Mil-std-105e (Ansi_asq z1.4-2008)

8/20/2019 Mil-std-105e (Ansi_asq z1.4-2008)

1/77

NOT MEASUREMENT

SENSIUYE

h

MIL-STWI05E

10 MAY 1989

SUPERSEDING

MIL-STD-105D

29 APRIL 1963

MILITARY STANDARD

SAMPLING PROCEDURES AND TABLES

FOR INSPECTION BY ATTRIBUTES

AMSC

N/A

AREA Qcil

~~~ Approved for public reiesse; dktribution is Unlimfi


2/77

QL-” SI’D105E

DEPA~ W DEFENSE

Washbgmn, DC

20301

SAT*LDG P~

T I ND’ZABESFOR INSP=TI@JBYMTNBUES

1. Ttis

tilitarystandad

is

approved

for use

by all

Depsmmms

and

Jqencies

of - ~~~ of ~f-”

.

2.

Beneficial

~.ts Cemmm&tiom. additions,Wetions) and any

peeine.ntdatawhi~ may beef usein~this~ shouldbe

addressedto:

CnRInancier

Us.

Amy

AmamE Rem-a, Dwelopnent

and

‘+-king Ckmer

M-IN:

SK?R-BAC-WBM J. 6

Picatinnytisenal,NJ 07806-5000

by

usi..gthe

self-a=-essed&.andardizaton Dmmmt

m~

PrepSal

(DDFom 1426)~L-hq at the md of this

docmmt or letter.

ii


3/77

ms

MZL-S’IZ+1C5Z

mRE3m*”

providessawling proce&res and referwm tablesforuse in

on the pxobabiiis.icrecu.+mce 05

e%.ts when a sa~iesof-iots or bat~s are

produ~ ti a stableenvironmrt.

Thispublicationshouldbe-usedto guide the

user in the ~kpmnt

of an

inspee.ionStratw thatprovidesa co=. eff~ive qroach to attaining

cm-:idm~ in pro&t

user is warnedof the

w-.

~liance wi”thca racaual te-&%i~ reqJ

ats. The

assumedrisksrelativeto the *sem sanple size and

~ifications shouldnot contaknrequirement for use of specific

Q.z?s,

23Z

shxld “. y provideAQL’s or H?D’s as a -~rmem.

pkns fc= coxinuous,ra’hr than lot inspection,are contm M

iii


4/77

~L-.STD-lO5E

GmTmTs

Paragraph

1.

1.1

1.2

2.

2.1

3.

3.1

3.2

3.3

3.4

3.5

2.6

3.7

3.e

3.9

3.10

3.11

3.12

3.13

3.14

3.15

3.16

3.17

3.18

3.19

3.20

3.21

3.22

3.23

4.

4.1

4.2

4.3

4.4

4.4.1

4.4.2

4.4.3

SCOPE...............................................

-se

...........................................

*liation .......................................

~IxmPEurs- ...............................

W.

qplicable....................................

=INITIONS .........................................

Acq able Qdality Ievel WE) ....................

AverageOutgo ~Quality(lQ)....................

AveraoeOutqoingQualityWt (AOQIJ.............

Classificationof Defects.........................

CriticalDefect...................................

CriticalDefective................................

Defect............................................

D@eccive................. ........................

DefectsPer Ru@edUn its... ......................

~i~......

..................................

~aim by Attribxes

..........................

w&or Batdl......................................

Im or Batch Size.................................

Major Defect

......................................

Major Defective...................................

Minor Defect

.....................................

Minor Defeaive. ..................................

PercentDefective

.................................

~s Average

...................................

Sanple............................................

Sanple Size COde~tt=v ...........................

Salq?linglan

.....................................

unit of Procalct..................................

~mxm=’nm

Written~

................................

NmcVnfozmne ....................................

Fonmticm and

Itificatim

of ~ or =Cks. ..

...............................................

ML use

...0...........*..........................

Umkation ........ ...............................

choosingAQU .....................................

Page

1

1

1

1

1

1

2

2

2

2

2

2

2

3

3

3

3

3

3

3

3

3

3

4

4

4

4

4

4

4

4

4

5

5

5

5

5

.

iv


5/77

mL-sm-lo5E

CcNTmrs - Conttiued.

Paragraph

~B~

4.5.1

4.5.2

4.5.3

4.6

4.7

4.7.1

4.7.2

4.7.3

4.7.4

4.8

4.9

4.9.1

4.9.2

4.9.3

4.9.4

4.10

4.lC.1

4.lC.1.A

4.1(?.1.2

4.10.1.3

4.10.1.4

4.10.2

4.11

4.12

4.12.1

4.12.2

Sarrpling........................................

[email protected]

..........................

The of Sanpling

.................. ..............

Double or MQtiple Sampling......................

~on P~

