Mixed-Signal ASIC Design for Space Communications
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Transcript of Mixed-Signal ASIC Design for Space Communications
Slide 1 of 34ESA AMICSA 2006
Mixed-Signal ASIC Design for Space Communications
Presented by Dr. Rajan Bedi
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Mixed-Signal ASIC Design for Space Communications
UK EXPORT CONTROL SYSTEM EQUIPMENT & COMPONENTS RATING: 3A001a1a, 3A001a2, 3A001a5a1, 3A001a5a2, 3A001a5a3, 3A001a5a4, 3A001a5b, 3A101a, 3C001a, 3C001b, 4A002b2, 4A002b1 & 5E001c1.
UK EXPORT CONTROL TECHNOLOGY RATING: 3E001, 4E001 5E001b1 &
5E001c2e. Rated By : Rajan Bedi with reference to UK Export Control Lists (version
INTR_A12. DOC 13 August 2003) which contains the following caveat: “The control texts reproduced in this guide are for information purposes only and have no force in law. Please note that where legal advice is required, exporters should make their own arrangements”.
Export licence : Not required for EU countries. Community General Export authorisation EU001 is valid for export to : Australia, Canada, Japan, New Zealand, Norway, Switzerland & USA.
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Presentation Overview
Introduction & Motivation
Research into mobile payload ADCs
Research into broadband payload ADCs
Research into space-grade DACs
Mixed-Signal Processing
Conclusion
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Introduction
Increasing amounts of analogue circuitry and digital logic are now being integrated on die and flown.
The availability of:
– Low-power, high-performing BiCMOS technologies, fT (peak
cut-off frequency) ~ 300 GHz!
– The inherent total-dose tolerance of the SiGe HBT.
– The addition of a SOI layer to SiGe BiCMOS.
– The ability to individually size of NPNs and PNPs with trench
isolation.
– Integrated EDA tools and common design & verification flows.
All of these offer the potential to advance mixed-signal microelectronics for space applications.
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Motivation
The benefits of integrating analogue circuitry with digital logic include:
Higher performance Lower power consumption Less mass Reduced costs Improved reliability Greater levels of reusability Enhanced system testing and quality
All of these benefits contribute to the spirit of “Faster, Better, Cheaper”!
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Motivation
Telecommunication satellites with on-board digital processors require ADCs at the receiver to digitize the IF/baseband carrier information.
Future mobile missions will be required to digitize information bandwidths around 50 MHz – this will necessitate baseband sampling at a rate greater than 100 MSPS.
Future broadband missions will be required to digitize information bandwidths around 500 MHz – this will necessitate baseband sampling at a rate greater than 1 GSPS.
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Motivation
This performance will only be delivered by advances in mixed-signal processing.
Experience has shown that accessing the latest deep sub-micron technologies is difficult due to the low volumes required by space companies.
When the major semiconductor vendors are willing to develop hardware, the NRE costs are exorbitant.
Moreover, the suitability of the fabrication technology for space flight first needs to be assessed, with vendors often adopting a low-risk approach to radiation testing and qualification.
As a satellite manufacturer, how do we support the development of future digital payloads for our customers?
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Motivation
This variation in the range of sampling frequencies greatly impacts the micro-architecture, the circuit design, the resolution and power consumption of mixed-signal converters that can be considered for use on satellite payloads.
This range of payload types, limited power budget, restricted fabrication options and operation in a harsh environment, all combine to make ADC/DAC design for space communications extremely challenging.
This objective of this presentation is to share with vendors current research on low-power, high-performance, space-grade converters for use with future mobile and broadband payloads.
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ADC Design
The design of low-power ADCs capable of sampling around 150 MSPS differs from those required to sample above 1 GSPS.
The development of an ADC involves a number of trade-offs, e.g. as the required sampling frequency or dynamic range increase, so does the complexity, size, weight, cost and power dissipation of devices.
As a general rule, effective resolution decreases by one bit for every doubling of the sampling frequency.
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Low-Power Narrowband ADC
For low-power ADCs, a sampling frequency of 150 MSPS is achieved by implementing micro-architectures that combine elements of the successive approximation and flash techniques with pipeline-type signal processing.
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Pipelined ADC Micro-Architecture
First stage of the pipeline performs a coarse quantisation on the input while subsequent stages are concurrently processing previously acquired input samples.
