, Slovenia.

3 University of Graz, Austria.

Fat parentSkinny parent

X

Tiling microarray

Identify the relevant QTLs (SNVs) in pooled strains. Sequencing

Segregants

Average populationExtreme population

QTL#1Extreme population Average population

position position

Fat parent

Skinny parent

Extreme population Average population

QTL#1Tiling microarray

Sequencing

Candidate causative gene

position position

Fat parent

Candidate causative genes:

Single

swaps

Double swaps

Triple swaps

Quadruple swap

CONCLUSIONS

RANDOM MUTAGENESIS

Hundreds - thousands mutants

Robust strain, low productivity

Non-robust strain, high productivity

Identification ofproductivity-related mutations

ALLELESWAPS

Robust strain, high productivity

NEW GENERATION INDUSTRIAL MICROORGANISMS

ACKNOWLEDGEMENTS

Tomaž Curk

Bioinformatics LaboratoryFaculty of Computer and

Information Science University of Ljubljana

Slovenia

Klaus Natter

Yeast Genetics and Molecular Biology Group

Institute of Molecular Biosciences

University of GrazAustria