.................... .......

WitdlirlgP~

.............................

Normalto Tightened

......0......................

Tight- to Normal

.....0......................

Normalto ~

..............*.....**...**...

Rduced to Normal

................................

Disconthtion of~on... .................

SanplingPlans...................................

~ion Wvel

.................0...............

Co& utters

.....................................

~aining San@ing Plan

..........................

TYF= of sapling Pkns

..........................

Determinationof~ability. ..................

P~Defective~ion. ....................

Single Sanql@ Plan.............................

Double Sa@ing Plan

.............................

FhltipleSanpling.lan..........

*..............

~ p~

forRedu*IrqeCtion .........

DefectsPer

?lundmdt?nits~ion ............

Idniting@ality Protection.....................

~s .................*.........................

~t@~merkic ~ ..................

A~ge SanpleSizeComes.......................

5. TABES

.............*...*..............*.............

Table

I.

II-A.

II-B.

II-C.

III-A.

III-B.

III-C.

Sa@e Size CodaMitters........................

SingleSan@ing Plansfor Normal-

~im Naster table)......................

SingleSmpliq Plms for Tightewd

~i~ ~=t~le) o..o-oooo==oo.=.e....

SingleSapling

Plans

for~

~ia (Mas@rtable)......................

DoubleSamplingPlans forNormal

~i~ -a~le).. oo......o.BOO.......

DcxbleSapling

Plans for

Tight-

~m ~er=e) ......................

DoubleSamplimgP1.ansforReduced

~im (Mastertable)......................

Page

5

5

5:

5

:

6

6

6

6

“7

7

7

7

7

8

8

8

8

8

8

8

9

9

9

9

9

11

13

14

15

16

17

18

19

v


6/77

MIL-STW105E

mt’n’mrs-

Conthued.

Table

IV-A.

IV-B.

TV-c.

V-A.

V-B.

%3-A.

V3-3.

XI-A.

VII-B.

~*~1-

IX.

Mltiple Sa@ing Plans for Norml

Inspectim M3ster-le) ......................

M.dtipleSanplingPlans for Tightened

~im (MastertaMe) ......................

Mdtiple SamplingPlans for ReduOed

Inspection(Mastertable)......................

AverageOutgoing

uty IAmit F~s for

lwml~on (Sin@e Zq) .....-...o..

~ge Outgo* QualityLimit

Fa=ors for

TightenedIMpeCtiOn (S=le ~1~).:...-..”

uting Quality(h

Perumt Def-iue) for

Wch a Pa =

10% (forNomal Inspemion,

S~le Saxrpling)...................-..-...-*o”

LimitingQuality(inDefectsper ~

Unks) for which the Pa = 10% (forNozmal

Inspection,SingleSanplhg).-..---------------

Unliziq Quality (inP~t mfecti=) fo~

khid. “thePa = 5 (forNom@

~ionl

SingleSawling)......................

..........

LimitingQuality(fiDefectsper Hmdma

Units)for which the Pa = 5%

(f= W*

~m, Siwle S=@@

....*..............

Li,mitNmbersfor ~ Inspection............

AuerageSampleSize Cumes for DDuble and

FmltipleS.mpliq .............-...--.-......-.c-

~ltig pl= and cparatirq~amic

Cumes (andData) for:

X-A.

San@e Size~ktter A........................

X-3 .

Sanple Size~Utter B.........................

x-c. SanpleSizeMkter C..........e00-00o.......

X-D. San@e SizeCo& LetterD........................

X-E. SanpleSize~Utter E........................

X-F.

San@e SizeMletter F........................

x-G .

SanpleSizeMUtter G...............--..-..”-

X-H. ~le Size@ckletter H........................

X-J. qksM-~ J............*..”””””.”.”

X-K. SaupleSizeMIetter K.......-----------------

X-L.

~le S~M~ L........................

x-M.

SanpleSize M~M ...........e............

X-N. San@eSizeM E~N ........................

x-P.

Sal@esizeM wtterP . . . . . . . . . . . . . . . ..”....”.

x-Q.

~le S~Mk= Q.......*”+”*.==.*”+”*..=

X-R.

~le S@ Mk=R ..................=””~””

Page

20

22

24

26

27

28

29

33

31

32 “

33

34

36

38

40

42

44

46

48

50

52

54

56

58

6

62

64

vi


7/77

x-s.

Paragraph

6

6.1

6.2

6.3

mL-sl’wlo5E

,

CCN’TS - Continued.

Page

~~e size~ ~tt~v S

........................

66

........*..............................

. . . .

v

Intf2nckci

use...................................

67

Subject’I’em (keyuofi) tist~ ................” 67

~fr~P~im Issw . . . . . . . . . . . . . . . . . . . . 67

mlmsAL. .............................

68


8/77


9/77

F2L-S’ID-105S

1.