STAGE 0 STAGE 1 STAGE N-1 STAGE N
LATCH LATCH LATCH
…
…
+
+
+ +
++
ANALOGUE PIPELINE
DIGITAL PIPELINE
INPUT
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Pipelined ADC Micro-Architecture
Each stage comprises a S&H, low-resolution ADC and DAC and a subtractor.
--
DACADC
SAMPLE & HOLD
A+VIN
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Pipelined ADC Micro-Architecture
High-throughput, concurrent design.
For pipelined ADCs, power dissipation can be minimised through the appropriate choice of per-stage resolution and selection of suitable op-amp architectures.
Thermal noise, comparator offsets, sample-and-hold offsets, gain errors and non-uniform levels within the interstage DACs all affect the performance of pipelined ADCs.
Simulations and circuit design are continuing that investigate trade-offs between thermal noise, speed, linearity and power dissipation.
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Pipelined ADC Micro-Architecture
For low power operation, CMOS converters are preferred as digital consumption scales with sampling frequency.
Bipolar converters developed to operate at a particular frequency but used at lower rate, will incur a fixed penalty and dissipate the same power as clocking at the higher frequency due to constant current structures.
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Pipelined ADC Micro-Architecture
The digital capability of CMOS easily allows the inclusion of error correction, calibration and other computational features to improve overall converter performance and accuracy.
Fabrication using deep submicron CMOS results in higher performance due to reductions in parasitics.
However, concomitant with the migration to smaller feature sizes, lower supply voltages make it more difficult to maintain input SNR – Continual technology scaling impacts ADCs!
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Low Power Broadband ADC
For low-power broadband ADCs, sampling frequencies above 1 GSPS are achieved by implementing interleaving micro-architectures or variations of Flash techniques:
· Folded Flash
· Folded & Interpolative Flash
· Pipelined, Folded & Interpolative Flash
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ESA AMICSA 2006
Folded Flash ADC
INPUT
COARSEADC
FOLDINGCIRCUIT
FINEADC
DIGITAL ADDER &CORRECTION CIRCUIT
DIGITAL OUTPUT WORD
Folding is a technique that reduces hardware while maintaining the one-step nature of a full Flash ADC.
An analogue pre-processing circuit generates a residue which is digitised to obtain the LSBs.
The MSBs are resolved using a coarse ADC that operates in parallel with the folding circuit.
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Folded Interpolative Flash ADC
Interpolation reduces the number of comparator preamplifiers at the input of a Flash converter.
Interpolation substantially reduces the input capacitance, power dissipation and area of flash converters, while preserving the one-step nature of a Flash architecture.
Simulations show that offset, gain and timing mismatches result in SNR degradation at high input frequencies.
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DAC Design
We have started investigating current-steering DAC micro-architectures with the goal of achieving low power with high speed and low distortion.
Traditionally current-steering DACs were fabricated using bipolar technology, however, the ability to generate matched CMOS current mirrors will result in lower power consumption.
A segmented architecture provides a good balance between performance vs. area and complexity.
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VLSI
To achieve the required performance and low power, silicon-based technologies are being targeted for fabrication.
CMOS converters are preferred as digital power dissipation scales with sampling frequency.
SOI CMOS typically offers 30 to 50% higher performance for the same power compared to bulk CMOS (30% less power at the speed).
SOI offers reduced cross-talk for mixed-signal design, immunity to latch-up, better tolerance of SEEs and the absence of radiation-induced leakage between devices.
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VLSI
BiCMOS processes combine faster, higher-current driving bipolar transistors with smaller, lower-power, high impedance CMOS devices.
This makes BiCMOS attractive for mixed-signal design.
The bipolar transistor can be either Si or SiGe.
For the same operating current, a SiGe HJT has higher speed, increased gain, lower RF noise and less 1/f noise compared to a Si BJT – ft ~ 300 GHz.
SiGe BiCMOS allows the integration of analog, digital and RF using existing CMOS foundries.
Currently investigating SOI and BiCMOS to minimise noise coupling through the wafer substrate.
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Space Microelectronics
Heavy-ion strikes can trigger latchup in CMOS and bipolar devices with the potential to damage a circuit permanently.