~~~

1.2 Pqse.

This ~li=tim establisheslot or bat~ sapling plans and

proceduresfor ~ion by attributes.

‘1’nisubli=tion shallnot & irfter-

p.retedto superm3e or confli= with any amtraCtti ~

s.

m words

“awqX”,

“a~”, “acceptable”*etc,

referonly

to the contractor’s use

of

the sanplingpkms Writ- in this

~anddonotinplyana~ W

-theGove&mmn

t to acceptany prcdom. Det

erfninationf aqability by the

Gwen ‘:=% shallk as desm~ in contractual~ts.

me Sarfplinglans

*sdhd in Ws standad m

awli-le to U’s of .01pe~t or ~~ and

are‘the.refre not suitablefor ++licationswherequality1-1s

;az.sper millionrange m be realiz05.

in

the defemive

are applicable,

a.

b.

c.

d.

e.

f.

9.

h.

ElrIctems.

Cmponents

Qerations

Materialsin process.

Su@ies in storage.

Maintenance~ations.

Data

or records.

Mmbistrative

~-

Theseplans are intendedprimarilyto be used fora continuingseries

of

lots

0:

batches.

The plans may alsobe used for the inspectionof isolatedlots or

Mches, W., in MS latter=, m = K =i~ to ~t ~ ~m

characteristic

mrves to f ind a plan whichwill yieldthe desiredprotectim

(see4.11).

2.

2.1

3.

N&. -liable.

=INITICNS

1


10/77

FEL-S’IW105E

3.1 z

~ableQualityLevel (ML).

When a mntinuous seriesof 10Es is

considered,the AQiiis tbe qualitylevelfib, for the roses of sa@@

~.ion, is the limitof a satisfactoryprocessaverage (Se 3.19).

NOTE:

A sanpl~ plan and an AQL are chosenin accordanm with the risk assured.

Useofa@ueoflQL fora

a2rtain& fector groupof &fec5s indicam that the

ql~ PM till acoeptthe -t majorityof the lots or bata pbded the

prooess-X levelof ~ defectiwe(or&fects per

huxlredunits) in these

lots or batchesbe no greaterthan the ~ignated value

of A Thus, the AQL is

a ckignated value of ~ defective(or&facts per

hundredunits) forfich

btswill~a~+m~oftk timbythesaqlingp

~re bing used. The

~liw pl~ prfi~ here~ ~ ~ ~ tit ~ p~i~ty of a~

at the ~ignat~ A@ ~ue ~ ~ the sanplesize,~ Z~N ~Xr

:0= 1~~ samples-n for mall ones, for a givenAQL. The AQL alone does not

idelm=ifthe chanoes of aqing or rejectingindividual10Ls or batchesM m.-

dire- ~

.-y relatesto whatmightbe ~ed fruna seriesof lots

or

batches,

prm”i- * steps indi=ted h -s publi~tion aze “taken.

lt is

~sary to

=eYerto the operattigdarad.=”iscic

~ of t.te

plan to *texmine

the relative

risks.

3.3 Average

Qxqoing QualityLimit (ADQL). The M(2L is the

maximum ACQ fora

9L~ a9L~~ -lW pkn. Factorsfor

~@? ML tiues are givm M

Tabie V-A for each of “~ singlesaqlimg plans for normalirqection and in

TableV-3 for each of the singlesmpling plans foz tightened~ “on.

3.4 ClassifimEion of Defects.

A classificationf defectsis t enumerationof

pcsstiie

defects

of the unit

of pxduct

classified

amrdirq to

their seri~.

3.5 Czlti~ DefS&.

A criticaldefect is a ~fect that j~ and ~ri=ce

~mte would resultin hazardousor unsafeconditionsfor individualsUS*,

--, or

~

~upontheprodwt, ora ~fecttbat~ti

experim indicate is likely to prevent perf~

of ttE ~cal fun-on of a

major * itm SU* as a Ship,aixuaft

tank,nbsile, or ~ title.

3 6 Critidl Defective.

A criticalckfectiveis a unit of prockt uhi~

contti one or mre criti~ defectsti may also

contdn mejor and/orminor

defects.

3.7 Defect.,

A defectis any

nonconformanmof the unit of productwith

specimTEi%@l=mts .

2


11/77

laks’m-lo5E

3.8 Def-.ive.

A def=~ive is a unit of productwhich containsone or mre

defe.s.

3.5

Defe.s

per HunckedUnits.

The nwber of defe=s per hundredunits of ~Y

gim quantityof units of productis one

hundredtimesthe mm&r of &fects

con=zinedtherein(oneor mme *fec s being possible in any unit of product)

diviti by the total nunberof units of product,i.e.:

Defects p“

=

Nunberof &fects x 100

hundredunits

Nmbar of units ~~

3.2C Impaction.

Inspectionis the processof ~imt

~gt testmt

cr o-.?m.isecmparing the unitof pmdu~. with the reqair-nts.

7 1i T

- - -

~io~ by Attribtes. Inspectim by

attributesis inspectionwhe~

eizher‘& unit of productis classifiedsimplyas defectiveor non+ef=eive, or

~he numberof defe~.sti the unit c= prcdue.

is courted,with re~st to a givm

~~:i~m or set or requirements.

3.12

tit

or -t&l.

The term lot ox katch shall man “inspectionlot” or

“i==se.ion batcb.”,i.e.,

a collee.ionof unitsof productfrom whi~ a sanple

is EC be dram and i~ed md may dif5erfrm a mll-~ion of unitsdesignate

as a 10= or bat~ for 0“= purposes(e.g., production,shipnent,etc.).

3.13 bt or BatchSize.

The lot or ~t~ size is the number of units of prtib

A a lot‘0:bata.

3.14

M3jor

Defect. A majordefecL

is

a -fact, otherthan criti-, that is

liKelyto resultin failure,or to reducemateriallythe usabilityof the unit

of productfor its int- ~-

3.15 ~a

jor

* f~i~.

0: mre majordefects,

defect.

A majordefectiveis a unit of productwhid? containSon

* may

alSO contain

rrtiordefecLsbut containsno aiti-

3.16

Minor

Defect.

Anbm~i.Sa&fti~t isnot-yto~

materiallythe usabilityof the unit of productfox its int- puzpose~m is

&par&m

fran ~

~WviIgU*~@m

tkeffeCtiWUSec

operatim

of the

unit.

3-17 MinorDef-i-. A

minordefectiveis a unit of P-a M* ~ ~

-- -— . . . —

ox more minor &facts

mtamtains

no aititi or

major*feet.

3


12/77

GL-SB105 2

3.16

Per-m

Defective.

The percent &femive of any givm quantityof units

of produe~is one hur&4 tires the n~- of defemive units of prda~. contairEd

thereindiviti by the total mmber of units of produa, i.e.:

?ercentDefective

=

Nmber of &fectives x 100

~“ of lmits ~ed

3..19ProcessAverage. The Droces

s averageis the average~t &fective or

averagenmber of &fects pez

hw@red

u n it s wh ic h eve r

is ~li~le) of product

szhitted by the sq@ier for originalinspection. Originalinspectionis ~

firstinspectionof a

pa.z.zicula.r

uantityof produceas d.istinguis@dfranthe

~ion of productwhi~ has been

resu&nittedafterprior rejection.