In ADC/DACs, a transient generated in the analogue part of a device can propagate into the digital section causing logic level shifts.
The migration to smaller geometries has helped CMOS transistors to become inherently more resistant to TID radiation as thinner gate oxide layers trap less positive charge.
Radiation hardening by design techniques are being used to mitigate the damage, functional upsets and data loss caused by radiation.
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Radiation Hardening By Design
The use of enclosed layout NMOS transistors.
The design of portions of a circuit using PMOS FETs only. As PMOS transistors are not prone to edge leakage, there is no need for annular layout.
Such structures are immune to latchup due to the absence of stray silicon-controlled rectifier structures.
Latchup can be avoided by completely enclosing NMOS and PMOS FETS using guard rings or through the addition of an epi layer.
Design-hardened versions of integrated circuits typically require more die space than their soft counterparts!
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Analogue Section of 12-bit SegmentedDAC Incorporating RHBD
63 Unary Current Sources 6 Binary Current Sources
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Radiation Hardening By Design
All NMOS transistors drawn as Enclosed Layout Transistors (Annular) – this makes them immune to edge leakage effects.
Guard rings isolate all n+ diffusions at different potentials.
Current sources are all PMOS.
Solely PMOS structures are immune to latch-up.
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PMOS Current Source – (LSB Binary)
W = 1.1 μmL = 0.8 μmM = 1
bias_P2
bias_P1
out
VDD
W = 1.1 μmL = 0.8 μmM = 1
ILSB
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PMOS Current Source – (Unary)
W = 1.1 μmL = 0.8 μmM = 64
bias_P2
bias_P1
out
VDD
W = 1.1 μmL = 0.8 μmM = 64
64 * ILSB
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Mixed Signal Processing
A number of signal processing techniques exist that potentially could ease the hardware implementation of the data converters:
– Complex Baseband Sampling
– RF/IF Bandpass Sampling
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Complex Baseband SamplingAnalogue Generation of I/Q Samples
i[n] – jq[n]x(t)x(t)
A/D
A/D
i[n]
q[n]
xi(t) i(t)
q(t) xq(t)-90°
sin ωct
Analogue Digital
Complex baseband sampling at a rate greater than the highest frequency component – allows access to lower sampling frequencies – lower power if using CMOS ADCs.
Difficult to match frequency response of both paths
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Complex Baseband SamplingDigital Generation of I/Q Samples
x(t)
Analogue Digital
A/D
i[n] i’[n]
q’[n] q[n]
sin ωct
cos ωct
Complex baseband sampling at a rate four times the highest frequency component.
Single ADC, no matching issues, simple mixing
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RF Bandpass Sampling of L-band User Uplink
Zone 1 2 3 4 23 24
Fs/270.25
Fs140.5
1.5 Fs210.7
2 Fs281 Frequency (MHz)
12 Fs1686
11.5 Fs1615.7
Band-pass AAF
Amp.
Bandpass sampling achieves digitisation and downconversion in a single operation, without the use of analogue mixers, local oscillators and image-reject filters.
Intentionally alias the RF information to baseband/IF.
The availability of wideband ADCs, e.g. bandwidths approaching 3 GHz, makes direct sampling of L/S-band RF carriers a real possibility.
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RF Bandpass Sampling
To realise bandpass sampling, the ADC must have the necessary analogue input bandwidth to process the highest frequency component within the input signal.
Low distortion and good linearity at this frequency are essential.
ADCs intended for undersampling applications are more sensitive to the amount of noise at the input than a traditional converter.
Board layout, decoupling considerations and minimising jitter on the sampling clock are critical.
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Conclusions
I have shared with you current investigations that research the development of low-power, high-performance, space-grade converters for use with future mobile and broadband payloads.
Satellite manufactures have intimate knowledge of payloads.
Different types of telecommunication satellites have unique mixed-signal requirements, e.g. sampling frequency, resolution, dynamic performance and power consumption.
Pipelined ADCs should be targeted for future mobile payloads
and folding, interpolative flash architectures for broadband processors.
Segmented, current-steering DACs should be targeted for future satellites.
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Conclusions
A re-usable design and verification flow and design trade-offs at the systems-level, the micro-architectural level, the circuit level and at a technology level combine to enable mission-specific, mixed-signal IP.