3.2C Sa~le. A sampleconsi=.sof one or mre u..irsof product

drawn

fran a 10=

or &z&, the units of the sem@e being sele~beda= randomwithoutr- to their

q~z:icy.

~ nmtx= C: units of productin the sampleis the sarplesize.

3.22 SampleSize CoaeUtter.

The sanplesize code letter is a deviceused

ElO.ngWitihthe WA fcr l-tins a sapling

p lan cm a

table cf semplingplans.

3 22 Sa?’@hg Plan

A sanplingplan indc caceshe nunt?erof unitsof product

fromeat’.io= or bat&.which m to be insoect

ad (sanplesize or seriesof

sa@e sizes)and the criteriafor cke.rmi.%ngthe acceptabilityof the lot or

batch (acceptan02anc rejectionnumbers).

?.23 ‘Unit

of

Prodxz .

The unit of produ~.is the thing inspectedin o-r to

&.emme lts classif~mtion as defectiveor non-def-hive or to countthe ~“

of +.fecbs. It my be a

singlearticle,a p&ir, a set, a hmgth, an =8 ~

operation,a volme, a cmpcmmt of an end product,or tlw end prociuaitself.

The unit of p~GL may or my not be the sameas the unit of ~, SWPIY,

production,or sh.ipnent.

4.

QN=AL RmJIm=m

4.1

Written

P~ . Written

p~

.

are o~ily davelopedami made

avaalablefor* Govemmm ~

“Ve’s~,lqmnmquast. --

writtenp~ indime me of this stmdard,

they shallamply with -

mq’111aErltsof this

stmdard arxlZefermce

appropriate~ as ~.

4.2 Nonconformance

‘he extentof nonconf~

ofpro&ct sbaube=rP=-

eitherin

terns

Of peroent

Ckfectiveor in term of ckfectsper ~ titS.


13/77

MIPST’D-105E

4.3 Fo.mationand Identificationof Uts or Bat&es.

Theproductshauke

as-led into i-tifiable lots,-lots, batches,or in - otkr manneras

may be paaibed . Ea* lot ox bat~ shall,as

far as

is practicable,mnsist

of unitsof prcduct of a singletype, grade,class,size,and composition,

manufacturedunder es-tially the sam renditions,and at

.

~ythesam

tine

The lots or bat- shall be

itified by the contractorand shallbe k

intar.in adequateand suitablestoragespace.

4.4 AQL.

4.4.1 AQL use.

The

AQL, to@ther with the SaupleSizeb& Letter,is used

f or

.

~

ln ?Lnc the sapl ing

plansp.mcw herein.

4.4.2 Iimita:ion.

The selectionor use of an AQL shallm. inplythatthe

cwcractor has the rightto sm@ y any defecEivewilt of product.

4.4.3 Chmshc ?@’&.

Diff~t ~Ls IllSye Chosenfor ~

of &fects

cms.ide.redolle.+.ivel, or for individual&fee&s.

An ML for a groupof &fe

my be tiosenin a~cion to AQM for individualdefects,or mkqraps, within

chat group. AQL values of 10.0 or lessmy be expressedeitherin ~t

&fective or *. ~fects ~- hunckd units;thoseover 10.0 ZhaU be qressed i

defe.s per “

mdmd units only.

4.5 Saxlplinq.

4.5.1 Repmsmt

ative (Stratified)Satrplinq.

When~ropriate, the rnzr&rof

unitsin the sanple shall& sel~ed in proportionto the size of subletsor

-bat-, or -s of tM lot or bat~, idmtified by q rationalcriteri

when represemat

hHaIcpMniswad 121e

uni ts

franeaal

part

of the

lot or

batdi

shallbe select”edt ranch.

4.5.2 Time of San’Plhq

A samplemay be dram afterall

the lot or batch have bi+enassembled,or sarrpleunitsmay

of the lot or bat~, in uhi~ case the size of the lot or

Sublet,

sub-batch or

the unitscaprising

be drawnduringassa

M* tillk * t e *

kefore any ample units are dram.

If tk sampleunitsare drawnduringas~l~

oftklot or batda, mdif tkrejectionnmb2ris

~m foreth lotis

Curpleted,that pomim of U lot almldy cxmpletedshallbe @ected. m a

oftkdefective ~shall bedmermined

and ammctive actiontaken,afte

&ichanewl otorbat*shgd.lk *.

4.5.3 Doubleor

Mltiple Saup ~

used,ea~ qle shallbe selecte&

WherI

&&le or

Ovarthe entire

mkiple sauplingis to be

lot or bat~.

5


14/77

IaL-s’Iwlc5E

4. 6

~ion Pr~. Normalinspectionwink-at the startof

inspection.

Normal,tightenedor redu~ -bion shall continueundwqed for

each class of def~s or &fectiws an sumsive lotsox batd7esexq. wherethe

%it~ p~

givm klw require -. m swit~ P

~? *1

be -lied to each class of

ck fecSs oz

&2f_iveS <

Y”

4.7

%?it-

P~es .

4.7.1 Normalto Tightened.

~ normalinspectionis in

effect,ti@tened

*mim shallk institutedwhm 2 ouc of 2, 3, 4, or 5

comecutive lots or

batcheshave been rejettedon originalhspection (i.e.,ignoring~

“tted lots

0: btC S fOr thiS Fr~) .

4.?.2 Tig?l:eneeo No.mal. When tightened~ion is -b effect,no.mbal

inspecuon shailbe instituted*=I 5 consecutive10:sor baccbeshave -n

co.nsidey-a-ptable on original~

on.

4.7.3 No.malto R@xed.

When normalinspectionis in effect,reducedir++ion

shal1 be -.ituted providedthatall

of the followi~ conditionsare satisfied:

6. Tne pretig 20 lots ox

bat- (ormre, as indicatedby EYW note tc

Ta5~eVIII) have bee on no.mal~ction aiidall have ben acceptedon original

inspection;and

b. The.total nurber

of ckf-i= (orbf~) fi ~ ~~es ~ ~

p.re

eding 10 lots or batches (orSU* Ot&r mmber as was used for condition“a”

-) is equalto or lessthanthe a@i-le nmber givenin TableVIII. If

dable or mikiple

smpling is

+les only; imd

Pro@cLion is at a

RE cked~ “on

in

use,

al l

samplesinspectedshouldbe ~ti-,

steadyrate; and

is consi&rr &sirable.

4.7.4 RedWed to Normal.

shallbe institutedif any

a.

A lot or bat~

b. A le. Or batd)

4.10.1.4,or

_ ~ ~ion is in effect,normal inspection

of - follcwingomu on originalinq3acEcion:

is rejected;or

is comi-

acceptaMe underthe procedueS

of

c.

Productionbecmes

-= or dela~; or

d. Otherconditims ~ant that normalinspectionshallbe instituted.

6


15/77

MIL-SIW105E

4. 8

Discontinuationf 1~

ion.

If the cumulative nmber of lots not

acce~.edin a sequenceof

mnsecmive LuLson originaltightmed inspection

r~achesfive,the acceptan~ prm3dures of this standardshallbe discontfiued

Inqlm un~- the provisims of *thisstandardshallnot be ~ until

mrrective actionhas ~ takZ7.

Tigthened~ion shallthenbe used as i

4.7.1had been invoked.

.

4.9

SanplinqPlans.

4.9.1 InspectionM.

The inspectionlevel&termines

the rela+~onship~

the lo: or &t* sizeand the sanplesize.

Thehspemion levelto be used for

any pa.mieti~-re@~c will be as prescribedby the contractor’swritten

P-~

-“-es.

Threein.spec.ionevels:I, II, and 111, are g:van in Table I for

ge-.-eraise (see4.1). Normally,hspee~ion Level II is us-. Hmmmr,

In~=.ion @vel I my be usedwhm lessdis=”wtion is needed,

or Ievel 111

my be used for greaterdiscrtition. Four additionalspeciallevels:

S-1, S-2, S-3, mti S-4, am gimn in the same tabieand my be used where

relaciveiysmallsanpiesizesace necessaryand largesa@ing risks can or W.

& mlerat~.

N3TE:

In the selectionof inspee.im ievelsS-1 tc S-4, ~ must be exercise

avoidAQii mm.asistentw“iti.hese ~eion levels.

Lm OLk” words, the ~

of the special

inspemion levels is to keep sanplessmallwhen ~saxy. For

in.stanae,he code iectersunderS-1 go no funk: than D, equivalentto a siql

sanpleof size 8,

but it is cf nc use to chooseS-1 if the AQL is 0.10 ~.

whichthe

mhinm ample is 125.

4.9.2

Co& Letters. Sanplesizesare designated

by

wck letters..-Table I sha

be used to findt& applicableco& letterfor the ~icular lot or batch size

and the p~iked impectl

“onlevel.

4.’3.3retainingSallp

illgPlan.

TTieAQLandthe m& lettershallbe usedto

=ain tne sanpl.irqlan franTablesII, III, or IV. Whm no sapling

plan is

availablefor a givencabination of AQL and code letter,the tablesdirectthe

user tc a differentletter.

Thesa@e size to beusedisgLvm bythenew co&

letter,not by t& originalletter. If this p~

leadsto differentsampl

sizes fo r

diff~ classesof &fects, t& code letterm

.

~ sa@e sizederivedmay be used for all

~tothe

Classesof defec+s. & an

alternativeto a sirqlesauplii

plan with an ~

~ofo, the plan

with an a~

m.mberof lwithitscomeqmmbg

ly Mqer sauplesize fo r

&signated AQL (wkre

avai lable ,

may be ~.

7


16/77

MIL-S’ID-105E

4.9.4

Typesof SanplingPlans.

Three types of sapling plans: Single,Double,

and Wlziple, are givm h TablesII, III, and IV, respectively.Whe several

:ypes of plans are availablefor a givenAQL and code letter,any one may be used.

A decisionu to t= of plan,eithersingle,double,or titipler ~ ~l~le

for a given ~ @ * letter, will ~ly & ~ ~ * ~ison bet=

the administrativeiffitity and the ~ge sanplesizesof the availableplans.

7he averageszmplesize of multipleplans is lessthan for -Ie (~ M ~

case co.~

to si@e aqance n-- 1) and both of these m always

lessthan a si~le qle size (seeTable IX). US@lY m ~~a”~ve

difficultyfor singlesmpling and the costper unit of the sanpleare lessthan

for doubleor mltiple.

4.lG Daennina:ia of Amsmability.

4.2G.I Pe~nt Defeaive Inspection. To determinea~ ility of a lot or

bate mder percentdefectiveinspection,the appli-le. San@@ plan shallbe

used in accodance with 4.10.1.1,4.10.1.2,4.10.1-3,@ 4.3~.l.4.

4.IC.I.2 Shgie SanpLingPlan.

The n-” of sanpleunits inspecxedshallbe

qua2 tc the sanplesize givm by the plan. If tk n-v of =f-.i- f- ~

the sampleis equalto or lessthanthe aqan~ rnmber,t& lot or bat~ shall

‘m consideredaqable. If the nmber of &feccives is equal to or great-”than

the mjemion nwker,

the 10= or bat~ shallbe rejected.

4.10.1.2 DoubleSamplinqPlan.

Anuberof sa@eunkS6S?ud to the first

sa@e sizegiw by the plan shallbe inspected. If the mmber of def=ives

foundm the firstsanpleis equalto or lessthanthe first~ nmber,

the lot or bat- shallbe consi- a~le. If tb ~ of W-W

foundinthefirst sampleis equaltoorgmater than the firSt z@eCtim~l

the lot or batd shallbe rejected.

If tb nmber of &fectives fomd in &

firstsanpleis betweenthe first~c and rejectionxnzc&rs,a ~

sanpleof the sanesize shallbe ~ed. TM ~ of a-i= f- in

the fixstand secmd aanpks shallbe ammlated. If the ~tiw ~ of

*fectives isaqualto or lessthanthesemnda~

mmber, the lot or batd

shallh cmsickred a~le. If the cmdative rnmberof &fectives G equal

toorgreaterthan~~ rejectim~,t&lOtOrk* aballbe

= jetted.

4.10. 1.4 spec ial P~for~xnSJect

im.

- Xed13=d~im *

Sanplingpmoadura may t~

Withultaith=ac=pt==

or rejectionaiteria

m--” ~

*l~or=*~~be--

acceptable,but normal reinstatedstartingwith the next lot or

batch (see4.7.4.b).

8

.


17/77

mL-Slmlo5E

4.10.2 Defectsw Hundredunits

Inspection.To &temine

~

a-ability of a

lot Or batti k-

&feCts ~“ hundredunits~

ion, t& promdure

specified

forpemem 63feGive inapecxionaboveshallbe “-, ex~ that the woti

“defects”shallbe substitutedfor

“ckfectives”

4.~1 ~i”

mg

QualityProtection.

The sanplingplans and associated~

given m this@liatim weredesignedforuse _ the units of productare

prodmed in a continuingseriesof lotsor batches mer a period of tire.~t

‘” the lot or batti is of an isolatedmm, it is ~irable to limitthe

=lec&im of sarrplinglansto those,

associatedwith a ck2signatedL mlw, Z

prouidenot lessthan a ~fied limitingqualitypmtectim

-W pldns for

this purpose-. be selectedby dmosing a LimitingQuality (L@ and a ~’s

riskto be associatedwith it.

TablesVI andVII give values of W for the

the cmnonly used ‘bonsmer’srisksof 10 ~at and 5 ~t ~bively.

If a

tiffe.mc valueof co~’

s risk is recpired,the O.C.

cumesandtheirtabu-

lazedvaluesmy be used. The conceptof IQ may also be useful in specify+q the

L-L and ~~.i

on Levelsfora seriesof lotsor bat-s, thus fixim mimmm

s*ie size-vherethereis saw

reason

foravoiding

corsmer’s risk)more than & Limking p~rtion of

singlelot or bat~..

(withmre than a-gima

def-kives (ordefects)in any

4.X2

Cum?es.

4.12.1 @crating Characteristics.

The qerathg ~ctaistic mmes

for

normal

-~ion, shownin TableX, indi~=e the pe.roentagef lots or kt~

whAtimay be ~ed to be acceptedunderthe varioussapling plans for a given

pmoess @ity. The mmes

shownare forsinglesapling;

cumes for tile and

mlziple saqling are xmtchedas closelyas p-i-le. The O.C. cumes shown

for AQIs greaterthan 10.0are based on the Poisson&ibution ti are ~li-

~le fo= defectspax hundredunits i.nsp&tion;those for~ of 10.0 or less and

sanplesizesof 80 or lessareM on the binanialdistrikmim and azz

applicableforper- defecLive~-ion; those for AQE of 10.0 or less and

sarplesizes1-- than 80 am based the Poissondistributionand m ~li-le

eim- for defeczsper hundredunits hsoect

ion,or forpercentde@ctive

inspection(thePoissm distribution&&g an ~te q~

.Onto the

timid distrih.tim - theseconditions) TaMhted mluas,

selectedvaluesor

pmhabilitiesof aqanue (Pa,in

~) are gi- f= a&

ofth CUmes -, an& in addition,for tightenedimpectx

“on,and for M-

perhundred units for ZoflO. O orlessand sauplesizesof800r less.

4.~2-2

Amage S

qle SizeOzrves.

Averageample sizemrves for~le @

mltiple sanplingam in TableIX. = showthe averagesa@e sizeswMA may

be qed to omzr un&r the varioussa@ing plans

or q

levelsof prooess

quality. The

cumailmnt of ~im aml are ~roximte

the m-t tha-m e= upon the Poissondistribution,and that the s&e

sizes

for doubleand multiplesamli.ngare

assmed to &

0.631nand 0.25n

respectively,wheren is the

size.


18/77

MIL-SlW105E

/

SEXZIC)N

TAW3SANOG7E7VES

.

u


19/77


20/77


21/77

SINGLE

NORM L

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30/77

MULTN

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31/77

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32/77

MULTI

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Mil-std-105e (Ansi_asq z1.4-2008)

Documents

Transcript of Mil-std-105e (Ansi_asq z1.4-2008)